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A Third Party View of Soft Errors
" “This trend has not been that noticeable until the industry
reached the 0.13µm process node”
" “As speed increases and silicon area and voltage decrease the
performance continues to increase. Unfortunately, the System
SER is increasing right along with global performance”
System SER
1000
100
10
1
0.25 um 0.18 um 0.13 um 0.09 um 0.05 um Source: Semico Research 6/02
10000
2008
N e tw o rk in g
C o m p u tin g
Normalized FIT Rate
T e le c om
1000
C r itica l A p p lic atio n s 2005
(S p a c e , A u to m o tiv e ,
S m a rt C a rd )
100 2001
2012
10
2003
W ir eless
1999 P C P er ip h er a ls
1 .0 PC
1997
S oft E rr o r R a te E x tr a cted fr o m
A M D , In tel, C om p a q
0 .1 Source:
0 .3 5 u m 0 .3 0 u m 0 .2 5 u m 0 .2 0 u m 0 .1 5 u m 0 .1 0 u m 0 .0 5 u m
iRoC
Technologies
Semico Research
Corp June 2002