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  • Tmax RN

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    daisy_cynthia
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    TetraMAX 2007 includes a set of commands, command options, and flows for small delay defect testing. The new write simtrace command generates Verilog constructs to monitor signals of interest for additional automation when debugging mismatches. O Per-cycle pattern masking. Fail data files, either from a Verilog testbench / DPV simulation or from the ATE, can be used to mask expected responses in a pattern set.

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    TetraMAX 2007 includes a set of commands, command options, and flows for small delay defect testing. The new write simtrace command generates Verilog constructs to monitor signals of interest for additional automation when debugging mismatches. O Per-cycle pattern masking. Fail data files, either from a Verilog testbench / DPV simulation or from the ATE, can be used to mask expected responses in a pattern set.

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    60 vizualizări1 pagină

    Tmax RN

    Încărcat de

    daisy_cynthia
    TetraMAX 2007 includes a set of commands, command options, and flows for small delay defect testing. The new write simtrace command generates Verilog constructs to monitor signals of interest for additional automation when debugging mismatches. O Per-cycle pattern masking. Fail data files, either from a Verilog testbench / DPV simulation or from the ATE, can be used to mask expected responses in a pattern set.

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    din 1

    What's New in TetraMAX 2007.

    12
    The following are the key features included in the TetraMAX 2007.12 release. For the most
    current information, see the TetraMAX release notes on the Synopsys SolvNet site at
    https://solvnet.synopsys.com/login/designsphere.

    o SDC Support for Timing Exceptions SDC files can be read to specify setup timing
    exceptions, instead of using add slow path commands or running the
    write_timing_exceptions script in PrimeTime. The SDC files can be written by PrimeTime,
    or can be user-generated, but must adhere to legal SDC syntax.

    o Small delay defect testing. TetraMAX now includes a set of commands, command options,
    and flows that can be used for small delay defect testing.

    o Test-point insertion based on undetected fault topology. This feature analyzes the
    topological location of undetected faults and creates a list of test points that can be inserted
    into the netlist to increase the test coverage. The new run testpoint analysis command uses
    an improved algorithm and will replace the older run observe analysis command in future
    releases. For now, both commands are available in TetraMAX.

    o Write simtrace for mismatch debugging. The new write simtrace command generates
    Verilog constructs to monitor signals of interest for additional automation when debugging
    Verilog testbench/DPV simulation mismatches.

    o Per-cycle pattern masking. Fail data files, either from a Verilog testbench/DPV simulation
    or from the ATE, can be used to mask expected responses in a pattern set and the patterns
    can be re-fault simulated with the masked values if necessary.

    o DFT MAX scan chain diagnostics. Defects which cause internal scan chain shifting to fail
    can now be diagnosed using scan compression patterns in addition to regular scan patterns.

    o Dynamic Bridging. TetraMAX now includes a dynamic bridging fault model and fault
    simulation.

    o Diagnostic legacy pattern support. New diagnostic flow features help automate the use of
    very old pattern sets with new TetraMAX versions, and also enable simple pattern masking of
    tester mismatches.

    o Tcl API Documentation. A set of Tcl API commands, used primarily for diagnosis, is now
    documented in On-Line Help.

    Note: Tcl mode will remain a non-default mode in the TetraMAX 2007.12 release. However, it is
    anticipated that Tcl mode will become the default mode in the 2008.09 release, or a later
    release.

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