Mentor UT: User's Manual

Mentor UT
User’s Manual
104M6211 Rev. H
02/2020
Mentor UT Portable Equipment User’s Manual
Date: 08/22/2017 File: 104M6211_RevB

Date: 11/20/2017 File: 104M6211_RevC
Date: 04/12/2018 File: 104M6211_RevD
Date: 11/21/2018 File: 104M6211_RevF
Date 07/25/2019 File: 104M6211_RevG
Printed in 2019
In order to further develop our products, we reserve the right to change data and designs without prior notice. All
rights reserved, particularly rights relating to duplication,
Dissemination and translation excepted. No part of this publication may be reproduced, processed or disseminated
in any form (e.g. through photocopying, microfilming, electronic data processing and/or storage or other means)
without the prior written consent of GE Inspection Technologies, LP Skaneateles, NY
In service situations, please contact: Email: RemoteService@ge.com

Website: https://www.industrial.ai/inspection-technologies
Phone: See listing of Global Tech Support at the end of this manual.
Copyright by GE Measurement & Controls - Inspection Technologies
ii
User’s Manual Mentor UT Portable Equipment
Application Features.....................................................................................................3-3
Table of Contents Types of Panels ...............................................................................................................3-5
Chapter 1:........................................................................................................ 1 Touchscreen Shortcuts................................................................................................3-6
Introduction...........................................................................................................................1 Correcting Incompatible Parameter Settings.....................................................3-7
Important Notice................................................................................................................2 Gate Setup: Single Element Probes.....................................................................3-10
Limited Service Warranty................................................................................................8 Two Point Calibration (Single Element Probe)................................................3-11
Safety Information ............................................................................................................9 CV - DAC / TCG .............................................................................................................3-12
Informations sur la sécurité ..........................................................................................9 Using DAC........................................................................................................................3-12
Compliance Information .............................................................................................. 12 Using TCG........................................................................................................................3-14
Maintenance ..................................................................................................................... 16 AWS ...............................................................................................................................3-16
Chapter 2:.....................................................................................................2-1 AWS Setup......................................................................................................................3-17
Features..............................................................................................................................2-1 DGS Calibration............................................................................................................3-18
Mentor UT Instrument..................................................................................................2-2 Preparing to Record the Reference Echo...........................................................3-19
Overview ............................................................................................................................2-2 Display and Adjust the DGS Curve.......................................................................3-23
Using this Manual...........................................................................................................2-3 Gain Modification ........................................................................................................3-23
Powering On and Connecting to the Instrument .............................................2-4 Evaluating Results in DGS Mode...........................................................................3-24
The MUX Module.............................................................................................................2-5 Recording / Saving Conventional UT Data .......................................................3-26
Probe Connectivity.........................................................................................................2-6 TOFD ...............................................................................................................................3-28
Interfaces...........................................................................................................................2-7 Probe Centre Separation (PCS).............................................................................3-35
Desktop Features............................................................................................................2-9 TOFD Analysis................................................................................................................3-35
Chapter 3:.....................................................................................................3-1 Phased Array UT Setup and Other Menus .......................................................3-36
Operation...........................................................................................................................3-1 Soundpath & Depth Gate with S-Scan...............................................................3-39
Launching Applications................................................................................................3-2 Working with Display Range for S-Scan.............................................................3-39
Installing New Apps.......................................................................................................3-2 Interpreting and Controlling Phased Array Data Views..............................3-41
Navigating within an Application.............................................................................3-3 Selecting the Scan Pattern......................................................................................3-42
iii
Overview and Active C-Scan Displays................................................................3-43 Global Gain & Gates...................................................................................................3-68

Volume Corrected C-scan & B-scan ...................................................................3-44 Y-Probe or Splitter Box Configuration.................................................................3-68
Active B-Scan Displays..............................................................................................3-44 Statistical Measurement..........................................................................................3-69
Dead Element Check..................................................................................................3-46 Interpreting the LED Indicator Light ...................................................................3-70
Velocity Calibration (Multi-Step)...........................................................................3-47 Accessing the Menu View........................................................................................3-71
Velocity Calibration (Multi-Backwall)..................................................................3-48 Working with Stored Files .......................................................................................3-72
Delay / Zero Point Cal.................................................................................................3-49 Generating and Viewing a Report ........................................................................3-74
TCG Calibration (Multiple Step).............................................................................3-50 Changing System Settings ......................................................................................3-75
TCG Calibration (Multiple Backwall)....................................................................3-51 Mentor PC File Management .................................................................................3-77
TCG Calibration (Depth / SDH)...............................................................................3-52 Wifi Connections..........................................................................................................3-79
Sensitivity Calibration................................................................................................3-53 Remote Access with a VNC Desktop ..................................................................3-80
Scanner / Encoder Check..........................................................................................3-54 Updating the Software..............................................................................................3-81
Clearing Calibration Data ........................................................................................3-55 Appendix A – UT Parameter Listing with Definitions...................... A-1
Recording/Saving Phased Array Data ................................................................3-56 Conventional Parameters.......................................................................................... A-1
Manual Index..................................................................................................................3-57 Phased Array Parameters.......................................................................................... A-5
Overlay..............................................................................................................................3-58 TOFD Parameters........................................................................................................A-11
Overlay Presets.............................................................................................................3-59 General Parameters....................................................................................................A-15
Phased Array UT Multigroup...................................................................................3-60 Appendix B – Specifications ................................................................ A-22
Multigroup Weld Configuration.............................................................................3-60
Y-probes ..........................................................................................................................3-62
64:64 Splitter.................................................................................................................3-62
Group Display................................................................................................................3-64
Active Group..................................................................................................................3-65
Calibration Icons..........................................................................................................3-66
Skew Angle.....................................................................................................................3-67
iv
Chapter 1:
Introduction
1-1
Important Notice
The following information must be read and understood by any user of GE Oil & Gas, Digital Solutions equipment. Failure to follow these
instructions can lead to errors in measurements or other test results. Decisions based on erroneous results can, in turn, lead to property
damage, personal injury or death.
General Warnings
Proper use of test equipment requires three essential elements:
• Selection of the correct test equipment.
• Knowledge of the specific “test application requirements.”
• Operator training.
The user’s manual provides instruction in the basic set up and operation of the testing equipment.
Operator Training
Operators must receive adequate training before using test equipment.
Operators must be trained in general testing procedures and in the set up and performance demands of a particular test.
More specific information about operator training, qualification, certification, and test specifications is available from various technical
societies, industry groups, and government agencies.
Safety Information
ATTENTION! This instrument is intended for materials testing. Any use for medical applications or other purposes is not allowed.
The instrument may only be used in industrial environments.
Software
According to the current state of the art, software is never completely free from errors.
Before using any software-controlled test equipment, make sure that the required functions operate perfectly in the intended combination.
1-2
Defects/Errors and Exceptional Stresses

If you have reason to believe that it is no longer safe to operate your instrument, you must disconnect the instrument from its AC Power
Adapter/Battery Charger, shut it down, and secure it against unintentional reconnection.
Safe operation is no longer possible if the instrument:
• shows visible signs of damage.
• no longer operates perfectly.
• is subjected to heavy stresses during transportation
• is subjected to prolonged storage under adverse conditions like exceptional
temperatures and/or especially high air humidity, or corrosive environmental conditions.
Service
Every effort has been made to provide you with a reliable product. However, should service become necessary, GE Oil & Gas, Digital Solutions
has established a number of Factory Trained Service Centers. For the location of the nearest facility, refer to the end of this user’s manual.
1-3
Batteries
Only batteries (Lithium-ion) recommended and supplied by GE Oil & Gas, Digital Solutions may be used for instrument operation.
NOTE:
Internal batteries may only be replaced by a factory trained service center. Opening the instrument case in an attempt to access the batteries
will void the instrument’s warranty. An externally connected battery pack is available from suppliers as described in this manual.
NOTE:
When the instrument reaches the end of its life, the Lithium-ion battery must be removed. Then properly dispose of the instrument and of the
Lithium-ion battery.
Battery Life and Temperature
The amount of time that the Mentor can be run on a fully charged battery (and the heat generated internally) is directly related to current
consumption in the instrument electronics. One of the largest consumers of current, and the one most directly controllable by the user, is the
back light for the display. Running that display brighter than necessary will drain the battery faster and make the instrument run hotter. We
recommend setting the display brightness as low as possible and choosing the best color scheme for your lighting conditions. Our experience
shows that 25% brightness works well for most applications, with the DARK color scheme for indoor use and the LIGHT color scheme for
outdoor.
Power Supply Management
Mentor UT can draw power from instrument battery or from MUX battery or from DC power adapter.
MUX Batteries
Mentor UT is operated with an internal battery with the base unit and an external battery mounted on the battery rack of MUX module. MUX
battery rack is mounted on the left side of the MUX module. The battery is intended to automatically released from the MUX module when the
retention pins are released. To engage the battery, close the door and engage the pins. Battery and power charging operation of Mentor UT
will function as described below:
1-4
Instrument Power Adapter MUX Battery charge Instrument battery charge % Behavior
Powered ON Plugged In %
YES NO 100% 100% MUX battery powers entire system, instrument battery not used.
YES NO 90-100% <100% MUX battery will charge instrument battery and at the same time run
the instrument.
YES NO 0-89% 1-100% MUX battery will run instrument until MUX battery is exhausted. MUX
will NOT charge instrument battery. When MUX battery is exhausted
system will run from instrument battery.
YES NO 0% or No MUX battery 25-100% System (MUX + Instrument) will run from instrument battery.
installed
YES NO 0% or No MUX battery 1-25% System (MUX + Instrument) will run from instrument battery, but
installed instrument LCD brightness will be limited to 25% of maximum.
YES YES 100% 100% System will run from power adapter. No battery energy is being used.
YES YES <100% <100% System will run from power adapter. MUX battery will charge to 90%
full, then MUX and instrument batteries will charge until both are at
100%. Charging for Instrument or MUX battery will occur as long as
battery is within acceptable temperature range for charging.
NO YES <100% <100% MUX and Instrument batteries will be charged at the same time until
they both reach 100%. Charging for Instrument or MUX battery will
occur as long as battery is within acceptable temperature range for
charging.
NO NO 100% <100% he MUX will NOT charge the instrument. This is a safety requirement.
1-5
Battery Indicator
Battery life indicator displays the percent of full charge when the charger is attached or time remaining when not connected to the charger.
Below are the indicators when battery is charging and when its discharging. The MUX and instrument battery status are shown individually. A
percentge indicates the battery is charging or idle. An estimated remaining run time indicates the battery is discharging. Remaining run time
is estimated for the battery in use. if the run time is next to the MUX battery then that is the remainin grun time for the MUX battery, likewise
for the instrument battery. The MUX battery can be exchanged while the system is operating. To insure uninterrupted system operation, the
instrument battery should have more than 20% capacity remaining.
Indicators for when the MUX battery is charging and the instrument is idle. Instrument battery will begin to charge when the MUX battery
reaches 90% capacity.
Indicators when MUX module is attached but MUX battery is not connected, and instrument battery is charging.
Indicators when MUX battery is connected, and powering the entire system, and instrument battery is idle or charging. The MUX battery will
display estimated run time.
Indicators when MUX module is attached but MUX battery is not connected, and instrument battery is powering the entire system. Note that
the instrument battery icon is displaying remaining run time.
NOTE: The instrument battery icon will change from green to red when the instrument battery is critically low in capacity and
requires charging.
1-6
Display
The display on your Mentor UT is large and bright and of very high quality. However, industry standards for display (shown below) allow a small
number of electronically defective pixels, five or fewer per display. Defects may fall under the following categories:
1. A dark pixel that is black against a white background and is essentially not electrically connected.
2. A bright pixel that may be red, green, blue, or white but brighter than background.
Under most conditions, these defects have no impact on use. However, there may be cases when a display that is acceptable under the
industry guidelines is unacceptable for your use case. In these cases we will replace the device.
Reference standard: ISO 9241-302:2008 Class 1
Power plug
Class 1: For AC line powered equipment the power plug may only be inserted into a grounding-type receptacle. Any disconnection or
interruption of the protective conductor may make the instrument unsafe. When connecting equipment with other devices, the protective
conductors shall be made equipotential.
Class 2: Use only the power cord and AC Power Adapter/Battery Charger supplied by GE Oil & Gas, Digital Solutions for this instrument.
Serious harm to the instrument is highly likely if the incorrect power supply is used.
1-7
Charger Specifications
AC input to charger specification: 100–240 VAC, 47–63 Hz
DC charge input specification: 12 VDC ± 5%, 72 W
Limited Service Warranty

If, through our negligence, GE Oil & Gas, Digital Solutions directly caused damage to your equipment while the equipment is in the sole custody
and control of GE Oil & Gas, Digital Solutions, we shall choose at our opinion either to repair the damage or replace the damaged portion of the
equipment at our own expense, or to indemnify and hold you harmless for such physical damage to the Equipment. The equipment shall be
free of any claim of ownership by third parties and when new, be free from defects in material and workmanship and perform in accordance
with the Product’s specifications under normal use and service.
EXCEPT FOR THE WARRANTY SET IN THIS PARAGRAPH, GE OIL & GAS, DIGITAL SOLUTIONS EXPRESSLY DISCLAIMS ALL WARRANTIES AND
REPRESENTAION OF ANY KIND WITH RESPECT TO OUR SERVICES OR THE INFORMATION CONTAINED IN ANY REPORTS THAT WE ISSUE
TO YOU, WHETHER EXPRESSED OR IMPLIED, INCLUDING ANY IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR
PURPOSE, NON-INFRINGEMENT, TITLE AND WARRANTIES ARISING FROM COURSE OF PERFORMANCE, COURSE OF DEALING OR TRADE
USAGE.
This limited warranty shall not apply to any problems arising from (i) failure to follow the product instructions or failure to perform preventive
maintenance, (ii) service, repair or modification by someone other than GE Oil & Gas, Digital Solutions or one of our authorized service
representatives; or (iii) external causes, such as accident, abuse, misuse, or problems with electrical power.
The use of unauthorized spare parts shall render the manufacturer’s warranty null and void.
1-8
Safety Information Informations sur la sécurité

Follow the safety instructions and exercise caution at all times to reduce the risk of Suivez les consignes de sécurité et faites preuve d'une prudence constante pour
accidents, personal injury, and material damage. réduire le risque d'accidents, de dommages corporels et de dégâts matériels.
Types of Safety Messages in this Manual

REMARQUE : Ce message indique des informations supplémentaires.
NOTE:
This message indicates additional information. DANGER !
Danger immédiat : une telle situation peut entraîner la mort ou une blessure grave
si elle n'est pas évitée.
DANGER!
Immediate danger: situation will cause death or serious injury if not averted.
AVERTISSEMENT !
Ce terme indique le danger et la possibilité de dommages corporels.
WARNING!
This term indicates danger and the possibility of personal injury.
AVERTISSEMENT !
CAUTION Ce terme indique que des dommages peuvent être causés à l'appareil.
This term indicates that damage could occur to equipment.
Safety Messages
AVERTISSEMENT !
Danger provenant d'une mauvaise utilisation !
WARNING!
Danger resulting from misuse!
1-9
WARNING!
AVERTISSEMENT!
Equipment to be operated by authorized personnel only.
L'appareil doit être utilisé uniquement par du personnel autorisé.
Wear Personal Protective Equipment when there are risks of injury! Portez un équipement de protection individuelle en cas de risque de blessures !
ELECTRICITY!
ÉLECTRICITÉ !
Potential death or serious injury may result from contact with
electrically charged components. An electric charge can build up Il existe un risque potentiel de mort ou de blessure grave en cas de contact avec
des composants chargés électriquement. Une charge électrique peut s'accumuler
in electronic components and remain even after switching off and dans les composants électroniques et subsister bien après la mise hors tension et
disconnecting the equipment from the power supply. la déconnexion de l'appareil de la source d'alimentation électrique.
WARNING!
AVERTISSEMENT !
Instruments containing wireless devices are designed for use in
specific countries. Instrument user is responsible for ensuring that Les instruments contenant des dispositifs sans fil sont conçus pour une utilisation
dans des pays spécifiques. L'utilisateur de l'instrument se doit de vérifier que les
the instrument’s wireless devices are only used in countries for appareils sans fil sont utilisés uniquement dans les pays pour lesquels ils ont été
which they are intended. conçus.
WARNING!
Operation of some wireless devices on airlines is prohibited because AVERTISSEMENT !
their signals could interfere with critical aircraft instruments. Le fonctionnement de certains appareils sans fil dans les avions est interdit
en raison de leurs signaux qui pourraient interférer avec des appareils d'avion
WARNING! critiques.
The instrument contains a Lithium Ion battery and magnesium in its

case. Should the instrument be involved in a fire, use an extinguisher AVERTISSEMENT !
approved for use on electrical and flammable metal fires. Water L'instrument comporte une batterie lithium ion et du magnésium à l'intérieur de
must not be used. son boîtier. En cas d'incendie de l'appareil, servez-vous d'un extincteur agréé pour
une utilisation sur les incendies électriques et les métaux inflammables. En aucun
cas, n'utilisez de l'eau.
1-10
CAUTION
ATTENTION
There are no serviceable parts inside the instrument. Do not open the
instrument housing. Aucune pièce interne à l'instrument n'est réparable. N'ouvrez
pas le boîtier de l'instrument.
WARNING!
AVERTISSEMENT !
Surfaces on the rear of the instrument can become hot under normal
operating conditions. Les surfaces sur l'arrière de l'instrument peuvent chauffer sous
certaines conditions de fonctionnement normal.
WARNING!
Support stand can cause injury if allowed to close on fingers.
AVERTISSEMENT !
La béquille risque de provoquer des blessures en cas de
fermeture sur les doigts de l'utilisateur.
1-11
Compliance Information
European Commission
GE Inspection Technologies LP hereby declares that this product is in compliance with the essential requirements and other relevant
provisions of the 2011/65/EU RoHS.
Declaration of Conformity is held by:
GE Sensing & Inspection Technologies GmbH
Huerth, Germany
Tel: 1-866-243-2638
Email: RemoteService@ge.com
F
ederal Communications Commission
FCC Part 15, Subpart B, Class A
RED directive 2014/53/EU

Wireless Module Approvals:
IEEE 802.11b/g/n
FCC Part 15, FCC ID: XF6-RS9110N1102
IC ID: 8407A-91101102
Bluetooth (BT) 2.1 + EDR
FCC Part 15, FCC ID: QOQWT32AE
IC ID: 5123A-BGTWT32AE
1-12
Notifications for Wireless Modules:

• The wireless modules utilize the 2.4 GHz band.
• The modules are designed to be embedded into general electric devices, and are not designed for aircraft instruments, atom control, artifi-
cial life support and any other devices requiring extremely high reliability and quality.
• As the modules communicate via radio waves, it is strongly recommended that configuration be performed regarding security, to prevent
information leakage to a third person.
• The modules may effect or be affected by any surrounding devices utilizing the same bandwidth. Please investigate the environment in
which the modules will be operated before installing it.
• Disassembling or modifying the modules may lead to penalties based on radio wave law.
1-13
Canadian Notice for Wireless:

This equipment does not exceed the Class A limits for radio noise emissions as described in the Radio Interference Regulations of the Canadi-
an Department of Communications.
Le present appareil numerique n’emet pas de bruits radioelectriques depassant les limites applicables aux appareils
numeriques de la classe A prescrites dans le Reglement sur le brouillage radioelectrique edicte par le ministere des
Communications du Canada.
FCC Notice for Wireless:

This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions:
1. This device may not cause harmful interference.
2. This device must accept any interference received, including interference that may cause undesired operation.
This equipment has been tested and found to comply with the limits for a Class A digital device, pursuant to part 15 of the FCC Rules. These
limits are designed to provide reasonable protection against harmful interference when the equipment is operated in a commercial environ-
ment. This equipment generates, uses, and can radiate radio frequency energy and, if not installed and used in accordance with the instruction
manual, may cause harmful interference to radio communications. Operation of this equipment in a residential area is likely to cause harmful
interference in which case the user will be required to correct the interference at his own expense.
IMPORTANT: Under FCC rules, modifications not expressly approved by the
manufacturer could void the user's authority to operate the equipment.
1-14
Disposal of packaging materials

Dispose of packaging material in accordance with legal requirements and local regulations.
Environmental Compliance
GE Oil & Gas, Digital Solutions is an active participant in Europe’s Waste Electrical and Electronic Equipment (WEEE) take-back initiative,
directive 2012/19/EU.
The equipment that you bought has required the extraction and use of natural resources for its production. It may contain
hazardous substances that could impact health and the environment. In order to avoid the dissemination of those substances in
our environment and to diminish the pressure on the natural resources, we encourage you to use the appropriate take-back
systems. Those systems will reuse or recycle most of the materials of your end life equipment in a sound way.
The crossed-out wheeled bin symbol invites you to use those systems. If you need more information on the collection, reuse and
recycling systems, please contact your local or regional waste administration.
Visit http://ec.europa.eu/environment/waste/weee/index_en.htm for more information about this initiative.
Battery Disposal
This product contains a battery that cannot be disposed of as unsorted municipal waste in the European Union. See the product
documentation for specific battery information. The battery is with this symbol, which may include lettering to indicate cadmium
(Cd), lead (Pb), or mercury (Hg). For proper recycling return the battery to your supplier or to a designated collection marked with
this symbol, which may include lettering to indicate cadmium (Cd), lead (Pb), or mercury (Hg). For proper recycling return the
battery to our supplier or to a designated collection point.
1-15
Maintenance
Inspecting and Cleaning the System
Inspect and clean the Mentor UT system before and after each use with the a soft cloth and a 70% alcohol-to-water solution. If using the system
in a dirty environment, clean the components more frequently, as needed.
If damage is found, contact GE Oil & Gas, Digital Solutions for return instructions and an RMA (return material authorization) number.
Early detection of minor conditions can prevent costly repair.
1-16
Chapter 2:
Features
2-1
Mentor UT Instrument
Overview
The Mentor UT instrument allows you to run applications,
generated by Mentor Create development software,
which are adapted to your needs and reflect your best
practices. This highly portable ultrasonic inspection device
incorporates a high-resolution screen that’s visible in any
light, a touchscreen that works when wearing many common
glove types, and a customizable interface through which all
members of your team can communicate. Additional features
include:
• Large 10.4 inch color, touch display
• Simplified UI, allowing custom inspection “Apps"
• LED for alarms, warnings, and charge
• IP65
• Drop protection
• “Dialog” functionality ensures the correct probe is
connected at all times
• Simplified calibration procedures
2-2
Using this Manual

This manual explains how to navigate between the Mentor UT’s various
on-screen features and utilize its various parameter-adjusting tools. The
user needs to apply these instructions to various different on-screen
configurations since an application's architect determines its specific
contents, the parameters and data types displayed, and various other
features.
2-3
Powering On and Connecting to

the Instrument
1 - Press and momentarily hold to power on the instrument.
2 - Connect the AC power adapter here.
3 - UT probe connectors are inserted here (optional, varies by probe type).
4 - Connectivity module includes various data ports (optional)
5 – USB
6 – Encoder Z, Alarm and Inhibit signals
7 – Encoder XY and Encoder Index
8 – Single-Element Probe
9 – Phased-Array Probe
CAUTION
The instrument must be powered OFF before attaching or removing these or other modules.
To avoid equipment damage, only attach modules in the correct orientation and to the
proper port.
2-4
The MUX Module

Mentor UT is a modular device. The multiplexor is capable of driving 32 array channels and up to 128 element physical probes when the probe is a simple single array. If
the probe is a dual array, such as the DM probes, up to 64 elements may be driven. For a single array, the pulser and receiver from the same channel connect to the same
probe element. For a dual array, a receiver might typically connect channel 1 to element 1, while pulser 1 connects to element 65. In this fashion, the lower half of the
channels wire to the receive side of the array and the upper half to the transmit side. The Probe Type parameter shall be interpreted by the instrument software to switch
the multiplexing automatically.
2-5
Probe Connectivity
The Tyco probe connector shall be provided to mate with Phasor XS style Tyco connector probes. The connections will provide access to up to
128 elements linear or 64 element dual probes, along with a dialog chip read capability for Phasor probes. Picture includes the connector latch
handle at the right side and shows two mounting holes to allow screwing down the sealed head shell.
Phasor Connector, Instrument Side
2-6
Interfaces • LEMO 00 coax connector – To connect the conventional

UT probes
The entire rear of the instrument connectors are provided for essential digital I/O functions • GPIO 9-Pin LEMO 00 – For system
including USB, external video, encoders and Ethernet. The interfaces on the rear of the synchronization and alarm inhibit input
instrument are described here.
• Z: 7-Pin LEMO 00 – For alarm outputs, . Do NOT plug
encoders in here, that can cause unexpected switch off of unit.
• X-Y: 7-Pin LEMO 00 – Quadrature encoder

connectivity for scan and index axes.
• USB 2.0 – For data and file transfer
• HDMI – To connect with external monitors or projectors.

NOTE: Monitors or projectors must be connected prior to
powering on. Resolution must be a minimum of 1024 x 768.
External displays not meeting the minimum resolution will
affect touchscreen accuracy. Requires Mentor instrument
main hardware Rev 7 or higher. Rev 6 and earlier does not
support external video.
• Ethernet LAN – For Remote Desktop Connection. also

supports internet connections for upgrade, app install or
InspectionWorks Connect
2-7
Connecting the MUX Module

The MUX module is encoded with firmware that is compatible only with the Mentor UT instrument. A required firmware update to the instrument will be necessary for pro-
per operation of the MUX system. When updating the instrument firmware, the firmware within the MUX module will also be updated.

1. Turn off the Mentor UT
2. Position the Mentor UT face down
3. Remove the probe or probe cover if any are connected to Base Mentor UT unit by unscrewing the screws
4. Remove the connectivity module or cover if any are connected to Base Mentor UT unit by unscrewing the screws
5. Align the MUX module with Mentor UT base unit and mount at the Mentor UT probe docking connector and Mentor UT connectivity
docking connector. Screw in the captive screws on the top and bottom
6. Switch ON the Mentor UT
2-8
Desktop Features
This is the Desktop. It is displayed when the instrument powers on (if
so configured by the Startup setting) and whenever the HOME KEY is
pressed.
1 – Use touch screen to select any application loaded into the

instrument’s active desktop.
2 – Swipe the desktop page all the way left or right to access additional
pages. Number of circles at bottom center of a display indicate how many
additional pages are viewable. Open circle indicates the position of the
current view in relation to all available pages (in the case shown here, the
user is currently viewing the second of three available pages).
3 – Press to access and load additional application files (including those

on certain external devices such as a USB thumbdrive).
4 – Press at any time to return to the Desktop.
5 – Press to access System Settings, (User Preferences, etc.), File

Manager, Remote Access setup, and to Shut Down the instrument.
6 – Select to open the Application Information box that, along

with providing a description of the application, allows the application to
be deleted.
7 – Date and time format are selected via the Regional setting.
8 – Battery life indicator displays the percent of full charge when the
charger is attached or time remaining when not connected to the charger.
2-9
Chapter 3:
Operation
3-1
Launching Applications
1 – Use touch screen to select any application installed on the instrument.
2 – Select the application’s starting point from a list of options determined by the
application architect. Selecting Resume begins the application at the panel and settings
last active.
Installing New Apps

3 – Press to access application files stored on connected external devices. Files must first
be added into the active application list (those that appear on the desktop) before they can
be launched.
4 – Choose an application from the USB list (if one is installed).
5 – After selecting a file (it will turn blue), select Add to install the application in the
instrument or to replace an existing application with an updated version. The newly
installed application joins others on the instrument’s desktop.
NOTE: Application files have an iwp file extension.
3-2
Navigating within an
Application
Applications contain a variety of UT data display capabilities, video
and still-image visual guides, and illustration/text references.
An application’s architect determines its specific contents, the
inspection parameters displayed, which parameters are adjustable
by the user, and to within what range of values a particular
parameter can be set. Applications include one or more panels.
1 – Identifies which panel of the active application is currently

displayed.
2 – Press this key to access and navigate the list of all panels in
the active application, identify the position of the currently active
panel, and jump to any other available panel.
3 – Name of the currently displayed panel.
4 – Press the forward arrow to sequentially navigate through
all available panels. Press the back arrow to view the previously
displayed panel.
5 – Generates (as a .pdf file) a report of settings and a capture of
the current display.
6 – Captures the current display and saves as an image file (.jpg
format).
Application Features
7 – Locks or enables touch operation. When locked, touch this
Applications contain a variety of UT data display capabilities, video and
area of the touchscreen to unlock.
still-image visual guides, and illustration/text references. An application’s
architect determines its specific contents, the inspection parameters
displayed, and which parameters are adjustable by the user.
3-3
Static Controls – Instructional purposes

1 – Goto – Jumps to another panel in the application
2 – Image – photo or other image
3 – Video Player – opens a video player frame
PDF viewer – tool for viewing pdf documents
Rich Text – tool for viewing text
Parameter Controls – system wide settings effect instrument operation.
NOTE: Channel based parameter controls are accessed via View Controls (see below)
4 – Numeric – set by sliders or number pad
5 – List – select from a drop down list
6 – Check Box – Boolean type parameters
7 – Command Buttons – perform a task (such as freezing the display) or open a menu
View Controls – manage display of UT data. Tap any display screen to access menus buttons,
then select the Display menu. Double tap any display to expand for full-screen viewing or
return to original size.
8 – C-Scan displays are found in phased array probe applications. Overview C-Scans represent
Single Element UT Setup Menu
all test-piece geometry defined by the application’s scan path. and Changing Parameter
9 – A-Scan displays are found in both single element and phased array probe applications.
Reflector amplitude is plotted against time/distance. Values
NOTE: that gate settings are accessed through the A-Scan Gates menu button. The UT Setup menu provides access to those parameters that impact test conditions
10 – E-Scan/S-Scan displays are found in phased array probe applications. Reflector depth is when using a single-element probe. A description of each parameter is found in the
plotted against probe width or element position. Color palette represents reflector amplitude Appendix. Each application's architect determines which parameters are viewable
while beam cursor allows user to select for display an A-Scan from a specific probe element. and adjustable. Refer to the next several pages of this manual to access the Display
and Gates menus and work with phased-array probes.
NOTE: The terms Conventional, CV, Single Element Channel, or Single
3-4
Types of Panels
An application is made up of one or more panels. The purpose, appearance, and sequence of panels is determined by the application’s architect. Panel functions and
features can, however, be categorized as one of four general types.
1 – Information-only panels include instructions, illustrations,

or other app-specific information. They do not allow for
ultrasonic measurement.
2 – Setup panels include ultrasonic measurement output
displays (A, E, and S-scans), a freeze button that freezes output
display, parameter readouts, and menu access buttons.
3 – Calibration panels guide the user through various
calibration processes. Most calibration processes begin
automatically when the panel is opened and a series of
instructional banners appear at the top of the display. These
panels include the features of a setup panel as well as buttons
that store and clear calibration data.
NOTE: The respective calibration icon will change to
green from orange after the panel's specific calibration
procedure had been successfully completed.
4 – Scan panels display live results of phased array scans while
offering the other functionality of the setup panel. Scan panels
include buttons controlling the recording of live phased array
scan data. Scans must be recorded in order to later save their
resulting data.
NOTE: The application architect has to assign the
inspection technique (i.e., "Phased Array; TOFD;
Conventional) for each panel while defining the application
in Mentor Create. According to user assigned inspection
technique on each panel, instrument will automatically
switch to "Phased Array" or "TOFD" or "Conventional"
mode for data acquisition and calibration.
3-5
Touchscreen Shortcuts
1 – Touch to select the E-Scan Beam Cursor then drag it to display the A-Scan signal from a specific
probe element. In this case, the A-Scan associated with probe element 19 is displayed.
2 – Touch within the gate so that its entire outline is highlighted. Then drag to reposition the entire
gate.
3 – Touch either side of the gate to select that side, which will become highlighted, then drag that side
to change the Gate Width setting.
4 – Touch the Gate Threshold, which will become highlighted, then drag the threshold up or down to
change its height.
5 – Touch and drag Overview C-Scan Crosshairs to a point of interest. Values related to the point
under the crosshairs appear across the top of the display.
6 – Touch and drag the Overview C-Scan to create a Selector Box. The Active C-Scan display shows a
zoomed view of the contents of this user-defined box.
7 – Double tapping on any data display panel enlarges it to full-display and returns an enlarged panel to
normal size.
8 – Touch and drag the Active C-Scan Crosshairs to a point of interest. Values related to the point under
the crosshairs appear along the top of the Active C-Scan display.
9 – Touch and drag the Active C-Scan to create a Selector Box. This data-box displays statistical data
related to the C-Scan contents defined by the Selector Box.
NOTE: The Active C-Scan Crosshairs automatically relocate to the center of the Selector Box.
10 – Place two fingers on any color palette then slide them apart or move them together to expand or
compress the range of values represented by the palette. Alternatively, touch and drag either end of the
palette to move just that end.
11 – Single tap this button in this position to lock and unlock the touch screen.
NOTE: When turned off, this display location is the only place where touch-screen actions are
recognized.
3-6
Correcting Incompatible
Parameter Settings
When the user-inputted values for two or more related
parameters create an incompatibility, the instrument
indicates the incompatible values and allows the user
to adjust any or all of the related parameters. This
incompatibility can occur, for instance, between the PRF
setting and A-scan acquisition (or gate) start and end
points. If the PRF is too high and the acquisition or gate
is too far out in time, it may be time to start the next
cycle before the gate or acquisition could complete. The
instrument indicates an incompatible combination of
parameters by coloring the conflicting parameters red
and stopping acquisition until the conflict is resolved.
1 – When parameter values are set to create a physically

impossible configuration, the instrument display is
frozen and the involved parameters are shown in red. To
unfreeze the display, adjust one or more of the indicated
parameter values.
2 – When the values assigned to interrelated parameters
are determined to be incompatible, icons for all menus
containing the parameters involved are also displayed
in red. Select any of these icons to access and adjust the
parameters involved.
3-7
Element Mode are used interchangeably to describe ultrasonic inspections carried out with a single element probe.
1 – The UT Setup Icon opens and closes the menu. These menu icons remain hidden until the user touches somewhere on the Data View or unless a menu is currently open.
2 – Swipe vertically to scroll through menu parameters that may be out of view.
3 – Touch the desired parameter control to activate it and set values.
4 – Press either button to change the parameter value (if adjustable). A brief tap makes small changes in value while pressing and holding makes a larger change. Touch and
drag the bar for coarse adjustment.
5 – Link icon indicates two parameters will be adjusted in equal increments. Touch icon to unlink or re-establish this connection.
6 – When icon is unlinked, you can adjust each parameter independently. Hold icon for two seconds to equalize values.
7 – Use keypad to input desired parameter value.
8 – Individual parameter controls may also appear anywhere on an application panel.
9 – Press header area to deactivate the parameter.
10 – Indicates that the parameter value is Locked. Parameters are locked because the application’s architect intended the value to be observed but not altered, or the
display is frozen. When frozen, all parameters whose value affects only live data are locked.
11 – When panel design includes this button, select to alternate between single-element and phased-array probe operation.
NOTE: Available menus, parameters, and settings differ between single-element and phased array operation.
3-8
1 – When panel design includes this button, select to alternate between single-element
and phased-array probe operation.
NOTE: Available menus, parameters, and data display options, differ between
single-element and phased array operation.
2 – Select the Display Icon to access parameters related to the A-Scan display. These
menu icons remain hidden until the user touches somewhere on the Data View or
unless a menu is currently open.
3 – Double tapping on a data display panel enlarges it to full-display and returns it to
original size.
4 – Display parameters available for viewing or (if enabled) modification. Touch to
activate.
5 – Freezes and unfreezes the active data display.
6 – Clears the active display of data.
7 – Select to Save currently acquired data (display must first be frozen) or to Load
previously saved data. Also allows saving or loading of settings.
8 – Capture the display screen or generate a report.
3-9
Single Element Data Display Gate Setup: Single Element

Probes
Single-element probe data is displayed on an A-Scan. Display menus control
the appearance of each screen (provided the application's architect made these
parameters viewable and adjustable). A description of each parameter is found The Gates menu provides access to those parameters that impact gate position, shape, and
in the Appendix. functioning characteristics. A description of each parameter is found in the Appendix. Each
applications's architect determines which gate-controlling parameters are viewable and
adjustable. Refer to the previous pages of this manual to access the UT Setup and Display
menus.
1 – Select the Gate Icon to open the Gates menu. These menu icons remain hidden until the
user touches somewhere on the Data View or unless a menu is currently open.
2 – Gates (change color and illuminate LED when triggered by an alarm condition)
3 – Drag up or down to access all gate-configuring parameters available for viewing or (if
enabled) modification. These include: the number of gates enabled, the triggering logic of
each gate, and each gate’s size and position.
4 – Touch the desired parameter control to activate it and (if enabled) set its value.
5 – Displays the active parameter’s current value.
6 – Select the desired value for the active parameter.

NOTE: When a panel includes both Single Element and Phased Array
7 – Press to deactivate the parameter.
readouts and data views (such as C-Scans, E-Scans and Amplitude
Displays), while working with a conventional probe the Phased Array 8 – Touch any side of the gate to select it, then drag to reposition that side.
views and Readouts remain static.
9 – Touch within the gate, then drag to reposition the entire gate.
NOTE: Any of these parameters may be hidden by an application's architect.
3-10
Two Point Calibration

(Single Element Probe)
When included by an application’s architect, the Single Element Probe Two Point
Calibration compares the A-Scan triggers for two different known-thickness calibration
blocks. The resulting TOF values are used to calculate the velocity of sound through the
test material and establishes the time-of-flight zero point that represents the single
element probe/test part interface.
1 –The calibration process begins automatically when this banner appears at the top
of the display. Calibration evaluates time-of-flight through a sample of two known
thicknesses to determine the velocity of sound through the material. Two A-Scan gates
are used, one positioned to capture the echo from each known thickness.
NOTE: Be sure the single element probe icon is selected before beginning the
process.
2 –Follow on-screen instructions to couple the attached phased array probe to a
calibration block. First capture the thinner material sample in Gate A. Press the
Calibration button to continue.
3 –Follow on-screen instructions and capture the second known thickness in Gate B.
Again, press the Calibration button to continue.
4 –This message will display after successful completion of the Two Point Calibration.
The caliper icon appears after any successful calibration procedure.
5 –To view the calculated values for the Probe Delay and Part Velocity parameters,
select this button and open the UT Setup Menu.
3-11
CV - DAC / TCG Using DAC

Conventional measurements can be made using the Time Corrected Gain (TCG) and Distance When displayed, the DAC curve visually represents a line of
Amplitude Correction (DAC) functions. These functions are accessed through the DAC/TCG constant reflector peaks over a range of material depths.
function on A-scan view > Calibration Menu. Both the DAC and TCG functions operate based
NOTE: When in DAC mode, the only deviation from traditional
on a set of user-recorded data points. These points are recorded from the Calibration menu as
display and operation is the appearance of the DAC curve. All
described below.
A-Scan echoes are displayed at their non-compensated height.
The TCG function displays reflectors of equal size at equal A-Scan amplitudes, regardless of the A DAC curve can be based on up to 16 data points (material
reflector's depth in the test material. This is accomplished by adjusting the gain at different depths).
locations in the A-scan disp-lay, corresponding to different material depths, to compensate for
A DAC curve is programmed using a series of same-reflector echoes
signal loss (or variation) due to attenuation, beam spread, or other factors.
at various depths covering the range of depths to be inspected
When TCG is Activated, the TCG icon will turn to green on the Calibration icon status bar. in the test material. Because near field and bam spread vary
according to transducer size and frequency, and materials vary in
The DAC function displays all echoes at their true amplitude (without depth compensation). attenuation and velocity, DAC must be programmed differently
NOTE: When operating in DAC mode, a Distance Amplitude Correction curve is based on application.
superimposed on the A-Scan display. The curve, like the one shown below, represents The dynamic range of the DAC function is 90 dB. Maximum curve
constant reflector size at varying material depth. slope is 50 dB per microsecond. Successive data points do not have
to decrease in amplitude. That is, the DAC/TCG curve does not have
to have a constantly descending slope.
3-12
Recording the DAC Curve

DAC curve points are typically recorded from a standard with equally sized reflectors (holes) located at various material depths. The primary echo from each of these
points (for up to a total of 16 echoes) are recorded. When DAC is active, the instrument display a line that represents echo peaks for constant reflectors at varying material
depth. This line is drawn as either a curved (linear in gain) line based on a series of collected DAC points or a series of straight line segments that join these DAC points.
Only one DAC curve can be stored at a time.
To program the DAC Curve, perform the following steps:

1. Access the Calibration menu by pressing on A-scan.
Select DAC/TCG = DAC
2. Couple the probe to the reference point, adjust GATE A START and A THRESHOLD so that th eA-Gate so that it is broken by the primary echo. If necessary, adjust the
gain so that the echo crosses the A-Gate and highest peak in gate A is at approximately 80% full-screen height.
NOTE: The highest peak must NOT be higher than 800% full-screen height.
3. While the Gate is lined up over the first reference echo, press next to the CALIBRATE button on UT Nav Bar. When the value of the DAC/TCG POINT function changes
from 0 to 1, you have recorded the first DAC Curve point.
NOTE: The first point is treated as the reference echo. The amplitude value at which this point is recorded becomes the "reference amplitude" value.
4. Continue to record additional curve points following steps 2 and 3, up to a maximum of 16 points.}
NOTE: Atleast 2 points are required to create a curve.
5. When all points are recorded, press next panel to perform inspection or other calibration.
6. The DAC curve can appear as a series of straight line segments that join the stored DAC points or a curved (linear in gain) line that is based on these points. Access
the DAC TYPE function, located in the SETUP submenu, to display the desired DAC curve type.
3-13
Working with DAC Curves

In DAC mode, the instrument uses the user-input reference points to create a curve representing the amplitudes of echoes representing same-size reflectors at varying
material depths. The recorded reference point data is stored until replaced or edited.
Using TCG
When the TCG function is in use, echoes from equally sized reflectors appear as the same height on the A-Scan display. When operating in TCG mode, will appear on the
display screen. Before using the TCG function, perform the following steps:
1. The instrument/probe combination has been calibrated and all instrument settings (PULSER, RECEIVER, etc) have been made.
NOTE: Changing settings after the TCG reference points are input will affect the accuracy of measurement.
2. TCG reference points (up to 16) must be recorded. This process allows the instrument to calculate and compensate for the effect on material depth on reflector-echo
height. The dynamic range of the TCG function is 60dB. Maximum curve slope is 6dB per microsecond. Successive data points do not have to decrease in amplitude. That
is, the DAC/TCG curve does not have to have a constantly descending slope.
Generating the TCG Reference Curve

TCG reference points are derived from the points used to create the DAC curve. Points are typically taken from a standard with equally sized refectors (holes) located at
various material depths. The primary echo from each of these points (for up to a total of 15 echoes) are recorded. When TCG is active, the instrument compensates for
different material thickness by applying a varying gain level to echoes at material depths other than the baseline depth. Only one DAC curve can be sotred at a time.
Working with TCG

In TCG mode, the instrument uses the recorded reference points to calculate an amount of gain correction required to display each echo from same-size reflectors at the
same amplitude (figure below). The recorded reference point data is stored until replaced or edited.
3-14
Adjusting DAC / TCG Display

and Adding Offsets
TCG line represents the amplitude of 1st DAC point and Once the DAC or TCG curves are displayed, the addition of guidelines offset from
it continued to the last point
the reference line by a fixed or variable dB value, provides enhanced evaluating
abilities. Similarly, the TRANSFER CORR function applies dB compensation for the
difference in coupling conditions between the known standard and the test piece.
To use the stored reference points and operate in TCG mode, perform the following:
1. With the Calibration Menu accessed, select DAC/TCG Mode = TCG
NOTE: The TCG curve begins at the first reference point recorded. It then
proceeds horizontally from this amplitude of this first reference point to
the depth (time position) of the last reference point recorded.
NOTE: When rectification is set to RF, reference lines are not displayed.
3-15
Defining DAC or TCG Curve

Offsets (DAC/TCG -
OFFSETS - MODE)
To add a series of guidelines, offset from the DAC or TCG curve by a definable dB
increment (but not to exceed + or - 24 dB from the reference curve):
1. Access the CALIBRATION Submenu (located in A-scan View)_.

DAC Offsets
2. Set the DAC /TCG Mode function to FIXED (for evenly spaced offset lines)
or CUSTOM for user-controlled offset line placement. Set this function to
OFF to remove offset lines from the display.
3. If FIXED offset MODE is selected, set the DAC/TCG Offset function to the
dB increment at which offset lines are drawn avove and below the DAC or
TCG line (in figure below, a 3 dB fixed offset is specified.
4. If CUSTOM offset MODE is selected, access the Offset 1, Offset 2, Offset 3,

Offset 4 Submenu and input the positive or negative offset at which each of
up to the four guidelines are drawn.
TCG Offset
Upto 4 offset lines are drawn at fixed increments from

DAC line at user specified offset dB
3-16
AWS
Features that evaluate measurement results; suchas, AWS D1.1 / D1.5, are first
selected by the user via the A-scan > Calibration Menu > AWS function as ON.
The AWS annotations appear on the A-scan view.
This feature allows analysis of welds according to AWS specifications D1.1 or

D1.5 and provides a D1.1 or D1.5 rating. The AWS D1.1 feature is accessed
via the HOME menu. The feature utilizes four AWS-specified variables. These
variables include the following:
- A INDICATION: Gain (indB) required to position an A-scan echo's peak (from the
measured reflector) at an amplitude equal to the reference amplitude (between
10 and 90% of full screen height)
- B REFERENCE: Gain (in dB) required to position an Ascan echo's peak (from the
reference reflector) at the user selected amplitude (between 10 and 90% of full After adjusting the gain so that the reference echo's peak is between 10%
and 90% of full screen height, record the reference dB. This reference
screen height)
value will be stored in the instrument until manually changed.
- C ATTENUATION: Determined by subracting 1 inch from the sound-path
distance to the discontinuity, using the equation (inch units): C=(SA-1) x 2. This
compensates for sound loss from material attenuation along the sound path to
the discontinuity.
- D D1.1 Rating: Calculated based on the AWS formula: D=A-B-C (see NOTE)
After adjusting the gain so that the reference echo's peak is between 10 and 90%
of full screen height, record the reference dB. This reference value will be stored
in the instrument until manually changed.
NOTE: The dB value of A-Indication will be automatically adjusted to match

the amplitude of the B Ref upon performaing the dB rating calculation.
3-17
AWS Setup DGS Calibration

Before activating the AWS D1.1/D1.5 weld rating feature, be sure that all instrument
settings are properly adjusted for the specific measurement applications. Access the The instrument’s Distance Gain Sizing (DGS) feature is accessed through
AWS D1.1 menu (via HOME menu) and follow the following steps: the DGS menu, located on the calibration view menu icon. The DGS
feature allows the user to use a probe to compare a reflector in a test
1. Apply couplant and couple the probe to a suitable reference test standard.
piece with a known standard reflector.
2. Ensure that the A-Gate is positioned over the desired echo. Adjust the gain
until the peak of the desired echo reaches the desired amplitude. The DGS feature relies on a reference curve based on a recorded reference
point. The procedure for recording a reference point using the DGS Menu
NOTE: If the echo's peak amplitude (A%A) does not fall between 10% and is described below. Using the DGS feature (Distance Gain Size), you can
90%, the inputted point will not be accepted. compare the reflecting power of a natural flaw in the test object with
3. Press next to the B REFERENCE function (then to confirm) to define the that of a theoretical flaw (circular disk-shaped equivalent reflector) at the
reference dB level. same depth.
4. To evaluate a reflector in a test piece, couple the probe to the test piece. NOTE: A comparison between the reflecting power of a natural flaw
Adjust the A-Gate position, if required, so that it is over the desired echo. with that of a theoretical flaw is being made. No definite conclusions
may be drawn on the natural flaw (roughness, inclined position,
5. Adjust the gain until the peak of the test piece echo reaches the desired
etc.,)
screen height. The dB value that is recorded for A-INDICATION will be
automatically adjusted based upon the amplitude difference between it and The DGS diagram consists of a set of curves showing the connection of
the value recorded for B-REF. It will usually NOT match the instrument dB gain three influencing variables:
settings.
• Distance D between the probe and circular disk-shaped equivalent
6. With the AWS D1.1 SETUP annotations displayed, note that the A, C, and D reflector
parameters automatically update to match the A-Gate triggering echo.
• Difference in gain G between various large circular disk-shaped
7. Press CLR button to clear the AWS results.
equivalent reflectors and an infinitely large backwall
• Size S of the circular disk-shaped equivalent reflector. The influencing

variable S always remains constant for one curve of the set of curves
The advantage of the DGS method is repeatablility. The fact that you can
carry out reproducible evaluations of small discontinuities is the very basis
of reliable inspections.
3-18
Apart from the influencing variables already mentioned, there are other factors determining the curve shape:
• Sound Attenuation
• Transfer Losses
• Amplitude Correction Value
• Probe
The following probe parameters affect the curve shape:
• Element or Crystal diameter
• Delay length
• Delay velocity
These parameters are adjustable on the instrument in such a way that the DGS method can be used with a variety probes on different materials. When the DGS function is
in use, echoes from equally sized reflectors located at varying depths appear to lie along the DGS Reference Curve. When operating in DGS mode, the DGS Reference Curve
appears on the display screen. Before using the DGS function, do the following:
• Calibrate the instrument/probe combination
• Make all required instrument settings related to the pulser, receiver, and material-velocity settings.
The instrument will prevent changes to certain settings after the DGS Reference Echo has been recorded and DGS is turned ON
Preparing to Record the Reference Echo

Before using the DGS feature to evaluate reflectors in test pieces, the characteristics of the attached probe must be specified, certain characteristics of the reference
standard must be input, and a reference echo must be stored. To specify the probe characteristics:
1 Press Probe submenu (located in A-Scan view).
3-19
2 Select Probe Name parameter, this parameter allows you to choose from the MWB60-4 56928
list of probe types in Table 1. These are probes for which probe characteristics MWB70-4 56929
are already input in the instrument, with the exception of the user-defined SWB45-2 58414
probe (Custom)
SWB60-2 58415
3 If the user-defined probe type (Custom) is selected, you can input probe SWB70-2 58416
related parameters (mentioned in Step 4). SWB45-5 58420
NOTE: Selecting any value other than custom will automatically fetch SWB60-5 58421
probe settings described in Step 4. SWB70-5 58422
WB45-1 56993
4 Following probe parameter values should be considered
WB60-1 56994
FREQUENCY—The probe’s frequency rating WB70-1 56995
WB45-2 56999
EFF. DIAMETER—The probe element’s effective diameter rating
WB60-2 57000
DELAY VELOCITY—User determined delay-line velocity WB70-2 57001
NOTE: The characteristics for other than custom probes will be fetched by MSEB-2 57461
instrument automatically MSEB-4 57462
MSEB-4 0 500474
Table: DGS Probe number assignment
MSEB-5 57464
Probe Name Probe Part Number SEB-1 57466
B1-S 57744 SEB-2 KF5 56464
B2-S 57745 SEB-4 KF8 56465
B4-S 57746 SEB-2 57467
MB2-S 57748 SEB-4 57469
MB4-S 57749 SEB-2 0° 500065
MB5-S 57750 MWB45-2 tD** 500678
MWB45-2 56921 MWB60-2 tD** 500679
MWB60-2 56922 MWB70-2 tD** 500680
MWB70-2 56923 MWB45-4 tD** 500681
MWB45-4 56927
3-20
MWB60-4 tD** 500682

MWB70-4 tD** 500683
On tD probes, the user interface limits the material velocity to 3,255 km/s ± 5%.
Record the Reference Echo that Defines the DGS Curve
Prior to generating the DGS curve, a test standard with a known reflector must be used to define a reference point.
Acceptable test standards include these reference types:

• BW—Backwall echo with reference defect size defined as infinity
• SDH—Side Drilled Hole with a reference defect size defined as the hole’s diameter
• FBH—Flat Bottom Hole with a reference defect size equal to the hole’s facial diameter
3-21
Figure: Record a DGS reference point to generate a DGS Curve.
Recording a DGS Curve

1 Select the Part view menu icon on A-Scan, then select Reference Type parameter. Once it is open, this parameter allows you to select one of the three
reference types described above, and specify the size of the known standard’s reference flaw.
2 Couple the probe to the known standard, capture the reference flaw so that it’s reflected echo is displayed on the instrument’s A-Scan, and adjust the
Gate – A’s starting point to ensure that the resulting echo triggers the gate.
3 Adjust the gain (Under UT Setup menu of A-Scan) until the reference flaw’s A-Scan peak measures 80% of FSH (A%A = 80%).
4 With the probe coupled to the standard, and the reference flaw’s echo captured by the Gate – A, press Caliper to the RECORD REF function to store a
DGS reference echo.
NOTE: When a DGS reference echo is stored, corresponding annotations will appear A-Scan top right corner. Only one DGS reference echo can
be stored at a time. To delete the currently stored reference, push Clr icon on navigation bar and follow the on-screen prompts.
These two adjustments should be made prior to recording a reference echo. Changing these values after the DGS curve is generated will cause the curve to
be deleted.
• REF ATTEN (found in the Part menu)— Specify a sound attenuation value (in dB per inch or mm of material thickness) for the material from which the
known standard is made.
• AMPL CORRECT (found in the Part menu)— Correction required when using an angle-beam type probe. This value is specified on the probe’s data
sheet.
3-22
DGS curve update scenario

After the DGS Mode = ON, the DGS should be relatively updated
based on few scenarios mentioned below:
• When user changes the DGS CURVE parameter
• When user changes the Gain Offset or Gain Modification
• When user changes the TEST ATTEN parameter
DGS CURVE Modification

User can modify the DGS CURVE parameter after the DGS MODE
= ON. Every time when user changes the DGS CURVE parameter,
software must compute the curve plotting.
Gain Modification
Recording a DGS reference
When user set the DGS MODE = ON, then System Gain is set to
0.0dB. When DGS Mode = ON, software will adjust the Lower Limit
Display and Adjust the DGS as per the available gain.

DGS curve will linearly get updated as per the gain value
Curve adjustment. Every time when user changes the Gain (i.e., Gain
Offset) parameter, software will compute the curve plotting &
Once a reference echo has been recorded, the DGS curve is displayed simply by update within split seconds.
setting the setting the DGS MODE function to ON (Figure below). Once the DGS Curve is displayed, it can be adjusted using one of
NOTE: Switching this value to OFF does not delete the curve — it simply these three functions:
removes the curve from the display and disables the DGS mode. TEST ATTEN (found in the Part menu)— Specify a sound attenuation
When user set the DGS MODE = ON, set the System Gain = 0.0dB. User should be value (in dB per inch or mm of material thickness) for the material
able to increase or decrease the system gain. When DGS Mode = ON, software from which the test piece is made.
should adjust the Lower Limit as per the available gain. TRANSFER CORR. (found in the Part menu)— dB compensation for
3-23
difference in coupling conditions between the known standard and the test piece. Setting this to values other than zero will change the DGS calibration icon
to “ ”, when it is 0.0 dB then DGS calibration icon turns to “ ”.
DGS Curve and Probe Delay
DGS CURVE (found in the Calibration Setup menu)— Positions the probe’s DGS Curve based on the size of the reflector (flaw) being tested. The setting will
usually depend on the largest acceptable flaw size.
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Figure: DGS Curve
Evaluating Results in DGS Mode

Once the DGS curve is recorded and displayed (by turning DGS MODE on), echoes are automatically compared to the recorded reference. There are three
ways this comparison can be made and two additional DGS related results that can be displayed:
• A%rA—Amplitude of the signal crossing the A-Gate as a percentage of the corresponding DGS curve amplitude.
• dBrA—dB equivalent height difference between the signal crossing A-Gate and the corresponding DGS curve height.
3-25
To aid in interpreting the DGS Mode’s display, the

instrument will display up to four curves representing
fixed-gain offsets from the DGS curve. These curves are
enabled and positioned (by specifying the dB-equivalent
amount they are offset above or below the DGS curve)
by accessing the OFFSETS parameters in the Calibration
Setup Menu.
DGS Clear or Delete:

User can delete or clear the DGS recording using CLR
button. When CLR button is pressed after recording
software display confirmation message “Do you want to
clear the DGS Recording” with “Yes” or “No” option.
• YES Clear the DGS recording. System gain value is
set back to default
• NO Retain DGS settings
Figure: DGS reading with offset curve
ERS—Evaluates the reflected echo and calculates the Equivalent Reflector Size
Gt—DGS test gain, which initializes the DGS curve’s max height at 80% FSH.
Gr—DGS reference gain, which represents the instrument gain at which the reference
echo’s peak reaches 80% FSH.
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Validation of the DGS Method

Echo amplitude evaluations according to the DGS method are only reliable and reproducible in cases when:
• The reference echo is received from the test object if possible. If this is not possible, it should be ensured that the reference block is made of the same
material as the test object.
• The evaluation is carried out using the same probe which was also used for recording the reference echo. Another probe of the same type can be
used after recording a new reference echo.
• Echo amplitudes for reflector distances smaller than half of the probe’s near-field length are subject to heavy variation – for physical reasons due to
interference phenomena effecting the area. Thus evaluation results may fluctuate more than the usually permissible +2 dB. An evaluation according to
the DGS method is possible but not recommended for this case.
Recording / Saving Conventional UT Data

Mentor UT now supports the data recording with C-scan & B-scan display. To save the results from a conventional UT scan, the record feature must be
activated before beginning the scanning process.
1 Change the UT mode to Conventional UT
2 Select to begin Recording.
3 During the record process, select to Pause recording, which allows recording to continue with a press of Record button.
4 During the record process, select to Stop recording, which ends data collection.
5 During the record process, select to Clear the already-acquired data while continuing recording.
6 Select Save to save recorded data. to Load to retrieve previously save data.
7 Select only to change the default file name.
8 Files may be saved to the instrument or an external USB storage device.
9 Select Save then wait while the file-saving process proceeds.
10 Saves parameter settings for the currently active application. Settings can late be reloaded, but only in the same application.
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11 Select to export a CSV (Comma Separated Value) file. This numerical representation of on-screen graphical data can be downloaded to a connected
USB memory device. The CSV grid file’s spatial resolution is determined by the Grid settings in the C-Scan Analysis menu.
12 NOTE: Grayed-out controls are not available during the recording process
Figure: various views can be selected for each recording or multiple recordings
3-28
TOFD
Time-of-Flight Diffraction (TOFD) is a method that uses signal diffration effects on cracks and other material flaws. TOFD is used primarily for testing weld seams. In the TOFD
image below, the time-of-flight or material depth is defined by moving the probe.
The TOFD method uses two very broadband probes in transmit-receive mode. The entire weld seam is scanned with ultrasound and probed in one scan run with only one axis
along the weld seam. Because flaw recognition with TOFD does not depend on the flaw’s location, precise measurement of flaw size, position, and direction is possible. Point
reflectors can be defined precisely using geometric relationships, angles of incidence, and the correct sound velocity.
NOTE: If the gain on the Mentor UT is not enough to meet the expected sensitivity, it is recommended to connect a pre-amplifier to the receiver side of the
instrument. This will allow additional gain to be applied.
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TOFD Image TOFD Rulers

To have the TOFD Image user need to select the Panel Type as TOFD in Mentor Create. TOFD Data True Depth Rulers
View will be shown on the TOFD panels which needs to placed on the panels. In general, TOFD
With TOFD scans, in the uncorrected mode a depth scale is
Image is recommended to use in TOFD Scan Panels.
displayed on the left-hand side of the image. The True Depth
mode assumes that the reflector location lies precisely
symmetrically between the probes. The depth scale is
drawn starting at the probe distance set in the Probe Center
Separation.
Fig: TOFD image with True Depth Ruler
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TOF Rulers
With TOFD scans, in the uncorrected mode TOF scale is displayed on the left-hand side of the image. User can select the depth ruler can be selected as TOF or Material Depth.
On A-scan view, user can see 2 rulers at same time.
Fig: TOFD A-scan with TOF & True Depth rulers
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TOFD Setup Probe Centre Separation

For TOFD to make the proper setup the following parameters has to be known to the
user: (PCS)
• LW Arrival Time (LWA): Time of flight of the lateral wave from transmitter to receiver; Probe Centre Separation (PCS) is the distance between beam exit point of Transmitter
is equivalent to the time of flight for the direct probe distance and Receiver probes along the scanning surface. PCS must be planned by the user as
per the Part Thickness, Beam Angle and Beam Intersection point. The accurate probe
• Backwall Sound Path: Sound path of the first backwall echo (longitudinal wave) distance is required so that the area of expected flaws is covered by the sound beam,
• Backwall Arrival Time (BWA): Time of flight of the first backwall echo especially in case of a large wall thickness. According to the wall thickness and the test
specification you can perform calculations for one or more depth zones with different
• Backwall Mode Convert LT: Time of flight of the longitudinal waves that are converted settings
into transversal waves
These values can serve as an orientation guide when setting the A-scan for expected
range.
The A-scan delay (i.e., Range Start) should be set approx. 1μs before the arrival of the
lateral wave. The A-scan range (i.e., Range End) should be adjusted so that the backwall
echo will be displayed completely (either of the longitudinal wave or of the converted
transversal wave, according to the test specification).
Calculation example:
Delay (Range Start) = LW Arrival Time (LWA) – 1 μs
Range (Range End) = Distance 'BWA - LWA' + 2 μs
or Fig: PCS setup of 44mm on 12mm weld specimen
= Distance 'Mode Convert - LWA' + 2 μs User can define the tolerance limit for “PCS Variation Unit” based on the “Distance” or
in “Percentage”. According the PCS Variation Unit the software compare the “Actual
NOTE: In Mentor UT the Range Start & Range End is automatically computed on PCS” with “Expected PCS” are within the acceptable tolerance or not when user
Setup Panel based on the Probe Diameter, Probe Frequency, Wedge Z-Offset, perform the PCS calibration.
Wedge Velocity, Wedge Angle, Beam Intersection, Part Velocity, Time Definition,
Time Before LW and Time After BW etc.,
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When included by an application’s architect, the Probe Centre Separation (PCS) calculates the actual PCS based on the Lateral Wave and Backwall echo. The resulting TOF
values are used to calculate the Actual PCS of test material. The measured PCS is shown in readout “PCS” for the user to adjust the PCS.
1 – The PCS calibration evaluates time-of-flight of Lateral Wave and Backwall Echo through a calibration sample. Two A-Scan gates are used, Gate A positioned to capture the
Lateral Wave echo and Gate B positioned to capture the Backwall Echo
2 - The process begins automatically when this banner appears at the top of the display.
3 – Follow on-screen instructions to couple the transmitter and receiver probe to a calibration block. Capture the lateral wave in Gate A and backwall echo in Gate B. Press the
4 - This message will display after successful completion of the PCS Calibration if the Actual PCS is within the acceptable tolerance limit.
NOTE: In case you measure the probe distance between the front edges of the probes instead of the index points you must set the parameter Wedge Front. At
both the transmitter and the receiver probe, Wedge Front is the horizontal distance of the probe exit point from the wedge’s front edge. This value is taken from
the Probe & Wedge database for BHGE Inspection Technologies and can be changed according to the technical data of the probe
Fig: PCS Calibration
3-33
Sensitivity Calibration
When included by an application’s architect, the Sensitivity Calibration adjusts the gain so that the A-Scan echo from a known reflector appears at same amplitude for a
reflector.
1 – The Sensitivity Calibration evaluates the echo detected from a lateral wave of known reflector with a calibration sample and adjusts display gain so that the echo’s
amplitude appears at Reference Amplitude of full screen height.
2 – The process will begin automatically when this banner appears at the top of the display.
3 – Follow on-screen instructions to couple the TOFD probes to a calibration block. Capture the known reflector in the gate as shown. Press the Calibration button to continue.
4 – This message will display after successful completion of the Sensitivity Calibration. The Sensitivity caliper icon appears in green after any successful calibration procedure.
Reflectors of sizes equal to the known reflector will now appear on the A-Scan display as echoes with maximum amplitude equal to reference amplitude of full-screen-height.
3-34
TOFD Data Recording Perform the following to start the TOFD Recording Process:
1. Go to TOFD Scan panel

Mentor UT now supports the TOFD data recording with TOFD display. To save the results from TOFD
scan, the record feature must be activated before beginning the scanning process. 2. Select to begin Recording.
Pre-Setup: Select the TOFD Panel in Mentor Create to perform the TOFD Inspection. TOFD data 3. During the record process, select to Pause recording, which
recording can be done on the TOFD Scan panel allows recording to continue with a press of Record button.
4. During the record process, select to Stop recording, which

ends data collection.
5. During the record process, select to Clear the already-acquired

data while continuing recording.
6. Select Save to save recorded data. to Load to retrieve

previously save data.
7. Select only to change the default file name.
8. Files may be saved to the instrument or an external USB

storage device.
9. Select Save then wait while the file-saving process proceeds.
10. Saves parameter settings for the currently active application.

Settings can late be reloaded, but only in the same application.
11. Select to export a CSV (Comma Separated Value) file.

This numerical representation of on-screen graphical data can
be downloaded to a connected
Fig: Selection of Inspection Technique in Mentor Create when creating Panels
12. NOTE: The grayed-out controls are not available during
the recording process
3-35
TOFD Analysis
TOFD analysis can be performed using the 2 cross hair cursors. Cross hair cursor 1 maps to A-scan as per the scan position. Cross hair cursor 2 is used to support the sizing.
Cross hair measurement which are needed can be selected by the application author in create. The selected measurements will be displayed on TOFD image.
NOTE: Refer the Appendix A for TOFD measurements details.
3-36
3 – Touch the desired parameter control to activate it and (if

enabled) set its value.
4 – Press to change parameter value (if adjustable) or touch and
drag for coarse adjustment.
5 – Link icon indicates two parameters will be adjusted in equal
increments. Touch icon to unlink or re-establish this connection.
6 – When icon is unlinked, you can adjust each parameter
independently. Hold icon for two seconds to equalize values.
7 – Use keypad to input desired parameter value.
8 – Individual parameter controls may also appear anywhere on an
application panel.
9 – Press anywhere in this header area to deactivate the
parameter.
10 – Indicates that the parameter value is Locked. Parameters are
locked because the application’s architect intended the value to be
observed but not altered, or when displaying recorded data. In this
case, all parameters whose value affects only live data are locked
until the display is cleared.
11 – When panel design includes this button, select to alternate
Phased Array UT Setup between single-element and phased-array probe operation.

NOTE: that available menus, parameters, and settings differ
and Other Menus between single-element and phased array operation.
The UT Setup and other menus provide access to those parameters that impact test conditions. A
description of each parameter is found in the Appendix. Each application's architect determines
which parameters are viewable and adjustable.
1 – Each icon opens and closes a menu. These menu icons remain hidden until the user touches
somewhere on the Data View or unless a menu is currently open.
2 – Swipe vertically to scroll through menu parameters that may be off the bottom of the screen.
3-37
3 – Overview C-Scan display shows all data to be collected during

the architect-defined scan process.
4 – Active C-Scan display shows a user-defined zoomed view during

data evaluation and a portion of the C-Scan during the scanning
process.
5 – Amplitude Display indicates each probe element’s gate triggering
amplitude with the constantly updated green line. The red line
shows the maximum A-Scan amplitude observed by each beam
since the A-Scan was last cleared (by changing Gain or certain other
parameters, or hitting the CLR button). The purple band defines
the target amplitude and tolerance band for the TCG and Auto80
calibration procedures.
6 – Select the Display Icon to access parameters related to the
E-Scan / S-Scan display. Menu icons remain hidden until the user
touches somewhere on the Data View or a menu is currently open.
7 – Display parameters available for viewing or (if enabled)
Phased Array Data Display modification. Touch to activate.

8 – Clears the active display of data.
Screens 9 – Select to begin recording scan data. Scans must first be recorded
before saving data.
Phased array probe data can be displayed in one or more of five screen types. Display menus 10 – Select to Save currently acquired data (display must first be
control the appearance of each screen (provided the application's architect made these parameters frozen) or to Load previously saved data. Also allows saving or
viewable and adjustable). A description of each parameter is found in Appendix A. loading of settings.
NOTE: Double tapping on a data display screen enlarges it to full-display and returns it to 11 – Readout screens provide measured data values as selected by
original size. the application architect.
1 – A-Scan display screen. 12 – Various color palettes are available for both Amplitude and
Time of Flight data view screens.
2 – E-Scan / S-Scan display screen.
3-38
display.
1 – Select the center or a component of a gate on the A-Scan. All (as

shown here) or the selected component of the gate will highlight. Once
selected, drag the gate component to change gate position or dimensions.
This change will automatically occur to the gate position in the E-Scan
(right).
2 – When a gate is visible in the E-Scan display, selecting and moving
some portion of the gate will also effect its position in the A-Scan display.
3 – Select the Gate Icon to open the Gate Setup menu. These menu
icons remain hidden until the user touches somewhere on the data
display or unless a menu is currently open.
NOTE: Double tapping on a data display screen enlarges it to full-
display and returns it to original size.
4 – Drag up or down to access all gate-configuring parameters available
for viewing or (if enabled) modification. These include: the number of gates
enabled, the triggering logic of each gate, and each gate’s size and position.
Touch the desired parameter control to activate it and (if enabled) set its
Working with Phased Array Gates

value.
5 - Gate A and Gate B will work based on the reflector type for E-Scan /
and Beam Cursors S-Scan

• Radius - The gate position will be as per soundpath so the
During phased array operation, an application may incorporate as many as three A-Scan gates (IF, gates will appear as a curved line on S-Scan. Gate Start | End represents
A, and B). In addition to displaying the selected A-Scan gates, the E-Scan also includes a Beam Soundpath not the depth
Cursor, which allows the user to select for display the A-Scan signal generated by a specific • Depth - The gate position will be as per Depth so the gates will
probe element. appear as a straight line on S-Scan. Gate Start | End represents depth.
The Gate Setup menu provides access to those parameters that impact gate position, size, 6 – Select the E-Scan / S-Scan Beam Cursor and drag it to display the
and functioning characteristics. A description of each parameter is found in the Appendix. A-Scan signal from a specific probe element. In this case, the A-Scan
Each application's architect determines which gate-controlling parameters are viewable and associated with probe element 13 is displayed. In the view below, the
adjustable. Notice that the phased array Gate Setup menu is only accessible through an A-Scan Beam Cursor has been dragged to display the A-Scan from element 27.
3-39
Soundpath & Depth Gate with

S-Scan
S-Scan with Depth Gate for Depth Reflector
Working with Display

S-Scan with soundpath gate for Radius Reflector
Range for S-Scan
Range Start and Range End is used to define the Display range.
For sector Scan, the Display range is defined based on Reflector
Type.
• Radius - Range Start and Range End is considered as
soundpath. The same soundpath is applied for all beam angles.
• Depth - Range Start and Range End is considered as Depth.
Range End is used as depth value to be covered by all beam
angles. The beam with highest soundpth is applied for all beams
to display the sector.
3-40
Range Radius Range Depth
3-41
3 – A-scan from selected beam element

4 – C-scan Scan Axis (X direction)
5 – C-scan Index Axis (Y direction)
6 – Default menu icons and menus available with each type
of data view are shown here. Each application’s architect
may alter the available menus and their icons.
NOTE: See Appendix A for a listing of default menu
structures including parameter controls and their
descriptions. Menus and parameters available are
defined by the application architect.
7 – Gates menu
8 – Probe menu
9 – Wedge menu
10 – Focal Law menu
11 – Pulser Receiver menu
12 – Part menu
13 – UT Setup menu
14 – Display menu
15 – Scan Setup menu
Interpreting and Controlling Phased

16 – Analysis menu
Array Data Views

1 – C-scan (Top View). Touch and drag anywhere on this Overview C-scan to create this Selector Box,
which defines the contents of the Active C-scan.
2 – E-scan / S-scan (Frame View) with Beam Cursor, which selects a specific beam element’s A-scan for
display.
3-42
recognizable visual relationship between the C-scan and

the part, it is important to move the probe in one direction
and at a consistent speed across the part. Without the use
of a mechanical encoder, the instrument is unaware of the
operator reversing the probe’s direction of motion.
A Line Scan provides mechanical encoding only along the
Scan (X) Axis, while the Index (Y) Axis is defined only by
the electronically controlled sequential firing of the probe’s
elements.
Raster Scan provides two axes of mechanical position, so
the Index Axis is a combination of the sequential firing of
the probe’s elements and a mechanically encoded Index
Offset. The Scan Axis behaves the same on both Linear
and Raster Scans.
1 – Touch the C-scan display to activate the menu buttons,
then select this button to open the Scan Setup menu.
Access the Scan Pattern parameter to choose between
Line and Raster Scan.
Selecting the Scan Pattern 2 – Line Scan

Provided an application’s architect has enabled the Scan Pattern parameter,
3 – The Scan (X) Axis, in both a Line and Raster Scan, is
monitored by a mechanical encoder.
the type of C-scan pattern is a user- selected feature. Options include Line
Scan, Raster Scan, and Hand Scan. First, it’s important to recognize the 4 – A Line Scan’s Index (Y) Axis represents only the
terminology applied to C-scan axes: the X axis is known as the Scan Axis probe’s elements
while the Y axis is identified as the Index Axis.
5 – Raster Scan
Line and Raster Scans rely on an encoder to track movement along the
6 – A Raster Scan’s Index Axis represents a combination
Scan Axis while in a Hand Scan procedure the operator controls the probe’s
of the probe’s elements and a mechanically encoded Index
movement with no positional feedback to the instrument. To produce a
Offset (7).
3-43
Overview and Active C-Scan

Displays
The Overview C-Scan display allows the user to identify a point or area of interest, a zoomed view
of which can then be observed in the Active C-Scan display.
NOTE: that the statistical data provided for a selected C-Scan portion is defined by the
applications’ architect and may vary from one application panel to another.
1 – Overview C-Scan display shows all data to be collected during the architect-defined scan
process.
2 – Touch and drag Overview C-Scan crosshairs to a point of interest. Values related to the point
under the crosshairs appear across the top of the screen.
3 – Touch and drag the Overview C-Scan to create a Selector Box. The Active C-Scan display shows
a zoomed view of the contents of this user-defined box.
4 – Double tap the Active C-Scan, enlarging it to full-display. Then touch and drag the Active C-Scan
crosshairs to a point of interest. Specific values selected by the application's architect and related
to the point under the crosshairs appear along the top of the Active C-Scan screen.
5 – Touch and drag the Active C-Scan to create a Selector Box. This data-box displays statistical
data related to the C-Scan contents defined by the Selector Box.
NOTE: that the Active C-Scan crosshairs automatically relocate to the center of the Selector Box.
6 – Double tap the Active C-Scan to return it to normal size.

NOTE: that the E-Scan and A-Scan display views now show the data associated with the
point under the Active C-Scan crosshair. The A-Scan shown actually represents the exact
point under the C-Scan crosshair, while the E-Scan displays the entire phased array probe
frame that included the A-Scan. The E-Scan’s beam cursor position corresponds with the
displayed A-Scan.
3-44
Volume Corrected C-scan & B-scan

To simplify the image interpretation and to provide better enhanced images to the operator who performs the inspection, providing the volumetric merged C-scan and
B-scan on the image as live while acquiring the data will change the perception of phased array ultrasonic images on device and it will open up for lots of simplification like
performing the on device assisted indication sizing just by using the C-scan & B-scan etc., The below images will show the advantages of Volume Corrected C-scan vs Un
Corrected C-scan. Below figure explains the projection of Volume Corrected C-scan & B-scan data as how it is represented in Mentor UT
Fig: Single Frame of Volume Corrected C-scan & B-scan
Active B-Scan Displays

Mentor UT supports the B-scan view with Angle Correction, which projects all of the beam along the Scan Axis versus Material Depth. The B-scan shows the data of Active
Probe Position for the Raster Format. For analysis, the B-scan projects the data according to the Active Box region drawn on the Overview C-scan. Defining the box on the
B-scan display the Statistical Measurement according to the area of the box. The B-scan can display the data as per the Data Source of “Amp A-scan”; “Amp A”; “Amp B”.
The following figure shows a B-scan display. The left-side image is the Overview C-scan with the active box defined to be displayed on Active C-scan & B-scan shown in the
magenta-colored box is tOn the right side of the image top one the Active C-scan and its respective B-scan. Based on definition of Active Box in Overview C-scan the B-scan
will be projected based on the maximum amplitude with respect to Index Axis.
3-45
Fig: Overview C-scan (left) with Active C-scan & Active B-scan (right)
Fig: Sector Scan with Volume Corrected C-scan & B-scan
Fig: Projection of Active C-scan & B-scan based on the Active Box defined on the Overview C-scan
3-46
Dead Element Check

1 5 When included by an application’s architect, the Dead Element Check
compares the A-Scan amplitude achieved by each phased array probe
element to identify any inoperative probe elements.
1 – The Dead Element Check evaluates signals from each of the elements
in a phased array probe. When non-functioning or “dead” elements are
detected, the specific element(s) is identified.
2 – The process will begin automatically when this banner appears at the
3 top of the display.
1 3 – Follow on-screen instructions to couple the attached phased
array probe to a calibration block. In this case the upper E-Scan display
indicates the A-Scan response of each of the 30 probe elements. The
1
lower data view, the Amplitude Display, uses the constantly updated
2 Place the probe on calibration block and press calibdrate button.
thin green line to indicate each element’s gate triggering amplitude.
The thin red line represents the maximum A-Scan amplitude observed
1 by each beam since the A-Scan was last cleared. This red maximum-
amplitude line is cleared by changing Gain or other parameters that
4 directly impact amplitude, or by hitting the CLR button.
4 – Continue by pressing the Calibration button.
5 – This message will display after successful completion of the Dead
5 Element Check. If non-functioning elements were detected, they would
be identified on the display screen.
3 2 Place the probe on calibration block and press calibdrate button.
NOTE: Gate B is needed for dead element check for the detection of a short circuited
dead-element evaluation. Gate B should NOT be modified or turned off for dead element
check.
3-47
Velocity Calibration (Multi-Step)

When included by an application’s architect, the Velocity Calibration compares the A-Scan
triggers for two different known-thickness calibration blocks. The resulting TOF values are
used to calculate the velocity of sound through the test material.
NOTE: The velocity of sound in the calibration material is calculated using data from
a single beam selected by the E-Scan/S-Scan cursor and shown in the A-Scan display.
An alternative velocity calibration method, Multi-Backwall, may be selected by the
application’s architect.
1 – The velocity calibration evaluates time-of-flight through a calibration sample of two

known thicknesses to determine the velocity of sound through the material. Two A-Scan
gates are used, one positioned to capture the echo from each known thickness.
Ref 1 and Ref 2 parameters located under Calibration Setup menu are user reference
soundpath or depth for velocity calbration.
NOTE: Ref 1 and Ref 2 parameters will function along soundpath for "Reflector
Type Vel" as "Radius". The same parameter will function along material depth for
"Thickness" and "Depth" reflector type
2 – The process begins automatically when this banner appears at the top of the display.
3 – Follow on-screen instructions to couple the attached phased array probe to a calibration
block. Capture the first known thickness in Gate A.
NOTE: that the color in the E-Scan indicates an A-Scan echo of nearly full screen height.
Press the Calibration button to continue.
4 – Follow on-screen instructions and capture the second known thickness in Gate B.
NOTE: that the color in the E-Scan indicates the height of the A-Scan echo. Press the
5 – This message will display after successful completion of the Velocity Calibration. 'The
Velocity Icon changes from Yellow to Green on Successful calibration procedure.'
3-48
NOTE: The velocity of sound in the calibration material is calculated using

data from the single beam selected by the E-Scan cursor and shown in the
A-Scan display. An alternative velocity calibration method, Multi-Echo,
may be selected by the application’s architect.
1 – The velocity calibration evaluates time-of-flight through a calibration sample
of one known thickness to determine the velocity of sound through the material.
Two A-Scan gates are used, automatically positioned to capture consecutive
echoes from the known thickness.
Ref 1 and Ref 2 parameters located under Calibration Setup menu"are user
reference soundpath or depth for velocity calbration.
NOTE: Ref 1 and Ref 2 parameters will function along soundpath for
Reflector Type Vel as Radius. The same parameter will function along
material depth for Thickness and Depth reflector type.
2 – To select the velocity calibration process, touch the E-Scan display to display
menu selection buttons, then press this button to access the Part Setup Menu.
Set the Velocity Cal Type to Multi Backwall (or Multi Step as described on
the previous page of this manual) and specify the S-Ref 1 thickness. Gates A
and B will be automatically positioned based on this thickness setting.
5 NOTE: The Multi Backwall Velocity Calibration process should not be used
for DM type probes.
3 – The process will begin automatically when this banner appears at the top
of the display.
Velocity Calibration (Multi- 4 – Follow on-screen instructions to couple the attached phased array probe
to a calibration block. Capture the known thickness in Gate A.
Backwall) NOTE: The color in the E-Scan indicates an A-Scan echo of nearly full screen
When included by an application’s architect, the Multi-Backwall Velocity Calibration compares height. Press the Calibration button to continue.
A-Scan gate triggers from two consecutive backwall echoes. This process requires only one 5 – This message will display after successful completion of the Velocity
known-thickness calibration block. The resulting TOF values are used to calculate the velocity Calibration. The Velocity Icon changes from Yellow to Green on Successful
of sound through the test material. calibration procedure
3-49
3 Delay / Zero Point Cal

1 – The Delay Calibration is used to calibrate the individual beam wedge delay
of the attached probe and wedge. An A-scan gate is positioned to capture the
echo from the known reflector. (Thickness/Depth/Radius)
2 – Define the Reflector Type as Thickness or Depth or Radius for the delay
calibration.
3 – Follow on-screen instructions to couple the attached phased array probe
to a calibration block. The amplitude is triggering the Gate A Threshold for all
the beams. Start the calbration by pressing Calibration button.
4 – Move the probe on Reflector to record the Time of Flight for each beam. In
1 case of 0 deg E-scan with thickness and if the block is wider to cover all the
beams, then probe doesn't need to be moved. Record the TOF by pressing
Calibration button.
5 – Once "Record the Indication and Press Calibrate" banner appears. Move
the probe on SDH or Radius or Backwall to verify all the beams are within
defined tolerance and press Calibration button.
4 NOTE: Depth Envelope view can be used to see the depth values are
within tolerance limit. For "Radius" or "Thickness" reflector type delay,
5 set the "Range Ruler" as "Soundpath" under display menu of Depth
Envelope view to visualize the soundpath of all the beams. For "Depth"
reflector type delay, set the Range Ruler as Depth under display menu of
6 Depth Envelope view to visualize the depth of all the beams.
NOTE: The delay is calculated uniquely for each beam compensating for
any variation in wedge construction.
6 – Probe Delay readout will display the delay applied for the selected beam.
3-50
TCG Calibration (Multiple Step)

When included by an application’s architect, the TCG (Time Corrected Gain) Calibration compares
the A-Scan indications from multiple echoes taken from different known-thickness calibration
blocks. Two alternative TCG calibration procedures are described in the next two pages.
In practice, the TCG function displays reflectors of equal size at equal A-Scan amplitudes,
regardless of the reflector’s depth in the test material. This is accomplished by adjusting the
gain at different locations in the A-scan display, corresponding to different material depths, to
compensate for signal loss (or variation) due to attenuation, beam spread, or other factors.
NOTE: A purple band appears on the Amplitude Display during the TCG calibration
procedure. The band is centered on the TCG Target Amp setting, with a width defined by
the Amplitude Tol setting. During the TCG calibration process, gain is added to increase the
amplitude of each echo until it falls within this band.
1 – Begin the process by pressing the Calibration button.
2 – The TCG Calibration (multiple step option) evaluates backwall or SDH or radius echo A-scan
amplitudes from the multiple TCG points. The procedure can involve up to 16 TCG points. The
application shown here requires five different thickness readings.
3 – Continue to follow on-screen instructions to couple the attached phased array probe to the
correct calibration block until all five thicknesses are recorded. Make sure the gate captures the
correct A-Scan echo for each of the TCG points, then press the Calibration button to record that
point and continue.
4 – After following the on-screen instructions to capture the last known thickness, press the
Calibration button to complete the TCG Calibration process.
5 – This message will display after successful completion of the TCG Calibration. The caliper icon
appears after any successful calibration procedure. Reflectors of equal size will now appear
on the A-Scan display as echoes of equal amplitude, regardless of differences in material
depth.
5
3-51
TCG Calibration (Multiple Backwall)

When included by an application’s architect, the TCG (Time Corrected Gain) Calibration Multiple
Backwall option compares recurring A-Scan backwall echoes from a calibration standard of one
known thickness.
NOTE: that two alternative TCG calibration procedures are also described in this manual.
In practice, the TCG function displays reflectors of equal size at equal A-Scan amplitudes,
regardless of the reflector’s depth in the test material. This is accomplished by adjusting the
gain at different locations in the A-scan display, corresponding to different material depths, to
compensate for signal loss (or variation) due to attenuation, beam spread, or other factors.
NOTE: A purple band appears on the Amplitude Display during the TCG calibration
procedure. The band is centered on the TCG Target Amp setting, with a width defined by
the Amplitude Tol setting. During the TCG calibration process, gain is added to increase
the amplitude of each echo until it falls within this band.
1 – Select this button to open the TCG Setup menu, then confirm that TCG Type is set to Multi
BW. If allowed by the application’s architect, Reflector Type and Number of TCG Points may
also be input.
NOTE: "TCG Reflector Type - Depth" cannot be used for the Multi Backwall TCG calibration
in both E-scan and S-scan. "TCG Reflector Type - Radius" can be used for Multi Backwall
TCG calibration in S-scan. "Radius" reflector cannot be used for E-scan.
2 – Select this button to open the Calibration Setup menu, then input the thickness of the
calibration standard. Remember, the Multiple Backwall TCG calibration process relies on
recurring backwall echoes from a single known thickness or radius.
3 – Begin the process by pressing the Calibration button.
4 – Continue to follow on-screen instructions to couple the attached phased array probe to the
calibration block. The calibration process automatically steps the A-Gate from one recurring
backwall echo to the next until the number of specified echoes (in this case, three) are recorded.
5 – This message will display after successful completion of the TCG Calibration. The caliper icon
appears after any successful calibration procedure. Reflectors of equal size will now appear on
the A-Scan display
as echoes of equal amplitude, regardless of differences in material depth.
3-52
TCG Calibration (Depth / SDH)

When included by an application architect, the TCG (Time Corrected Gain) Calibration compares the
A-scan indication from multiple echoes taken from different known reflectors. In this case, the reflectors
are side drilled holes (SDH) drilled into a calibration block at different known depths. Two alternative TCG
calibration procedures are described on the previous pages.
In practice, the TCG function displays reflectors of equal size at equal A-Scan amplitudes, regardless of the
reflector's depth in the test material. This is accomplished by adjusting the gain at different locations in
the A-scan display, corresponding to different material depths, to compensate for signal loss (or variation)
due to attenuation, beam spread or other factors.
NOTE: A purple band appears on the Amplitude Display during the TCG calibration procedure.
The band is centered on the TCG Target Amp setting, with a width defined by the Amplitude Tol
setting. During the TCG calibration process, gain is added to increase the amplitude of each echo
until it falls within this band.
1. The TCG Calibration (Multiple Step type with a SDH reflector) evaluates the amplitude of an A-scan echo
recorded by measuring SDH drilled into a calibration block at multiple different known depths. Tap the
Amplitude Display screen, then choose the indicated menu button to open the TCG Setup Menu. Specify
the TCG Type, TCG Reflector, and TCG Count values. The procedure can involve up to 16 different points.
The application shown here requires two different TCG readings.
2. Begin the process by pressing the Calibration button.
3. Continue to follow on-screen instruction. Couple the attached phased array probe to the correct
calibration block until reflector from holes are recorded. Ensure the gate captures the correct A-scan echo
for each of the TCG points, then press the Calibration button to record that point and continue.
4. Re-scan the reflector to verify that the amplitude of all beams are within the tolerance and press
Calibrate button. If all beams are within tolerance software automatically moves to the next TCG point. If
not record the scan until all beams are within tolerance.
6
5. After following the on-screen instructions to capture the last known reflector, press the Calibration
button to complete the TCG Calibration process.
6. This message will display after successful completion of the TCG Calibration. The TCG icon appears after
any successful calibration procedure. Reflectors of equal size will now appear on the A-scan display as
echoes of equal amplitude, regardless of differences in material depth.
3-53
When included by an application’s architect, the Sensitivity Calibration
adjusts the gain so that the A-Scan echo from a known reflector appears
at same amplitude for a reflector.
NOTE: A purple band appears on the Amplitude Display during the
Sensitivity calibration procedure. The band’s width is defined by
the Amplitude Tol setting. Sensitivity calibration can be done as
Sensitivity Type as "Selected Beam" or "All Beams".
• Selected Beam - Amplitude correction as per reference amplitude
is done as per selected beam and the same gain correction is
applied for all other beams.
• All Beam - Amplitude correction as reference amplitude is done
for all beams based on the Active Amplitude for all beams. So for
S-scan, only Radius Reflector is recommended to use for All Beams.
1 – The Sensitivity Calibration evaluates the echo detected from a
known reflector with a calibration sample and adjusts display gain so
that the echo’s maximum amplitude appears at Reference Amplitude of
full screen height.
2 – The process will begin automatically when this banner appears at
the top of the display.
3 – Follow on-screen instructions to couple the attached phased array
probe to a calibration block. Capture the known reflector in the gate as
shown. Press the Calibration button to continue.
NOTE: Software performs the recording of amplitude for all beams
and apply sensitivity correction in single step when "Recording
= Off". This is applied when you dont need to move the probe to
record the indication (ex: Backwall of 0 deg E-scan or Radius of
S-scan).
4 Software performs the recording of amplitude for all beams and apply
of sensitivity correction in 2 step process when "Recording = On". This is
applied when you need to move the probe to record the indication (ex:
SDH / FBH of 0 deg E-scan or SDH/ Notch / Radius of S-scan).
4 – This message will display after successful completion of the
Sensitivity Calibration. The caliper icon appears appears green from
orange" after any successful calibration procedure.
3-54
Scanner / Encoder Check

When included by an application’s architect, the Scanner Check compares the encoder
signal received from the scanning fixture and compares it to the application’s as-
designed values. The procedure requires movement of the scanner from an origin
point, which is identified on its base, to a point near its extreme limit of motion and
back to the origin. The check evaluates encoder accuracy as well as system hysteresis.
1 – The scanner’s range of motion and allowable variance is input by the application’s
architect. The process will begin automatically when this banner appears at the top of
the display.
2 – Follow on-screen instructions by moving the scanner to one of the marked origin
points, then press the Calibration button.
3 – Move the scanner to the extreme range of motion (in both X and Y directions) away
from the origin. Again, press the Calibration button.
4 – Return the scanner to the same origin point used in item 2, then press the
Calibration button.
5 – This message will display after successful completion of the Scanner Check. The
small display boxes at the bottom of the display screen show the actual measured
values of scanner motion.
3-55
Clearing Calibration
Data
Anytime after a calibration has been performed, stored
calibration data can be cleared by following this procedure.
1 – The calibration icon turns from orange to green when

the respective calibration is done
2 – Press and hold to clear stored calibration data

resulting from Velocity, TCG, and Probe Delay calibrations.
3 – Select to confirm and continue the data-clearing

process.
3-56
Recording/Saving Phased Array Data 1 – Select to begin Recording.

2 – During the record process, select to Pause
Follow these instructions to Save any acquired UT data. To save the results from recording, which allows recoding to continue with a
a phased array scan, the record feature must be activated before beginning the press of the Record button.
scanning process. To save single-element probe data, freeze the display.
3 – During the record process, select to Stop recording,
which ends data collection.
4 – During the record process, select to Clear the
already-acquired data while continuing recording.
5 – Select Save to save recorded data or Load to
retrieve previously saved data.
6 – Select only to change the default file name.
7 – Files may be saved to the instrument or an external
USB storage device.
8 – Select Save, then wait while the file-saving process
proceeds.
9 – Saves parameter settings for the currently active
application. Settings can later be reloaded, but only in
the same application.
10 – Select to export a CSV (Comma Separated
Value) file. This numerical representation of on-screen
graphical data can be downloaded to a connected USB
memory device. The CSV grid file’s spatial resolution
is determined by the Grid settings in the C-Scan
Analysis menu.
11 – NOTE: that grayed-out controls are not
available during the recording process.
3-57
Manual Index
Manual Indexing is the feature to achieve the Raster Scan format
with one encoder for scan axis and the indexing can be done with
soft click on the software. The software will move the area of
interest to the new area based on the beam width (between first
and last beam) and the index overlap percentage defined by the
user.
To achieve the Raster Scan format with Manual Indexing, do the
following:
1. Set the Manual Index = ON for the indexing without second
encoder.
Press Record Button to display Manual Indext buttons Manual Index buttons during Record Process
2. Define Index Overlap % as how much overlap has to attained
between first and second pass.
3. Press RECORD button to start the record process. When Manual
Index is ON and during the record process the Manual Index with
buttons will appear on C-scan.
4. After the first pass of scanning is done, press on upper arrow at
top right or top left buttons to move the area to the next pass.
5. Place the probe to new index region with overlap and acquire
the data in raster format.
6. To go back to previous pass region, press the down arrow on
C-scan at Bottom Left or Bottom Right.
After 1st pass, press UP arrow to index to new area New area acquisition without 2nd axis encoder
NOTE: Manual Index arrow buttons appear only during the record
process. It will not appear before recording or after recording is
done.
3-58
Overlay
The graphic overlay feature allows the user to use preset overlays while viewing an angle corrected linear or sector scan image. The overlay control parameters are located
in the Part Settings for E-scan / S-scan and in the Display Menu for C-scan.
The overlay image is linked to the position of the origin line. Moving the origin line will move the overlay on the image. The OVERLAY DISPLAY parameter is used to display
or hide the overlay once it has been defined.
There are preset overlay types to choose from. The following preset overlays are supported:
• None - No overlay will be drawn
• Scan Area - To define scanning area of interest on E-scan and C-scan
• V-Weld - V type weld preparation, centered around the origin line
• VV-Weld - X type weld preparation, centered around the origin line
• J-Weld - J weld preparation, centered around the origin line
• Rectangle - To define the rectangular box as area of interest on E-scan or S-scan
To select and set up an overlay:
1. Setup the desired scan according to the test being performed.
2. Navigate to the Part menu
3. Select Overlay Type as "None", "Scan Area", "V-Weld", "VV-Weld", "J-Weld", "Rectangle"
4. Using the dimensioned drawing that is displayed as a reference set each of the dimension parameters to describe the part or region being inspected.
5. Once all dimensions have been set properly activate the overlay by setting Overlay as ON.
3-59
Overlay Presets Asymmetric V-Weld Overlay

Terminology
Symmetric V-Weld
Terminology with V-Weld
Overlay on S-scan
Asymmetric VV-Weld Overlay

Symmetric VV-Weld
Terminology
Overlay Terminology
with VV-Weld Overlay on
S-scan
Symmetric J-Weld Asymmetric J-Weld Overlay

Overlay Terminology Terminology
Part Entry Point
Range End - Start

Rectangle Overlay Scan Area Overlay Terminology
Origin Line
Terminology
B A
3-60
Phased Array UT Multigroup

Mentor UT can perform the Multigroup inspection of Phased Array UT. Each Sector Scan or Linear Scan configuration is called as Group. Combination of more than one Sector
Scan or one Linear Scan is called as Multigroup Inspection. The Multigroup Configuration can be done with the same probe or different probe. When the multigroup application
is launched all the defined group will acquire the data when performing inspection.
You have to pre-define the number of groups needed for the application using the Mentor Create software. Once the number of groups are pre-defined, the groups count
cannot be increased by adding a new group on the instrument. Similarly, the group count cannot be decreased by deleting the pre-defined group. However, user can modify
the settings of each probe, group etc., on the instrument.
Multigroup Weld Configuration

For the Multigroup Weld Inspection user can now configure the Sector scan; Linear Scans with different angle on the same probe and also user can connect more than one
probe with the Mentor UT. User can select the Wave Type for each group and hence it can be used for Couplant Check.
Fig: Mentor Create - Configuration of Multigroup with 2 Probes & 2 Groups under Probe 1
3-61
Fig: Mentor Create - Parameter Configuration in PA Setup based on the Group Selection
Multigroup Probe Configuration

The multiple probes can be connected to Mentor UT using the Y-Probe or using the splitter box. In both the cases user need to define how the splitting is hardwired on
Y-Probe or how its hardwired on the splitter Box. Each added probe in the application have a parameter “Split Channels” and as per the connected Y-Probe or Splitter user
need to enter as per the physical channels. According to the Split Channels the probe elements will be physically mapped.
User can configure the First Element of each probe connected with Probe Element as 1 since the Split Channel will internally map the physical channel connected to the
instrument.
NOTE: Mentor UT supports up to 4 probes can be connected as maximum probes count
3-62
Y-probes 64:64 Splitter

TYCO 64:64 is the probe splitter which can be connected on the MUX module
Y-Probes are the one which has hardwired on probe connector for the Probe 1 &
and user can connect any 2 probes with elements <= 64 on each connector of
Probe 2. In case of 2x16 element Y-Probes, if its wired as 1-16 for Probe 1 & 33-48
the split box.
for Probe 2, we have to consider that 32 elements are used to split the 1st probe
and 32 elements for 2nd probe. So we have to configure as mentioned below:
• Probe 1: 32
• Probe 2: 32
Fig: Mounting 2 separate 64 Element PAUT probes on the Splitter Box
The same split box shall be able to use for Linear Array or DM Array or PR PAUT
Probe.
Fig: Y-Probe with 2 PAUT probe connected to single connector
3-63
Split Channel Configuration • Probe 1: Split Channel = 64; First Element = 1; Last Element = Up to 64
o If 16 or 32 elements are connected, then enter the Last Element
as 16 Elements or 32 Elements accordingly
Split Channel is the parameter used in Mentor UT that define how many channels are allocated o If user doesn’t want to use all the 64 elements but wants to use
for each probe connector. If the splitter is 64:64, then user must enter as mentioned below: only 48 elements of 64 elements probe, then user can set the Last
Element = 48
• Probe 1: 64 o If user doesn’t want to use all the 32 elements but wants to use
• Probe 2: 64 only 24 elements of 32 elements probe, then user can set the Last
Element = 24
With the proper configuration of Split Channel parameter in instrument, Elements Allocated on • Probe 2: Split Channel = 64; First Element = 1; Last Element = Up to 64
each splitter or each probe will automatically map the 1st Element. So user can always consider o If 16 or 32 elements are connected, then enter the Last Element
the First Element of each probe as 1. as 16 Elements or 32 Elements accordingly
o If user doesn’t want to use all the 64 elements but wants to use
only 48 elements of 64 elements probe, then user can set the Last
Element = 48
o If user doesn’t want to use all the 32 elements but wants to use
only 24 elements of 32 elements probe, then user can set the Last
Element = 24
NOTE: With 2x64 Splitter (2x32 element DM Probe can be

connected) at same time and perform Multigroup of 2 Linear
Scans. Or one side upto 64 element Linear Array Probe and another
side upto 32 DM Array Probe can be connected & Used as 2-Probe
multigroup
Fig: 2x64 Element PAUT probe directly connected on the Mentor UT
3-64
Group Display
Mentor UT can display only one group per data view (Frame View; C-scan & B-scan). Every data view (i.e., Frame View; A-scan; C-scan; B-scan; Amplitude Map View; Depth Map
View) have the option to select the Group. User can select the group to be displayed in each data view for the Multigroup Application. If the data views are linked to a Frame
View in the panel then all the linked view display the same group. In case of non-linked data view the group display can be selected independently.
For the calibration panels the Group Display and Active Group will share the same Group. Either by selecting the Group on the Group Display parameter or on the title bar
will select the same group. Each group have the unique ID when created using Mentor UT. This unique ID is used as Group Display Annotation on each data view. The Group
Annotation can be turned On/Off using the Group Annotation parameter placed under the display settings of each data view.
Fig: 2-Sided Weld Inspection with 2 sector scan
Fig: 3 Groups with “Sector + Linear 60° & Couplant Check” Scan on same probe
3-65
Active Group
Active Group is the group that is used for performing the calibration when there is more than one group present in the App. When there is a parameter placed in the panel
that parameter display the value of the Active Group selected in the Title Bar.
Figure: parameters can be update based on Active Group. When placing the Gain icon on the panel and when there are multiple group present in the panel and if user change the Gain then modified
gain will be applied for the Active Group selected. When the readouts are placed on the data view, it will show the readout value of the Active Group selected on the Title Bar.
NOTE: Active Group is different than the Group Selected to display in each data view (ex: Frame View; A-scan; B-scan & C-scan). The Active Group
& Group Select is synchronized only in Calibration Panels (ex: Dead Element Check; Velocity; Delay; Sensitivity; TCG & Encoder)
3-66
Calibration Icons
Mentor UT displays the status of Calibration support for Phased Array UT & Conventional UT. The calibration icons display on the title with color coding.
When the Phased Array UT Mode is selected the following Calibration icon sets will be displayed in Orange Color. Group ID is displayed as 1st annotation
followed by the set of calibration icons:
• Velocity
• Delay
• TCG
• Sensitivity
• Encoder
Fig: Group ID & Calibration Indicators before Calibration is done
When the calibration is done the respective icon will display in green color. The calibration icon set displays for each group as per the number of groups defined
in the application. On tapping the Calibration Icon set on Title Bar display the calibration status of each group.
• The velocity calibration icon turn to green for all the group which has same Wave Type when the velocity calibration is done for one group.
• The Delay calibration; Sensitivity & TCG must be done for each group separately.
• The Encoder Calibration icon turn to green for all the group when its done once.
Fig: Group ID & Calibration Indicators after all Calibration are done
3-67
Skew Angle
Skew is used to determine the direction in which the probe is placed on the specimen. Mentor UT can be configured with the Skew Angle from 0° to 359°.
The Skew Angle can be used for any application. Based to the Skew Angle the Beam Direction along the index axis will change on the Frame View; C-scan. The
previous Probe Orientation of Normal & Reversed direction is replaced by Skew Orientation to follow the single co-ordinate system. The previous Reversed
option is mapped with 270°.
Fig: Sector Scan on Left Side is 90° Skew Angle; Sector Scan on Right Side is 270° Skew Angle
Fig: Sector Scan with Skew Angle 90° Fig: Sector Scan with Skew Angle 270°
The index offset can be set as positive value for both angle. According to the Skew Angle the index offset direction is calculated as positive or negative value
in the software. Skew Angle has to be defined for each probe defined for the application. All the groups under same probe have the same skew angle.
3-68
Global Gain & Gates

Global gain is the parameter that applies the same gain to all the groups. Global Gain will be useful when the same Gain Offset needs to be applied for all the
groups for inspection. Global Gain is applied in addition to the Gain applied for each group. The Global Gain will limits are dynamically adjusted as per the Gain
value of all groups since both the Gain and Global Gain are interlinked.
Gates can be set as “Global” as “Group” using the parameter “Gates Linkage”. For the Global Gates, all the Gates will share the same value of Gate Start &
Gate End. If the Groups are set with Reflector Type as Radius or Depth, the Gate Start & Gate End values share the values along Soundapth or Material Depth
in each group.
Y-Probe or Splitter Box Configuration

The multiple probes can be connected to Mentor UT using the Y-Probe or using the splitter probe. In both the cases user need to define how the splitting is
hardwired on Y-Probe or how its hardwired on the splitter Box. Each added probe in the application have a parameter “Split Channels” and as per the connected
Y-Probe or Splitter user need to enter as per the physical channels. According to the Split Channels the probe elements will be physically mapped.
User can configure the First Element of each probe connected with Probe Element as 1 since the Split Channel will internally map the physical channel
connected to the instrument.
3-69
Statistical Measurement
Statistical Measurement are the measurements that provides the statistical values as per the area of interest defined on the Active C-scan or Active B-scan.
Statistical Measurement needed for the application can be defined by the author from independently on each Active C-scan and each Active B-scan. Statistical
Measurements can be seen when the data recording is in Pause or after data recording is stopped.
NOTE: Description of each statistical measurement is defined in Appendix of Parameters
Figure: Statistical Measurement
3-70
Interpreting the LED Indicator

Light
1 – This LED light changes color and/or flashes to indicate instrument
status, gate-triggered alarms, or other conditions.
During Normal Operation:
Red LED – Gate Alarm
Green LED – normal run, no external power
Cyan LED – normal run, with external power
Blinking Magenta LED – Microcontroller is currently being updated or
microcontroller firmware is damaged and needs to be updated
When the Instrument is Powered Off:
No LED – Instrument is off and the external charger is not connected
Blinking Blue LED (once/sec) – battery is being charged
Fast Blinking Blue LED (twice/sec) - battery is too warm - charging will
resume when battery cools.
Blue LED – batter is fully charged and the charger is connected
Blinking Red LED - Instrument battery exhausted, charge immediately OR
battery overloaded during use.
While the Instrument is Powering On:

Blinking Yellow LED – Instrument is powering up, FPGA is being configured
(Operator can release power button)
Blinking Magenta LED - Instrument is powering up, but there’s an internal
power supply failure
3-71
Accessing the Menu View

1 – Press to open this Menu View and access the following four
selections:
2 – Settings Button – Press to adjust display screen appearance and
instrument connectivity settings.
3 – File Manager – Press to access reports and other files. Also allows
access to attached USB storage device.
4 – Mentor PC Live - Select to connect the Mentor UT with PC for PC
based data acquisition and processing.
1
5 –InspectionWorks Connect – Select to launch the optional internet-
based system allowing collaboration between an inspector and a remote
expert.
2 3 4 5 6
6 –Shut Down – Press to turn off the Mentor UT.
7 –Press to return to the previously active display screen.
3-72
Working with Stored Files

1 – Press to access and select the File Manager button, which opens the
Application List Display.
2 – From this Application List Display, you can perform one of three actions
(items 3 through 5). NOTE: Users can slide the view to the left or right to access
additional pages. Number of circles at bottom center of a display indicates
how many additional pages are viewable. Open circle indicates the position
of the current view in relation to all available pages.
3 – Choose to display all Application, Report, Data, Setting, or Image files stored
in the instrument or from another Location (such as a connected USB storage
device). Choose Sort to control the arrangement of the displayed files.
4 – Select to open this Application Information box that, along with
providing a description of the application, allows the application to be deleted.
5 – First choose an application whose files you wish to access by selecting it with
a finger tap. The application's name appears across the top of the File Manager
display. Now, choose Filter by to display only the Report, Data, Setting, Image
or All files associated with the selected application. Choose Sort to control the
arrangement of the displayed files.
6 – Selecting either of these buttons at any time returns to the Application List
Display.
7 – Choosing any item in a displayed list changes its displayed text to blue and
allows it to be Uploaded (from the instrument to a connected external device)
or Downloaded (from the connected device to the instrument). Choose Select
Location to access the connected USB storage device and, after selecting the file(s)
to be moved, click either to Upload the file to the USB device or to
Download the file to the instrument.
8 – Deletes or Renames the selected file(s).
9 – Allows you to create and name a folder (directory) on the connected external
device.
10 – Select to delete application.
11 – Touch and hold to preview the file. PDF (or other) preview window opens as
shown here.
3-73
3-74
Generating and Viewing a

Report
1 – Select at any time generate a report, which contains a record of
parameter settings as well as a capture of the active display screen. The
report will be automatically stored (as a .pdf file type) in memory and its
name will temporarily appear in a banner across the top of the display
screen.
NOTE: Report will be generated as per the "Inspection Technique"
assigned on the respective panel.
If the panel is assigned with "Inspection Technique as Phased Array", only
phased array related parameters will be generated as report. The same
applies when the panel is assigned with Inspection Technique as "TOFD"
or "CV"
2 – Select at any time to capture a copy of the active display screen. The
screen capture will be automatically stored (as a .jpg file type) in memory
and its name will temporarily appear in a banner across the top of the
display screen.
3 – Select this button to access the menu display, then open the File
Manager.
4 – All stored files related to a specific application are found in a folder
labeled with the application’s name. When the File Manager opens,
select the folder to view and access files.
5 – First page of a typical report
6 – To view the report on the Mentor UT, press and hold the report name
in the file manager.
3-75
Changing System
Settings
1 – Press to open the Menu View then select the System Settings
button.
2 – Adjust screen appearance including choosing color scheme for
indoor or outdoor viewing.
3 – Regional Settings allows the user to select Units of Measure, Date
and Time Format, and the type of decimal point displayed.
4 – Set the time and date formats. Time servers automatically set time
and date each time the instrument connects to the internet.
5 – Input server settings and run a network test for this optional
internet-based collaboration feature.
6 – Turn WiFi access on or off.
7 – Configure for remote access through a VNC desktop.
8 – Install an application or upgrade the instrument’s software using a
GE-supplied file.
9 – Determine the software version installed in your instrument.
10 – Provides information on the health of various critical hardware
parameters. This information is primarily used when seeking service
help from GE Tech Support.
11 – Access the IP address of the instrument's Ethernet connection,
typically used in factory automated testing.
12 – Returns to previously active display screen.
3-76
Mentor PC Live
Mentor UT can be connected to a remote PC or laptop using the Ethernet Cable. The connected
instrument can be controlled by the PC using the Mentor PC software. Once the connection between
the PC and the Mentor UT is established the Mentor PC will become Live and display the A-scans
& other data views on the PC.
Mentor UT screen will be freezed since the data acquisition will be transferred to PC and the live
data is processed as per the Apps in the PC location
To establish the Mentor PC Live connection:

• Connect the Ethernet cable to the Mentor UT & PC (Its recommended to connect the Ethernet
cable before turning ON the Mentor UT)
• Turn ON the Mentor UT and once its booted up, Go to Settings and Open the Mentor PC Live icon
• On the PC launch the Mentor PC software. Go to Settings and open the Mentor PC Live icon
• Enter the Wired IP address in Mentor PC as shown in the Mentor UT instrument connected
• Click on Start button on the Mentor UT
• Click on Connect on the Mentor PC
• Once the connection is established, Launch the app and proceed the data acquisition.
NOTE: Mentor PC Live can use the maximum length of 100 meters of Ethernet cable
Mentor PC Live Auto Connect:

Mentor PC will automatically be connected to the previously connected device IP when “Auto
Connect” icon is enabled. After “Auto Connect” icon is enabled, Mentor PC will retain the previously
entered IP address. PC Live configuration page will open when Mentor PC is restarted. Mentor PC
will automatically establish the connection with Mentor UT device.
3-77
Fig: Mentor PC Status when it is not connected Fig: Mentor PC Status Waiting for Connection
Fig: Mentor PC Status when it is connected
Mentor PC File Management

The Apps, Data, Settings and Reporting file location can be configured independently under “Settings > Location Path”. With this capability the
individual user can configure the location of the data to be stored & the apps to be accessed for inspection on the independent user login.
3-78
Fig: Mentor PC Location Path Configuration
Recommendations:
• Mentor PC or PC Live can gain efficient performance when configured the PC or workstation with graphics card other than the Built-In HD chipset.
Digital Guardian Whitelisting:

• When MentorPC is started you can connect to an instrument. But as soon as you start an app and go to a panel with active acquisition (e.g. scan panel) and therefore data
acquisition is started Mentor PC will completely crash. The crash will happen inside DgApi64.dll which is part of Digital Guardian.
• Contact your IT administrators. They shall whitelist Mentor PC Live! to resolve this issue.
NOTE: Mentor PC Live can use the maximum length of 100 meters of Ethernet cable
3-79
Wifi Connections
1 – Press to access the Menu View. Then choose the Settings
button, followed by Wi-Fi.
2 – Select to enable instrument’s Wifi connection and to detect and

display available Wifi connections.
3 – List of all detected Wifi connections. Touch any of the of the

listed networks to connect. The connected network will appear in
blue. Touching another network will cause the instrument to end
the current network connection.
4 – Displays whenever the instrument’s Wifi connection is enabled.
5 – Select to view details of connected Wifi network.
6 – Select to disconnect from the currently active network and

forget that network in the future. In this case, the network will
continue to be listed, when in range, but the instrument will not
attempt to connect to it unless manually prompted.
7 – Select to return to previously active display screen.
3-80
Remote Access with a

VNC Desktop
1 – Prior to accessing through a VNC desktop, both the Mentor UT and
the device with which you wish to connect (phone, laptop, etc.) must
be connected to the same wired or WiFi network. Part of the VNC
connection process will require inputting the Mentor UT’s listed IP
address into the VNC client program.
NOTE: The device you wish to connect to the Mentor UT must also
be equipped with a VNC client program. VNC client programs can
be downloaded from various online sources (for PCs) or via the
Apple App Store.
2 – Press to access the Menu View. Then choose the Settings button
followed by Remote Desktop Connection.
3 – Select to deny access by VNC connection.
4 – Select to allow the VNC desktop to display but not control the
Mentor UT’s display screen.
5 – Select to allow the VNC desktop to display and control the Mentor
UT.
6 – Input a password that must be entered in the connecting device
before it can complete the VNC connection (optional).
You are now ready to complete the connection by launching the
VNC client program on the device you wish to connect.
3-81
Updating the Software

1 – From the Settings menu, choose Upgrade.
2 – Turn switch to ON to automatically check for software
updates and/or select to immediately check for updates. The
Mentor UT searches the root directory of a connected USB
memory device for available updates.
3 – Select to Install any available update from a USB memory
device.
4 – Follow on-screen instructions to complete the process.
NOTE: The Mentor UT requires a battery charge level of at least 10%
before allowing a software update to begin. The user is strongly
encouraged to connect to an AC power source before beginning
the software update process.
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InspectionWorks Connect (IWC)

GE's InspectionWorks Connect (IWC) is a service that enables cloud-based video collaboration sessions between Inspectors and Experts accessing the
IWC Web portal and infrastructure.
An Inspector can use his Mentor UT device to monitor and diagnose component while simultaneously connecting through the InspectionWorks Connect
cloud infrastructure to a remote Expert connected through the IWC web portal running in their browser. This allows the Inspector to share the Mentor UT
device screen and collaborate with the Expert in real-time.
The remote collaboration helps customers make asset and system integrity decisions faster and with more confidence by delivering expertise where and
how it's needed.
Equipping Your Mentor UT with InspectionWorks Connect
InspectionWorks Connect is an optional feature enabled at the time your device
is purchased or acquired after device delivery. To purchase the IWC capability,
contact your local GE salesperson or call Customer Care at 1-866-243-2638. You
can also contact us using our online contact form, http://inspectionworks.com/
support
All Mentor UT devices are provided a free 30 day pass to IWC. To activate your trial
use the “Trial License” control located in the InspectionWorks Connect global menu.
NOTE: IWC requires a wired or wireless (Wi-Fi) internet connection.
1 – Press to access the Menu View. Then select InspectionWorks Connect.
NOTE: If your device has already been equipped with IWC capability, the
Start Session screen will display and you can begin an IWC session.
2 – Select and enter the required information to begin a 30-day trial session or
contact GE to purchase the IWC capability.
3 – Select to run network test, change server, activate a license or view its
information.
4 – Select Activate to enter your product key. Other selections allow you to specify
the Server through which the IWC session occurs or run a Network Test to
determine if the network connection is sufficient to support IWC communication.
5 – Touch to enter the Product Key. The Virtual Keyboard will display. Select
Done after entering the key, then Activate to complete the IWC-enable process.
3-83
Starting and Stopping an IWC Session

6 – Press to access the Menu View. Then select InspectionWorks Connect. IWC requires an
Internet connection.
NOTE: If your device has already been equipped with IWC capability, the Start Session
screen will display and you can begin an IWC session. If it does not, see the previous section
of this manual.
7 – Set Video Quality to AUTO or LOW (a LOW setting allows for streaming video over a network
with limited bandwidth), Select Settings to specify the Server through which the IWC session
occurs (not a task you will normally perform) or conduct a Network Test to determine if the
network connection is sufficient to support IWC communication.
8 – Select to Start the session then, after reading the Terms of Use, select OK to continue.
9 – This icon appears when an IWC session is started.
10 – This session URL, identification, and password are required by anyone joining the session as a
remote Expert. Only one Expert at a time can participate in a session. Automatically deliver this
log-in information to any email address by selecting Invite (11). Alternatively, navigate away from
the IWC page to begin your session without automatically inviting an Expert.
NOTE: A session URL, ID, and password can be shared with an Expert who can then log into
the Expert portal and connect to your session. This can be accomplished automatically by
selecting the Invite button. To manually log into an IWC session, anyone with a supported web
browser can simply go to https://www.inspectionworks.com/#/support or click on the Join
a Live Connect Session button on the InspectionWorks home page. They need only input the
inspector-provided ID and Password to complete the process.
12 – Select at any time during an IWC session to Pause the session, Chat with the Expert, or End
the session.
13 – Select End to stop the session.
NOTE: IWC functionality is common to all GE Mentor products. As shown here, the
InspectionWorks operator and expert interfaces are virtually identical for Mentor EM and
Mentor UT instruments.
3-84
Email an Invitation to Join an IWC Session & Expert Login

14 – Select Invite to email an Expert then input the Expert’s email address and select
Send. All required login information and a link to the IWC website are automatically
included in the email.
15 – After receiving this invitation email, the Expert needs only to click on the included
link, input an on-screen name, and select Join Session.
Experts access IWC with any device capable of an Internet connection and
running a supported browser (Visit FAQs at https://www.inspectionworks.com/#/
support for a list of supported browsers.)
16 – Expert selects to capture the Mentor UT screen, saving it to his or her computer.
17 – This icon on the Mentor UT display indicates an Expert has joined the session.
Whether or not the displayed image is shared, the icon remains as long as the Expert is
logged into the session.
18 – Expert and Inspector can send and receive Chat messages throughout the
session, whether or not the display screen is currently shared. Icon indicates Chat
messages are available to be viewed.
19 – Inspector can Pause the session to stop sharing the displayed image with the
logged-in Expert.
NOTE: Stopping display sharing does not end the IWC session. Toggle between
Pause and Resume Session to turn screen sharing On and Off.
20 – Indicates session is underway and the screen can be viewed by the logged-in
Expert.
21 – Indicates session is Paused and the displayed image can not be viewed by the
logged-in Expert.
NOTE: Only the Mentor UT Operator can control whether or not the instrument’s
display can be viewed by the remotely located Expert.
3-85
Appendix A – UT Parameter Listing with Definitions

Conventional Parameters
Range Start Start of the sound path range in A-scan & E-scan
Probe Setup Range End End of the soundpath range in A-scan and E-scan
Probe Name Name of built-in probe options. Based on the Probe PRF uency and allows adjustment of Pulser Repetition Freq
Name selection, the probe related parameter will be Pulser Voltage Sets pulser voltage level
automatically updated
Pulser Width Mode Pulser width automatically calculated from the probe
Probe Part Number Display the Part Number of Probe selected as per Probe frequency
Name
Pulser Width Sets the width of sqaure pulse
Probe Frequency Frequency of the attached probe
Rectification Selects the rectification mode which effects how the
Eff. Diameter Effective diameter of the probe crystal A-scan appears on the display
Probe Angle Input the angle of a connected angle beam probe Damping Adjusts the damping level to match the connected probe
Probe X-Value Input the specified value from the angle beam probe’s BIP Probe Delay Represents the time delay caused by sound-wave travel
to front edge through a probe's wear plate, membrane, delayline, or
Probe Delay Represents the time delay caused by sound-wave travel wedge
through a probe's wear plate, membrane, delayline, or S-Ref 1 Reference soundpath 1 used to calibrate the Velocity
wedge
S-Ref 2 Reference soundpath 2 used to calibrate the Velocity
Delay Velocity Velocity of the wedge or delay material used with the
A-scan Samples Number of sampling points used to plot A-scan signal
probe
Probe Part Number Part number of the connected CV probe
Index Step Widh of the C-scan image along index axis
LED Alarm Identifies in which gate an event triggers and illuminates
UT Setup the LED light
Probe Name Name of built-in probe options. Based on the Probe Tone Alarm "Ability to set the tone alarm output based on the signal
Name selection, the probe related parameter will be triggering agate threshold. It only works if the correct
automatically updated output module is connected to the Mento UT
Probe Part Number Display the Part Number of Probe selected as per Probe NOTE: Tone Alarm will be functional only when
Name respective connectivity module is connected for
Gain Sets the gain value to the signals Tone"
Probe Frequency Frequency of the attached probe Averaging Averaged A-scans user can select the the Averaging from
1; 2;4; 8; 16; 32; 64; 128; 256
Filter Selects the frequency filter of the instrument
Mode Identified whether a single-element probe or dual
element probe is installed
AP-1
Conventional UT Gate Parameters DAC / TCG Offset Use fixed-displacement positive and negative offset lines
Gate A Logic Determines whether the Gate A alarm is triggered when s Mode or input individual displacement vales for each of up to
signal corsses the Gate A or does not cross the Gate A four offset lines
Gate A TOF Mode Indicates whether the Gate A triggering echo’s flank or DAC / TCG offset Value of fixed offset displacement
peak is used when making soundpath measurements DAC / TCG offset 1 Displays a line at a fixed-gain offset from the DAC or TCG
Gate A Start Sets the beginning position of Gate A line
Gate A End Sets the width of Gate A by defining its end point DAC / TCG offset 2 Displays a line at a fixed-gain offset from the DAC or TCG
line
Gate A Threshold Sets height of Gate A as a % of full-screen A-scan height
DAC / TCG offset 3 Displays a line at a fixed-gain offset from the DAC or TCG
Gate B Logic Determines whether the Gate B alarm is triggered when a line
signal corsses the Gate B or does not cross the Gate B
DAC / TCG offset 4 Displays a line at a fixed-gain offset from the DAC or TCG
Gate B TOF Mode Indicates whether the Gate B triggering echo’s flank or line
peak is used when making soundpath measurements
DAC / TCG Color Displays the DAC or TCG curve in selected color
Gate B Start Sets the beginning position of Gate B
DGS Enable the DGS as On or Off to record the signal
Gate B End Sets the width of Gate B by defining its end point
DGS Curve Positions the probe’s DGS Curve based on the size of
Gate B Threshold Sets height of Gate B as a % of full-screen A-scan height the reflector (flaw) being tested. The setting will usually
Trig depend on the largest acceptable flaw size.
Probe Angle Input the angle of a connected angle beam probe DGS Mode Once a reference echo has been recorded, the DGS curve
Part Thickness Sets the test-piece material thickness for angle-beam is displayed simply by selecting the DGS MODE function
measurements to ON
Probe X-Value Input the specified value from the angle beam probe’s BIP Reference Type Define the Reflector as Backwall or FBH or SDH
to front edge Reference Size Defined the size of Reflector to record DGS
Calibration Reference Atten. Specify a sound attenuation value (in dB per inch or mm
of material thickness) for the material from which the
AWS D1.1 Enable the AWS D1.1 mode as On or Off
test piece is made
DAC / TCG Select between TCG or DAC, or turn feature off
Amp Correct Correction required when using an angle-beam type
DAC / TCG Point Identify TCG or DAC point to be modified probe. This value is specified on the probe’s data sheet.
DAC Type Choose between a traditional curved DAC line and a Test Atten. Specify a sound attenuation value (in dB per inch or mm
straight DAC line, which simply connects the recorded of material thickness) for the material from which the
DAC points test piece is made
Transfer Corr. dB compensation for difference in coupling conditions
between the known standard and the test piece.
AP-2
Velocity Cal. Type Sets the type of veloctity calibration as "Multi Backwall" Active Scan Size Window size to be displayed when C-scan data
or "Multi Step" acquisition is in progress in encoded mode
Ref Amplitude Amplitude to be set as reference to apply the sensitivity Active Scan Time Window size to be displayed when C-scan data
correction acquisition is in progress in timed mode
Conventional A-scan Display CV Index Overlap % of minimum overlap needed along index axis for raster
scan data acquisition
Amplitude Ruler Shows or hides the amplitude ruler in A-scan
CV Index Distance Distance between 2 passes along index axis. CV Index
Range Ruler Shows or hides the range ruler in A-scan
Overlap & CV Index Distance are co-related parameters
Color Palette Shows or hides the color palette in A-scan
Encoder Type Defining the connected encoder in positional or
A-scan Color Sets the color of the A-scan quadrature type
Grid Selection Sets the A-scan grid display as Coarse or Fine Encoder Axis Axis used to calibrate the attached encoder
Grid Color Sets the color of grid on A-scan Encoder Dir. X Direction of encoder counts in scan axis (X)
Grid Shows or hides the grid on A-scan Encoder Dir. Y Direction of encoder counts in index axis (Y)
Scan Setup Encoder Res. X Resolution of attached encoder on scan axis (X)
Scan Pattern Sets the patter of C-scan to be acquired as "Line" or Encoder Res. Y Resolution of attached encoder on index axis (Y)
"Raster" or "Free Hand" forms Skew Angle Defines the probe placement on specimen to refer the 1st
Position Mode Sets the C-scan to operate in Timed or Encoded mode element is at origin or last element is at origin to map the
Manual Index "Move the index area of interest to next step as per the image for Raster Scan
index overlap% and beam width of all the beams. Index Tolerance Tolerance of encoder ticks which can be allowed as
Recommended to use only for 0 deg Linear Scan & Raster backlash along index axis (Y)
Scan" Scan Tolerance Tolerance of encoder ticks which can be allowed as
Scan Size Amount of C-scan data that can be acquired on scan axis backlash along scan axis (X)
as distance
C-Scan Display
Index Size Amount of C-scan data that can be acquired on index axis
Data Source Select amplitude or depth C-scan data view based on gate
as distance
A, B, A-scan
Scan Resoln. (Dist) Spacing between the data acquisition along scan axis on
Beam Fill Color mapping of beam fill between 2 adjacent beams
C-scan
Amp Palette Adjusts the range of colors used to depict the measured
Scan Time Amount of C-scan data that can be acquired on scan axis
amplitude
as time
TOF Palette Allows the user to selct a color palette for use in TOF-scan
Scan Resoln. The speed at which display scrolls during timed mode of
(Time) C-scan Amp Color Range Sets the compression of amplitude color palette in %
TOF Color Range Sets the compression of depth color palette in %
AP-3
Index Ruler Shows or hide the index ruler on E-scan and C-scan Active Scan End End point of the Active C-scan along scan axis
Min Depth Color Mimimum depth to map with lower most color in the Active Index Start Start point of the Active C-scan along index axis
palette forA-B data source Active Index End End point of the Active C-scan along index axis
Max Depth Color Maximum depth to map with higher most color in the Active Time Start Start point of the Active C-scan along scan axis in timed
palette for A-B data source mode
Scan Position Ruler Shows or hide the scan position ruler on C-scan Active Time End End point of the Active C-scan along scan axis in timed
Cross Hair Shows or hide cross hairs cursor on the C-scan mode
Active Box Show or Hide the box drawn to display the Active C-scan Overlay Type Defines the Overlay Type as None, Scan Area, V-Weld, VV-
Active Scan Start Start point of the Active C-scan along scan axis Weld, J-Weld, Rectangle
Active Scan End End point of the Active C-scan along scan axis A Root Height for the Weld Overlay or to poisition of Scan
Overlay
Active Index Start Start point of the Active C-scan along index axis
B Root Width for the Weld Overlay or to poisition of Scan
Active Index End End point of the Active C-scan along index axis
Overlay
Active Time Start Start point of the Active C-scan along scan axis in timed
C Bottom Thickness of VV-Weld Overlay
mode
Alpha Angle used to define the weld bevel
Active Time End End point of the Active C-scan along scan axis in timed
mode Beta Angle used to define the weld bevel
B-Scan Display Overlay Display Shows or hide the Overlay
Group Select Set the selected Group and its associated parameter Origin Line Display Shows or hide the Origin Line
Data Source Select amplitude or depth B-scan data view based on gate CV Index Distance Distance between 2 passes along index axis. CV Index
A, B, A-scan Overlap & CV Index Distance are co-related parameters
Beam Fill Color mapping of beam fill between 2 adjacent beams

Amp Palette Adjusts the range of colors used to depict the measured
amplitude
Amp Color Range Sets the compression of amplitude color palette in %
TOF Color Range Sets the compression of depth color palette in %
Index Ruler Shows or hide the index ruler on E-scan and C-scan
Scan Position Ruler Shows or hide the scan position ruler on C-scan
Cross Hair Shows or hide cross hairs cursor on the C-scan
Active Box Show or Hide the box drawn to display the Active C-scan
Active Scan Start Start point of the Active C-scan along scan axis
AP-4
Phased Array Parameters Wedge Menu

Wedge Part Number Attached probe wedge’s part number
Probe Menu
Wedge Angle Angle of probe wedge
Probe Select User can select the Probe ID based on the number
of probes in the App. With Mentor UT 3.2 Maximum Wedge Velocity Velocity of sound in wedge material
of 2 Probes can be defined in Create for Multigroup Z-Offset Distance from probe’s center to the bottom of the
Application wedge
Probe Type Select the probe type of 1D Linear Flat or DM probe Wedge Front Distance from wedge front to probe’s centerline
Probe Part Number Attached probe’s part number Part Menu
Probe Frequency Frequency of the attached probe Part Thickness Thickness of the part under test
Elements Total number of elements in the attached probe Velocity L Longitudinal Velocity of sound in the part under test
Pitch Distance between the centers of adjacent elements Velocity S Shear Velocity of sound in the part under test
Elevation Width of element (s) Part Velocity Velocity of sound in the part under test
Probe Delay Adjusted during the calibration process to exactly Index Offset Defines the distance from an artificially designated
set the time delay required to calibrate the time of zero position (suchas the center of weld) to the
flight measurements and correctly indicate reflector projection point of a reflector in the gate. Setting
location in the image equal to zero sets the probe's front edge as the zero
Max Dead El. % of dead elements allowed as a criteria to qualify position.
good or bad probe for inspection Weld Symmetry Set the Weld Overlay as Symmetric or Assymmetric.
Max Adj Dead El. Maximum allowed instances of 2 adjacent dead In case of Asymmetric weld, the overlay on right side
elements to qualify the bad or good probe for will use the values from 1,2,3,4
inspection A Root Height for the Weld Overlay or to define the
Probe Check Whether or not to check if the attached probe is poisition of Scan Overlay
correct or wrong based on the comparison with B Root Width for the Weld Overlay or to define the
Probe ID chip and probe defined in application poisition of Scan Overlay
Skew Angle "Skew Angle is the orientation of 1st element to Last C Bottom Thickness of VV-Weld Overlay
element is from Left to Right or Vice Verca. 0 to 180 -
Left to Right; 181 - 359 - Right to Left
Index Direction is replaced by Skew Angle Parameter. Beta Angle used to define the weld bevel of Bottom
Index Direction Reversed is equivalent to 270 deg; Thickness of VV-Weld
Normal is equivalent to 90 deg" 1 Root Height for the Weld Overlay or to define the
Element 1 Pos Position of probe's element 1 relative to wedge poisition of Scan Overlay of Asymmetric Side 2
AP-5
2 Root Width for the Weld Overlay or to define the Angle Start Sector scan’s starting angle
poisition of Scan Overlay of Asymmetric Side 2 Angle Step Step size at which shots are taken between starting
3 Bottom Thickness of VV-Weld Overlay of Asymmetric and ending angles
Side 2 Angle Stop Sector scan’s ending angle
Gamma Angle used to define the weld bevel of Asymmetric Focal Distance Depth into the test piece at which the beam focuses
Side 2
Pulser Receiver Menu
Delta Angle used to define the weld bevel of Bottom
Thickness of VV-Weld of Asymmetric Side 2 Filter Selects the frequency filter of the instrument
PRF Displays and allows adjustment of Pulser Repetition
Focal Laws Menu
Frequency
Group Select Select the Group Value and its resepective UT
Pulser Voltage The relative energy with which the pulser fires
Settings & Focal Law Setting
Active Group Active Group is the parameter to set a particular
frequency
Group as Active. Active Group will be considered for
independent parameters available in the panel. All Pulser Width Sets the width of square pulse
the group based readouts show the value of Active Rectification Selects the rectification mode, which effects how the
Group. Active Group can be selected using the A-scan appears on the display
Titlebar on the instrument
UT Setup Menu
Scan Type Sets the electronic pattern of scan as Linear or Sector
Gain Sets the gain value applied to the signals
First Element Number of physical element that begins the E-scan
Range Start Used to define the start of the Display range. For
Active Aperture Number of elements to be fired in scan step sector Scan, the Display range is defined based on
(including the first element) Reflector Type.
Aperture Step Number of elements to step per cycle during the Range End Used to define the end of the Display range. For
E-scan sector Scan, the Display range is defined based on
Last Element Number of the physical element at which the E-scan Reflector Type.
ends Display Start Mode Sets the display’s starting position to match the
Half Step Number of elements to step per cycle will be half and initial pulse or IF gate trigger (for E-scan) or the point
hence index resolution will be increased at which sound enters the test material’s surface (all
•For the defined the Aperture when Half Step = On, beams)
1st beam will be acquired as per "Active Aprture" and LED Alarm Identifies in which gate an event triggers and
2nd beam will be acquired at "Active Aperture + 1" illuminates the LED light
•So the beam exit point will be half of single element
step
Beam Angle Angle of beam enters into the part under test
AP-6
Tone Alarm Ability to set the tone alarm output based on the IF Gate TOF Mode Indicates whether the IF gate triggering echo’s
signal triggering a gate threshold flank or peak is used when making soundpath
Note: Tone Alarm will function only when connectivity measurements
module is connected for tone.
IF Gate Start Sets the beginning position of the IF Gate
A-scan Samples Number of sampling points used to plot A-scan signal
IF Gate End Sets the width of IF Gate by defining where it ends
Split Channels Define the number of channels reserved for each
IF Gate Threshold Sets the height of the IF gate as a % of full-screen
probe. As per the Probe Select the no. of channel
A-scan height
must be defined here.
Gate Linkage "Global - Sets the Gates to share the same Start | End
Gates Menu between all the Groups
Gate A Logic Determines whether the Gate A alarm is triggered Group - Sets the Gates to set the value independently
when a signal crosses the Gate A or does not cross for each Group"
the Gate A
Calibration Setup
Gate A TOF Mode Indicates whether the gate A triggering echo’s flank or
Cal Block Dist DE Calibration block distance to be used for Probe Dead
Element Check
Gate A Start Sets the beginning position of the Gate A
Velocity Cal Type Sets the type of veloctity calibration as "Multi
Gate A End Sets the width of Gate A by defining where it ends Backwall" or "Multi Step"
Gate A Threshold Sets the height of the Gate A as a % of full-screen Velocity L Longitudinal Velocity of sound in the part under test
A-scan height
Velocity S Shear Velocity of sound in the part under test
Gate B Logic Determines whether the Gate B alarm is triggered
Reflector Type Vel "Defines the type of reflector used for part velocityt
when a signal crosses the gate B or does not cross
calibration: DEPTH - Used for reflectors located at
the Gate B
same depth for all beams (ex: Side Drilled Holes, flat
Gate B TOF Mode Indicates whether the Gate B triggering echo’s bottomed holes) Radius - Used for reflectors located
flank or peak is used when making soundpath at same soundpath for all beams in Sector Scan (ex:
measurements Radius)
Gate B Start Sets the beginning position of the Gate B Thickness - Used for reflectors located at same
Gate B End Sets the width of Gate B by defining where it ends soundpath for all beams in Linear Scan (ex: Backwall)"
Gate B Threshold Sets the height of the Gate B as a % of full-screen Ref 1 Reference thickness / depth / soundpath 1 used to
A-scan height calibrate the velocity
IF Gate Logic Determines whether the IF Gate alarm is triggered Ref 2 Reference thickness / depth / soundpath 2 used to
when a signal crosses the IF gate or does not cross calibrate the velocity
the IF gate Ref 1 Dia Diameter of Side Drilled Hole 1 to considered for
Delay and Velocity Calibration
AP-7
Ref 2 Dia Diameter of Side Drilled Hole 2 to considered for TCG Point Dist "Sets the distance of selected TCG point use to plot
Delay and Velocity Calibration TCG
Cal Block Dist Delay "Distance of calibration block used for Delay Depth - Used for reflectors located at same depth
calibrations RADIUS - Distance to be defined as per for all beams (ex: Side Drilled Holes, flat bottomed
soundpath of indication for Sector Scan. holes)
DEPTH - Distance to be defined as per depth of Radius - Used for reflectors located at same
indication THICKNESS - Distanced to be defined as soundpath for all beams in Sector Scan (ex: Radius)
per soundpath of indication for Linear Scan" Thickness - Used for reflectors located at same
soundpath for all beams in Linear Scan (ex: Backwall)"
Reflector Type Delay "Defines the type of reflector used for Delay
calibration: Cal. Block Dist TCG Calibration Block distance considered for Multi
Depth - Used for reflectors located at same depth Backwall TCG Type
for all beams (ex: Side Drilled Holes, flat bottomed Sensitivity Type Sensitivity calibration has to be done for selected
holes) beam or all beams
Radius - Used for reflectors located at same Ref Amplitude Amplitude to be set as reference to apply the
soundpath for all beams in Sector Scan (ex: Radius) sensitivity correction
Thickness - Used for reflectors located at same
Recording Sets the amplitude recording of each beam is needed
at different instance or all the beams can be recorded
TCG Type Sets the type of TCG calibration as "Multi Backwall" or at same instance for sensitvity calibration
"Multi Step" on "Manual"
Amplitude Tol. Sens Tolerance of amplitude (as % of FSH) which can be
Reflector TCG "Defines the type of reflector used for TCG used for Sensitivity verification
calibration:
Reflector Type Sens. "Defines the type of reflector used for Sensitivity
Depth - Used for reflectors located at same depth
calibration:
for all beams (ex: Side Drilled Holes, flat bottomed
holes)
for all beams (ex: Side Drilled Holes, flat bottomed
Radius - Used for reflectors located at same
holes)
soundpath for all beams in Sector Scan (ex: Radius)
TCG Count Total number of points needed to plot TCG soundpath for all beams in Linear Scan (ex: Backwall)"
TCG Target Amp Sets the reference target (as % of FSH) for the TCG
calibration
Amplitude Tol. TCG Tolerance of amplitude (as % of FSH) which can be
used for TCG verification
TCG Point Sets the TCG point number to plot TCG
AP-8
Cal. Block Dist Sens. "Defines the type of reflector used for sensitivity Active Scan Time Window size to be displayed when C-scan and B-scan
calibration: data acquisition is in progress in timed mode
Depth - Used for reflectors located at same depth Index Overlap % of minimum overlap needed along index axis for
for all beams (ex: Side Drilled Holes, flat bottomed raster scan data acquisition
holes)
Index Distance Distance between 2 passes along index axis. Index
Overlap & Index Distance are co-related parameters
Thickness - Used for reflectors located at same Encoder Type Defining the connected encoder as positional or
soundpath for all beams in Linear Scan (ex: Backwall)" quadrature type
Scan Setup Encoder Axis Axis used to calibrate the attached encoder
Encoder Dir. X Direction of encoder counts in scan axis (X)
Encoder Dir. Y Direction of encoder counts in index axis (Y)
Scan Pattern Sets the pattern of C-scan to be acquired as “Line” or
Encoder Res. X Resolution of attached encoder on scan axis (X)
“Bi-Raster” or “Free Hand” form
Skew Angle Defines the probe placement on specimen to refer
Position Mode Sets the C-scan to operate in Timed or Encoded
the 1st element is at origin or last element is at origin
mode for data acquisition
to map the image for Raster Scan
Manual Index Move the index area of interest to next step as per
Encoder Res. Y Resolution of attached encoder on index axis (Y)
the index overlap% and beam width of all the beams.
Index Direction Defines the probe placement on specimen to refer
Recommended to use only for 0 deg Linear Scan & the 1st element is at origin or last element is at origin
Raster Scan to map the image for Raster Scan
Scan Size Amount of C-scan data that can be acquired. Shown Scan Tolerance Tolerance of encoder ticks which can be allowed as
on the scan axis as distance measurement backlash along scan axis (X)
Index Size Amount of C-scan data that can be acquired. Shown Index Tolerance Tolerance of encoder ticks which can be allowed as
on the index axis as distance measurement backlash along index axis (Y)
Scan Resoln. (Dist) Spacing between the data acquisition points along TCG UT Setup Menu
scan axis, as shown on the C-scan and B-scan
TCG Type Sets the type of TCG calibration as "Multi Backwall" or
Scan Time Amount of C-scan data that can be acquired. Shown "Multi Step" on "Manual"
on the scan axis as time measurement
Scan Resoln. (Time) The speed at which display scrolls during timed mode
of C-scan and B-scan
Active Scan Size Window size to be displayed when C-scan and B-scan
data acquisition is in progress in encoded mode
AP-9
Reflector TCG "Defines the type of reflector used for TCG calibration: Reflector Type Sens. "Defines the type of reflector used for Sensitivity
Depth - Used for reflectors located at same depth calibration:
for all beams (ex: Side Drilled Holes, flat bottomed Depth - Used for reflectors located at same depth
holes) for all beams (ex: Side Drilled Holes, flat bottomed
holes)
soundpath for all beams in Sector Scan (ex: Radius) soundpath for all beams in Sector Scan (ex: Radius)
Thickness - Used for reflectors located at same Thickness - Used for reflectors located at same
soundpath for all beams in Linear Scan (ex: Backwall)" soundpath for all beams in Linear Scan (ex: Backwall)"
TCG Count Total number of points needed to plot TCG Cal. Block Dist Sens. "Defines the type of reflector used for sensitivity
TCG Target Amp Sets the reference target (as % of FSH) for the TCG calibration:
calibration Depth - Used for reflectors located at same depth
Amplitude Tol. TCG Tolerance of amplitude (as % of FSH) which can be for all beams (ex: Side Drilled Holes, flat bottomed
used for TCG verification holes)
TCG Point Sets the TCG point number to plot TCG soundpath for all beams in Sector Scan (ex: Radius)
TCG Point Dist "Sets the distance of selected TCG point use to plot Thickness - Used for reflectors located at same
TCG soundpath for all beams in Linear Scan (ex: Backwall)"
Depth - Used for reflectors located at same depth Dist. Tolerance Tolerance of depth or soundpath which can be used
for all beams (ex: Side Drilled Holes, flat bottomed for Delay verification
holes)
Radius - Used for reflectors located at same Delay Setup
soundpath for all beams in Sector Scan (ex: Radius) "Defines the type of reflector used for calibration:
Thickness - Used for reflectors located at same Depth - Used for reflectors located at same depth
soundpath for all beams in Linear Scan (ex: Backwall)" for all beams (ex: Side Drilled Holes, flat bottomed
Cal. Block Dist TCG Calibration Block distance considered for Multi holes)
Backwall TCG Type Radius - Used for reflectors located at same
Sensitivity Type Sensitivity calibration has to be done for selected
beam or all beams
Reflector Delay soundpath for all beams in Linear Scan (ex: Backwall)"
Ref Amplitude Amplitude to be set as reference to apply the
sensitivity correction
Recording Sets the amplitude recording of each beam is needed
at different instance or all the beams can be recorded
at same instance for sensitvity calibration
Amplitude Tol. Sens Tolerance of amplitude (as % of FSH) which can be
used for Sensitivity verification
AP-10
"Defines the type of reflector used for calibration: TOFD Parameters

for all beams (ex: Side Drilled Holes, flat bottomed Probe Setup
holes)
Radius - Used for reflectors located at same Probe Name Name of built-in probe options. Based on the Probe
soundpath for all beams in Sector Scan (ex: Radius) Name selection, the probe related parameter will be
Thickness - Used for reflectors located at same automatically updated
Cal. Block Dist Delay soundpath for all beams in Linear Scan (ex: Backwall)" Probe Part Number Display the Part Number of Probe selected as per
Tolerance of depth or soundpath which can be used Probe Name
Dist. Tolerance for Delay verification Probe Frequency Frequency of the attached probe
Analysis Menu Eff. Diameter Effective diameter of the probe
Offline Gain Change the offline gain during data analysis Wedge
Change the offline gain during data analysis for all the Wedge Part Number Attached probe wedge's part number
Global Offline Gain groups Wedge Angle Angle of probe wedge
Displays the position of time in seconds along scan Wedge Velocity Velocity of sound in wedge material
Time Position axis during data acquisition
Z-Offset Distance from probe's center to the bottom of the
Displays the position of encoder (X) along scan axis wedge
Scan Position during data acquisition
Wedge Front Distance from wedge front to probe's centreline
Displays the position of encoder (Y) along index axis
Wedge Radius Radius of the wedge
Index Position during data acquisition
Grid View Enable or disable the grid settings on C-scan Gates
Grid Scan Size of the grid along scan axis of C-scan to be Gate A Logic Determines whether the Gate A alarm is triggered
displayed for analysis and CSV export when s signal corsses the gate A or does not cross the
gate A
Grid Index Size of the grid along index axis of C-scan to be
displayed for analysis and CSV export Gate A TOF Mode Indicates whether the gate A triggering echo's flank or
Gate A Start Sets the beginning position of the Gate A
Gate A End Sets the width of Gate A where it has to end
Gate A Threshold Sets the height of the gate A of full-screen A-scan
height
Gate B Logic Determines whether the Gate B alarm is triggered
when s signal corsses the gate B or does not cross the
gate A
AP-11
Gate B TOF Mode Indicates whether the gate B triggering echo's flank or Sensitivity Method Sensitivity has to be applied as per lateral wave or
peak is used when making soundpath measurements indication (i.e., SDH; Notch)
Gate B Start Sets the beginning position of the Gate A Ref Amplitude Reference amplitude in %FSH to be considered as
Gate B End Sets the width of Gate B where it has to end sensitivity
Gate B Threshold Sets the height of the gate B of full-screen A-scan Amplitude Tolerance Tolerance of amplitude (as % of FSH) which can be
height used for TOFD sensitivity calibration
Reflector Type Sens If the Sensitivity Method is Reference Echo, based on
Pulser Receiver
SDH or Notch the Gate B position will get adjusted
Filter Selects the frequency filter of the instrument
SDH Depth Depth of SDH location from probe position
PRF uency and allows adjustment of Pulser Repetition Freq
UT Setup
Pulser Voltage Sets pulser voltage level
Gain Sets the gain value to the signals
frequency Range Start [T] A-scan delay start in time of flight [us]
Pulser Width Sets the width of sqaure pulse Range End [T] A-scan range in time of flight [us]
Rectification Selects the RF as rectification mode for TOFD A-scan Range Start [Z] Start of the A-scan delay along material depth axis
display Range End [Z] Range of A-scan along material depth axis
Part Beam Angle Refracted angle of sound in material
Part Thickness Thickness of the part under test Intersection Beam intersection point in % along depth at the
centre of PCS
Velocity Longitudinal velocity of part under test
Damping Adjusts the damping level (50 Ω or 1000 Ω) to match
Velocity S Shear velocity of part under test
the installed probe
TOFD Calibration A-scan Samples Number of sampling points used to plot A-scan signal
Cal Block Thickness Calibration block thickness to be used for PCS and
Time Definition Time base range defintion as per direct backwall or
mode converted backwall
PCS Theoretical PCS computed before PCS calibtation.
Time Before LW Time base delay before lateral wave
After the PCS calibration is done it will show
measured PCS and locked Time After BW Time base range after the backwall echo
PCS Variation Unit PCS variation unit to be considered for acceptable PCS Averaging Averaged A-scans user can select the the Averaging
tolerance from 1; 2;4; 8; 16; 32; 64; 128; 256
PCS Variation % PCS tolerance limit in percentage for acceptable PCS A-Scan Display
PCS Variation Dist. PCS tolerance limit in distance (mm or inches) for Ascan Color Sets the color of the A-scan
acceptable PCS Amplitude Ruler Show or hide Amplitude ruler in A-scan
AP-12
Ascan Range Ruler 1 Shows (Depth or TOF) or hide the range ruler 1 option Scan Time Amount of TOFD data that can be acquired on scan
in A-scan axis as time
Ascan Range Ruler 2 Shows (Depth or TOF) or hide the range ruler 2 option Scan Resoln. (Time) The speed at which display scrolls during timed mode
in A-scan of C-scan
Ascan Color Palette Shows or hide color palette in A-scan Active Scan Size Window size to be displayed when C-scan data
Grid Selection Sets the grid display as Coarse or Fine grid to display acquisition is in progress in encoded mode
on A-scan Active Scan Time Window size to be displayed when C-scan data
Grid Color Sets the color of grid on A-scan and Amplitude view acquisition is in progress in timed mode
A-scan Color Sets the color of the A-scan Encoder Type Defining the connected encoder in positional or
quadrature type
Grid Shows or hide the grid on A-scan and Amplitude view
Encoder Dir. X Direction of encoder counts in scan axis (X)
TOFD Display
Encoder Res. X Resolution of attached encoder on scan axis (X)
Range Ruler 1 Display the Range Ruler as TOF ruler or Depth ruler or
hide the ruler Data Reverse Mode Option to remove the data or overwrite on reverse
encoder movement
Scan Pos. Ruler Show or hide the scan position cursor
Cross Hair Cursor Show Cross Hair Cursor 1 or Both 1 & 2 or hide both
cursors on TOFD image
Active Scan Start Start point of the Active C-scan along scan axis
Active Scan End End point of the Active C-scan along scan axis
Active Time Start Start point of the Active C-scan along scan axis in
timed mode
Active Time End End point of the Active C-scan along scan axis in
timed mode
Color Palette Show or hide the color palette on right side of TOFD
image
Global Offline Gain Change the offline gain during data analysis
Scan Setup
Position Mode Sets the C-scan to operate in Timed or Encoded mode
Scan Size Amount of C-scan data that can be acquired on scan
axis as distance
Scan Resoln. (Dist) Spacing between the data acquisition along scan axis
on C-scan
AP-13
Stat Box Shows or hides statistical measurement box on Beta Angle used to define the weld bevel
Active view of C-scan during analysis Overlay Display Shows or hide the Overlay
A-scan Display Menu Origin Line Display Shows or hide the Origin Line
Group Select Set the selected Group and its associated parameter C-scan Display Menu
Beam Select Sets the beam cursor position on E-scan Group Select Set the selected Group and its associated parameter
Amplitude Ruler Shows or hides the amplitude ruler option in A-scan Data Source Select amplitude or depth C-scan data view based on
Range Ruler Shows or hides the range ruler in A-scan the contents of the A-Scan's gate A and B
Color Palette Shows or hides the color palette in A-scan Beam Fill Color mapping of beam fill between 2 adjacent
A-scan Color Sets the color of the A-scan beams as interpolated or constant beam fill
Grid Selection Sets the grid display as Coarse or Fine grid to display Amp Palette Adjusts the range of colors used to depict the
on A-scan measured amplitude (as % of full screen height)
Grid Color Sets the color of grid on A-scan TOF Palette Shows or hides the TOF palette to display in C-scan
(as % of thickness)
Grid Shows or hides the grid on A-scan
Amp Color Range Sets the compression of amplitude color palette (as
E-scan / S-scan Display Menu % of full screen height)
Beam Fill Color mapping of beam fill between 2 adjacent TOF Color Range Sets the compression of depth color palette (as % of
beams thickness)
Amp Palette Adjusts the range of colors used to depict the Index Ruler Shows or hides the index ruler on C-scan
measured amplitude
Min Depth Color Minimum depth to map with lower-most color in the
Amp Color Range Sets the compression of amplitude color palette in % palette for A-IF, B-IF, A-B data source
Depth Ruler Shows or hides the depth ruler in E-scan Max Depth Color Maximum depth to map with higher-most color in the
Index Ruler Shows or hides the index ruler in E-scan palette for A-IF, B-IF, A-B data source
Color Palette Shows or hides the color palette in E-scan Scan Position Ruler Shows or hides the scan position ruler on C-scan
Overlay Type Defines the Overlay Type as None, Scan Area, V-Weld, Cross Hair Shows or hides cross hairs cursor on the C-scan
VV-Weld, J-Weld, Rectangle Active Box Show or hides the box drawn on Overview C-scan to
A Root Height for the Weld Overlay or to define the display the Active C-scan
poisition of Scan Overlay Active Scan Start Start point of the Active C-scan along scan axis
B Root Width for the Weld Overlay or to define the during analysis
poisition of Scan Overlay
C Bottom Thickness of VV-Weld Overlay
AP-14
Active Scan End End point of the Active C-scan along scan axis during Grid Shows or hide the grid on Depth view
analysis
Active Index Start Start point of the Active C-scan along index axis General Parameters
during analysis
Active Index End End point of the Active C-scan along index axis during Phased Array UT Readout Parameters
analysis Gate A Readouts - All Beams
Active Time Start Start point of the Active C-scan along scan axis in P%A Peak amplitude captured by Gate A associated with the
timed mode during analysis beam generating highest amplitude of the E-scan (as a % of
Active Time End End point of the Active C-scan along scan axis in FSH)
timed mode during analysis PZA^ Uncorrected depth of the peak amplitude of all beams in scan
Overlay Type Defines the Overlay Type as None, V-Weld, VV-Weld, that are currently captured by Gate A.
Scan Overlay PDA^ Volume corrected depth of the peak amplitude of all beams
A Root Height for the Weld Overlay or to poisition of in scan that are currently captured by Gate A.
Scan Overlay PPA^ Projection distance from specified origin of the peak
B Root Width for the Weld Overlay or to poisition of amplitude of all beams in scan that are currently captured by
Scan Overlay Gate A.
C Bottom Thickness of VV-Weld Overlay PRA^ Projection distance from beam exit point of the peak
Alpha Angle used to define the weld bevel amplitude of all beams in scan that are currently captured by
Gate A.
Beta Angle used to define the weld bevel
PZA/ Uncorrected depth of the first echo that crosses gate A
Overlay Display Shows or hide the Overlay
threshold of all beams in scan
Origin Line Display Shows or hide the Origin Line
PDA/ Volume corrected depth of the first echo that crosses gate A
Amplitude Display Menu threshold of all beams in scan.
Group Select Set the selected Group and its associated parameter PPA/ Projection distance from specified origin of the first echo that
Amplitude Ruler Shows or hides the amplitude ruler in Amplitude view crosses gate A threshold of all beams in scan.
Beam Index Ruler Shows or hides the index ruler in Amplitude view PRA/ Projection distance from beam exit point of the first echo
Grid Shows or hides the grid on Amplitude view that crosses gate A threshold of all beams in scan.
Depth Display Menu Gate B Readouts - All Beams

Group Select Set the selected Group and its associated parameter P%B Peak amplitude captured by Gate B associated with the beam
generating highest amplitude of the E-scan (as a % of FSH)
Range Ruler Shows or hide the range ruler option in Depth view
Index Ruler Shows or hide the index ruler option in Depth view
AP-15
PZB^ Uncorrected depth of the peak amplitude of all beams in scan RA^ Projection distance from beam exit point to the reflector
that are currently captured by Gate B. represented by the highest echo in A-Gate in the beam
PDB^ Volume corrected depth of the peak amplitude of all beams selected by the beam cursor
in scan that are currently captured by Gate B SA/ Soundpath of the first echo that crosses gate A threshold in
PPB^ Projection distance from specified origin of the peak the beam selected by the beam cursor
amplitude of all beams in scan that are currently captured by ZA/ Uncorrected depth of the first echo that crosses gate A
Gate B. threshold in the beam selected by the beam cursor.
PRB^ Projection distance from beam exit point of the peak DA/ Volume corrected depth of the first echo that crosses gate A
amplitude of all beams in scan that are currently captured by threshold in the beam selected by the beam cursor.
Gate B. PA/ Projection distance from specified origin of the first echo that
PZB/ Uncorrected depth of the first echo that crosses gate B crosses gate A threshold in the beam selected by the beam
threshold of all beams in scan cursor.
PDB/ Volume corrected depth of the first echo that crosses gate B RA/ Projection distance from beam exit point of the first echo
threshold of all beams in scan. that crosses gate A threshold in the beam selected by the
PPB/ Projection distance from specified origin of the first echo that beam cursor.
crosses gate B threshold of all beams in scan. Gate B Readouts - Selected Beams
PRB/ Projection distance from beam exit point of the first echo A%B Amplitude (as % of Full Screen Height) of the highest echo to
that crosses gate B threshold of all beams in scan. cross B-Gate in the beam selected by the beam cursor
Gate A Readouts - Selected Beams SB^ Soundpath represented by the highest echo to cross B-Gate
A%A Amplitude (as % of Full Screen Height) of the highest echo to in the beam selected by the beam cursor
cross A-Gate in the beam selected by the beam cursor ZB^ "Uncorrected depth to the reflector represented by the
SA^ Soundpath represented by the highest echo to cross A-Gate highest echo in B-Gate in the beam selected by
in the beam selected by the beam cursor the beam cursor."
ZA^ "Uncorrected depth to the reflector represented by the DB^ "Volume corrected depth to the reflector represented by the
highest echo in A-Gate in the beam selected by the highest echo in B-Gate in the beam selected
beam cursor" by the beam cursor."
DA^ "Volume corrected depth to the reflector represented by the PB^ Projection distance from specified origin to the reflector
highest echo in A-Gate in the beam selected by represented by the highest echo in B-Gate in the beam
the beam cursor." selected by the beam cursor.
PA^ Projection distance from specified origin to the reflector
represented by the highest echo in A-Gate in the beam
selected by the beam cursor.
AP-16
RB^ Projection distance from beam exit point to the reflector TmB Minimum thickness in Gate B in the current displayed E-scan
represented by the highest echo in B-Gate in the beam TmBA Minimum thickness difference between Gate B and Gate A in
selected by the beam cursor the current displayed E-scan
SB/ Soundpath of the first echo that crosses gate B threshold in TSmA The minimum thickness seen in Gate A since last reset of the
the beam selected by the beam cursor. MIN automatically clears after decoupling for 20 seconds
ZB/ Uncorrected depth of the first echo that crosses gate B TSmB The minimum thickness seen in Gate B since last reset of the
threshold in the beam selected by the beam cursor. MIN automatically clears after decoupling for 20 seconds
DB/ Volume corrected depth of the first echo that crosses gate B TSmBA The minimum thickness seen Gate B to A since last reset of
threshold in the beam selected by the beam cursor. the MIN automatically clears after decoupling for 20 seconds
PB/ Projection distance from specified origin of the first echo that
crosses gate B threshold in the beam selected by the beam Statistical Measurements - Corrosion Application ONLY
cursor. Tmin Minimum thickness within the defined statistical area
RB/ Projection distance from beam exit point of the first echo Tmax Maximum thickness within the defined statistical area
that crosses gate B threshold in the beam selected by the
Tmean Mean or Average thickness within the defined statistical
beam cursor.
area
Gate A-B Readouts - Selected Beams Tloss% Wall thickness loss in % from scanning surface
SBA "Soundpath difference between the echoes in Gate A and
Gate B in the beam selected by the beam
cursor."
PBA Projection distance difference between the echoes in Gate A
and Gate B in the beam selected by the beam cursor.
DBA Volume corrected depth difference between the echoes in
Gate A and Gate B in the beam selected by the beam cursor.
RBA Projection distance from beam exit point difference between
the echoes in Gate A and Gate B in the beam selected by the
beam cursor.
Corrosion Readouts & Measurements (Corrosion Application
ONLY)
TA Thickness in selected beam in Gate A
TB Thickness in selected beam in Gate B
TmA Minimum thickness in Gate A in the current displayed E-scan
AP-17
BWR Ratio of Amplitude between Max to Minimum Thickness SBM1 Soundpath measurement from the selected BEAM at the
within the defined statistical area crossing point with Horizontal Cursor 1
T% % of thickness loss for the cross hair position of data Z1 Uncorrected vertical depth of the horizontal cursor.
cursor P1 Projected horizontal distance from Origin line to Cursor 1
T Thickness of the cross hair position of data cursor intersection
Statistical Measurements - General Applications L1-2 Straight line distance from Cursor 1 inter-section to cursor
2 intersection
Len Length of the Statistical Box which can be used for
indication sizing P1-2 Absolute Projected horizontal distance from Vertical
Cursor 1 to Vertical Cursor 2
H Height of Statistical Box along Depth Axis for indication
sizing Z1-2 Uncorrected distance from Horizontal Cursor 1 to
Horizontal Cursor 2
W Width of Statistical Box along Index Axis for indication
sizing (Only for C-scan) Z2 Uncorrected vertical Depth to Horizontal Cursor 2
Max Amp Maximum Amplitude within Box region P2 Projected horizontal distance from Origin line to Vertical
Cursor 2
Z Material Depth of Indication with respect to the indication
of Maximum Amplitude SBM2 Soundpath measurement from the selected Beam at the
Horizontal Cursor 2 intersection
D True Depth (Leg corrected Depth) with respect to the
indication of Maximum Amplitude Cross Hair Measurements in TOFD
S Soundpath of Indication with respect to the indication of Z1 Uncorrected vertical depth to horizontal cursor 1
Maximum Amplitude Z2 Uncorrected vertical depth to horizontal Cursor 2
TOF Time of Flight with respect to the indication of Maximum Z1-2 Uncorrected distance from Horizontal Cursor 1 to
Amplitude Horizontal Cursor 2
A%r Relative Amplitude of TCG with respect to the indication of X1 Displays the position on data cursor 1 along scan axis
Maximum Amplitude
X2 Displays the position on data cursor 2 along scan axis
dBr Relative dB of TCG with respect to the indication of
X1-2 Scan position distance between vertical cursor 1 to vertical
Maximum Amplitude
cursor 2
Cross Hair Measurements - C Scan AMP1 Amplitude (% Full Screen Height) of cursor 1 intersection
X Displays the position on data cursor along scan axis AMP2 Amplitude (% Full Screen Height) of cursor 2 intersection
Y Displays the position on data cursor along index axis TOF1 Time of Flight in us to horizontal cursor 1
A Amplitude in % (as of % FSH) for the cross hair position of TOF2 Time of Flight in us to horizontal cursor 2
data cursor
Cross Hair Measurements in E-scan / S-scan
AP-18
Dead Element Check Readouts - PAUT ONLY dBrB dB difference between the reference echo and the highest
Adj Dead El. Number of instances of 2 adjacent dead elements that can echo to cross B-Gate.
be allowed Conventional UT Readouts
Dead El. Displays the % of dead elements Corrosion Readouts - Corrosion Application ONLY
Dead Elements Display the physical number of element which are dead TA Thickness in selected beam in Gate A
Elem. Sensitivity Sensitivity of the dead element in relation to average TB Thickness in selected beam in Gate B
amplitude of all the live element versus dead element SA Sound-Path distance or duration represented by the
Encoder Calibration Readouts highest echo to cross A-Gate
Ref. Position X Display the position of encoder (X) along scan axis SB Sound-Path distance or duration represented by the
Ref. Position Y Display the position of encoder (Y) along index axis highest echo to cross B-Gate
Stop Position X Displays the position of encoder (X) only after starting the SBA Sound-Path distance or duration from the highest echo in
encoder calibration along scan axis A-Gate to the echo in B-Gate. Reading is only available if
B-Gate and A-Gate are on.
Stop Position Y Displays the position of encoder (Y) only after starting the
encoder calibration along scan axis DA Material-thickness depth from the test-piece surface (the
probe-contacted side) to the reflector represented by the
Data Acquisition & Analysis Readouts echo in A-Gate.
Error Rate % of missing lines in acquired scan area DB Material-thickness depth from the test-piece surface (the
Max Scan Speed Display of maximum possible scan speed for the data probe-contacted side) to the reflector represented by the
acquisition echo in B-Gate
Time Position Displays the position of time in seconds along scan axis LA Leg number of the reflector represented by the echo in
during data acquisition A-Gate.
Scan Position Displays the position of encoder (X) along scan axis during LB Leg number of the reflector represented by the echo in
data acquisition B-Gate.
Index Position Displays the position of encoder (Y) along index axis during PA Projection distance from the probe’s BIP to the reflector
data acquisition represented by the echo in A-Gate, minus the inputted
TCG Readouts X-VALUE.
A%rA Amplitude of the signal crossing the A-Gate as a PB "Projection distance from the probe’s BIP to the reflector
percentage of the reference amplitude represented by the echo in B-Gate, minus the
inputted X-VALUE."
A%rB Amplitude of the signal crossing the B-Gate as a
percentage of the reference amplitude RA Projection distance from the probe’s BIP to the reflector
represented by the echo in A-Gate.
dBrA dB difference between the reference echo and the highest
echo to cross A-Gate.
AP-19
RB Projection distance from the probe’s BIP to the reflector C-ATTENUATION "Determined by subtracting 1 inch from the sound-path
represented by the echo in B-Gate. distance to the discontinuity, using the equation (inch
A%rA Amplitude of the signal crossing the A-Gate as a units): C = (SA–1) × 2.
percentage of the active EVAL MODE’s reference This compensates for sound loss from material attenuation
amplitude. along the sound path to the discontinuity."
A%rB Amplitude of the signal crossing the B-Gate as a D-D1.1 RATING Calculated based on the AWS formula: D = A-B-C
percentage of the active EVAL MODE’s reference DGS Readouts - CV ONLY
amplitude. A%rA Amplitude of the signal crossing the A-Gate as a
dBrA dB equivalent height difference between the signal percentage of the active EVAL MODE’s reference
crossing A-Gate and the active CALIBRATION MODE’s amplitude.
reference height. A%rB Amplitude of the signal crossing the B-Gate as a
dBrB dB equivalent height difference between the signal percentage of the active EVAL MODE’s reference
crossing B-Gate and the active CALIBRATION MODE’s amplitude.
reference height dBrA dB equivalent height difference between the signal
SBA Soundpath difference between the echoes in Gate A and crossing A-Gate and the active CALIBRATION MODE’s
Gate B reference height.
PBA Projection distance difference between the echoes in Gate dBrB dB equivalent height difference between the signal
A and Gate B crossing B-Gate and the active CALIBRATION MODE’s
DBA Volume corrected depth difference between the echoes in reference height
Gate A and Gate B ERS Evaluates the reflected echo and calculates the Equivalent
RBA Projection distance from beam exit point difference Reflector Size
between the echoes in Gate A and Gate B Gt DGS test gain, which initializes the DGS curve’s max height
AWS D1.1 Readouts - CV ONLY at 80% FSH
A-INDICATION "Gain (in dB) required to position an A-Scan echo’s peak Gr DGS reference gain, which represents the instrument gain
(from the measured reflector) at an at which the reference echo’s peak reaches 80% FSH
amplitude equal to the reference amplitude (between 10 TOFD Readouts
and 90% of full screen height)" PCS Actual PCS value measured based on lateral wave on Gate
B-REFERENCE "Gain (in dB) required to position an AScan echo’s peak A and backwall on Gate B
(from the reference reflector) at the user A%A Amplitude (as % of Full Screen Height) of the echo to cross
selected amplitude (between 10 and 90% of FSH)" A-Gate
A%B Amplitude (as % of Full Screen Height) of the echo to cross
B-Gate
AP-20
A%LW Amplitude (as % of Full Screen Height) of the lateral wave

recorded during sensitivity calibration
TOF A Time of flight of the echo to cross A-Gate in us
TOF B Time of flight of the echo to cross B-Gate in us
SA Sound-Path distance or duration represented by the echo
to cross A-Gate
SB Sound-Path distance or duration represented by the echo
to cross B-Gate
ZA Material-thickness depth from the test-piece surface (the
echo in A-Gate.
ZB Material-thickness depth from the test-piece surface (the
echo in B-Gate.
TOFD G Offset Gain added or reduced after the sensitivity calibration is
done
Ref. Position X Display the position of encoder (X) along scan axis
Stop Position X Displays the position of encoder (X) only after starting the
encoder calibration along scan axis
Error Rate % of missing lines in acquired scan area
Max Scan Speed Display of maximum possible scan speed for the data
acquisition
AP-21
Appendix B – Specifications
Physical
Dimensions (W x H x D) 295 mm x 230 mm x 60 mm (12” x 9.4” x 2.4”)
Weight, instrument w internal battery 2.9 kg (6.5 lbs)
MUX Dimensions (W x H x D) 218 mm x 213 mm x 104 mm (8.6" x 8.4" x 4.1")
MUX Weight, with battery 2.9kg (6.5 lbs)
Display
Size 264 mm (10.4”) diagonal
Resolution 1024 x 768 pixels
Mode Indoor and Outdoor specific color modes
Viewing Angle ± 85˚ all directions
Operating System
Operating System Linux x64 Bit
Touch Screen
Technology PCAP - Projected Capacitance, multi-touch
Gloved Operation Yes
Surface Chemically strengthened glass, scratch resistant, chemical resistant, optically bonded to display
Storage
Solid State Hard Drive 128 GB
Maximum Data File Size 2.55 GB
USB Storage USB 2.0 with included module
Data Capture
Data Files Full ASCAN capture for every CSCAN point, all settings. Recall on instrument with full analysis capability.
Settings Files All instrument settings plus position in workflow.
Screen Capture JPG Format
Report PDF Format
AP-22
Connectivity
Wi-Fi Yes… 802.11 b, g, n
InspectionWorks Enabled Yes
Remote Collaboration Local Network and Internet-Enabled via InspectionWorks Connect
I/O via included module
Encoder Axes 2 digital quadrature encoders for X-Y axes
Encoder Power Output 5 VDC, 0.5 A max
Alarm TTL
Audible Tone, 2.7 kHz
Ethernet GigaBit Ethernet (Category 6)
Power
Internal Battery 74 WH Lithium Ion
External Battery (included) 84 WH Lithium Ion
MUX Battery 84 WH Lithium Ion
AC Supply Supply and charge
Input 100 to 240 VAC, 47 - 63 Hz, 1.9 A
MUX Input 100 to 240 VAC, 47 - 63 Hz, 1,9 A, 12 VDC
Battery Life 3 hrs internal, 6 hrs with included external battery under typical operating conditions
Transport Compliance Meets IATA air transport regulations with one contained in battery and one packed with (Not Installed) external battery
Environmental
Operating Temperature -21C to +55C
Storage Temperature -21C to + 70C
Humidity 95%, non-condensing
Ingress Protection IP65
Shock 4’ drop, Shock, Transit Drop, Vibration per Mil STD 810G
Altitude 2000 M max
AP-23
Data Visualization
User Interface Customizable with Mentor Create software
Zoom Any data view may be expanded to full screen with gesture
Instructional Material Rich Text, JPG, PNG, BMP, PDF or Video (MP4)
"Phased Array: ASCAN, ESCAN, SSCAN, BSCAN, CSCAN, CSCAN OVERVIEW, AMPLITUDE MAP, DEPTH MAP
Views TOFD: ASCAN, TOFD
Conventional: ASCAN, CSCAN, CSCAN OVERVIEW, BSCAN"
Probe Selection Swap between conventional and phased array on same screen
Measurements Amplitudes, Depth, Distance, % Wall Loss, Thinnest point, X&Y Positions
"Phased Array: TCG, Material Velocity, Delay, Sensitivity, Encoder Cal, Dead Element Check
TOFD: PCS, Sensitivity, Encoder Cal
Calibrations Conventional: 2 Point (Material Velocity & Probe Delay), Auto 80, DAC/TCG, AWS D1.1, DGS"
Ultrasonic
Array / MUX Module Conventional / TOFD
Scanning
Aperture 1-32 elements
Max Elements 32
Focal Laws 1024
Electronic Pattern Linear, Sector, T/R or PR
Multigroup Up to 8 Groups of Phased Array UT
Pulser
Pulse Shape Bipolar square wave Bipolar square wave; Negative Square; Positive Square
Voltage 20 - 150 in 5 V steps 20 - 150 in 5 V steps Bi, 10-75 Uni
Width (auto or manual) 50 - 3000 nS 32-512 nS
Output impedence 40Ω 20Ω
Delay Step Increment 10 nS N/A
Receiver & Digitizer
Gain 0 - 78 dB in 0.2 dB steps 0 to 95dB in 0.2dB steps
TCG
Number of points Up to 16 Up to 16
Slope 50 dB/µS 50 dB/µS
AP-24
Rectification Pos HW, Neg HW, Full, RF Pos HW, Neg HW, Full, RF
System Bandwidth 0.5 MHz to 15 MHz 0.5 MHz to 15 MHz
Input Impedence 50Ω 150 Ω or 50 Ω, selectable
PRF 10 Hz to 20 kHz 10 Hz to 20 kHz
Digitizing Rate 62.5 MHz, upsampled to 500 MHz 62.5 MHz, upsampled to 500 MHz
Delay Step Increment 2.5 nS N/A
Acquisition Range 50 nS to 150 µS 50 nS to 150 μS
ASCAN Compression Points 512, 1024, 2048, 4096 512, 1024, 2048, 4096
1, 2, 4, 5, 7.5, 10 MHz, 2.5 - 12.5 MHz, 1-5 MHz, 2-10 MHz,
Filters 1, 2, 4, 5, 7.5, 10, 15 MHz and 2.5 - 12.5 MHz
3-12 MHz, 5-18 MHz, 0.5 - 15 MHz
Gates A, B and IF, controlled by gesture or menu parameters A and B controlled by gesture or menu parameters
TOF Modes J-Flank, Flank, Zero Before, Zero After, Peak J-Flank, Flank, Zero Before, Zero After, Peak
Amplitude Modes Readings up to 800% FSH - deep dynamic range Readings up to 800% FSH - deep dynamic range
Start Modes Initial Pulse, IF Initial Pulse
Thickness Resolution 0.05 mm (0.002”) 0.05 mm (0.002”)
Veocity Range 500 m/s to 16000 m/s 500 m/s to 16000 m/s
Screen Refresf Rate for A-scan Equal to Pulse Repition Rate. Digitally processed Equal to Pulse Repition Rate. Digitally processed
Digitizer Vertical Resolution 14b x 2 14b x 2
Highest digitized frequency 15 MHz 15 MHz
Timebase error <0.5% <0.5%
Input Voltage at FSH 5.5V 5.5V
Maximum Input Voltage 5.5V (Nominal) 5.5V (Nominal)
Linearity of Vertical Display <2% FSH Error <2% FSH Error
Linearity of vertical display over
the extreme frequency ranges of the <2% FSH Error <2% FSH Error
instrument
Dead time after transmitter pulser <1 µs <1 µs
AP-25
Equivalent input noise <91 nV

Dynamic Range > 80dB > 80dB
Cross-Talk between receivers Isolation > 55 dB
Gain Linearity ± 2dB ± 2dB
Channel Gain Variation <2dB
Threshold operation Coincidence or Anti-Coincidence Coincidence or Anti-Coincidence
Averaging N/A Up to 256
NOTE: Mentor UT, also including the MUX, complies to the EN ISO 18563-1. The tests for the conventional
channel are based on the EN 12668-1.
AP-26
IT Technical Support Access Information

Email: RemoteService@ge.com
Global Phone: 1-866-243-2638
AP-27

Mentor UT: User's Manual

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Mentor UT: User's Manual

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Mentor UT

Date: 08/22/2017 File: 104M6211_RevB

In service situations, please contact: Email: RemoteService@ge.com

Copyright by GE Measurement & Controls - Inspection Technologies

Overview and Active C-Scan Displays................................................................3-43 Global Gain & Gates...................................................................................................3-68

Defects/Errors and Exceptional Stresses

Limited Service Warranty

Safety Information Informations sur la sécurité

Types of Safety Messages in this Manual

The instrument contains a Lithium Ion battery and magnesium in its

RED directive 2014/53/EU

Notifications for Wireless Modules:

Canadian Notice for Wireless:

FCC Notice for Wireless:

Disposal of packaging materials

Using this Manual

Powering On and Connecting to

The MUX Module

Phasor Connector, Instrument Side

Interfaces • LEMO 00 coax connector – To connect the conventional

• X-Y: 7-Pin LEMO 00 – Quadrature encoder

• USB 2.0 – For data and file transfer

• HDMI – To connect with external monitors or projectors.

• Ethernet LAN – For Remote Desktop Connection. also

Connecting the MUX Module

1 – Use touch screen to select any application loaded into the

3 – Press to access and load additional application files (including those

4 – Press at any time to return to the Desktop.

5 – Press to access System Settings, (User Preferences, etc.), File

6 – Select to open the Application Information box that, along

Installing New Apps

1 – Identifies which panel of the active application is currently

Static Controls – Instructional purposes

Parameter Controls – system wide settings effect instrument operation.

1 – Information-only panels include instructions, illustrations,

1 – When parameter values are set to create a physically

Single Element Data Display Gate Setup: Single Element

5 – Displays the active parameter’s current value.

6 – Select the desired value for the active parameter.

Two Point Calibration

CV - DAC / TCG Using DAC

Recording the DAC Curve

To program the DAC Curve, perform the following steps:

Working with DAC Curves

Generating the TCG Reference Curve

Working with TCG

Adjusting DAC / TCG Display

1. With the Calibration Menu accessed, select DAC/TCG Mode = TCG

Defining DAC or TCG Curve

1. Access the CALIBRATION Submenu (located in A-scan View)_.

4. If CUSTOM offset MODE is selected, access the Offset 1, Offset 2, Offset 3,

Upto 4 offset lines are drawn at fixed increments from

This feature allows analysis of welds according to AWS specifications D1.1 or

NOTE: The dB value of A-Indication will be automatically adjusted to match

AWS Setup DGS Calibration

• Size S of the circular disk-shaped equivalent reflector. The influencing

• Amplitude Correction Value

The following probe parameters affect the curve shape:

• Element or Crystal diameter

• Calibrate the instrument/probe combination

Preparing to Record the Reference Echo

1 Press Probe submenu (located in A-Scan view).

MWB60-4 tD** 500682