Documente Academic
Documente Profesional
Documente Cultură
Dual Studies
ID#: 21211412
Jerusalem – Palestine
Academic year: 2019-2020
Table of Contents
Activities Achieved...............................................................................................................................8
Obstacles:..............................................................................................................................................9
Lessons Learned:.................................................................................................................................10
Recommendations:..............................................................................................................................10
Conclusion...........................................................................................................................................10
References…………………………………………………………………………….…………………………………………………………12
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About Al – Quds University
Al-Quds University (The Arab University in Jerusalem) is a non-profit public higher
education institution located in the rural setting of the large city of Jerusalem called Abu Dis
and is officially accredited by the Ministry of Education and Higher Education. Al-Quds
University is a medium-sized coeducational institution which offers courses and programs
leading to officially recognized higher education degrees such as pre-bachelor degrees (i.e.
certificates, diplomas, and associate or foundation degrees), bachelor degrees, and master
degrees in several areas of study. The University also provides several academic and non-
academic facilities and services to students including a library, housing, sport facilities and/or
activities, financial aids and scholarships, study abroad and exchange programs, as well as
administrative services.
The Institute for Photovoltaics researches and teaches with regard to the manufacturing,
characterization and use of materials, components, and systems in semiconductor electronics
and electrical energy storage systems; with a special focus on their use in renewable energy.
Further activities include defect-free laser processing of semiconductors and sensor
technology.
This program has been designed to give the Palestinian students the opportunity to raise their
professional level and gain knowledge to be effective in the Palestinian labor market.
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The Dual Studies program was launched in 2015, and offered a bachelor degree in Electrical
Engineering and Information Technology, in 2016, the program also offered a degree in
Business Administration.
Introduction:
This internship in the Sensor technology department of the institute of photovoltaics was
about developing a software and hardware system to detect the defects in the solar modules
automatically, and the internship was divided into sub main tasks to reach our goal.
Task #I: Crack labelling using image labeler tool from MATLAB:
Image segmentation is a commonly used technique in digital image processing and analysis
to partition an image into multiple parts or regions, often based on the characteristics of the
pixels in the image. Image segmentation could involve separating foreground from
background, or clustering regions of pixels based on similarities in color or shape.
Task #II: Labeled Images analysis
The aim of this task, is to compare the accuracy and error of the human labeled images
using MATLAB image labeler tool, the same images were labeled by different employees.
The identified cracks in the solar cells, will be the outputs of the Neural Network (the final
task) which will be used to identify the defects in the solar cells automatically in the future,
and so, we wanted to study the effect of the human error on the labeled images, which could
also be used to further reduce the error in the next time.
Method: Image processing
The size of the labeled crack differs from on employee to another, based on the size of the
brush used to label the cracks, and so the first thing to be done, as a solution to this problem,
and to unify the size of the labeled cracks from different employees was to use something
called Skeletonization, in which the width of the crack is reduced to one pixel only.
The next step is to analysis those cracks, and to do this, I classified the cracks into 3 types:
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1- Separated crack (end point to end point crack)
2- Brach to Brach crack
3- Branch point to End Point Crack
Based on this classification, we developed python script to compare the cracks in each
labeled image for certain employees (e.g. Mohannad vs Pascal).
The comparison included (per each label):
1- Type of cracks.
2- Count of Cracks
3- Length of cracks in Pixels
4- Location of Cracks (starting and ending point of the cracks)
The final data was written an Excel sheet contain the previous data, which was used
later to discuss the differences in labeling between the employees.
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At the pixel level, the bus bars are just two straight lines that extends from edge to the edge of
the solar cell image, and to save time and effort (we didn’t want to label them using the
MATLAB image labeler tool), we developed a software that could search for the busbars and
return them.
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modifications of the software, for example, the neural network should return the busbars and
the cracks, so we don’t have to search for the busbars again in the image.
Method:
We developed 3 models of CNN, 54 layer NN, 67 and 103 layers NN, then we used the
collected data to train the neural network.
Input Images are called features
Labeled Images are called labels
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The neural network will learn from the 3 labeled classes (crack, busbar and background) to
segment the images.
The parameters to be adjusted to train the neural network to get the best accuracy and reduce
the loss, are the learning rate, number of epochs and number of classes.
We trained the first model (67 layer) on 600 images/labels divided into:
Training set 60%
Validation set 20%
Testing set 20%
Accuracy and Loss measurement method:
Intersection over Union
The Intersection over Union (IoU) metric, also referred to as the Jaccard index, is essentially
a method to quantify the percent overlap between the target mask and our prediction output.
This metric is closely related to the Dice coefficient which is often used as a loss
function during training.
Quite simply, the IoU metric measures the number of pixels common between the target and
prediction masks divided by the total number of pixels present across both masks.
IoU=target∩predictiontarget∪predictionIoU=target∩predictiontarget∪prediction
As a visual example, let's suppose we're tasked with calculating the IoU score of the
following prediction, given the ground truth labeled mask.
Results:
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figure(2): Model Acc
The model shows that the accuracy is increasing with the number of epoch, epoch one
iterations of all the data set
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figure(3): Model Loss
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figure(5): Example of labeled defected cell, red most defected, and blue least defected
Obstacles:
The training period was very informative but the time was too short to gather all the
information in such a great topic.
Lessons Learned:
- How to use Machine learning to solve problems in Electrical Engineering.
- New techniques and methods of working in Electrical Engineering.
Conclusion
This practical phase was a shift in applying electrical engineering new sciences, using
machine learning and neural networks which is a very powerful tool, new instruments and
methods of working especially in the field of solar energy development were introduced in
this phase, and this exchange program could really change the way how the students look
towards the Electrical Engineering.
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References:
1- Krizhevsky, A., Sutskever, I. and Hinton, G.E., 2012. Imagenet classification with
deep convolutional neural networks. In Advances in neural information processing
systems (pp. 1097- 1105).
2- Wei Xiong , Bo Du, Lefei Zhang, Ruimin Hu, Dacheng Tao "Regularizing Deep
Convolutional Neural Networks with a Structured Decorrelation Constraint ” IEEE
16th International Conference on Data Mining (ICDM) , pp. 3366–3370, 2016.
3- O. Russakovsky, J. Deng, H. Su, J. Krause, S. Satheesh, S. Ma, Z. Huang, A.
Karpathy, C. V Jan, J. Krause, and S. Ma, “ImageNet Large Scale Visual Recognition
Challenge.”.
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