XRF

X-ray fluorescence course for sequential WDXRF systems Comprehensive course for users of sequential WDXRF spectrometers controlled by SuperQ
Fundamental and practical techniques of X-ray fluorescence analysis using sequential spectrometers are treated in this course. Particular emphasis is placed on the practical use of these instruments in conjunction with SuperQ and Omnian / IQ+ software. Practical aspects of parameter selection, matrix effects, sample preparation, qualitative analysis, standardless analysis, calibration and calibration update, monitor correction and results analysis are dealt with extensively. The course is composed of lectures and practical sessions, with exercises on the spectrometers currently available in our Application Competence Center. After participating this (10 days) XRF course, the user is capable of using the XRF spectrometer, use SuperQ software for application development, maintain calibrations and has a good understanding of the hardware and theory of XRF Although many subjects are the same as the (5 days) basic course, this 10-day course is targeted at users who need to know to operate the spectrometer and software in depth e.g. system owners. Prerequisites Greatest benefits can be derived from the course after the instrument has been installed at the user site and the participant has had an opportunity to become acquainted with the XRF spectrometer and software. It is therefore recommended that the course should be attended after installation rather than before. A good working knowledge of the English language is required. Basic knowledge of the operation of MS Windows -based software packages is required. Please also refer to the outline pages of the folder. Course contents Physics of X-rays The X-ray spectrometer Instrumental parameters Sample preparation Matrix effects Sources of errors Qualitative analysis Quantitative analysis Standardless analysis Statistical Process control Fundamental Parameter basics Calibration update Instrument monitor correction Spectrometer AxiosmAX, Axios, MagiX, MagiX PRO, PW2404, PW2400, XUnique, XUnique II, PW1480, PW1404. Course duration 10 days - the course starts in the first week on Monday (10:00 a.m.) and continues until Friday (5:00 p.m.) in the following week. Total number of participants Minimum number of participants: 6 Maximum number of participants: 12 Each participant of an XRF training course receives a Tutorware CD free of charge Tutorware is training in the form of a software program, which guides the user through the principles of the XRF technology. Graphics, animations and simulations make it interesting and easy to follow. The course consists of a number of modules, which cover all aspects from introduction to X-rays to the basic operating principles of X-ray analysis, whereby each module can be started up independently. An ideal help to learn, refresh and stay up to date. At our Application Competence Center courses are given in English. Courses in German (and French) can be arranged upon request. If you prefer the assistance of an interpreter please contact your local PANalytical representative. We will do our utmost to find a satisfactory solution. The course material is in English. For further information contact your local PANalytical representative or: Ms. J. Sutton ACC Coordinator PANalytical B.V. Application Competence Center P.O. Box 13 7600 AA Almelo The Netherlands Tel: ++31 546 534438 Fax: ++31 546 534445 e-mail: jacqueline.sutton@panalytical.com www.panalytical.com