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INTRODUCTION
PCI is common metric in industry to measure and predict capability of manufacturing processes Communication tool:
Shop floor personnel Company management Customer, and certification organizations
SPC is a primary tool for process capability analysis SPC can detect cause of output in real time Control limits - critical decisions for control charts Common control charts: X-bar and Range charts
Process Capability Index (Cpk) determinates the efficiency of the process. It measures how close the process is to target.
CMM - Measurement
Machine Components (CMM Errors) Part Component (feature form error)
Sampling Patterns
Fitting Algorithms
EXPERIMENTAL WORK
OBJECTIVE Three experiments have been conducted to evaluate the effect of this decision on some important parameters and metrics used in the industrial community such as: the process capability index (Cpk), and Statistical Process Control (SPC) control limits. Estimate and compare the calculations of Process Capability Index (PCI) and Statistical Process Control (SPC) limits. INSPECTION TOOLS Coordinate Measuring Machine (CMM), Computer Aided Design (CAD) based software PC-DIMIS to generate and simulate the inspection program. Digital Height gage (accuracy 0.000050 inch) Digital caliper (accuracy 0.0005 inch)
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Fixturing - CMM
-K-
3.812 .002
2.120 .002
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Fixturing - CMM
-A-
-E-
-F-
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-DTrue Position .004 to datum DEA - 10 probing samples taken to establish slot contour of datum - F-
-D-
Fixturing - CMM
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Inside Packet Square was established with 2 probing hits on each side of square
Extruded Square DIM was established with 2 probing hits on each side of square
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Inside Packet Square measured at two locations (top & bottom) average recorded.
Extruded Square measured at two locations (top & bottom) average recorded.
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Data
X AND R CHART FOR THE 2, 12 C/L DISTANCE FOR CASE STUDY (H. GAGE)
X AND R CHART FOR THE 2.12 C/L DISTANCE FOR CASE STUDY (CMM)
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35 30 25 20 15 10 0 0 .0 0 . 0 0 .0 0 .0 0 . 0 0 0 0 0 0 0 0. Data
X AND R CHART FOR THE TRUE POSITION 0.004 STUDY II (HEIGHT GAGE)
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The SPC process control limits for the X and R charts shown in are 35% less for the CMM data.
Histogram of CMM O D .5 2 , Caliper O D .5 2 _ 1
Norm al 500
Variab le C M M O D .52 C alip er O D .52_1 M ean 0.5203 0.5202 S tD ev N 0.0008945 30 0.001341 30
400
Density
300
200
100
0 0.517
0.518
0.519
0.520 Dat a
0.521
0.522
0.523
XandRChartfortheOD0.52Distance forCaseStudy(Caliper)
Proceedings of NAMRI/SME, Vol. 39, 2011
FXandRChartfortheOD0.52 DistanceforCaseStudy(CMM)
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Results Discussion
For all cases that the range of the measured data is larger for the height gage and caliper compared to the CMM. This phenomenon may affect a SPC charts by either shrinking or expanding the region between the upper and lower statistical limits depending whether the measured data is collected from a CMM or conventional tool. Suggested standard deviation monitoring graph is used to insure the integrity of the Cpk calculations. Figure a shows the cumulative standard deviation for the 2.12 C/L distance (case study I) Figure b is based on a window of the last ten points. Figure c is based on a window of the last five points. The erratic behavior of the standard deviation of the height gage is noticed and this justifies the low Cpk value. Using this graph will minimize false alarms and/or the need to re-calculate the upper and lower control limits for SPC charts; since this situation should be avoided (www.itl.nist.gov).
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Results Discussion
For all cases that the range of the measured data is larger for the height gage and caliper compared to the CMM. This phenomenon may affect a SPC charts by either shrinking or expanding the region between the upper and lower statistical limits depending whether the measured data is collected from a CMM or conventional tool. Suggested standard deviation monitoring graph is used to insure the integrity of the Cpk calculations. Figure a shows the cumulative standard deviation for the 2.12 C/L distance (case study I) Figure b is based on a window of the last ten points. Figure c is based on a window of the last five points. The erratic behavior of the standard deviation of the height gage is noticed and this justifies the low Cpk value. Using this graph will minimize false alarms and/or the need to re-calculate the upper and lower control limits for SPC charts; since this situation should be avoided (www.itl.nist.gov).
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Conclusions
The analysis provided in this paper reveals that the CMM measurement proved to be more accurate than manual gages. The measurement data collected from manual gages is more spread around the mean, while in case of coordinate based metrology tool the collected data is more clustered around the mean or the target values. There is major difference when calculating the Cpk and the SPC control chart limits based on selection of the measurement device. This will effect a percentage of nonconforming products. The difference in the calculation of the X and R charts control limits may cause inconsistency, confusion, and may result in unnecessary false alarms.
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Recommendation
As a recommendation, if a checked dimension is critical to the product functionality such as: bore diameter in an engine block, a CMM would be recommended, while if the dimension is non-critical, a conventional inspection tool may be considered convenient. The suggested standard deviation monitoring graph provided in this paper is a part of larger scale study intended to provide a decision support system for the manufacturing and/or quality engineer to make better decisions regarding the control process monitoring and inspection process.
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Thank You
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