MAGNETIC FLUX LEAKAGE TESTING ASNT-NDT-LEVEL-III

1) The primary condition which needs to be met to obtain a signal response from the discontinuity

when the MFL, testing of Ferro-Magnetic test piece is magnetized close to the

saturation point using an encircling coil as a sensor.

-Moving the Ferro-Magnetic test piece in relation to the coil

2) Fig-1, What will be the relative flux leakage level on the surface of the 1x7 Strand Cable-Rope

caused by an outer wire break compared with that caused by an inner wire break ?- Greater

3) What method of magnetization can be used in Flux leakage testing- Permenant Magnet & DC

 Spatial & Temporal discretization is used in order to satisfy the governing Hyperbolic partial

differential equation resulting in partial differential wave propagation equation.

 Total Flux Leakage

 MFL-Wire Rope

 Stray Field MFL Signal Analyis

 Blablabla question asked about nearly a 5 line paragraph: but the matter is Longitudinal (Axial

)Defect is detected by Circumfrential magnetization.

 The purpose of Ferrite core used in Pickup coil – Remove the unwanted Eddies /Leakage

 Static Field Technic are governed by-elliptical partial differential equations

 Quasi-Static Field technic are governed by Parabolic partial differential equations

 Wave-Field techniques are governed by hyperbolic partial differential equations

 Computerized Signal developed-Moore’s Law

 Maxwell’s time varying equations including signal displacement current results in 4 types of filed 1)

Quasistatic 2) Finite Curl 3)Electro Magnetic Field & 4 ) Divergence

 Velocity of propagation of EMF=Speed of Light, & Depends on permittivity of free space

,permeability of free space

 Maxwell’s Equation ∇ 𝑥 𝐻 = 𝐽 𝐶𝑢𝑟𝑟𝑒𝑛𝑡 𝐷𝑒𝑛𝑠𝑖𝑡𝑦 & ∇ 𝑥 𝐵 = 0, ∇𝑥𝐷(𝐸𝑙𝑒𝑐𝑡𝑟𝑖𝑐 𝑓𝑙𝑢𝑥 𝑑𝑒𝑛𝑠𝑖𝑡𝑦) = 𝜌

 Curl (rotation) of a vector field is related to Curvature of field &the

 Divergence of the vector field is related to nature of sources of the field

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 MAGNETIC FLUX LEAKAGE TESTING ASNT-NDT-LEVEL-III
 MFL is a Qualitative measurement

 Loss of Metalic Area (LMA) in wire rope by ECT is Quantitative.

 MFL-Wire rope testing , the Discontinuities are Circumfrential (Circular)Magnetic Flux Leakage

 A Spatial-Notch Filter is to remove Strand Wave form component from the original signal

 Filtered discontinuity by Notch Filter transformed to a Gray Scale Map

 The Annular-Array of Hall sensors around the magnetized wire rope will capture while the sensors

moving-Stray Field of the rope surface

 The Hall Sensors detect the- Radial magnetic flux leakage surrounding the rope

 Permanent Magnets made of Sintered-Nd-Fe-B

 The first permanent magnets were made from magnetite, an ore of iron which gets naturally

magnetized by the earth's magnetic field, the headphones for music systems, smaller and more

powerful magnets are required. These magnets are made from a material known as samarium

cobalt(SmCo). Neodymium magnets are widely used in computer hard disks, better materials such as

Alnico (an alloy of Aluminium, Nickel and Cobalt) were used. Permanent Magnets are magnets which

retain magnetism even after the magnetizing field strength is removed. Permanent magnets are used

in equipments such as speakers, data storage devices, generators, etc, etc.

 Two types of MFL-Pipe Testing Thresholds are Internal (ID ) & External (OD)

 MFL of Steel tube testing,Shape enhancement, digitization by sample signal as a vector U,in an N

dimensional space in order of 100

 A typical MFL has 32 sensors,each sensor’s signal sampled at the frequency 4KHz=128,000 data per

se cond processed

 A MFL system to operate in a real time,a non-trivial implementation with clevercoding hardware used

 Prove-Up method or Prove-up station in online MFL-Ultrasonic Thickness Gauging by T/R probe

 False negative-Missing of Actual Defects

 False Positives-Accepting of Non-relevant signals

 Two types of MFL Detection errors are False negative & False Positive.

 Shape enhancement Algorithm of MFL based on,comparing the similarities between,natural

discontinuities & reference notches

 Two types of Electro-Magnetic Fields are Static (MFL) & Dynamic or Time-Varying (ECT)

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 MAGNETIC FLUX LEAKAGE TESTING ASNT-NDT-LEVEL-III
 The difference between 2D & 3D FEM?

 Critical value of the crack depth in MFL 12.5% of wall thickness

 Monte-Carlo-Simulation –A MFL-numerical model of crack detection in steel pipes,thatuncertainities

& false detections were analyzed

 Type-1 error-Lack of detection of un-acceptable defects- (Accepted tubes with un-acceptable

defects)

 Type-2 error-False alarms (Rejected Tubes with sub-critical defects)

𝑄3
 MFL-Monte-carlo Detection Reliability=100 𝑄1+𝑄3
⬚

 Neural Networks –Post MFL date processing reducing the Noise

MFL-Tank floor Scanning

 A powerful rare-earth permenant Magnet is used as a Magnetic Bridge between 36 Hall sensor

between S-N pole; Scan width 250mm,Scan length-15M & scan speed 0.45m/s

 Tank floor cleanliness,rougher the surface,higher background noise & reduction in MFL sensitivity

 MFL- Critical crack depth Inspection Standards are –API-1995 & ISO1989

 Two types of MFL-sensors are Inductive Coil & Hall sensors

 Inductive coils are passive sensor devices,based on faraday’s law,in the presence of magnetic field,a

voltage is generated in the coil,& the level of the voltage depends on the number of turns in the coil

& rate of the change of flux leakage

 Hall sensors are Active-sensor Devices, a solid state device as a part of an electrical circuit and when

passed through a magnetic field,the v alue of the voltage in the electrical circuit varies dependent on

the absolute value of the flux density.

 Contrary of MFL-Tank floor scanning, Top side defect signal is Lower Amplitude & Bottom side signal

amplitude is Higher

 MFL-Tank floor scanning Prove-up method is UT-Thickness with Corrosion evaluation.

 Tank floor scanning MFL+ECT combination probe design allows to display the same defect signal at

the same time makes it possible to distinguish back surface discontinuities from those on the top

surface only bcoz ECT +MFL signals can be aligned to CONTRAST their difference

 Advantage of using MFL-Crawler-A mobile device used for Tank Shell Thickness measurement

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 MAGNETIC FLUX LEAKAGE TESTING ASNT-NDT-LEVEL-III
without scaffolding

 100% Tank Bottom –Manual & Automated UT,MFL,RFT,Lowfrequency-ECT

 When MFL of Tank Bottom Floor,a Cause for significant reduction in the thickness of the floor will

result in some of the MFL being forced in to the AIR around the area of reduction

 Discontinuity width or diameter has less effect on the AMPLITUDE of MFL signal than discontinuity

depth

 Brittle fracture is the major cause for Catastropic Tank failure.

 The UNDER-SIDE of tank bottom plates is typically inspected with UT+MFL that can-” See-Through

the plate”

 LCD-Screen with Gray Scale Screen-

 Total-Flux Magnetic Leakage method-Installed Ferromag Pipes

Releveant parameters for Monte-Carlo-Simulations are Crack width,Crack depth,pipe wall

thickness,Applied (Noramal component), magnetizing field (Ho),Magnetizing field inside

material,Magnetic Flux density (Bo), & Lift-Off

MFL Critical crack depth standard deviation of 25% mean value used in Monte-carlo-simulation

The Hall effect is the deflection of electrons (holes) in an n-type (p-type) semiconductor with current
flowing perpendicular to a magnetic field. The deflection of these charged carriers sets up a voltage,
called the Hall voltage, whose polarity depends on the effective charge of the carrier.

If a current carrying conductor placed in a perpendicular magnetic field, a potential difference will generate in the conductor
which is perpendicular to both magnetic field and current. This phenomenon is called Hall Effect. In solid state physics,
Hall effect is an important tool to characterize the materials especially semiconductors. It directly determines both the sign
and density of charge carriers in a given sample.

the n-type semiconductor, free electrons are the majority carriers and holes are the
minority carriers. That means most of the current in the n-type semiconductor is
conducted by free electrons.

In the p-type semiconductor, holes are the majority carriers and free electrons are the
minority carriers. That means most of the current in the p-type semiconductor is
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 MAGNETIC FLUX LEAKAGE TESTING ASNT-NDT-LEVEL-III
conducted by holes.

Now we get an idea about the p-type and n-type semiconductors. But how can we
identify whether the semiconductor is p-type or n-type.

Free electrons and holes are the very small particles. So we can’t see them directly with
our eyes. But by using Hall Effect we can easily identify whether the semiconductor is a
p-type or n-type.

When a voltage is applied to a conductor or semiconductor, electric current starts flowing

through it. In conductors, the electric current is conducted by free electrons whereas in
semiconductors, electric current is conducted by both free electrons and holes.

The free electrons in a semiconductor or conductor always try to flow in a straight path.
However, because of the continuous collisions with the atoms, free electrons slightly
change their direction. But if the applied voltage is strong enough, the free electrons
forcefully follow the straight path. This happens only if no other forces are applied to it in
other direction.

If we apply the force in other direction by using the magnetic field, the free electrons in
the conductor or semiconductor change their direction.

Consider a material, either a semiconductor or conductor as shown in the below figure.

When a voltage is applied, electric current starts flowing in the positive x-direction (from
left to right).

If a magnetic field is applied to this current carrying conductor or semiconductor in a

direction perpendicular to that of the flow of current (that is z-direction), an electric field is
produced in it that exerts force in the negative y direction (downwards). This
phenomenon is known as Hall Effect. Hall Effect was named after American Physicist
Edwin Hall, who discovered the phenomenon in 1879.

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