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A Media
New Year, Same Mission
Katzbek 17a A Happy New Year to all of our readers.
D-24235 Laboe, Germany May your wishes come true and those good
Phone: +49 4343 42 17 90 intentions last into the coming year. You have
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info@bodospower.com in your hands the first issue of the New Year,
www.bodospower.com eleven more will follow. I can proudly an-
Publishing Editor nounce that the vast majority of our support-
Bodo Arlt, Dipl.-Ing. ers will continue with us into 2020. We thank
editor@bodospower.com you for your continued support, without you
Junior Editor
Holger Moscheik it would not be possible for us to complete
Phone + 49 4343 428 5017 our mission – to distribute a magazine with
holger@bodospower.com well-founded articles and the latest news to
Editor China the industry. Other exciting news is that our new website
Min Xu has been online for a month now, and what
Phone: +86 156 18860853 can I say - positive feedback again. In ad-
At the beginning of December our third WBG
xumin@i2imedia.net
Power Conference took place in Munich, dition to the well-known sections - like the
UK Support
June Hulme for the first time spread over two days. archive, the news, and our event calendar
Phone: +44 1270 872315 The first day included a panel discussion - there’s some interesting information about
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US Support respected experts on the achievements in ticles in the magazine. If you have a minute,
Cody Miller take a look, it’s worth it.
Wide Bandgap applications and an outlook
Phone +1 208 429 6533
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one hour question-answer session, followed Bodo’s magazine is delivered by postal
Creative Direction & Production
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Printing by: job. As did all of the presenters who made My Green Power Tip for the Month:
Brühlsche Universitätsdruckerei GmbH this event what it was: a big success. And for Did you know that in Germany for the first
& Co KG; 35396 Gießen, Germany everyone who attended, our appreciation - time, shops have banned fireworks from
A Media and Bodos Power Systems you “made the day”. their assortment of New Year’s Eve trinkets ?
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change our Christmas practice for 2019.
material contained herein regardless
Instead of the Christmas cards that we have celebrating the New Year too.
of whether such errors result from
negligence accident or any other cause sent in the past, we decided to donate to
whatsoever. UNICEF, as we believe that thinking about Best regards
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Events
NEPCON 2020 India Electronics Week 2020 APEC 2020
Tokyo, Japan January 15-17 Bangalore, India February 13-15 New Orleans, LA, USA March 15-19
www.nepconjapan.jp/en www.indiaelectronicsweek.com www.apec-conf.org
W /S
al
or ta
ld nd
20 2 1
20 1
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-40 to +125 °C in a surface mounted SO8 or SO16 package. • 2 μs response time
• Up to 3 kV RMS isolation
www.lem.com • Double Over-Current Detection outputs for short
circuit and over-load protection (SO16 version)
CONTENT
NEWS
www.fujielectric.com
Lunch time?
… or work time?
Scan for
product.
CONTENT
NEWS
ECPE Events
ECPE Workshop 'Power Semiconductor ECPE Workshop 'Magnetic Components in
Robustness - What Kills Power Devices?' Power Electronics'
13 January (afternoon) - 14 January 2020, 19 - 20 February 2020, Grenoble, France
Munich, Germany
ECPE Tutorial 'EMC in Power Electronics'
ECPE Tutorial 'Drivers and Control Circuitry - further information published soon
for IGBTs and MOSFETs' - further informa- 22 - 23 June 2020, Eindhoven, Netherlands
tion published soon
18 - 19 February 2020, Barcelona, Spain
www.ecpe.org
www.fujielectric-europe.com
www.americas.fujielectric.com/semiconductors
CONTENT
NEWS
www.intersolar.de
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Main benefits
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CONTENT
NEWS
Leading IGBT technology for 1200 V, 900 A with emitter controlled 7 diode, NTC and PressFIT contact technology,
ideal for general purpose drives, electric busses and trucks, as well as solar applications.
www.infineon.com/igbt
PRODUCT
CONTENT
OF THE MONTH
The latest product release from UnitedSiC are 7mohm, 650V and a 9mohm, 1200V Silicon Carbide FETs in a TO247-4L package. The UF3SC
devices set a new benchmark for low, on-state losses from room temperature to the rated 175C. The 5V threshold voltage coupled with the +/-
20V Vgs rating means these devices are compatible with standard Si as well as SiC gate drivers and can be successfully driven 0 to 12V.
The ultra-low conduction losses are combined with low switching losses, which makes these devices useful in >99% efficient EV traction in-
verters, EV fast chargers, UPS and Solar applications. Solid-state breakers can now be implemented with very low conduction losses. Many
designs, previously requiring paralleled devices, now need just one. Similarly, designs needing expensive power modules could now be imple-
mented with these discrete devices.
www.unitedsic.com
Partnering in SiC-MOSFETs
to Deliver Automotive
and Industrial Solutions
Interview with Dr. Rainer Käsmaier, ABB
To accelerate market entry into the high-growth electric vehicles (EV) sector, Dr. Rainer
Käsmaier, Managing Director of Semiconductors at ABB’s Power Grids business, and
Gregg Lowe, CEO of Cree, the leading US-based manufacturer of silicon carbide power
semiconductors, have announced a partnership to jointly expand the rollout of SiC-based
products in the rapidly growing power semiconductor market. This contract is to enable
Cree to broaden its customer base, leveraging ABB’s extensive power semiconductor
portfolio.
By Roland R. Ackermann, Correspondent Editor Bodo’s Power Systems
By incorporating Cree’s silicon carbide semiconductors into its But you already had power modules in your portfolio?
product portfolio, ABB accelerates its entry into the fast-expanding EV That's right. Power modules are the main products in our Semicon-
sector. ductors product group, and they go into various markets. Essentially,
we have been providing our power modules in all industrial segments
For Cree, the partnership enables the company to broaden its cus- requiring voltage source converters. We are particularly well on our
tomer base. Cree’s products will be included into ABB’s power semi- way in the large traditional “mobility” segment of traction inverters for
conductor product portfolio, across power grids, train and traction, trains.
industrial, and e-mobility sectors. Cree’s high-end silicon carbide de-
vices will be assembled into power modules in ABB’s award-winning And, of course, we are very active delivering semiconductor modules
automated power semiconductor factory in Lenzburg, Switzerland. for Power Grids, our home division. With renewable power grids, it's
becoming extremely important to transport bulk electricity from wind
We have asked Dr. Käsmaier some ques- or solar power plants – which are located somewhere, but not exactly
tions about the partnership with Cree: where the cities are – over long distances. Highly efficient substations
are needed for that purpose (which my colleagues in another ABB
What was the main reason for you to division will then build).
make this arrangement with Cree?
The main reason was essentially: We at And it's precisely this know-how that we have that can also be used
ABB decided some time ago that the exper- very well in the automotive sector. Automotive power modules natu-
tise we have in the high-voltage (HV) area rally look different from that of a train or an HVDC converter station.
of semiconductors would enable us to open Requirements in terms of size, form factor and converter integration
new business areas. This is exactly in line are different in a car. We believe that we have understood these
with the trend in electric cars, requiring HV requirements very well and we presented such a module at this year's
power semiconductors to drive electric mo- PCIM (see the description in the box on page 20).
tors and to charge HV battery systems. In this market – in addition to
industrial and rail markets in which our semiconductors have already Your move in the direction of wide bandgap silicon carbide in
been in use so far – we have exactly the appropriate experience to this respect is also beneficial for the environment because of its
use and apply our expertise, and wide bandgap (WBG) technology, in smaller dimensions, higher efficiency and reliability, and lower
this case SiC, is an efficient base material option for the EV applica- consumption?
tions. At ABB, we are not on the road with lower voltage silicon MOSFET or
gallium nitride, but in the higher voltage segment. We see the need
We have been developing power components for quite some time to use SiC in order to contribute to environmental friendliness and re-
that are also well suitable for use in vehicles. It was also foreseeable duced battery sizes. Compared to a standard silicon-based semicon-
that silicon carbide would bring significant advantages in the electric ductor, a silicon carbide semiconductor allows energy conversion with
vehicle power train and that we would therefore have to deal with it. almost no losses, thus reducing power conversion losses and carbon
And here Cree virtually offers itself as a strong partner. dioxide emissions.
But this can in future also open options for the rail sector, where our
modules are used in high-speed trains all over the world offering an
attractive alternative to flight operations – a considerable contribution
to the increased cleanliness of our planet. This has an even greater
effect in Asia with its long distances, but it´s also becoming more and
more important in Europe.
For EVs, whose customers are the end consumers, you need a
small power electronics unit that consumes little electricity allowing
to maximize the driving range with the existing battery, or – which is
a burning issue – use a smaller battery with a correspondingly lower
weight and cost. If you can then make everything that consumes elec-
tricity and is necessary for electricity conversion more efficient, then
you can also achieve the desired longer range, which is still a decisive
purchase criterion for any electric car.
It is quite possible that we will not only maintain the status quo that
everyone has, but also look at how we are progressing in the partner-
ship in the future. Especially for our industry, you need to do devel-
opments constantly to stay competitive. And this is probably even
more extreme in the semiconductor industry than in other industries
because of the short cycle times.
This has been the case for decades. And if you then have a partner
who is travelling a lot around the world, then it's also clear that you're
The innovative LinPak concept answers the market’s request for a new package that
offers exceptionally low-stray inductance and, due to separated phase and DC
connections, allows for simpler inverter designs. The LinPak low-inductive phase leg IGBT
module is available in 1700 V and 3300 V with current ratings of 2 × 1000 A and 2 × 450 A,
respectively.
abb.com/semiconductors
COVER
CONTENT
STORY
The device includes several auxiliary functions and features to ac- The below-ground voltage phenomenon
celerate the design of the system, minimize the need for external The negative spike voltage of a half-bridge output is often found in
components and circuits, avoid using complex and delicate protection power applications, especially if space or mechanical constraints do
schemes against noise and disturbances, and keep the overall appli- not allow an optimized PCB layout. The below-ground spike can lead
cation simple and cost effective. to unwanted phenomena such as the over-charging of the bootstrap
capacitor and the incorrect operation of the output stage if devices
The STDRIVE601 is housed in a space-efficient SO28 package and with insufficient ruggedness are used.
replaces three half-bridge drivers, enabling a compact PCB layout. Its
6 outputs can each sink 350 mA and source 200 mA, with gate-driving In half-bridge topologies, especially when driving highly inductive
voltage ranging between 9 V and 20 V. Ioads, the output of the power half-bridge could experience a negative
voltage, with an initial dynamic spike followed by a static component
The 3 high-side bootstrapped sections can operate as high as 600 V (Figure 1b). This phenomenon occurs when the bridge makes a hard
and can be supplied through the integrated bootstrap diodes, which switching transition towards the low voltage level and the load current
save PCB area and reduce the bill of materials. An under-voltage is outgoing (from the bridge to the load). When the high-side switch
Managing your system’s power usage is crucial to achieving the performance that
your design requires. Our product portfolio of power monitoring devices allows you
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enables you to efficiently design a solution to manage the power requirements of
your system.
The Microchip name and logo and the Microchip logo are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. All
other trademarks are the property of their registered owners.
© 2018 Microchip Technology Inc. All rights reserved. DS20006065A. MEC2230Eng11/18
COVER
CONTENT
STORY
turns off, the inductive component of the load tries to keep the output We’ve driven an RL load (200 µH, 16 Ω) while putting an inductor with
current constant. The output voltage drops and when it reaches the several selectable values (0.19 µH, 0.45 µH, 0.82 µH) in series with
“ground” value the current starts flowing through the low-side free- the low-side IGBT, to simulate a stray inductance that can be due to
wheeling diode, which gets forward biased. The main contributors to very bad PCB layout.
dynamic below-ground voltage are the spikes due to the high dI/dt
experienced by the PCB parasitic inductances in series with the free- Figure 3 shows the case of a stray inductance of 0.82 µH: the output
wheeling diode located along the low-side current path of the half- swings from 300 V to 0 V and the below-ground spike has a minimum
bridge. Other contributors are the forward peak voltage of the low-side peak at -127 V and remains negative for about 148 ns.
freewheeling diode, which passes from a high voltage reverse condi-
tion to a forward condition in a short time, and by the parasitic induc-
tance of the shunt resistors.
- Professional support for the selection of the right product and for
your system design from our application experts worldwide
Power Modules
Systems
www.semikron.com Power Electronic Stacks
𝑽𝑽𝑶𝑶𝑶𝑶 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ 𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺
𝒕𝒕𝒕𝒕𝟏𝟏𝟏𝟏 ≅ 𝒍𝒍𝒍𝒍(( 𝑽𝑽𝑶𝑶𝑶𝑶 ))
≅ 𝑹𝑹𝑹𝑹𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶 ∙∙𝑪𝑪𝑪𝑪𝑶𝑶𝑶𝑶 ∙∙𝒍𝒍𝒍𝒍 𝒕𝒕𝟐𝟐 ≅
𝒕𝒕 ≅ 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ 𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺
𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶 𝑶𝑶𝑶𝑶 𝑽𝑽𝑶𝑶𝑶𝑶
𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺 𝟐𝟐 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ 𝑽𝑽𝑰𝑰𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺
𝒕𝒕𝟏𝟏 ≅ 𝑹𝑹𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶 ∙ 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ 𝒍𝒍𝒍𝒍 ( 𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺 𝑰𝑰𝑶𝑶𝑶𝑶
𝑶𝑶𝑶𝑶
) 𝒕𝒕𝟐𝟐 ≅ ∙ 𝒍𝒍
𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺 𝑰𝑰𝑶𝑶𝑶𝑶
Where 𝑽𝑽 = 𝑂𝑂𝑂𝑂 𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓 𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣
Where 𝑽𝑽𝑂𝑂𝑂𝑂 = 𝑂𝑂𝑂𝑂 𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓 𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣 𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙
𝑂𝑂𝑂𝑂 𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙
COVER
CONTENT
STORY Where 𝑽𝑽𝑂𝑂𝑂𝑂 = 𝑂𝑂𝑂𝑂 𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓 𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣 𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙
In case
In case the
the OD OD pin pin isis connected
connected to to VCC
VCC by by an an external
external pull-up
pull-up resistor
resistor RROO
In time
case the OD pin
time isis determined
determined by is connected
by the to
the external VCC
external networkby an external
network RROD_ext pull-up
OD_ext , CCOD and
, OD
resistor
and by by the
the ROD_e
inte
inte
time is determined
(Equation 3), while by the the external
Restart time network
is R
determined
(Equation 3), while the Restart time is determined by current in ROD_ext (Equ OD_ext by
, COD and
current byin the
R intern
OD_ext (Eq
(Equation 3), while the Restart time is determined by current in ROD_ext (Equat
Smart ShutDown overcurrent protection
STDRIVE601 integrates a comparator committed to fault protection 𝑹𝑹 ∗𝑹𝑹
𝑹𝑹 𝑶𝑶𝑫𝑫𝒆𝒆𝒆𝒆𝒆𝒆∗𝑹𝑹 𝑶𝑶𝑵𝑵𝑶𝑶𝑶𝑶 𝑽𝑽 𝑽𝑽
≅ 𝑪𝑪𝑪𝑪𝑶𝑶𝑶𝑶 ∙𝑹𝑹∙(( 𝑶𝑶𝑫𝑫∗𝑹𝑹
𝒕𝒕𝒕𝒕𝟏𝟏𝟏𝟏 ≅
𝒆𝒆𝒆𝒆𝒆𝒆 𝑶𝑶𝑵𝑵𝑶𝑶𝑶𝑶 𝑶𝑶𝑶𝑶−𝑽𝑽 𝒐𝒐𝒐𝒐
) ∙ 𝒍𝒍𝒍𝒍 ( 𝑽𝑽𝑶𝑶𝑶𝑶− 𝒐𝒐𝒐𝒐 ) Equation
Equation 33
through a smart ShutDown (SmartSD) circuit. 𝑶𝑶𝑶𝑶 𝑶𝑶𝑫𝑫 𝑹𝑹𝑶𝑶𝑫𝑫𝒆𝒆𝒆𝒆𝒆𝒆 +𝑹𝑹
𝑶𝑶𝑵𝑵 𝑶𝑶𝑵𝑵𝑶𝑶𝑶𝑶 ) ∙ 𝒍𝒍𝒍𝒍𝑽𝑽( 𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺
𝑽𝑽𝒐𝒐𝒐𝒐 −𝑽𝑽𝒐𝒐𝒐𝒐) Equation 3
𝑹𝑹𝒆𝒆𝒆𝒆𝒆𝒆
𝑶𝑶𝑫𝑫𝒆𝒆𝒆𝒆𝒆𝒆 +𝑹𝑹 𝑶𝑶𝑶𝑶 𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺 −𝑽𝑽𝒐𝒐𝒐𝒐
𝒕𝒕𝟏𝟏 ≅ 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ (𝑹𝑹 +𝑹𝑹
)
𝑶𝑶𝑵𝑵𝑶𝑶𝑶𝑶
∙ 𝒍𝒍𝒍𝒍 ( 𝑽𝑽
𝑶𝑶𝑶𝑶−
−𝑽𝑽
) Equation 3
The SmartSD architecture turns off the gate driver outputs in case of 𝑶𝑶𝑫𝑫𝒆𝒆𝒆𝒆𝒆𝒆 𝑶𝑶𝑵𝑵𝑶𝑶𝑶𝑶
𝑽𝑽
𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺
𝑽𝑽
𝒐𝒐𝒐𝒐
overload or overcurrent conditions, with just 360 ns delay between 𝒕𝒕𝒕𝒕𝟐𝟐𝟐𝟐 ≅≅ 𝑪𝑪𝑪𝑪𝑶𝑶𝑶𝑶 ∙∙ 𝑹𝑹𝑹𝑹𝑶𝑶𝑶𝑶_𝒆𝒆𝒆𝒆𝒆𝒆 ∙∙𝒍𝒍𝒍𝒍 𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺−𝑽𝑽 𝑶𝑶𝑶𝑶
𝒍𝒍𝒍𝒍((𝑽𝑽𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺− 𝑶𝑶𝑶𝑶 ) Equation
Equation 44
𝑶𝑶𝑶𝑶 𝑶𝑶𝑶𝑶_𝒆𝒆𝒆𝒆𝒆𝒆 𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺−
𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺−
𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺− 𝑶𝑶𝑶𝑶)
𝑽𝑽𝑶𝑶𝑶𝑶𝑽𝑽𝑽𝑽𝑶𝑶𝑶𝑶 Equation 4
fault-detection and the actual output switch-off. The protection inter- 𝒕𝒕𝟐𝟐 ≅ 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ 𝑹𝑹𝑶𝑶𝑶𝑶_𝒆𝒆𝒆𝒆𝒆𝒆 ∙ 𝒍𝒍𝒍𝒍 (𝑽𝑽 ) Equation 4
𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺− 𝑽𝑽𝑶𝑶𝑶𝑶
vention time, which is about two times faster than other gate drivers where
where
in the market, is independent of the duration of the disable time after where
where 𝑹𝑹𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶
𝑽𝑽𝑽𝑽𝑜𝑜𝑜𝑜 =
𝑜𝑜𝑜𝑜 =
𝑹𝑹𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶 ∙ 𝑽𝑽𝑐𝑐𝑐𝑐;; 𝑽𝑽𝑽𝑽𝑂𝑂𝑂𝑂 = 𝑽𝑽𝑽𝑽𝑐𝑐𝑐𝑐
the fault. 𝑹𝑹𝑹𝑹𝑶𝑶𝑶𝑶_𝒆𝒆𝒆𝒆𝒆𝒆 +𝑹𝑹𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶 ∙ 𝑽𝑽𝑐𝑐𝑐𝑐 𝑂𝑂𝑂𝑂 =
𝑐𝑐𝑐𝑐
𝑹𝑹𝑶𝑶𝑶𝑶_𝒆𝒆𝒆𝒆𝒆𝒆
𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶+𝑹𝑹𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶
𝑽𝑽𝑜𝑜𝑜𝑜 = 𝑹𝑹 +𝑹𝑹
∙ 𝑽𝑽𝑐𝑐𝑐𝑐 ; 𝑽𝑽𝑂𝑂𝑂𝑂 = 𝑽𝑽𝑐𝑐𝑐𝑐
𝑶𝑶𝑶𝑶_𝒆𝒆𝒆𝒆𝒆𝒆 𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶
This allows the designer to increase the duration of the output disable
time after the fault event up to very large values without increasing the Figures 6 show examples of Smart ShutDown operation, with two
delay time of the protection. The duration of the disable time is deter- different capacitors connected to the OD pin. The triggering pulse on
mined by the values of the external capacitor COD and of the optional CIN has a width of 500 ns, with amplitude (peak to peak) of 1 V; the
pull-up resistor connected to the (OD) pin (see Figure 5). internal current source (IOD) has been used to charge the external
capacitor.
Equa;on 1 Equa;on 2
The comparator for smart ShutDown has an internal voltage reference
VREF connected to the inverting input, while the non-inverting input VSSDl−VOD
COD ∙ VSSDh
( VSSDl ) ( VSSDh−VOD )
VOD
is available on the CIN pin. The comparator’s t
CIN input can 1 ≅be con- ∙ COD ∙ ln
RON_OD t2 ≅ ∙ ln
nected to an external shunt resistor to implement a fast and simple
IOD
overcurrent-protection function. The comparator’s output signal is
Where VOD = OD f loat ing voltage le vel
filtered from glitches shorter than a fixed time (tfCIN, approximately
300 ns) and then fed to the SmartSD logic. In case the OD pin is connected to VCC by an external pull-up resistor ROD_ext, the OD discharge
;me is determined by the external network ROD_ext , COD and by the internal MOSFET’s RON_OD
The VREF threshold typical value is 460 mV; the comparator input
(Equa;on 3), while the Restart ;me is determined by current in ROD_ext (Equa;on 4).
(CIN) has a hysteresis of about 70 mV. If the impulse on CIN pin is
higher than VREF, the SmartSD logic is triggered and immediately
sets all the driver outputs to low-level (OFF). At the same time the
RODext*RON
OD
diagnostic pin (FAULT) is forced low to signal the event (for example
( VSSDl − Von )
VOD−Von
t ≅
to a microcontroller input) and OD starts to discharge
1 C ∙
ODthe external ∙ ln Equa;on 3
R ext + RONOD
COD capacitor used to set the duration of the output disable ODtime of
the fault event. As soon as the output disable time expires, the FAULT
pin is released and driver outputs restart following the input pins. V V
( VSSDh−VOD )
SSDl− OD
t2 ≅ COD ∙ ROD_ext ∙ ln Equa;on 4
The overall disable time is composed by two phases:
The OD unlatch time (t1 in Figure 5), which is the time required to dis-
charge COD capacitor down to VSSDl threshold.where
The discharge starts
as soon as the SmartSD comparator is triggered. RON_OD
Von =
∙ Vcc; VOD = Vcc
ROD_ext +
The OD Restart time (t2 in Figure 5), which is the time required
R
to ON_OD
recharge the COD capacitor up to the VSSDh threshold. The recharge
of COD starts when the OD internal MOSFET is turned-off, which
[ Fig.5 image]
happens when the fault condition has been removed (CIN < VREF -
Figure 5. Smart ShutDown ;ming waveform
no externalCINhyst) and
pull-up is the voltage on
connected toOD reaches
OD, the VSSDlCOD
the external threshold. Thisistime
capacitor discharged with a time
normally covers most of the overall output disable time.
onstant defined by COD and the internal MOSFET’s characteristic (Equation 1), and the Restart
Figures below show examples of smart ShutDown opera;on, with two different capacitors
me is determined by thepull-up
If no external internal current source
is connected to OD,IOD
theand by COD
external COD (Equation
capacitor2).
he external COD capacitor is discharged with a timeconnected to the OD pin. The triggering pulse on CIN has a width of 500 ns, with amplitude (peak
is discharged with a time constant defined by COD and the internal
OSFET’s characteristic (Equation 1),
MOSFET’s characteristic and the1),Restart
(Equation to peak)
and the Restart of time
1 V; the internal current source (IOD) has been used to charge the external capacitor.
is deter-
Equation 1 Equation 2
urce IOD andmined
by COD
by (Equation
the internal2). current source IOD and by COD (Equation 2). [Fig.6 image] [Fig.6a image]
𝑽𝑽𝑶𝑶𝑶𝑶 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ 𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺
Figure 6. On the le` 𝑽𝑽figure
𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺− 𝑽𝑽
COD𝑶𝑶𝑶𝑶= 2.2 µF, on the right figure COD = 330 nF
𝒕𝒕𝟏𝟏 ≅ 𝑹𝑹𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶 ∙ 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ 𝒍𝒍𝒍𝒍 ( ) 𝒕𝒕Equation
𝟐𝟐 ≅ 1 ∙ 𝒍𝒍𝒍𝒍 (Figure 5: Smart )
Equation 2 𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺 𝑰𝑰𝑶𝑶𝑶𝑶 𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺− 𝑽𝑽𝑶𝑶𝑶𝑶 ShutDown timing waveform.
Where 𝑽𝑽𝑂𝑂𝑂𝑂 = 𝑂𝑂𝑂𝑂𝑪𝑪𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓 𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑣𝑽𝑽𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙𝑙
𝑶𝑶𝑶𝑶 ∙ 𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺 𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺− 𝑽𝑽𝑶𝑶𝑶𝑶
( VSSDl )
COD ∙ VSSDh VOD
) 𝒕𝒕𝟐𝟐 ≅ ∙ 𝒍𝒍𝒍𝒍 ( ) Equation 2 disa ble t im e = + RON_OD ∙ COD ∙ ln
case the OD pin is connected 𝑰𝑰 𝑶𝑶𝑶𝑶 𝑽𝑽
to VCC𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺− 𝑽𝑽
by an 𝑶𝑶𝑶𝑶 external pull-up resistor ROD_ext, the OD discharge IOD
me is determined
Where Vby OD the
= ODexternal network
floating voltage levelROD_ext , COD and by the internal MOSFET’sCOD = 2.2 µF RON_OD Cod = 330 nF
quation 3), while the Restart time is determined by C current
= 2.2in
µFR OD_ext!(Equation
disable ⇒ 4).
;me disable
= 1.46 time
s = 1.46 s ⇒ disable time = 220 ms
n external pull-up
In case the resistor
OD pinROD_ext , the OD
is connected to discharge
VCC by an OD external pull-up resis-
VSSDh = 4 V VSSDh = 4 V
k ROD_ext , CODtor R andOD_ext by, the
the OD discharge
internal MOSFET’s RON_ODVSSDhby= 4the
time is determined V external
VSSDl = 0.56 V VSSDl = 0.56 V
network R , COD and by the internal MOSFET’s RON_OD (Equa-
mined by current 𝑹𝑹𝑶𝑶𝑫𝑫 in ∗𝑹𝑹 ROD_ext
𝒆𝒆𝒆𝒆𝒆𝒆 𝑶𝑶𝑵𝑵OD_ext
𝑶𝑶𝑶𝑶 (Equation 𝑽𝑽 4).
𝑽𝑽 I OD = 6 µA IOD = 6 µA
𝟏𝟏 ≅ 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ (tion
𝑹𝑹
3), while the
+𝑹𝑹
𝒍𝒍𝒍𝒍 (𝑽𝑽 𝑶𝑶𝑶𝑶−
) ∙Restart time 𝒐𝒐𝒐𝒐
−𝑽𝑽
is determined
) Equation 3 in ROD_ext
by current
R = 25 Ω R = 25 Ω
𝑶𝑶𝑫𝑫𝒆𝒆𝒆𝒆𝒆𝒆 𝑶𝑶𝑵𝑵𝑶𝑶𝑶𝑶 𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺 𝒐𝒐𝒐𝒐 ON_OD ON_OD
(Equation 4).
VOD = 15 V VOD = 15 V
𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺− 𝑽𝑽𝑶𝑶𝑶𝑶
𝟐𝟐 ≅ 𝑪𝑪𝑶𝑶𝑶𝑶 ∙ 𝑹𝑹𝑶𝑶𝑶𝑶_𝒆𝒆𝒆𝒆𝒆𝒆
Equation 3 ∙ 𝒍𝒍𝒍𝒍 ( ) Equation 4
𝑽𝑽𝑺𝑺𝑺𝑺𝑺𝑺𝑺𝑺− 𝑽𝑽𝑶𝑶𝑶𝑶
26 Bodo´s Power Systems® January 2020 www.bodospower.com
here
Equation 4
𝑹𝑹𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶
𝑽𝑽𝑜𝑜𝑜𝑜 = 𝑹𝑹 +𝑹𝑹
∙ 𝑽𝑽𝑐𝑐𝑐𝑐 ; 𝑽𝑽𝑂𝑂𝑂𝑂 = 𝑽𝑽𝑐𝑐𝑐𝑐
𝑶𝑶𝑶𝑶_𝒆𝒆𝒆𝒆𝒆𝒆 𝑶𝑶𝑵𝑵_𝑶𝑶𝑶𝑶
CONTENT
RFH
• 330 W…2200 W
• 0,5 Ohm…300 kOhm
• Pulseload 100kJ
• Thermoswitch on
request
• High IP rating
SR / SRE / RNO
• Enamelled protection
• 10 W…1620 W
• 0,04 Ohm…100 kOhm
• Non inductive option
• Various assembly
• Various connections
Figure 6: On the first figure COD = 2.2 µF, on the second figure COD = 330 nF.
The UVLO threshold has a hysteresis and a built-in filter to prevent unwanted activations from
noise on the supply voltage. All 6 drivers in STDRIVE601 are protected by the UVLO mecha-
nism. BD / BR
Summary
With the many advantages of three-phase mo- • Resistor Group
tors, they are rapidly displacing simple single • Individual assembly
phase and brushed motors. The ease of use,
availability, and cost-effectiveness of three- • Zinc coated metal
case IP 20
phase inverters, like the STDRIVE601, which
is a three-phase 600V-rated single-chip gate • Various power ratings
driver, is a valuable contributor to this progress.
• Thermostat on
Figure 7: UVLO mechanism on VCC power The STDRIVE601 delivers robustness, simplic-
request
supply. ity, and cost saving while assuring protected
system and safety functions.
www.st.com/STDRIVE601
info@muecap.de
www.bodospower.com January 2020 Bodo´s Power Systems®
www.muecap.de 27
ance matters – integrated capacitors
tation loop
POWER
inductance
CONTENT
MODULES
maximum
nverter power bridge leads electrical
to inefficiencies. value
The voltage and the application parameters are shrinking.
spikes
witch-off cycle (fig. 1) at a high rate of dI/dt:
By György Kovács, Sr. Development Engineer, Vincotech
Power modules are a big step forward for engineers seeking to boost tor provides a low-inductive, high-frequency solution that closes the
efficiency. They have several advantages over discrete components, commutation loop.
one being superior parasitic performance. Nonetheless, there is still
room for improvement, particularly if we take the electric components
connected to the power module into consideration. These connec-
tions are still the source of parasitic inductances that adversely affect
switching performance. They may even jeopardize the switching ele-
ments if the design lacks the necessary voltage buffer.
Page 1 of 4
Focused on
POWER ELECTRONICS?
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International Exhibition and Conference pcim-europe.com/exhibitors
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Renewable Energy and Energy Management
The largest die that Nexperia can fit into the D²PAK using its lat-
est Trench 9 super-junction 40V silicon is 120A. However, for the
smaller LFPAK88 which has no limiting bond wires, the largest die
Figure 1: LFPAK discrete MOSFET family of packages Nexperia can currently include is rated at 425A - in future when
the company releases larger silicon, the current rating will be even
Clip-bond versus wire-bond higher. [Note: the values shown are from measurement and not
60 %
packages: power density theory]
benefits
LFPAK devices are smaller than 2. RDS(on) [in mΩ]
D2PAK the older D²PAK and D²PAK-7 The three 500µm diameter bond wires used in the D²PAK add to
parts they replace, delivering the overall RDS(on) of the MOSFET.
an immediate improvement in
power density. For example, using the same Trench 9 40V technology platform
in both devices (as above), the largest silicon die Nexperia can fit
inside a D²PAK has an RDS(on) of 1.2mΩ. This reduces to 0.7mΩ
163 mm2 64 mm2 with the smaller clip bonded LFPAK88 thanks to the elimination
footprint area footprint area Figure 2: LFPAK88 smaller of the bond wire resistance. [Note: a 0.55mΩ LFPAK88 part is in
aaa-029470 footprint benefit over D²PAK development on the T9 platform].
3. Parasitic Source Inductance (nH) D²PAK largest die was measured at 0.43K/W; LFPAK88 measured at
Parasitic source inductance must be overcome at every switching 0.35K/W.
event, as it reduces efficiency. This loss assumes greater signifi-
cance in applications that need to switch at higher frequencies such The better Rth value is mainly resulting from the shorter thermal route
as DC/DC converters.Source bond wires also add to the overall with a thinner drain copper clip (0.5mm for LFPAK88 and 1.3mm for
parasitic source inductance, and a combination of the longer legs D²PAK)
of the D²PAK and the source bond wires give a value of 5nH. By
comparison, the LFPAK88 has no source bond wires and has only
small gull-wing leads, therefore the impedance is low at 1nH.
4. Current/thermal hotspots
When a high current flows through a device, it is concentrated at Figure 5: D2PAK and LFPAK88 thinner drain tab
bottlenecks where the bond wires connect to the silicon. These cur-
rent hotspots can lead to thermal/quality issues. Power Density >1W/mm³
The size benefits, with increased current capability and better RDS(on)
With the LFPAK88, the top copper clip covers significantly more all combine to give a better power density, as summarized in the table
area so hot spots do not occur. (using the same technology platform to give like-for-like performance)
LFPAK88 D²PAK
DBC connectors
IGBT body
A Brief HowTo:
Analyzing Control Loop
Stability with Bode Plots Using
Modern Oscilloscopes
Power supplies are an integral part of every electronic device. With the increasing
complexity of devices, electronics become more sensitive, translating to higher
requirements for the power supply and more stringent test needs. One of the important
tests an engineer has to perform is to verify stability of the power supply.
By Dr. Markus Herdin, Market Segment Manager Industry, Components, Research &
Universities, and Marcus Sonst, Application Development, both at Rohde & Schwarz
Traditionally, the method of choice has been to observe the step phase shift, the point where the control loop would get instable. The
response and judge from the timing whether the control loop is stable phase margin therefore measures the “safety” margin for the phase.
and fast enough. However, judging the level of stability from a step
response is more an art than a science. Mere observation of the step At the frequency where the phase of the control loop reaches-180°,
response makes it difficult to assess how changes in design improve the gain margin can be measured. The gain margin is the negative
the performance of a control loop. gain at this frequency, i.e. measuring the additional gain would be
needed in order to reach the point of instability. Both phase margin as
Stability also depends on the operation point of a power supply. A well as gain margin are therefore the safety margin for stability.
control loop might be stable for heavy loads but become nearly in-
stable for low loads. Consequently, verification of different operational
points is essential.
key products:
Trust.
Power Devices from
Mitsubishi Electric.
7th Generation IGBT Modules NX-Package
– 7th Generation IGBT with CSTBTTM chip
technology
– Thermal cycle failure free SLC package
technology
– Superior long term reliability package
structure based on Isolated Metal Baseplate
Precise and efficient control of dynamic processes puts heavy demands on the
(IMB) and hard resin encapsulation
components used. With 30 years history of IGBT production and continuously – Pre-applied Phase Change Material
inventing pioneering technologies, Mitsubishi Electric provides superior experience (PC-TIM) and PressFit- or Solder-Pin type
and expertise to meet such requirements. Latest chip technology as well as is optional available
– Comprehensive product line-up for 650 V,
mounting and assembly technologies offer user benefits like extended module 1200 V and 1700 V in various circuit topologies
lifetimes, high power density for compact design, easy system assembly and CIB, 6in1, 7in1 and 2in1
support of scalable platform concepts.
significantly. Injecting a signal across the resistor makes it possible As the gain of the control loop varies over frequency, so does the op-
to insert a perturbation signal into the control loop and measure the timum injection signal level. This is what amplitude profiling does, i.e.
response to this perturbation at the output of the power supply. This is allows definition of the amplitude level of the injection signal depen-
called the voltage injection method. It is important to add the resistor dent on the measurement frequency.
at a point where the impedance in the direction of the feedback loop is
much larger than the impedance looking backwards. Figure 2 shows D) Probing
how to correctly carry it out. Key to good measurements with oscilloscopes is choosing the right
probe. Probes differ in voltage levels, attenuation ratios, bandwidth
and many other parameters. Depending on the application, different
parameters are important.
Standard passive probes typically supplied with an oscilloscope
have an attenuation factor of 10:1 and a bandwidth in the range of
500 MHz. While the bandwidth of such a probe is totally sufficient for
control loop measurements, the additional attenuation is a significant
disadvantage.
www.rohde-schwarz.com/solutions/cla
se
Get a free test licen
carabinbackhaus.com
al
w w w.plexim.com/tri
POWER
CONTENT
SUPPLY
Figure 1: A solution for generating positive and negative voltages. VOUT1 is 3.3 V at 10 A and VOUT2 is –12 V at 3 A.
Conclusion
The LTC3892 is a versatile and flexible controller ostensibly designed
for synchronous step-down conversion, but it can be used in a Ćuk
topology to generate positive and negative voltages for automotive,
industrial, and other applications.
www.analog.com
www.bodospower.com 37
THERMAL
CONTENT
MANAGEMENT
Heat is transferred out of a power supply through a combination of all three heat transfer mechanisms:
2ew20P
radiation, conduction, and convection, but primarily via the latter two. If there is disparity between the
heat generated and the heat transferred, the device’s temperature will rise according to the equivalent on
-c o d e fo r free admissi
Nuremberg, Germany Your
thermal impedance between it and the cooler environment. To prevent component e temperatures from
d.de / vouch
er
rising to levels that adversely affect their reliabilities or safe operation, the
emb power d-worlmust
eddesupply be
25 – 27.2.2020 designed to allow generated heat to escape (by reducing the thermal impedance between heat sources
and the ambient environment), and also perhaps in a manner that minimizes the amount of heat
generated in the first place.
dissipated in Watts, POUT is the output power in Watts, and is the efficiency. POUT
Heat is transferred out of a power supply through a combination of all will begin to rise as well, further impeding the effects of conduction.
gned like subscripts to make clear the fact that the operational efficiency varies with
three heat transfer mechanisms: radiation, conduction, and convec- Fortunately, air is not inclined to stay in one static location, particularly
not just some fixed value.
tion, but primarily via the latter two. If there is disparity between the in the presence of temperature gradients throughout the fluid. As they
heat generated and the heat transferred, the device’s temperature will say, “warm air rises.” Indeed, as the temperature of the air nearest the
ut of a powerrise
supply through
according to athe
combination
equivalent of all three
thermal heat transfer
impedance mechanisms:
between it and warm power supply increases, the density of the air decreases, caus-
, and convection, but primarily via the latter two. If there is
the cooler environment. To prevent component temperatures disparity between
from the ing cooler, denser air to “sink in” and take its place.
he heat transferred, the device’s temperature will rise according to the equivalent
rising to levels that adversely affect their reliabilities or safe operation,
etween it and
thethe cooler
power environment.
supply To prevent
must be designed component
to allow temperatures
generated from
heat to escape Tackling density
(by reducing the thermal impedance between heat
adversely affect their reliabilities or safe operation, the power supply sources and the be
must For some power supplies, the natural process of convection is suf-
nerated heatambient
to escape environment),
(by reducingand the also perhaps
thermal in a manner
impedance that heat
between minimizes
sources ficient for maintaining an adequate temperature differential between
the amount of heat generated in the first place. the power supply’s outer surfaces and the air for appropriate heat
vironment), and also perhaps in a manner that minimizes the amount of heat
transfer. However, the rate of heat transfer via convection, not unlike
place.
The Origin of Thermal Derating conduction, has a dependence on interface area, or how much sur-
Given that the heat transferred from a PSU to the ambient environ- face in squared meters is actually in contact with the fluid.
l Derating
ment is directly proportional to the difference in temperature between
ransferred from a PSU
the two to the
media byambient environment
some constant is directly
k determined by proportional to the
the material proper- The power supply industry, alongside many of the industries it sup-
ature between the two media by some constant k determined by the material
ties, and that the average rise in temperature of the PSU is propor- ports, strives to achieve greater functional densities. One of the
he average rise in to
tional temperature of the PSU
the heat generated is proportional
(function to the
of efficiency andheat generated
throughput) strongest ongoing industry trends is to develop technologies that
y and throughput) less the heat transferred, one can
less the heat transferred, one can assert:
assert: allow us to put more and more power into smaller and smaller pack-
ages. Recall that, in general, as output power increases, the amount
1
∆𝑇𝑇𝐶𝐶 ∝ 𝑃𝑃𝑂𝑂𝑂𝑂𝑂𝑂 0 ( − 1) − 𝑘𝑘(𝑇𝑇1 − 𝑇𝑇2 ) of heat generated increases as well. Combining this with the fact that
𝜂𝜂0
the ability of convection to remove heat from the surface of a power
Where T is the ambient temperature, T is the temperature of the supply is dependent on the size of the power supply and its effective
ent temperature, T1 is2the temperature of the PSU, and 1 ΔTC is the PSU temperature
PSU, and ΔTC is the PSU temperature rise. The above equation tells contact area reveals the need for forced air cooling in many of today’s
ion tells us exactly why we must derate the output power of a power supply as the
surroundingusit exactly whyAswe
increases. T2 must derate the
approaches the output
value of power
T1, ΔTofC rises.
a power supply
That is, as as
the modern, high density power converters. The natural process simply
the ambient temperature surrounding it increases. As
of a power supply approaches its internal temperature, the ability of the T2 approaches isn’t fast enough to maintain adequate heat transfer rates and prevent
the value ofheat
er their self-generated T1, ΔT rises.
outCto That is, as
the ambient the ambientdiminishes.
environment temperature of a internal components from overheating.
power supply approaches its internal temperature, the ability of the
sfer and thecomponents to transfer
Origin of Convection vs.their self-generated
Forced Air Ratings heat out to the ambient Choosing wisely
environment diminishes. Ambient temperature impacts the behavior, performance, and reli-
nsfer of heat via the movement of fluids, including air, across the surface of an
ability of power supplies, making environment a critical factor in their
ature different than that of the fluid. Convection heat transfer can get a good deal
Convection Heat Transfer and the Origin of Convection vs. selection. By understanding industry conventions and popular cooling
conduction Forced
in the Air
context of power supply cooling. The key takeaway is to
Ratings methods, factors that underscore a power supply’s operational tem-
Convection is the transfer of heat via the movement of fluids, includ- perature range, thermal derating curves, and what to expect if thermal
ing air, across the surface of an object with a temperature different limits are exceeded, designers are well equipped to make the right
than that of the fluid. Convection heat transfer can get a good deal choice.
more complex than conduction in the context of power supply cooling.
The key takeaway is to understand that conduction does not work About the Author
alone to remove heat from inside a power supply; conduction simply
brings the internally generated heat out to the surface of the power Dylan Howes, Applications Engineer, TT
supply. From there, we depend on convection to “carry” the heat away Electronics
from the supply into the ambient environment. Power Partners, Inc. – a TT Electronics
company
Consider for a moment a situation whereby the air directly abutting
the surface of a power supply is somehow disallowed from moving. Dylan Howes manages all technical aspects
As the air stays in proximity with the hot power supply surface, its of power converter design-in efforts, and
temperature will rise. Eventually, the temperature will become equal authors technical content featuring power
to the temperature of the power supply surface. There is once again conversion trends and technologies.
a dependence on a temperature differential between the two media.
If the fluid (air) and the power supply (the hot object) are the exact
same temperature, no heat will be transferred. Without allowing heat
to move away from the outside of the power supply, its temperature www.ttelectronics.com
2020
New Orleans
MARCH 15-19, 2020
NEW
CONTENT
PRODUCTS
www.allegromicro.com
www.caly-technologies.com
www.powersystemtechnology.com
www.rohm.com
www.recom-power.com
www.renesas.com
www.cde.com/PC
www.aosmd.com
Articles, books, lectures, in-house seminars for engineers e.g. about active and
passive components, SMPS design, measuring instruments. Critical translations
German-English and vice versa.
www.infineon.com
https://eu.mouser.com
www.nexperia.com
www.emea.lambda.tdk.com
+
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