Documente Academic
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February 2010
For a quotation for other types of devices and measurement parameters, please contact farshid.manoocheri(at)tkk.fi or petri.karha(at)tkk.fi. OPTICAL PROPERTIES OF DETECTORS Quantity or service Customer device or artefact Service code Base fee (Euro) Service code Additional fees (Euro)
Spectral power responsivity Spectral scan at 10, 50 and 100 nm intervals, respectively, in the following wavelength ranges of spectrometer: 240 - 380 nm 350 - 850 nm 800 - 1700 nm Silicon detector Silicon detector Silicon , germanium and InGaAs detector S111 S121 S131 1200 1000 1200 S112 S122 S132 100 x additional data points 500 x additional detector
Spectral power responsivity Comparison with reference detectors at one of the following laser wavelengths: 325nm, 442nm, 458nm, 488nm, 543.5nm, 633nm, 650nm, 964nm, 1.31m, 1.55m Irradiance responsivity Correction factors for application specific light sources UVA, UVB and erythemal meter. R111 1200 R112 400 x additional lamp 800 x additional meter Silicon , germanium and InGaAs detector S141 700 S142 500 x additional laser line /detector
Illuminance responsivity Calibration at five illuminance levels in the ranges of: 0.1 - 500 lx 100 - 5000 lx 0.1 - 5000 lx Illuminance meter, photometer, luxmeter Illuminance meter, photometer, luxmeter Illuminance meter, photometer, luxmeter P111 P121 P131 1000 1000 1200 P112 P122 P132 50 x additional data points 50 x additional data points 50 x additional data points
Luminance meter
P211
1000
P212
Value added tax and postal costs are not included in the price. Prices and services subject to change without notice. Services subject to discontinuation without notice.
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February 2010
For a quotation for other types of devices and measurement parameters, please contact farshid.manoocheri(at)tkk.fi or petri.karha(at)tkk.fi.
LIGHT SOURCES
Quantity or service
Service code
Service code
Spectral irradiance (calibration of primary standard lamps with a filter radiometer) 290 - 900 nm 1 kW FEL, 1 kW DXW 1 kW FEL, 1 kW DXW, Wi41/G R311 1200 R312 900 x additional lamps
360 - 830 nm
R321
900
R322
Spectral irradiance (calibration of standard lamps with reference spectroradiometers) 290 - 830 nm 1 kW FEL, 1 kW DXW 1 kW FEL, 1 kW DXW, Wi41/G R411 1200 R412
360 - 830 nm
R421
900
R422
290 2500 nm
1 kW FEL, 1 kW DXW
R413
1800
R414
Color temperature Tungsten lamp Spectral radiance 290 - 800 nm Integrating sphere source R611 990 R511 800 R512 500 x additional lamps
Luminance Calibration at five luminance levels 1 - 40000 cd m-2 Integrating sphere source P311 800 P312 100 x additional data points
Luminous intensity (calibration of primary standard lamps with a reference photometer) 1 - 10000 cd Wi41/G, 1 kW FEL P411 950 P412 700 x additional lamp
Luminous flux (calibration of primary standard lamps with an absolute integrating sphere) 10 - 10000 lm Wi40/G Globe P511 950 P512 700 x additional lamps
Value added tax and postal costs are not included in the price. Prices and services subject to change without notice. Services subject to discontinuation without notice.
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February 2010
For a quotation for other types of devices and measurement parameters, please contact farshid.manoocheri(at)tkk.fi or petri.karha(at)tkk.fi.
OPTICAL PROPERTIES OF MATERIALS
Quantity or service
Service code
Service code
Regular transmittance (Absorbance) Calibrations at five wavelengths with beam size of 7-14 mm diameter, in the spectral range of: 240 - 380 nm 380 - 950 nm 950 - 1700 nm Neutral density filter Neutral density filter Neutral density filter S211 S221 S231 750 600 700 S212 S222 S232 50 x additional wavelength
Regular transmittance (Absorbance) Calibrations at five wavelengths with beam size of (1 x 3) (5 x 11) mm, using a transfer standard spectrophotometer: 200 - 850 nm 850 - 1700 nm Filter Filter S241 S251 500 600 S242 S252 400 x additional filter 50 x additional wavelength
Regular reflectance Calibrations at one angle and five wavelengths, in the range of: 240 - 380 nm 380 - 950 nm 950 - 1700 nm Flat mirror, reflector Flat mirror, reflector Flat mirror, reflector S411 S421 S431 1200 950 1000 S412 S422 S432 100 x additional data points
Diffuse reflectance factor Comparison with a reference standard with measurement geometry of 0:d or 8:d at five wavelengths in the range of: 240 - 380 nm 380 - 980 nm Reflectance standard Reflectance standard S511 S521 850 950 S512 S522 100 x additional data points 100 x additional data points
Laboratory contact information: Farshid Manoocheri or Petri Krh Metrology Research Institute P.O. Box 13000, FI-00076 Aalto, FINLAND Street address: Otakaari 5 A, FI-02150 Espoo, FINLAND Phone: +358 9 470 22337 or +358 9 470 22289 Fax: +358 9 470 22222 Website: http://metrology.tkk.fi/
Value added tax and postal costs are not included in the price. Prices and services subject to change without notice. Services subject to discontinuation without notice.
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