9/19/00

ATPG and Fault Coverages, Lecture 6

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Podem - Path oriented decision making In D-algorithm

x

0 a = 0, or b = 0, or a=b=0

b x

decisions are made at J-fronters decisions are made at PIs

a b c 1 d f=0 c=1 1 f 0 0

In Podem
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Li-C. Wangs Lecture

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Multi-Backtrackings
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1 1 1 1

In Podem, only one path is traced back at a time In FAN, multiple paths are traced back simultaneously

Decisions made at Headlines

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decision made here

In Podem, a decision is made at a PI In FAN, a decision can be made at a headline

k tree circuit

Li-C. Wangs Lecture

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s s

Convert ATPG problem into a SAT instance Use an existing SAT tool
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=1?

a c b (c+a)(c+b)(c+a+b)

g (a+b)(a+b) a c b (c+a)(c+b)(c+a+b) a b c

(c+a)(c+b)(c+a+b)

Li-C. Wangs Lecture

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In general, to solve an NP-complete problem with backtracking

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branching - a set of potential solutions, represented by a node, can be partitioned into mutually exclusive sets (children nodes). Bounding - an algorithm is available to determine the lower bound on the cost of solution
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In ATPG, this can mean no solution (= infinite cost) You will see in many algorithms, they try to prove as early as possible that a branch is a dead end so avoid unnecessary backtrackings.

Li-C. Wangs Lecture

Implication
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x
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determine necessary assignment as early as possible determine a conflict as early as possible recursively try all the combinations find out necessary assignments prove that there is no solution space underneath

Recursive learning
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Li-C. Wangs Lecture

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9/19/00

k=1

Li-C. Wangs Lecture

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n=0

Li-C. Wangs Lecture

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Search for a solution

prove no solution

In traditional ATPGs, redundant faults cause problems

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since ATPG is trying to look for a solution while there is not any

By alternating strategies, faults can be proved redundant quickly

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Li-C. Wangs Lecture

100% FC

# of patterns
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Lots of faults are detected by first few patterns

x x

many easy faults no need to waste time on them

ATPG spends most of the time on the hard faults

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Li-C. Wangs Lecture

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Step 1 - Random
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throw in a lots of patterns (eg. 16 at a time) fault simulate the circuit until no fault can be detected in i trials for each undetected fault
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Step 2 - Deterministic
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perform deterministic ATPG fault simulate remaining undetected faults removed fortuitously detected faults pattern compression in general, another NP-complete problem
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reverse fault simulation of all patterns

3 3

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Fault Coverage FC = # detected faults/ # faults Defect Coverage DC = # of detected defects/# defects William-Brown model
x

DL = 1 - Y (1-DC) DLest = 1 - Y (1-FC) ex. FC=0.99, Y=0.85, DL = 1623 PPM DLest DL

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In practice, no one knows what DC is

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Since FC DC
x

Li-C. Wangs Lecture

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To detect an andbridging
x

a and b good 1 c bad

detect a s-a-0 and b = 0 detect b s-a-0 and a = 0

To detect a transition fault on c

x x

pattern 1 : c = 1 pattern 2 : detect c s-a-1

If defects are not stuck-at, detecting them relies on fortuitous detection

Li-C. Wangs Lecture

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