Documente Academic
Documente Profesional
Documente Cultură
Loretta Arellano
Hughes Aircraft Company
P.O. Box 92426
Los Angeles, CA 90009
(3 10) 334-4248
I -1 43
(periodically in use or during initiated diagram can be developed which indicates
diagnostics), the probability of repeating the the dependencies. Redundancies, both
failures during diagnostics becomes very physical and functional, can be utilized and
high. taken into account. Several tools are
commercially available to quantify the
Manufacturina contribution probability of system success. Some System
The manufacturing process, if not controlled, Reliability figures of merit include: Mean
can be the largest contributor to high Time Between Failure (MTBF), Mean Time
warranty costs. Environment Stress Between Critical Failures (MTBCF), Mean
Screening (ESS) is a technique used to Time Between Maintenance Actions
eliminate poor workmanship and defects and (MTBMA), A, (Operational Availability), or R,
can be conducted at the part, board, unit or where R is the probability of success in a
system level. ESS involves subjecting the defined mission or period of use.
hardware to several cycles of temperature
extremes and usually includes some level of Once the system reliability is quantified,
vibration. By monitoring ESS failures and trades can be performed to weigh reliabifity
determining the root causes of failure, the against performance, the support concept
manufacturing processes can be improved. and cost A non-repairable or safety critical
In manufacturing large quantities of system requires a high confidence of
assemblies, maintaining high levels of survival, whereas an accessible repairable,
throughput require monitoring and analyses low cost system may tolerate a less reliable
such as Statistical Process Control (SPC) system.
techniques.
Failure Modes, Effects and Criticalla
Repair contribution Analysis (FMECA)
If hardware is returned for repair, the process Evaluating the effect of Failures to minimize
of re-furbishing can be life limiting. their effects is essential for safety critical
Unsoldering and re-soldering components systems. Redundancy mechanisms need to
require heat and solvents to be used. The be evaluated to prevent ‘single point failures’
effects of these should be considered when that void the redundant design. Reliability
re-deploying re-furbished hardware. critical components (new technologies,
temperature sensitive, large quantities per
Once the reliability drivers and objectives are system, etc.) are candidates for a detailed
understood, analyses and tests can be physics of failure analysis or being subjected
performed to balance reliability with cost, to accelerated life tests. Fault detectionffault
performance and supportability. In order to isolation analysis can be combined with the
design in reliability, a thorough Reliability FMECA. If built-in-test (BIT) is used in the
program should include the following types of design, all failure modes identified in the
activities: FMECA should be detected by BIT.
437
Electronic PartsICircuits Tolerance Analysis the growth in reliability. Via lognog plots of
JEPICTA) MTBF vs. test time we can project achieving
An EPICTA, also known as a worst case the MTBF required in subsequent product
analysis, is used to ensure that component production. In analyzing the failures during
tolerance build-up does not alter system RDIGT, a FMECA is a crucial tool to identify
performance. It should take into account the failure mechanism causing the failure.
such parameters as vol ge, power, and
aging effects. This analysis can be Conclusion
rmed using simulation or by actual These are several of the critical analyses to
be performed to assure the expected
reliability will be achieved. However, to
Derating Analysis assure the System Reliability will not
Electrical component derating is limiting the diminish as production continues it is
component temperatures and electrical necessary to continue observing failures,
stresses to optimize the inherent reliability of analyzing the root causes, and improving on
the components. Typical rule of thumb is to the process.
-
ESS
of a product, Reliability
Tests (RDIGT) are
performed, also known as Test, Analyze And
Fix (TAAF). The purpose is to test the
hardware under mission critical conditions for
sufficiently long periods to surface and fix
any failures that preclude achieving the
required MTBF. During the test period all
failures are to be analyzed, fixed and testing
resumed. By continuing in this fashion for
many hours (usually 3-10 times longer than
the MTBF of the product), we can observe