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Olympus DMA Probe Overview

Application info and Frequently Asked Questions

Chris Magruder
July 12, 2015

Olympus Dual Matrix Array Probes – Presentation Objectives


• Provide an overview of standard Olympus dual matrix probes and the wedges,
software, instrumentation, and accessories required to drive them.
• Provide answers to frequency asked questions regarding the setup and use of
dual matrix array probes with inspection data examples.
• Provide explanation of dual matrix array and dual linear array probe
configurations.
• The presentation is divided into the following sections:
• DMA probe and wedge overview.
• Instrumentation requirements for DMA probe use.
• Focal law import for OmniScan MX2 inspection.
• Volumetric DMA inspection overview and FAQ.
• Off axis DMA inspection overview and FAQ
• Surface DMA inspection overview and FAQ.
• Conclusions.

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Olympus Dual Matrix Array Probes – Promotional Video on Web Site

• Please watch the 8 minute promotional video for the Olympus dual matrix array
probes prior to reading this presentation.
• ftp.olympusndt.com/p_support/ChrisMagruder/DMA_PromotionalVideos.mp4

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Probe Overview


• Olympus dual matrix array probes extend the inspection range of the OmniScan
and Focus PX instruments for coarse grained austenitic and inconel alloy
materials and welds.
• Dual matrix array probes combine the benefits of focused longitudinal wave S-
scans and pitch-catch inspection strategy .
• Two standard dual matrix array probes in 2MHz and 4MHz are designed to
provide off the shelf inspection capability for a wide range of austenitic materials
and weld bevels including dissimilar metal CRA welds.

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Olympus Dual Matrix Array Probes – Probe Overview cont.
• Two standard dual matrix array probes in 2MHz (A17) and 4MHz (A27) are
designed to provide off the shelf inspection capability for a wide range of
austenitic materials and weld bevels including dissimilar metal CRA welds.
• Custom designed dual matrix array (DMA) and dual linear array (DLA) probes of
different aperture, element configuration, and frequency are available from
Olympus probe manufacturing.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Probe Overview cont.


• A standard DMA probe and wedge as opposed to a custom design is a
compromise for frequency, aperture, element configuration, refracted angle, roof
angle, squint angle, material velocity, and mechanical focal plane.
• Custom probes and wedges require additional engineering and have longer lead
times and greater expense and risk.
• For many welds the performance gain in SNR and beam steering of a custom
probe\wedge over an off the shelf design does not justify the time and expense
unless purchase is for one weld bevel or one job as in a pipeline or for unique
geometry.

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Olympus Dual Matrix Array Probes – Probe Overview cont.
• DMA probes are purchased in either a dual configuration for single sided DMA
inspection or in quad configuration for two sided simultaneous DMA inspection
as pictured below.
• All standard models are compatible with 32:XXPR pulser instrument
configuration.
• All standard models are compatible with 32:128PR in quad probe configuration.

Single sided dual matrix array inspection Two sided quad matrix array inspection

TX
TX RCV

RCV

RCV TX

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Probe Overview cont.


• The A17 two sided quad configuration has the additional capability of receiving
on the opposing arrays for supplemental volumetric and surface inspection.
• Unlike the A27, this is possible with the A17 DMA probe because there are
sufficient elements for beam steering in the secondary axis (4) and the wedges
have no roof angle.
• S-scan groups with an opposing array RCV as opposed to an adjacent array
RCV provides higher probability of detection coverage for off axis flaws.
• Also called low frequency focused TOFD. (LFFT)
Single sided dual matrix array inspection Two sided quad matrix array inspection

TX TX RCV
TX
RCV
RCV

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Olympus Dual Matrix Array Probes – Probe Overview cont.
• The DMA probes are compatible with standard Olympus Y splitters for two sided
inspection or can be purchased with all four arrays wired into the same
OmniScan connector.
• Use of standard Olympus splitter enables two independent dual matrix array
probes for two sided weld inspection.
• It is never necessary to use a splitter for single sided DMA inspection as the two
probe housings in DMA configuration are always wired into one connector.

Standard Olympus Y splitter for use with any two 1D


Quad array configuration all wired into one connector. or matrix array probes. (2X 1D probe pictured)

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Probe Overview cont.


• The Olympus 2.25MHz A17 DMA probe contains a 4X7 large element
configuration in each housing optimized for thicker and more attenuative
austenitic materials.
• Each array has an aperture of 12X19mm.
• Because the A17 DMA contains 4 elements in the secondary axis, the beam
steering of a mechanical roof angle can be achieved electronically with a flat
wedge.

Roof angle No roof angle

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Olympus Dual Matrix Array Probes – Probe Overview cont. FIX 16-8
• The Olympus 4MHz A27 DMA probe contains a 2X16 small element
configuration in each housing optimized for thinner and less attenuative
austenitic materials.
• Each array has an aperture of 6X16mm.
• Because the A27 DMA probe contains only 2 elements in the secondary axis,
the wedges require a mechanical roof angle for each pipe diameter or focus.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – NDT Setup Builder


• Any longitudinal high angle refracted beam generates direct longitudinal (70
degrees), shear wave (30 degrees) and the primary and secondary creeping wave
beams.

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Olympus Dual Matrix Array Probes – Probe Overview cont.
• The A27 probe is available in dual matrix array (DMA), dual linear array (DLA),
and single element UT probe configurations.
• Each of the A27 probe configurations below has a 6X16mm aperture and a
specific pro and con with respect to cost, pulser requirement, software,
dependence on wedge design, and acoustic performance.
• All configurations use the same removable A27 IHC wedges that are standard
with acoustic insulation of the TX and RCV, irrigation ports, scanner ports,
adjustable carbide wear pins, and precision mechanical design.

4MHz A27 dual matrix array probe

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Olympus Dual Matrix Array Probes – Probe Overview cont.


• The primary benefit of the A27 DMA probe is that it utilizes all the pulser
capacity of a 32:XXPR instrument for maximum energy within the aperture.
• Optimized S-scan beam steering and focus in the primary axis of the probe.
• Supported in NDT SUB 1.1 or later for focal law creation and weld plotting.
• Only compatible with Tomoview Advanced Calculator with flat wedge. (No AOD)
• Beam steering in the secondary axis with only two elements is not possible and
use of mechanical roof angle on wedge is required.

4Mhz A27 dual matrix array probe detects SWLF in Inco alloy 625 CRA weld.

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Olympus Dual Matrix Array Probes – Probe Overview cont.
• The benefit of the A27 DLA probe is that it uses ½ the elements of a DMA which is
beneficial when 4 or more PA probes are required on the same scanner.
• The A27 DLA probe provides a similar S-scan as the DMA with respect to angle
range and focus but are compatible with 16:128PR pulser configuration.
• A27 DLA is not supported in NDT SUB software. Requires TV Adv Calc.
• DLA focal law creation using TV Adv Calc has no limitation for AOD wedge.
Mechanical pseudo focal plane is visible in draw tool.
• DLA probes can be wired for fixed focal laws that do not require PR option.
• DLA S-scan is compatible with compound S-scan.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Probe Overview cont.


• The benefit of the A27 UT probes is that they are uniquely suited for
supplemental surface inspection using the high voltage UT lemo connectors of
the OmniScan or Focus PX for simultaneous acquisition with the PA probes.
• Single channel UT group at fixed angle and focus. (One A-scan \ strip chart)
• UT probes do not require phased array or PR option and are compatible will all
conventional UT instruments including Epoch650 and OmniScan SX UT.
• UT probes are capable of TRL probe strategies with higher SNR and closer
beam exit than commercial equivalents and utilize standard removable A27 IHC
wedges in different angle\roof\squint\focus.

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Olympus Dual Matrix Array Probes – Wedge Overview
• Olympus DMA wedges come standard with IHC options including acoustic
insulation of the TX and RCV housings, irrigation ports, 5mm scanner ports,
carbide wear pins, and precision mechanical design.
• DMA wedges are flat or contoured for pipe diameter on secondary axis. (AOD)
• The wedge nominal refracted angle is designed based on a material velocity of
5890 meters\second.

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Olympus Dual Matrix Array Probes – Wedge Overview cont.


• ANSI piping diameters are standard and custom diameters for exact fit are
available on request.
• DMA wedges are 50mm wide for both the A17 and A27 and the gap tolerances
listed below are relative to all wedge models.
• Because the wedges use a pitch-catch technique both sides must be properly
coupled at all times or result in data loss. Use of the irrigation ports and proper
adjustment of carbide feet is essential for repeatable best results.

AOD min (in) min (mm) max (in) max (mm)


AOD4 3.75 95.3 4 101.6
AOD4.5 4 101.6 4.5 114.3
AOD5.563 5 127 5.563 141.3
AOD6.625 5.563 141.3 6.625 168.3
AOD8.625 7.625 194.3 8.625 219.1
AOD10.75 8.625 219.1 10.75 273.1
AOD12.75 10.75 273.1 12.75 323.9
AOD16 12.75 323.9 16 406.4
AOD24 16 406.4 24 609.6
AOD48 24 609.6 48 1219.2
Flat 48 1219.2 N/A N/A

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Olympus Dual Matrix Array Probes – Wedge Overview cont.
• Acoustically insulating the TX and RCV in the wedge eliminates the need for
wedge dampening material and a large standoff.
• The smaller DMA wedge allows the useful focus depth and range of the probe to
be extended into the material resulting in higher SNR over larger sound path.
• Significant energy is lost in large wedges designed for 1D linear array probe
pulse echo longitudinal angle beam inspection due to wedge attenuation.

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Olympus Dual Matrix Array Probes – Wedge Overview cont.


• In some cases wedges designed for longitudinal wave pulse echo can be
problematic on the scanner due to large footprint, clearance, and weight.
• Given the same overall aperture and frequency, a DMA or DLA probe will have
higher SNR than the equivalent 1D linear array probe due to less wedge
attenuation, higher SNR from insulating the TX and RCV, and secondary axis
mechanical focus (DLA) or electronic focus (DMA).
• Sizing accuracy and flaw characterization in inconel alloy CRA welds is
enhanced greatly if penetration and detection is possible with 5MHz probes that
do not produce excessive reject or overcall rate.

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Olympus Dual Matrix Array Probes – Wedge Overview cont.
• The probe index offset reference and wedge surface distance reading (PA) are
measured as pictured below and the upper section of the rexolite wedge is only
to accommodate the housing screws.
• This allows beam exit as close to the weld line as possible without acoustic
performance compromise to accommodate mechanics or a big probe housing.

Nominal angle
beam exit
0,0 wedge
reference

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Wedge Overview cont.


• Olympus DMA wedges are compatible with the Olympus VersaMOUSE, Chain
Scanner, and Mapper scanners.
• Olympus DMA wedges are not compatible with the Mini Wheel encoder.
• Also compatible with Olympus DMA wedges are Jireh scanners or any scanner
hardware that can accommodate the 5mm scanner ports.
• Standard Olympus DMA wedges are not compatible with Pipe Wizard without
mechanical adaptation for the scanner.

PA reading

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Olympus Dual Matrix Array Probes – Wedge Overview cont.
• Throughout this presentation and the Olympus DMA promotional video DMA
wedges of similar design but different nomenclature are visible in the images.
• During the A17 and A27 DMA development some wedges of the same design
had different names and in some cases wedges used in the studio pictures
shared the same designation but were of slightly different design.
• All DMA data samples in this presentation and in the promotional video were
created with the equivalent of either the standard DN55L volumetric or DNCR
surface designs that are quoted with the A17 and A27 DMA probes.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Instrumentation Overview


• OmniScan modules used with DMA or DLA probes require an optional pulser-
receiver capability or “PR” option that allows transmit and receive or pitch-catch on
different apertures within the 128 element multiplexer.
• The A27 and A17 DMA probes require a minimum configuration of 32:128PR
pulser regardless if dual or quad configuration.
• Olympus does not offer a 32:64PR pulser configuration.
• PR capability is standard on all Focus PX instruments.

TRX RCV
Olympus OmniScan PA2 32:128PR

Olympus Focus PX 32:128PR

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Olympus Dual Matrix Array Probes – Instrumentation Overview cont.
• Upgrade pricing is available for all previous generation OmniScan modules to
latest PA2 32:128PR.
• Contact your local sales representative or distributor for details.
• Benefits of PA2 generation OmniScan modules include:
• Significantly improved SNR that is essential for austenitic
weld inspection (>15 dB)
• Expanded operating temperatures
• Fanless design
• 115 volt pulser on PA groups
• Video filtering in PR mode for DMA and DLA probes
• High definition 340V UT board independent of the phased
array electronics. (Allows single group PE or PC A-scan
from the lemo connectors)
• Manufactured to comply with EN-12668-1 (UT standard)
• Manufactured to comply with soon to be released ISO
18563-1 (PA Standard)

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – OmniScan Focal Law Import


• Use of DMA probes with the OmniScan requires a law file to be imported on the
OmniScan SD memory card.
• DMA probes are not supported in the OmniScan setup wizard or focal law
calculator and are not compatible with auto probe detection.
• The default location for law files on the OmniScan SD memory card is the
:\User\Law folder

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Olympus Dual Matrix Array Probes – NDT Setup Builder
• The Olympus NDT Setup Builder version 1.1R1 or later supports standard
Olympus DMA probes for scan plan plotting of welds and for creation of focal laws
for use in the OmniScan or Focus PX instruments.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection


• Volume inspection with the 2MHz A17 DMA probe is performed with the DN55L
wedge. (Dual nominal 55 degree longitudinal wave)
• The 2MHz large element design is optimized for thicker more attenuative materials.
• Typical volumetric weld inspection is performed using approx. 30-75 degree
focused S-scan to cover the volume and root areas of the weld.

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• In this example a 2mm EDM notch is visualized in a 25mm thick inconel alloy
CRA weld through the clad layer.
• Using cursors, length sizing is performed on the C-scan and depth and height
sizing is performed on the A-scan and S-scan.
• The cursor deltas and trigonometry are displayed and can be recorded in an
indication table directly from the OmniScan header.

Sm-r

Um-r VIA
OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• Volume inspection with the 4MHz A27 DMA probe is performed with either the
DN55L or DNCR wedge.
• The 4MHz A27 DMA probe is optimized for thinner less attenuative materials.
• The DNCR wedge is optimized for surface inspection but for weld bevels less
than approx. 25mm thick the DNCR wedge will provide more versatility for both
volume and surface inspection groups and recommended over DN55L.

4MHz A27 DMA S-scan on SS304 NAVShip

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• In this example the 4MHz A27 DMA probe with DNCR wedge is used for a CRA
weld inspection using 30-80 degree S-scan focused at 30mm sound path.
• The longitudinal velocity of the inconel alloy 625 weld is 5830 meters\sec and
the velocity of the carbon steel base material is 5890 meters\sec resulting in
minor beam angle change at the weld interface.
• The accuracy of depth and height plotting is directly related to the user knowing
the velocity of the base material and weld.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• The 4MHz A27 DMA probe demonstrates high SNR on the far side bevel flaw.
• Flaw plots to correct depth and location on the weld line.
• The flaw depth (DA) is measured from the A-scan of highest amplitude.
• Gate trigonometry readings for sound path (SA), depth (DA), probe distance (PA),
and volumetric position from zero on the index axis (VIA) plot correctly.

VIA

PA

SA DA

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• When no diffracted flaw tips are detected sizing is limited to amplitude drop
method only.
• Fast signal rise and fall time and linear indication on the weld line indicates LOF.
• In this weld, -3dB drop provides sizing accuracy within +\-.5mm and is aided by
higher frequency probe. (4MHz)

Um

Um-r
Ur

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• Amplitude drop sizing is only useful for flaws detected with orientation near
perpendicular to the beam such as side wall lack of fusion below.
• Manipulation of the color palette provides accurate –dB drop sizing
measurements for quick cursor placement.
• The color palette is modified directly on the OmniScan touch screen by dragging
the vertical amplitude zoom bar or in >Display>Properties>Color Palette.

-3dB drop flaw height -6dB drop flaw height


from max amplitude from max amplitude

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• Similarly to conventional UT inspection techniques like PE and TOFD, phased
array S-scans do not oversize flaws, inspectors do.
• The flaw is almost always smaller than the inspector thinks it is so be conservative.
• The benefit of experimentation on SDH, notches, and flaws of known size in the
actual inspection material or weld bevel cannot be over emphasized.
• It is also extremely helpful to validate the probe, wedge, and beam limits in carbon
steel prior to moving to more attenuative austenitic and CRA weld bevels.
• It only gets worse.

-3dB drop flaw height -6dB drop flaw height


from max amplitude from max amplitude

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• Factors that improved the precision of the inspection include in descending order
or importance:
• The wedge face is exactly where the OmniScan thinks it is in relation to the weld
centerline. (Mechanical precision)
• An accurate velocity for the material or materials used to create focal law was known.
• Appropriate sensitivity calibration and TCG strategy for weld volume.
• High resolution S-scan at .5 or .2 or .1 degrees with appropriate focus for weld bevel.
• High point count on the UT axis. (640+ points and compression scale < approx. 8)
• Appropriate UT start and range for digitized A-scans across S-scan.
• Receiver video filtering on S-scan. Use of 4MHz band pass filter. (PA2 module only)

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• For angle beam groups, which beam parameters below can be corrected in the
OmniScan wizards if an out of tolerance velocity was used for the beam formation?
• Beam angle
• Beam focus
• Beam exit in wedge
• Beam time of flight
• Beam wedge delay
• Trigonometry readings
• All of the above
• None of the above

• Hint: It is the same answer whether the group was created with the OmniScan
setup wizard or a focal law import from a PA calculator.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• For angle beam groups, none of the beam parameters below can be corrected
without creating a new group using a good velocity.
• Beam angle
• Beam focus
• Beam exit in wedge
• Beam time of flight
• Beam wedge delay
• Trigonometry readings
• All of the above
• None of the above
• Velocity error = angle error = everything error that cannot be fixed. 
• This is true for austenitic matrix array with imported focal law and this is true for
1D shear wave probe for carbon steel from OmniScan setup wizard.
• If 1D group created with OmniScan setup wizard, the velocity wizard takes a 1X
measurement on 1 A-scan and recreates the S-scan group with the new velocity.
That is why wedge delay and sensitivity calibration is lost.
• If group created with focal law import only UT axis is recalculated. (Not angle)

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• It is not possible to take a precision velocity measurement on a pipe or vessel that
does not contain a known reflector for the measurement.
• Use of a database velocity is highly recommended if precision block of same weld
bevel and velocity is not available for the measurement.
• Big SDH, piping notches, or short sound path reflectors are unacceptable for
measuring a precision velocity.
• Inconel = approx. 5700 m\s. Inconel alloy 625 = approx. 5830 m\s. Not the same!
• Use of PMI to validate material properties is highly recommended if available.

Material match
for SS321

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• In this example a 4MHz A27 DMA with DN55L volumetric wedge performs an
inspection of an inconel alloy CRA weld using the chain scanner.
• A 35-75 degree S-scan group at .5 degrees resolution is used for the volumetric
inspection.
• High UT point count, low compression factor, and use of receiver video filtering.
• Multiple one-line scans are acquired from different index positions from each side
of the weld for flaw detection and length sizing.

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• After detection, the flaw is optimized for depth and height sizing by moving the
probe in and out on the encoded index axis with the hand crank of the scanner.
• Sizing is most accurate when a clear upper and lower flaw tip can be imaged
with low angles. (30-60 degrees)
• Sizing is least accurate when low frequency (2.25MHz) amplitude drop sizing is
imaged at high angles. (60+ degrees)

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• In this example a 2MHz A17 DMA probe with DN55L volumetric wedge detects an
ID connected thermal fatigue crack in a 36mm thick inconel alloy 800 vessel weld.
• The green UT measure cursor is placed on the deepest crack ligament and the
red UT reference cursor is placed on the pipe ID. (B0)
• The through wall height of the crack = 5.7mm and the length = 11.4mm.

Um-r

Um-r

Sm-r

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• In this example a 2MHz A17 DMA probe detects a 3mm 25mm deep SDH
through the weld of a 50mm thick SS316 vessel calibration block.
• Attenuation through the weld is >12dB as compared to detection from the base
material side of the weld.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• The reason there are volume and surface versions of the A27 wedge even
though testing up to date indicates that the DNCR wedge can perform both
functions is that the DMA wedges are designed to support velocities from
between approx. 5700-6100 meters per second and in some materials the 5
degree difference between the two wedge designs may be significant.
• The A27 DN55L wedge is not recommended unless a specific acoustic benefit
like beam steering due to lower material velocity was identified or low angles for
long sound path are needed.

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• What is the minimum size defect that can detected in austenitic materials?
• It is very much dependent on the frequency of the probe and amount of distortion
and attenuation through the weld and around the base material.
• The best case scenario for any UT detection limit is a flaw approximately the size
equal to or greater than ½ the probe’s wavelength.
. / .
• For a 2MHz probe, 2.945mm. = 1.5mm.
• A 1.5mm diameter flaw is mathematically the smallest detection possible by a
2MHz probe in best case carbon steel and will only get worse in coarse grained
austenitic materials.
• As the length of the flaw is increased its probability of detection is also increased.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• What is the sizing accuracy of DMA probes in austenitic materials?
• It is very much dependent on the frequency of the probe, at what SNR detection
is possible, and the amount of distortion and attenuation through the weld.
• Only trial and error on targets throughout weld volume in similar bevel and weld
process can determine sizing accuracy limits.
• SS321, SS316, super duplex, inconel alloys, and similar can have +12dB or
more weld attenuation or inability to penetrate weld at any dB, and as a result
flaw characterization and sizing accuracy suffers.
• Sizing accuracy is worse for surface and near surface defects, when using high
angles for trigonometry, or when inspecting through the ID clad layer adjacent to
the weld root.

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• It defies physics and common sense that high angle longitudinal S-scan
inspection with low frequency probes (2-4MHz) in coarse grained austenitic
materials and welds can achieve the same detection and sizing precision as
high frequency (5-10MHz) shear wave probes in carbon steel inspections with
full V skipping and supplemental TOFD.
• More than software or instrument specifications it is advanced probes of
different frequency and design that will improve austenitic weld inspection with
regard to probability of detection, sizing accuracy, and flaw characterization.

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• The limits of any inspection’s sizing accuracy is dependent on the probe frequency
and at what SNR flaw detection is possible.
• Pictured right is the ASTM 2491 phased array
resolution block that is available in different material
specifications and is extremely useful in determining
probe beam steering and resolution limits.

Flaw detection Flaw resolution

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Olympus Dual Matrix Array Probes – Volume Inspection cont.
• Sizing is most accurate with low angles where a definitive diffracted tip is detected
with clarity and confidence.
• Sizing is least accurate at high angles with poor resolution and where only
amplitude drop sizing is possible.

Flaw detection Flaw resolution

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Volume Inspection cont.


• For typical flaws in new construction welds there is a direct relationship between
the size of the weld pass at different depths and the size of the flaws, especially
when measuring lack of side wall fusion or interpass non fusion.
• One unique aspect to austenitic welding including inconel alloy CRA welds is
that the weld process requires many smaller passes at lower heat and slower
production rates than carbon steel.
• Knowledge of the weld procedure is
extremely useful and should be weighted
when measuring flaw height, especially
when using lower frequency probes and
amplitude sizing where no tip diffraction is
possible.
• Cracks will propagate through multiple
weld passes and in base material but
typical flaws such as non fusion, porosity,
and slag are typically contained within a
single weld pass.

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Olympus Dual Matrix Array Probes – Off Axis Beam Skew
• Another advantage of 2D matrix arrays is that they have off axis beam skew
capability. This is the ability to steer the S-scan at an angle other than directly in
front of the probe.
• This is only possible with the A17 because it has sufficient elements (4) in the
secondary axis.
• The primary application for off axis S-scans is to detect and size axial and
transverse IGSCC in austenitic piping welds.
• Off axis beam skewing is not normally performed in full volumetric new
construction weld inspections referencing fracture mechanics acceptance criteria.
Electronic beam skew (-30 degrees) Mechanical probe skew (90 and 270 degrees)

-30
TX
90 TX RCV

RCV
RCV TX

90 270

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• The probe skew is defined as the orientation of the probe and wedge in relation to
the blue mechanical scan axis and is normally 90 and 270 degrees for opposing
probes perpendicular to the weld line as pictured below. The probe skew is
mechanical.
• The beam skew is defined as the orientation of the beam inside the wedge. Beam
skew is electronic and possible with phased array element delay.

Electronic Beam skew (-30, 0, and +30 degrees) Mechanical probe skew (90 and 270 degrees)

-30
TX
90 TX RCV
0
RCV
RCV TX
+30
90 270

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Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• In the OmniScan the mechanical probe skew is defined by the user in > Probe >
Part > Position and can be changed at any time before or after the inspection.

• The beam skew was created in the focal law and is not editable. The beam skew
is visible with the rest of the beam parameters in the > UT > Beam sub menu.

Electronic Beam skew 30 degrees Mechanical probe skew (90 and 270 degrees)

TX
90 TX RCV

RCV
RCV TX
+30
90 270

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• The limit of off axis beam skew is directly related to the number of elements in
the secondary axis of the probe and their size and frequency.
• The 2MHz A17 DMA probe is capable of 45+ degrees off axis beam skew with
flat wedge because it has 4 rows of elements in the secondary axis. Off axis
beam skew limits are reduced as the pipe diameter is reduced. (AOD wedge)
• The 4MHz A27 DLA and DMA probes are not capable of off axis beam skew
because they only have 1 or 2 rows of elements in the secondary axis.

Secondary
axis

Primary
axis

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Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• S-scan groups of different skew must be imported into the OmniScan
independently one at a time. (1 focal law for each S-scan)
• When using Focus PX or OmniScan OSTV for Tomoview acquisition, all beams
from all three S-scans can be acquired in one group (Uncorrected) and merged in
analysis for top, end, and side views. (Volume corrected)
• The limits of beam steering are determined by peaking a SDH or notch on the
calibration block and verifying mechanically if the max peaked signal occurs at the
angle entered in the calculator. (Peak signal by moving probe side to side >
measure angle of wedge and calibration block with protractor)

-30

-30

+30

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Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• Use of off axis beam skew for pitch catch between arrays on opposite side of the
weld is configured by using the “Replace receiver” in the TV Adv Calc while
connected to Focus PX or OmniScan OSTV through Tomoview.
• This configuration for focal law import into OmniScan is possible but requires
mechanical drawing with probe separation and offsets of all arrays so the law file
can be created in one step. (Not recommended)

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DMA Probe Overview – Surface Inspection
• Surface testing refers to the detection, sizing, and characterization of shallow weld
flaws or flaws connected to the outside surface of the weld.
• The surface inspection is optimized using A27 DMA, DLA, or UT probes for and is
limited to high angle first leg inspection.
• The A17 has only 7 large elements in the primary axis of the probe and is not
recommended for surface inspection due to poor high angle beam steering.
• Surface inspection supplements the volumetric inspection to provide complete
weld bevel coverage.

OLYMPUS Scientific Solutions

DMA Probe Overview – Surface Inspection cont.


• The surface inspection using DMA or DLA probe is configured by using a high
angle S-scan of approx. 70-85 degrees with shallow or short focus.
• Above approx. 70-75 degrees all A-scan beams essentially propagate parallel to
the surface at longitudinal velocity and will detect a shallow SDH, notch, or weld
flaw similarly.
• The surface inspection provides similar results whether the weld crown is flushed
or not.

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DMA Probe Overview – Surface Inspection cont.
• The high angle surface S-scan is imported into the OmniScan similarly as the
volume S-scan and uses either a half path (SUB) or projection (TV) focusing.
• The benefit of using the uncorrected display mode (Sound path) as opposed to
true depth is that 100% of the data view is utilized and gates are positioned more
efficiently for the C-scan data.
• The OmniScan true depth mode is changed to uncorrected in >Group\probe
>Group management >Technique.

OLYMPUS Scientific Solutions

DMA Probe Overview – Surface Inspection cont.


• In this example a 75-85 degree S-scan focused at 20mm from the wedge face
(Projection) is created with the TV Adv Calc and imported into the OmniScan.
• The UT settings are set for high voltage, appropriate receiver filter, and video filter
off or as desired.
• To calibrate TCG, position the wedge face directly on top of the surface notch and
adjust the UT gain to 100% amplitude.
• Reduce UT gain by 6dB as below.

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DMA Probe Overview – Surface Inspection cont.
• Select >Sizing >TGC type: TCG to create the manual TCG points over the weld.
• Select >Curves setup and move the position of TCG point 1 to the notch indication
in the A-scan and increase the gain until the signal is 100% amplitude.
• Select add to create TCG point 2.

OLYMPUS Scientific Solutions

DMA Probe Overview – Surface Inspection cont.


• Slide the probe backwards from the surface notch 10mm using a ruler against the
wedge face.
• Move the position of TCG point 2 to the new position of the surface notch
indication in the A-scan and increase the gain until it is 100% amplitude.
• Select add to create TCG point 3.

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DMA Probe Overview – Surface Inspection cont.
• Slide the probe backwards from the surface notch to 20mm using a ruler against
the wedge face.
• Move the position of TCG point 3 to the new position of the surface notch
indication in the A-scan and increase the gain until it is 100% amplitude.
• Continue until the desired coverage is obtained over the weld or until SNR of the
notch deteriorates.

OLYMPUS Scientific Solutions

DMA Probe Overview – Surface Inspection cont.


• Warning: There is a shear wave component of approx. ½ the angle propagating at
approx. ½ the velocity that is always present in longitudinal wave angle beam
inspection and affects both the volume and surface inspections.
• The useful range of the inspection is not always limited by the SNR of the notch as
the probe surface distance is increased. The range can also be limited by the
shear wave beam arriving at the cladding or the pipe ID.
• This is one reason that use of skipping with longitudinal wave angle beam
inspection is not recommended.

3
1 2

1 2 3

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DMA Probe Overview – Surface Inspection cont.
• Use of an unrectified waveform allows a grey scale color palette similar to TOFD
that is more sensitive to small defects.
• This is possible for the phased array or UT probes used for surface inspection.
• The setup and TCG procedure is the same for full wave rectified or unrectified and
the user can switch between the two before or after setup.

OLYMPUS Scientific Solutions

DMA Probe Overview – Surface Inspection cont.


• The position of gate A should represent the weld width or at least ½ the weld width
depending on the attenuation and SNR through the weld.
• Position the start of gate A just before the first TCG point as below.
• Position the width of gate A just after the end of the area of interest of the surface
inspection after the last TCG point.
• Optimization of the gate position will ensure the C-scan for the surface inspection
is relative to the weld width and does not contain shear wave signal.

Gate A = weld width

Gate A

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DMA Probe Overview – Surface Inspection cont.

• In this example the 4MHz A27 DMA probe with DNCR wedge detects a 1mm
deep X 10mm long EDM surface notch at 20mm+ from the wedge face in an
inconel alloy 625 weld.
• This is the same inspection configuration that appears in the DMA promotional
video with the Olympus Mapper scanner.

A-scan (78 degrees)

S-scan (All laws)

C-scan (All laws)

OLYMPUS Scientific Solutions

DMA Probe Overview – Surface Inspection cont.

• If all A-scans above approx. 70 degrees are essentially the same in that they
propagate parallel to the component surface where trigonometry is not possible,
why not just use a single static A-scan?
• Because use of multiple A-scans of slightly different delay, beam exit and beam
angle increase probability of detection and provides more information.
• The maximum amplitude A-scan detection is random and can occur on any of
the A-scans in the S-scan.

A-scan (75 degrees)

S-scan (All laws)

C-scan (All laws)

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DMA Probe Overview – Surface Inspection cont.

• In this example the 4MHz A27 DMA probe with DNCR wedge detects 3 shallow
flaws and 1 OD connected flaw in a 6 inch diameter inconel alloy 800 weld.
• There are numerous indications in the C-scan generated by the 75-80 degree
surface S-scan that have at least one A-scan >50% amplitude.

A-scan (75 degrees)

S-scan (All laws)

C-scan (All laws)

OLYMPUS Scientific Solutions

DMA Probe Overview – Surface Inspection cont.

• However there are only 4 indications that generated a >50% amplitude on all A-
scans within the 75-80 degree S-scan.
• Use of the color palette aids analysis by increasing probability of detection and
reducing over calls.
• Best practice for surface inspection includes combining time of flight position,
amplitude, and multiple A-scan detections developed during trials.

A-scan (75 degrees)

S-scan (All laws)

C-scan (All laws)

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DMA Probe Overview – Surface Inspection cont.

• In this example the 4MHz A27 conventional UT probes with DNCR wedge detect
an OD connected surface crack in duplex stainless steel.
• Use of the unrectified A-scan and grey scale color palette provides more sensitive
inspection for detection and sizing of small near surface and surface connected
weld flaws.

UT lemo connectors

OLYMPUS Scientific Solutions

Olympus Dual Matrix Array Probes – Conclusions


• Two standard dual matrix array probes in 2MHz (A17) and 4MHz (A27) extend
the range of what is possible with an OmniScan or Focus PX by providing off the
shelf advanced austenitic and inconel alloy weld inspection capability.
• Olympus dual matrix array probe technology is just one more example of the
benefits of phased array inspection accessible through a specialized OmniScan
friendly probe for both the novice and advanced user.

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Questions or comments:
Chris.magruder@olympus-ossa.com

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