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Features
Order code VDS @ TJmax RDS(on) max ID
STL16N65M2 710 V 0.395 Ω 7.5 A
1 2 3 4
Top View
S(1, 2, 3)
AM15540v2
Contents
1 Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2.1 Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
6 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
1 Electrical ratings
2 Electrical characteristics
Drain-source
V(BR)DSS VGS = 0, ID = 1 mA 650 V
breakdown voltage
VGS = 0, VDS = 650 V 1 µA
Zero gate voltage
IDSS VGS = 0, VDS = 650 V,
drain current 100 µA
TC=125 °C
Gate-body leakage
IGSS VDS = 0, VGS = ± 25 V ±10 µA
current
VGS(th) Gate threshold voltage VDS = VGS, ID = 250 µA 2 3 4 V
Static drain-source
RDS(on) VGS = 10 V, ID = 3.5 A 0.325 0.395 Ω
on-resistance
Table 6. Dynamic
Symbol Parameter Test conditions Min. Typ. Max. Unit
0.2
LV
HD
DU RQ V 0.1
LV '6 10 -1 0.05
WK 5
LQ D[ 0.02
Q P
WLR \ V
UD GE 0.01
SH WH
2 LPL
/ PV
7M &
7F &
6LQJOHSXOVH
10 -3
9'69 10-6 10-5 10-4 10-3 10 -2 10 -1 100 tp(s)
9
9'69 9*69
Figure 6. Normalized gate threshold voltage vs. Figure 7. Normalized V(BR)DSS vs. temperature
temperature
GIPD180920141442FSR GIPD180920141448FSR
VGS(th) V(BR)DSS
(norm) (norm)
ID = 250 µA
1.1 1.08
ID= 1mA
1.0 1.04
0.9 1.00
0.8 0.96
0.7 0.92
0.6 0.88
-75 -25 25 75 125 Tj(°C) -75 -25 25 75 125 Tj(°C)
2.2
VGS= 10V
1.8
1.4
1
0.6
0.2
,'$ -75 -25 25 75 125 Tj(°C)
Figure 10. Gate charge vs. gate-source voltage Figure 11. Capacitance variations
*,3')65 *,3')65
9*6 9'6 9 &
9 S)
9'6
9'' 9
,' $ &LVV
&RVV
&UVV
4JQ& 9'69
Figure 12. Output capacitance stored energy Figure 13. Source-drain diode forward
characteristics
*,3')65 *,3')65
( 96'
- 9
7M &
7M &
7M &
9'69 ,6'$
3 Test circuits
Figure 14. Switching times test circuit for Figure 15. Gate charge test circuit
resistive load
VDD
12V 47kΩ
1kΩ
100nF
RL 2200 3.3
μF μF
VDD IG=CONST
VD Vi=20V=VGMAX 100Ω D.U.T.
VGS 2200
RG D.U.T. μF 2.7kΩ VG
PW
47kΩ
PW 1kΩ
AM01468v1 AM01469v1
Figure 16. Test circuit for inductive load Figure 17. Unclamped inductive load test circuit
switching and diode recovery times
L
A A A
D
FAST L=100μH VD
G D.U.T. DIODE 2200 3.3
μF μF VDD
S B 3.3 1000
B B μF μF
25 Ω VDD ID
D
RG S
Vi D.U.T.
Pw
AM01470v1 AM01471v1
Figure 18. Unclamped inductive waveform Figure 19. Switching time waveform
9%5'66 ton toff
tr tdoff tf
9' tdon
90% 90%
,'0
10%
,' 10% VDS
0
8368143_Rev_B
A 0.80 1.00
A1 0.02 0.05
A2 0.25
b 0.30 0.50
D 5.00 5.20 5.40
E 5.95 6.15 6.35
D2 4.30 4.40 4.50
E2 3.10 3.20 3.30
e 1.27
L 0.50 0.55 0.60
K 1.90 2.00 2.10
8368143_Rev_B_footprint
P2 P0
T 2.0±0.1 (I) 4.0±0.1 (II)
(0.30 ±0.05)
Do E1
Ø1.55±0.05 1.75±0.1
Y
20
0.
D1
EF
F(5.50±0.1)(III)
R
W(12.00±0.3)
Ø1.5 MIN.
Bo (5.30±0.1)
C
L
REF
.R0
.50
Y
P1(8.00±0.1) Ao(6.30±0.1)
Ko (1.20±0.1)
SECTION Y-Y
(I) Measured from centerline of sprocket hole Base and bulk quantity 3000 pcs
to centerline of pocket.
(II) Cumulative tolerance of 10 sprocket
holes is ± 0.20 .
(III) Measured from centerline of sprocket
hole to centerline of pocket.
8234350_Tape_rev_C
W3
PART NO. 11.9/15.4
1.90
2.50
W2
18.4 (max)
R25.00
SENSITIVE DEVICES
ATTENTION
ØN A
178(±2.0) 330 (+0/-4.0)
4.00
2.50
ESD LOGO
77
W1
12.4 (+2/-0)
PS
06 ØA
128
R1.10
2.20
Ø21.2
CORE DETAIL
8234350_Reel_rev_C
6 Revision history
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