PP7400 8700 FP Configuration and Testing Guide

Passport 7400, 8700
Function Processor Conguration and Testing Guide
241-5701-610
Passport 7400, 8700
Function Processor Configuration and Testing Guide

Publication: 241-5701-610 Document status: Standard Document version: 2.0S1 Document date: July 2000
Copyright 2000 Nortel Networks All Rights Reserved. Printed in Canada NORTEL, NORTEL NETWORKS, the globemark design, the NORTEL NETWORKS corporate logo, DPN, DPN-100 and PASSPORT are trademarks of Nortel Networks.
Publication history
July 2000
2.0S1 Standard General availability. Contains information on Passport 7400, 8700 for the PCR 2.0 GA release.
Passport 7400, 8700 Function Processor Configuration and Testing Guide
2.0S1
Publication history
241-5701-610 2.0S1
Contents
About this document
Who should read this document and why 25 How this document is organized 25 Whats new in this document 26 Maintenance monitor for DS1 MSA32 and E1 MSA32 FPs 26 Integration of Packet Voice Gateway to Passport 7400 26 Text conventions 27 Related documents 28 How to get more help 28
25
Chapter 1 Basic process for configuring a function processor

Prerequisites for conguring a function processor 29 Conguring a function processor 30 Conguring a spare function processor 37 Conguring line protection on optical interfaces 38
29
Chapter 2 Port Testing

Types of port tests 42 Card loopback test 42 Local loopback test 43 Manual tests 43 Remote loopback test 46 Remote loopthistrib test 47 V.54 remote loopback test 47
41
2.0S1
Contents
PN127 remote loopback test 49 Testing ports and port components 49 Testing a port 49 Testing a tributary port 52 Testing a channel 55 Setting up a loopback 57 Port testing of optical interfaces with line APS 59 Testing a port 60 Setting up a loopback 62 Port test results and their meaning 64
Chapter 3 Card Testing

Changing the card test setup 70 Testing a card 73 Displaying card test results 74 Interpreting card test results 75
69
Chapter 4 V.11 function processor

V.11 FP conguration parameters 79 V.11 FP diagnostic tests 79 Provisionable V.11 FP components and attributes 82 V.11 FP OSI states 83 V.11 FP pinouts for physical loopbacks 84
79

V.35 FP conguration parameters 85 V.35 FP diagnostic tests 85 Provisionable V.35 FP components and attributes 87 V.35 FP OSI states 88 V.35 FP pinouts for physical loopbacks 89
85
Chapter 6 Four-port DS1 function processor

Four-port DS1 FP conguration parameters 91
241-5701-610 2.0S1
91
Contents 9
Four-port DS1 FP diagnostic tests 92 Provisionable four-port DS1 FP components and attributes 94 Four-port DS1 FP OSI states 95 Four-port DS1 FP pinouts for physical loopbacks 96
Chapter 7 Four-port E1 function processor

Four-port E1 FP conguration parameters 99 Four-port E1 FP diagnostic tests 100 Provisionable four-port E1 FP components and attributes 101 Four-port E1 FP OSI states 101 Four-port E1 FP pinouts for physical loopbacks 103
99
Chapter 8 Eight-port DS1 function processor
105
Eight-port DS1 FP conguration parameters 105 Eight-port DS1 FP diagnostic tests 106 Provisionable eight-port DS1 FP components and attributes 108 Eight-port DS1 FP OSI states 109 Eight-port DS1 FP pinouts for physical loopbacks 110
Chapter 9 DS1C function processor

DS1C FP conguration parameters 113 DS1C FP diagnostic tests 114 DS1C FP in a fractional T1 network conguration 115 Provisionable DS1C components and attributes 118 DS1C OSI states 119 DS1C FP pinouts for physical loopbacks 121
113
Chapter 10 E1C function processor

E1C FP conguration parameters 123 E1C FP diagnostic tests 124 V.54 and PN127 remote loopback tests 125 Provisionable E1C FP components and attributes 126 E1C FP OSI states 127
123
2.0S1
10
Contents
E1C FP pinouts for physical loopbacks 129
Chapter 11 DS3 function processor

DS3 FP conguration parameters 131 DS3 FP diagnostic tests 131 Provisionable DS3 FP components and attributes 133 DS3 FP OSI states 133
131
Chapter 12 E3 function processor

E3 conguration parameters 137 E3 diagnostic tests 137 Provisionable E3 components and attributes 139 E3 OSI states 140
137

DS3C FP conguration parameters 143 DS3C FP diagnostic tests 144 Provisionable DS3C FP components and attributes 145 DS3C FP OSI states 146
143
Chapter 14 HSSI function processor

HSSI FP conguration parameters 149 HSSI FP diagnostic tests 149 HSSI local loopback test 150 Provisionable HSSI FP components and attributes 151 HSSI FP OSI states 152
149
Chapter 15 Three-port DS1 ATM function processor

Three-port DS1 ATM FP conguration parameters 155 Three-port DS1 ATM FP diagnostic tests 156 Provisionable three-port DS1 ATM FP components and attributes 157 Three-port DS1 ATM FP OSI states 158
241-5701-610 2.0S1
155
Contents 11
Chapter 16 Three-port E1 ATM function processor
161
Three-port E1 ATM FP conguration parameters 161 Three-port E1 ATM FP diagnostic tests 162 Provisionable three-port E1 ATM FP components and attributes 163 Three-port E1 ATM FP OSI states 164
Chapter 17 Eight-port DS1 ATM function processor

Eight-port DS1 ATM FP conguration parameters 167 Eight-port DS1 ATM FP diagnostic tests 168 Provisionable eight-port DS1 ATM FP components and attributes 169 Eight-port DS1 ATM FP OSI states 170
167
Chapter 18 Eight-port E1 ATM function processor
173
Eight-port E1 ATM FP conguration parameters 173 Eight-port E1 ATM FP diagnostic tests 174 Provisionable eight-port E1 ATM FP components and attributes 175 Eight-port E1 ATM FP OSI states 176
Chapter 19 JT2 ATM function processor

JT2 ATM FP conguration parameters 179 JT2 ATM FP diagnostic tests 180 Provisionable JT2 ATM FP components and attributes 181 JT2 ATM FP OSI states 182
179
Chapter 20 DS3 ATM function processor

DS3 ATM FP conguration parameters 185 DS3 ATM FP diagnostic tests 186 Provisionable DS3 ATM FP components and attributes 188 DS3 ATM FP OSI states 189
185
2.0S1
12
Contents
Chapter 21 E3 ATM function processor

E3 ATM FP conguration parameters 191 E3 ATM FP diagnostic tests 192 Provisionable E3 ATM FP components and attributes 194 E3 ATM FP OSI states 195
191
Chapter 22 OC-3 ATM function processor

OC-3 ATM FP conguration parameters 197 OC-3 ATM FP diagnostic tests 198 Provisionable OC-3 ATM FP components and attributes 200 OC-3 ATM FP OSI states 201
197
Chapter 23 DS3 ATM IP function processor for Passport 7400

DS3 ATM IP conguration parameters 205 DS3 ATM IP diagnostic tests 206 Provisionable DS3 ATM IP components and attributes 208 DS3 ATM IP OSI states 209
205
Chapter 24 E3 ATM IP function processor for Passport 7400

E3 ATM IP conguration parameters 211 E3 ATM IP diagnostic tests 212 Provisionable E3 ATM IP components and attributes 214 E3 G.832 trail trace 215 E3 ATM IP OSI states 215
211
Chapter 25 OC-3 ATM IP function processor for Passport 7400

OC-3 ATM IP conguration parameters 219 OC-3 ATM IP diagnostic tests 220
219
241-5701-610 2.0S1
Contents 13
Provisionable OC-3 ATM IP components and attributes 222 OC-3 ATM IP OSI states 223
Chapter 26 DS1 AAL1 function processor

DS1 AAL1 FP conguration parameters 227 DS1 AAL1 FP diagnostic tests 228 Provisionable DS1 AAL1 FP components and attributes 228 DS1 AAL1 FP OSI states 229
227
Chapter 27 E1 AAL1 function processor

E1 AAL1 FP conguration parameters 231 E1 AAL1 FP diagnostic tests 232 Provisionable E1 AAL1 FP components and attributes 232 E1 AAL1 FP OSI states 234
231
Chapter 28 DS1 MSA32 function processor for Passport 7400

DS1 MSA32 FP conguration parameters 237 DS1 MSA32 FP diagnostic tests 238 Clock synchronization 239 Test setup and result attributes 239 Interpreting test results 240 Provisionable DS1 MSA32 FP components and attributes 240 DS1 MSA32 FP OSI states 242 Maintenance monitor for DS1 MSA32 function processor 243 Provisioning the maintenance monitor 244 Starting the maintenance monitor 246 Stopping the maintenance monitor 246
237
Chapter 29 E1 MSA32 function processor for Passport 7400

E1 MSA32 FP conguration parameters 247 E1 MSA32 FP diagnostic tests 248
247
2.0S1
14
Contents
Clock synchronization 249 Test setup and result attributes 249 Interpreting test results 250 Provisionable E1 MSA32 FP components and attributes 251 E1 MSA32 FP OSI states 252 Maintenance monitor for E1 MSA32 function processor 253 Provisioning the maintenance monitor 255 Starting the maintenance monitor 256 Stopping the maintenance monitor 256
Chapter 30 DS1 voice function processor for Passport 7400

DS1 voice FP conguration parameters 259 DS1 voice FP diagnostic tests 260 Provisionable DS1 voice FP components and attributes 261 DS1 voice FP OSI states 262 DS1 voice FP pinouts for physical loopbacks 264
259
Chapter 31 E1 voice function processor for Passport 7400

E1 voice FP conguration parameters 265 E1 voice FP diagnostic tests 266 Provisionable E1 voice FP components and attributes 267 E1 voice FP OSI states 268 E1 voice FP pinouts for physical loopbacks 270
265
Chapter 32 J2MV function processor for Passport 7400

J2MV FP conguration parameters 271 J2MV FP diagnostic tests 272 Provisionable J2MV FP components and attributes 274 J2MV FP OSI states 275 J2MV pinouts for physical loopbacks 277
271
241-5701-610 2.0S1
Contents 15
Chapter 33 DS1 MVP/MVP-E function processor for Passport 7400
279
DS1 MVP/MVP-E FP conguration parameters 279 DS1 MVP/MVP-E FP diagnostic tests 280 Provisionable DS1 MVP/MVP-E FP components and attributes 282 DS1 MVP/MVP-E FP OSI states. 283 DS1 MVP/MVP-E FP pinouts for physical loopbacks 284
Chapter 34 E1 MVP/MVP-E function processor for Passport 7400
287
E1 MVP/MVP-E FP conguration parameters 287 E1 MVP/MVP-E FP diagnostic tests 288 Provisionable E1 MVP/MVP-E FP components and attributes 290 E1 MVP/MVP-E FP OSI states 291 E1 MVP/MVP-E FP pinouts for physical loopbacks 293
Chapter 35 TTC2M MVP/MVP-E function processor for Passport 7400

TTC2M MVP/MVP-E FP conguration parameters 295 TTC2M MVP/MVP-E FP diagnostic tests 296 Provisionable TTC2M MVP/MVP-E FP components and attributes 298 TTC2M MVP/MVP-E FP OSI states 299 TTC2M MVP/MVP-E FP pinouts for physical loopbacks 301
295
Chapter 36 Ethernet function processor

Ethernet FP conguration parameters 303 Provisionable Ethernet FP components and attributes 304 Ethernet FP OSI states 305
303
2.0S1
16
Contents
Chapter 37 100BaseT Ethernet function processor
307
100BaseT Ethernet FP conguration parameters 307 Provisionable 100BaseT Ethernet FP components and attributes 309 100BaseT Ethernet FP OSI states 310
Chapter 38 DS3C AAL function processor

DS3C AAL FP conguration parameters 311 DS1 tributary ports 312 DS3C AAL FP diagnostic tests 312 Provisionable DS3C AAL FP components and attributes 313 DS3C AAL FP OSI states 315
311
Chapter 39 32-port E1 AAL function processor
319
32-port E1 AAL FP conguration parameters 319 32-port E1 AAL FP diagnostic tests 320 Provisionable 32-port E1 AAL FP components and attributes 321 32-port E1 AAL FP OSI states 323
Chapter 40 Voice services function processor
325
Voice services FP conguration parameters 325 Conguring a voice services function processor 326 Sparing the Voice services FP 328 Voice services FP diagnostic testing 329 Provisionable voice services FP components and attributes 330 Voice services FP OSI states 330
241-5701-610 2.0S1
Contents 17
List of gures
Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6 Figure 7 Figure 8 Figure 9 Figure 10 Figure 11 Figure 12 Figure 13 Figure 14 Figure 15 Figure 16 Figure 17 Figure 18 Figure 19 Figure 20 Figure 21 Figure 22 Figure 23 Figure 24 Figure 25 Figure 26 Figure 27 Figure 28 Figure 29 Figure 30 V.54 remote loopback test on a channelized DS1 FP 48 Remote loopback tests on a channelized E1 FP 48 Data paths for V.11 FP port tests and loopbacks 81 Provisionable V.11 FP components and attributes 82 Data paths for V.35 port tests and loopbacks 87 Provisionable V.35 FP components and attributes 88 Data paths for four-port DS1 FP port tests and loopbacks 93 Provisionable DS1 FP components and attributes 94 Data paths for four-port E1 FP port tests and loopbacks 100 Provisionable E1 FP components and attributes 101 Data paths for eight-port DS1 FP port tests and loopbacks 107 Provisionable DS1 FP components and attributes 108 Data paths for DS1C FP port tests and loopbacks 115 DS1C to a fractional T1 network configuration 117 DS1C to a DDS network configuration 118 Provisionable DS1C FP components and attributes 119 Data paths for E1C FP port tests and loopbacks 125 V.54 and PN127 E1C test configuration 126 Provisionable E1C FP components and attributes 127 Data paths for DS3 FP port tests and loopbacks 132 Provisionable DS3 FP components and attributes 133 Data paths for E3 FP port tests and loopbacks 138 Provisionable E3 components and attributes 139 Data paths for DS3C FP port tests and loopbacks 144 Provisionable DS3C FP components and attributes 145 Data paths for HSSI FP port tests and loopbacks 150 Provisionable HSSI FP components and attributes 152 Data paths for DS1 ATM FP port tests and loopbacks 157 Provisionable three-port DS1 ATM FP components and attributes 158 Data paths for three-port E1 ATM FP port tests and loopbacks 163
2.0S1
18 Contents
Figure 31 Figure 32 Figure 33 Figure 34 Figure 35 Figure 36 Figure 37 Figure 38 Figure 39 Figure 40 Figure 41 Figure 42 Figure 43 Figure 44 Figure 45 Figure 46 Figure 47 Figure 48 Figure 49 Figure 50 Figure 51
Provisionable three-port E1 ATM FP components and attributes 164 Provisionable eight-port DS1 ATM FP components and attributes 169 Provisionable eight-port E1 ATM FP components and attributes 175 Data paths for JT2 ATM FP port tests and loopbacks 180 Provisionable JT2 ATM FP components and attributes 181 Data paths for DS3 ATM port tests and loopbacks 187 Provisionable DS3 ATM FP components and attributes 188 Data paths for E3 ATM FP port tests and loopbacks 193 Provisionable E3 ATM FP components and attributes 194 Data paths for OC-3 ATM FP port tests and loopbacks 199 Provisionable OC-3 ATM FP components and attributes 200 Data paths for DS3 ATM IP port tests and loopbacks 207 Provisionable DS3 ATM IP components and attributes 208 Data paths for E3 ATM IP port tests and loopbacks 213 Provisionable E3 ATM IP components and attributes 214 Data paths for OC-3 ATM IP port tests and loopbacks 221 Provisionable OC-3 ATM IP components and attributes 222 Provisionable DS1 AAL1 FP components and attributes 228 Provisionable E1 AAL1 FP components and attributes 233 Provisionable DS1 MSA32 FP components and attributes 241 Provisionable maintenance monitor components and attributes 244
241-5701-610 2.0S1
Contents 19
Figure 52 Figure 53 Figure 54 Figure 55 Figure 56 Figure 57 Figure 58 Figure 59 Figure 60 Figure 61 Figure 62 Figure 63 Figure 64 Figure 65 Figure 66 Figure 67 Figure 68 Figure 69
Provisionable E1 MSA32 FP components and attributes 251 Provisionable maintenance monitor components and attributes 254 Provisionable DS1 voice FP components and attributes 261 Provisionable E1 voice FP components and attributes 267 Data paths for J2MV port tests and loopbacks 273 Provisionable J2MV FP components and attributes 274 Data paths for DS1 MVP/MVP-E port tests and loopbacks 281 Provisionable DS1 MVP/MVP-E FP components and attributes 282 Data paths for E1 MVP/MVP-E FP port tests and loopbacks 289 Provisionable E1 MVP/MVP-E FP components and attributes 290 Data paths for TTC2M MVP/MVP-E FP tests and loopbacks 297 Provisionable TTC2M MVP/MVP-E FP components and attributes 298 Provisionable Ethernet FP components and attributes 304 Provisionable 100BaseT Ethernet FP components and attributes 309 Provisionable DS3C AAL FP components and attributes 314 Provisionable DS3C AAL FP components and attributes (continued) 315 Provisionable 32-port E1 AAL FP components and attributes 322 Provisionable voice services FP components and attributes 330
2.0S1
20 Contents
List of tables
Table 1 Table 2 Table 3 Table 4 Table 5 Table 6 Table 7 Table 8 Table 9 Table 10 Table 11 Table 12 Table 13 Table 14 Table 15 Table 16 Table 17 Table 18 Table 19 Table 20 Table 21 Table 22 Table 23 Table 24 Table 25 Table 26 Table 27 Table 28 Table 29 Table 30 Table 31 Port test result attributes and uses 64 Interpreting port test results 65 Card test result attributes and uses 75 Interpreting card test results 76 X21 component state combination 83 V.11 Test component state combination 83 Faceplate connector pinouts for a V.11 FP 84 V35 component state combination 88 V.35 Test component state combination 89 Faceplate connector pinouts for a V.35 FP 90 DS1 component state combination 95 DS1 Channel (Chan) component state combination 95 DS1 Test component state combination 96 Faceplate connector pinouts for a four-port DS1 FP 97 Termination panel connector pinouts for a four-port DS1 FP 97 E1 component state combination 102 E1 Channel (Chan) component state combination 102 E1 Test component state combination 103 Faceplate connector pinouts for a four-port E1 FP 104 Termination panel connector pinouts for a four-port E1 FP 104 DS1 component state combination 109 DS1 Channel (Chan) component state combination 109 DS1 Test component state combination 110 Faceplate connector pinouts for an eight-port DS1 FP 111 Termination panel connector pinouts for an eight-port DS1 FP 111 Summary of V.54 supported and unsupported items 116 DS1 component state combination 120 DS1 Channel (Chan) component state combination 120 DS1 Test component state combination 121 Faceplate connector pinouts for a DS1C FP 122 Termination panel connector pinouts for a DS1C FP 122
241-5701-610 2.0S1
Contents 21
Table 32 Table 33 Table 34 Table 35 Table 36 Table 37 Table 38 Table 39 Table 40 Table 41 Table 42 Table 43 Table 44 Table 45 Table 46 Table 47 Table 48 Table 49 Table 50 Table 51 Table 52 Table 53 Table 54 Table 55 Table 56 Table 57 Table 58 Table 59 Table 60 Table 61 Table 62 Table 63 Table 64 Table 65 Table 66 Table 67
E1 component state combination 128 E1 Channel (Chan) component state combination 129 E1 Test component state combination 129 Faceplate connector pinouts for an E1C FP 130 Termination panel connector pinouts for an E1C FP 130 DS3 component state combination 134 DS3 Test component state combination 135 E3 component state combination 140 E3 Test component state combination 141 DS3 component state combination 146 DS3 Test component state combination 147 HSSI component state combination 153 HSSI Test component state combination 154 DS1 component state combination 159 DS1 ATM Channel (Chan) component state combination 160 DS1 ATM Test component state combination 160 E1 component state combination 165 E1 ATM Channel (Chan) component state combination 166 E1 ATM Test component state combination 166 DS1 component state combination 170 DS1 ATM Channel (Chan) component state combination 171 DS1 ATM Test component state combination 171 E1 component state combination 176 E1 ATM Channel (Chan) component state combination 177 E1 ATM Test component state combination 177 JT2 component state combination 182 JT2 ATM Test component state combination 183 DS3 component state combination 189 DS3 ATM Test component state combination 190 E3 component state combination 195 E3 ATM Test component state combination 196 OC-3 Sonet/Sdh component state combination 201 OC-3 Test component state combination 202 OC-3 Path component state combination 202 DS3 component state combination 209 DS3 ATM Test component state combination 210
2.0S1
22 Contents
Table 68 Table 69 Table 70 Table 71 Table 72 Table 73 Table 74 Table 75 Table 76 Table 77 Table 78 Table 79 Table 80 Table 81 Table 82 Table 83 Table 84 Table 85 Table 86 Table 87 Table 88 Table 89 Table 90 Table 91 Table 92 Table 93 Table 94 Table 95 Table 96 Table 97 Table 98 Table 99 Table 100
241-5701-610 2.0S1
E3 component state combination 216 E3 ATM Test component state combination 217 OC-3 Sonet/Sdh component state combination 223 OC-3 Test component state combination 224 OC-3 Path component state combination 224 DS1 component state combination 229 DS1 Channel (Chan) component state combination 229 E1 component state combination 234 E1 Channel (Chan) component state combination 235 E1 Test component state combination 235 Port and channel test types supported on DS1 MSA32 FP 238 DS1 component state combination 242 DS1 Channel (Chan) component state combination 242 Port and channel test types supported on MSA32 E1 FPs 248 E1 component state combination 252 E1 Channel (Chan) component state combination 253 E1 Test component state combination 253 DS1 component state combination 262 DS1 Channel (Chan) component state combination 262 DS1 Test component state combination 263 DS1 voice Framer component state combination 263 Faceplace connector pinouts for a DS1 voice FP 264 Termination panel connector pinouts for a DS1 voice FP 264 E1 component state combination 268 E1 Channel (Chan) component state combination 268 E1 Test component state combination 269 E1 voice Framer component state combination 269 Faceplate connector pinouts for an E1 voice FP 270 Termination panel connector pinouts for a DS1 voice FP 270 J2MV E1 component state combination 275 J2MV Channel (Chan) component state combination 275 J2MV Test component state combination 276 Faceplate connector pinouts for a J2MV FP 277
Contents 23
Table 101 Table 102 Table 103 Table 104 Table 105 Table 106 Table 107 Table 108 Table 109 Table 110 Table 111 Table 112 Table 113 Table 114 Table 115 Table 116 Table 117 Table 118 Table 119 Table 120 Table 121 Table 122 Table 123 Table 124 Table 125 Table 126 Table 127 Table 128
DS1 component state combination 283 DS1 Channel (Chan) component state combination 283 DS1 Test component state combination 284 Faceplate connector pinouts for a DS1 MVP/MVP-E FP 284 Termination panel connector pinouts for a DS1 MVP/ MVP-E FP 285 E1 component state combination 291 E1 Channel (Chan) component state combination 292 E1 Test component state combination 292 Faceplate connector pinouts for an E1 MVP/MVP-E FP 293 Termination panel connector pinouts for an E1 MVP/ MVP-E FP 293 E1 component state combination 299 E1 Channel (Chan) component state combination 300 E1 Test component state combination 300 Faceplate connector pinouts for a TTC2M MVP/MVP-E FP 301 Termination panel connector pinouts for a TTC2M MVP/ MVP-E FP 301 Ethernet (En) component state combination 305 100BaseT Ethernet (En) component state combination 310 DS1 component state combination 316 DS1 Channel (Chan) component state combination 316 DS1 Test component state combination 317 DS3 component state combination 317 DS3 Test component state combination 318 E1 component state combination 323 E1 Channel (Chan) component state combination 324 E1 Test component state combination 324 Settings for PModule components 326 Vsp component state combination 330 PModule component state combination 331
2.0S1
24 Contents
241-5701-610 2.0S1
25
About this document

This guide contains information about function processor provisioning and testing. To use this guide effectively, see the following sections: Who should read this document and why on page 25 How this document is organized on page 25 Whats new in this document on page 26 Text conventions on page 27 Related documents on page 28 How to get more help on page 28
Who should read this document and why

This guide is intended for anyone who is responsible for provisioning and testing function processors (FP). Users should be familiar with Passport provisioning procedures.
How this document is organized

This guide contains generic and specic sections that you use together. The rst three chapters contain generic procedures for conguring an FP, testing an FP, and testing a port. The sections that follow contain specic information about each FP. Specic information includes the values you need to congure an FP, such as the port type, the number of ports, and the number of channels (if applicable). These sections also specify the types of port tests supported by that FP, provisionable components and attributes, and OSI state information.
2.0S1
26
About this document
Most FPs use the generic procedures. If a unique procedure applies, you can nd it in the section specic to that FP.
Whats new in this document

Information about protection switching was restructured in the following section: Port testing of optical interfaces with line APS (page 59). The following features were added to this document: "Maintenance monitor for DS1 MSA32 and E1 MSA32 FPs" on page 26 Integration of Packet Voice Gateway to Passport 7400 (page 26)
Maintenance monitor for DS1 MSA32 and E1 MSA32 FPs

The DS1 MSA32 FP and the E1 MSA32 FP allow you to monitor the ingress data ow of a single channel on a port and direct it as an AAL1 CES data stream to a remote receiver. The purpose is to provide a system that, once provisioned, may be activated remotely by operations staff to add a nonintrusive monitor onto a channel. The following sections were added to this document: Maintenance monitor for DS1 MSA32 function processor (page 243) Maintenance monitor for E1 MSA32 function processor (page 253)
Integration of Packet Voice Gateway to Passport 7400

This project allows the Packet Voice Gateway functionality to be available for Passport 7400 as well as Passport 8700. The following sections were updated in this document: DS3C AAL function processor (page 311) 32-port E1 AAL function processor (page 319) Voice services function processor (page 325)
241-5701-610 2.0S1
About this document 27
Text conventions
This document uses the following text conventions:
nonproportional spaced plain type
Nonproportional spaced plain type represents system generated text or text that appears on your screen.
nonproportional spaced bold type
Nonproportional spaced bold type represents words that you should type or that you should select on the screen. italics Statements that appear in italics in a procedure explain the results of a particular step and appear immediately following the step. Words that appear in italics in text are for naming. [optional_parameter] Words in square brackets represent optional parameters. The command can be entered with or without the words in the square brackets. <general_term> Words in angle brackets represent variables which are to be replaced with specic values. UPPERCASE,lowercase Passport commands are not case-sensitive and do not have to match commands and parameters exactly as shown in this document, with the exception of string options values (for example, le and directory names) and string attribute values. | This symbol separates items from which you may select one; for example, ON|OFF indicates that you may specify ON or OFF. If you do not make a choice, a default ON is assumed.
2.0S1
28
About this document
... Three dots in a command indicate that the parameter may be repeated more than once in succession.
The term absolute pathname refers to the full specication of a path starting from the root directory. Absolute pathnames always begin with the slash ( / ) symbol. A relative pathname takes the current directory as its starting point, and starts with any alphanumeric character (other than /).
Related documents
For information about provisioning Passport and Passport components and attributes, see the following information sources: 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide 241-5701-600 Passport 7400, 8700, 15000 Operations and Maintenance Fundamentals 241-5701-420 Passport 7400, 8700, 15000 Trunking Guide 241-5701-050 Passport 7400, 8700, 15000 Commands 241-5701-060 Passport 7400, 8700, 15000 Components
How to get more help

For information on training, problem reporting, and technical support, see the Nortel Networks support services section in the product overview document.
241-5701-610 2.0S1
29
Chapter 1 Basic process for conguring a function processor

The same basic steps apply to conguring all function processors (FP). You must, however, refer to the FP-specic sections for detailed information about your specic function processor. These sections include component hierarchy diagrams, notes about provisioning that FP, and attribute values. For information about conguring a function processor, see the following sections: Prerequisites for conguring a function processor on page 29 Conguring a function processor on page 30 Conguring a spare function processor on page 37 Conguring line protection on optical interfaces on page 38
Prerequisites for conguring a function processor

Before you provision a function processor, you must complete the following activities: Install all hardware (see 241-5701-210 Passport 7400, 8700 Hardware Installation Guide). Perform startup procedures (see 241-5701-270 Passport 7400, 8700, 15000 Software Installation Guide). Install your software (see 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide).
2.0S1
30 Chapter 1 Basic process for configuring a function processor
Provision the node (see 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide).
Before you perform the procedures in this chapter, you must be familiar with the provisioning fundamentals explained in 241-5701-600 Passport 7400, 8700, 15000 Operations and Maintenance Fundamentals. You must enter provisioning mode to perform the steps in these procedures. See 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide for information about how to enter and exit provisioning mode. For information about the components and attributes used while provisioning processor cards, see 241-5701-060 Passport 7400, 8700, 15000 Components. Except where noted, the descriptions and procedures assume that operators are working with Passport through a VT-100 terminal or terminal emulator. For information about Nortel Networkss proprietary network management system NMS, see 241-6001-023 NMS Architect for Passport User Guide.
Conguring a function processor

CAUTION
Risk of data loss
Before you lock a port, lock any services (for example, frame relay) or Passport trunks running on the port. Otherwise, a loss of data can occur. These procedures outline the basic steps to provision a function processor using a text interface device: Conguring a new function processor (FP) on page 31 Provisioning a new logical processor (LP) on page 32 (optional, depending on whether a suitable LPT already exists) Conguring a spare function processor on page 37 (optional) Adding a port to the LP on page 33 Adding a channel to a port on page 34 (optional, depending on whether or not the FP is channelized) Setting provisionable attributes on page 34
241-5701-610 2.0S1
Chapter 1 Basic process for configuring a function processor 31
Activating conguration changes on page 35 Conguring line protection on optical interfaces on page 38 See Port Testing on page 41, for information about testing ports.
Procedure 1 Conguring a new function processor (FP)
Before you add a new function processor (FP) to a shelf, check to see if the Card component for that FP exists. If the Card component does not exist, use this procedure to add it, and set the appropriate cardType attribute.
1 Enter provisioning mode. start prov 2 See which Card components are currently congured. display shelf card/* 3 If the Card component does not already exist, add it to the shelf. add shelf card/<n> where: <n> is the slot number and can be between 1 and 15 for function processors 4 Specify the type of function processor you are adding by setting the cardType attribute. set shelf card/<n> cardType <cardtype> where: <n> is the slot number and can be between 1 and 15 for function processors (depending on the number of slots in the shelf) <cardtype> is the value for the new function processor See the FP-specic sections for the appropriate cardtype values for your function processor. 5 If a suitable logical processor (LP) does not exist, create one using the procedure Provisioning a new logical processor (LP) on page 32. or Add a port to the LP using the procedure Adding a port to the LP on page 33.
2.0S1
32 Chapter 1 Basic process for configuring a function processor Procedure 2 Provisioning a new logical processor (LP) 1 To display existing logical processor types (LPTs) and their features use the command: display Sw Lpt/* featureList If a suitable LPT does not exist, you must create one. For more information, see 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide. If a suitable LPT exists, you must provision a new LP to run the selected logical processor type software on the FP. 2 Add a Logical Processor component. add lp/<n> where: <n> is any number between 1 and 15 3 Set the logicalProcessorType attribute to use the feature set dened by <lpt name>. set lp/<n> logicalProcessorType Sw Lpt/<lpt name> where: <lpt name> can contain up to 25 alphanumeric characters (see the service guides for additional information)
Note: You can provision more than one service on some FPs. You must specify features in order of priority. For example, <feature1> is the feature for which you want the best performance. See the Release Notes for information about which services you can run concurrently on each FP.
4 If this is a spare function processor, use the procedure Conguring a spare function processor on page 37. If this is a main function processor, set the mainCard attribute using the following command. set lp/<n> mainCard Shelf Card/<m> where: <m> is the number of the slot on the shelf. For example, to link the FP in shelf slot number 1, enter 1 as the value for <m>. 5 Add a port to the LP using the procedure Adding a port to the LP on page 33.
241-5701-610 2.0S1
Chapter 1 Basic process for configuring a function processor 33 Procedure 3 Adding a port to the LP 1 To determine an FPs possible port types, enter help lp The listed subcomponents are the possible port types. 2 Add a port depending on the type of interface required. add lp/<n> <port>/<m> where: <n> is the LP number <port> is the port type <m> is the port number See the FP-specic sections for valid values for <port> and <m>. 3 If the FP supports tributary ports beneath the port you added in step 2, add a tributary port. add lp/<n> <port>/<m> <tributary port>/<q> where: <n> is the LP number <port> is the port type <m> is the port number <tributary port> is the tributary port type <q> is the tributary port number See the FP-specic sections for valid values for <tributary port> and <q>. 4 5 If this is a channelized function processor, see the procedure Adding a channel to a port on page 34. Otherwise, proceed to the next step. Set provisionable attributes using the procedure Setting provisionable attributes on page 34
To provision a channelized function processor, you must Add a Channel component to the port (step 1). Assign timeslots to the Channel component (step 2). Assign a data rate for the timeslots on the Channel component (step 3).
2.0S1
34 Chapter 1 Basic process for configuring a function processor Procedure 4 Adding a channel to a port 1 Add a Channel component to the port. The Passport software automatically adds Channel 0 when you add a port. add lp/<n> <port>/<m> chan/ See the FP-specic sections for valid values for . 2 Assign timeslots to the Channel component. set lp/<n> <port>/<m> chan/ timeslots <timeslots> See the FP-specic sections for valid values for <timeslots>. 3 For some ports, you must assign a data rate for the timeslots within each channel. See the FP-specic sections for exact provisioning data. set lp/<n> <port>/<m> chan/ timeslotDataRate <rate> where: <rate> is the timeslot data rate 4 5 Repeat this procedure for each channel. Set provisionable attributes using the procedure Setting provisionable attributes on page 34.
Procedure 5 Setting provisionable attributes 1 Enter provisioning mode. start prov 2 Set provisionable attributes. set lp/<n> <port>/<m> <attribute> <attributevalue> See the FP-specic sections for attribute values of specic FPs. Regular provisioning activities typically involve entering a small set of changes for activation at the next scheduled activation session. During the period between one activation session and the next, there can be multiple sets of changes, entered by multiple operators. Changes accumulate until the next activation session.
Note: Some FPs, for example, the Voice Services FP, must be linked to an application before you can activate provisioning changes. See the FPspecic sections for more information.
241-5701-610 2.0S1
Chapter 1 Basic process for configuring a function processor 35 3 If you want to activate your changes immediately, see Activating conguration changes on page 35. Otherwise, continue to the next step to save your changes and activate them later. 4 When all changes and additions are complete, perform a semantic check of the changes made. check -changed prov The -changed parameter asks the system to do a semantic check on only those components that are in the edit view and are new or changed from the current view. As a result, the semantic check is faster than a full check. 5 Optionally, store the edit view as a saved view. save [-file(<filename>)] prov where: <lename> is an optional user-supplied designation for the saved view The -le parameter is optional. You only need to use it if the new saved view needs a unique lename. The system automatically resets the sequence number to 001. 6 Optionally, end the provisioning session. end prov Procedure 6 Activating conguration changes 1 Perform a full semantic check of the edit view. check prov Provisioning errors are reported on-screen. You must correct all errors before moving on to the next step. During a full semantic check, the system issues warnings for components affected by critical provisioning data changes. These are changes that can require components to be out of service before the change is activated. 2 Optionally, store the edit view as a saved view. save [-file(<filename>)] prov where: <lename> is an optional user-supplied designation for the saved view
2.0S1
36 Chapter 1 Basic process for configuring a function processor The -le parameter is optional. You only need to use it if the new saved view needs a unique lename. The system automatically resets the sequence number to 001. 3 Activate the view. activate prov This command copies provisioning data from the edit view into the current view. When the activation is complete, the current view and the edit view are identical.
Note: An activate command can cause the system to reload. If a reload occurs, wait until the node comes back up, then log on and reenter provisioning mode.
4 Conrm the view. confirm prov The conrm command veries that the newly activated edit view allows proper access to the node. Conrm the view within 20 minutes after the activation is complete, otherwise the node automatically restarts using the committed view. You can only save one committed view to disk. You can issue the conrm command even if you are not in provisioning mode. 5 Save the current view. save -current prov 6 Commit the current view. commit prov This command creates a special saved view of all conguration information in the current view. This committed current view id now the view that the node uses whenever undergoing a reload, restart, or switchover.
Note: If a new current view is not committed at this time, the node uses the last committed view in the event of a reload, restart, or switchover.
7 End the provisioning session. end prov 8 Now that the provisionable attributes have been set for the port, you can add applications and link to the port using specic procedures outlined in the service guides.
241-5701-610 2.0S1
Chapter 1 Basic process for configuring a function processor 37
Conguring a spare function processor

Most FPs support one-for-one sparing where one spare FP supports one main FP. In a one-for-n sparing conguration, where n can have a value between two and four, you must congure n logical processors to point to the same spare FP. Before setting up sparing between processor cards, check the product equipment codes (PECs) of the active and spare cards. For function processors, the rst six digits (four letters and two numbers) must match. Note: See 241-5701-200 Passport 7400, 8700 Hardware Description for equivalent PECs. Except where noted, processor cards with equivalent PECs can be used as spares for each other.
Procedure 7 Conguring a spare function processor 1 Set the spareCard attribute for each logical processor to point to the same spare FP. set lp/<n> spareCard sh ca/<m> where: <n> is the instance value of the logical processor <m> is the slot in which the spare FP sits 2 If you are using one-for-n sparing, specify which FP you have attached to each connector on the sparing panel by setting the sparingConnection attribute. Specify the connection for all of the main FPs and the spare FP. set sh ca/<n> sparingConnection <m> where: <n> is the slot in which the FP sits <m> is the connector on the sparing panel. For the spare FP, the value of <m> is spare. For the main FPs, possible values for <m> are mainA, mainB, mainC, and mainD. 3 Verify that the provisioning changes are acceptable. check prov 4 Activate the changes you have provisioned. activate prov 5 Conrm the provisioning view.
2.0S1
38 Chapter 1 Basic process for configuring a function processor confirm prov 6 Save the provisioning view. save prov 7 Commit the provisioning view. commit prov
Conguring line protection on optical interfaces

Line automatic protection switching (line APS) is congured on optical cards. Both ports must be congured as Sonet or Sdh: Line APS does not support a mix of Sonet and Sdh ports. To congure a pair of lines to work together under line APS, one line must be designated as working, the other line designated as protection. Follow the instructions below to provision line APS on an optical function processor card. If you are provisioning a new card see Conguring a new function processor (FP) on page 31 before proceeding with line APS.
Procedure 8 Conguring line automatic protection switching 1 Enter the provisioning mode. start Prov 2 Provision the line APS feature. set sw lpt/aps featurelist aps 3 Link the logical processor to the line APS application. set lp/<n> lpt sw lpt/aps where: <n> is the instance of the logical processor linked to the line APS application. lp/<n> is provisioned as the main card 4 Add an APS component, and link it to the two ports on the Lp. add aps/<m> set aps/<m> workingLine lp/<n> <porttype>/0 path/0 set aps/<m> protectionLine lp/<n> <porttype>/1 path/0
241-5701-610 2.0S1
Chapter 1 Basic process for configuring a function processor 39 where: <m> is the instance number of the APS component. Possible values range from 0 to 255. <n> is the logical processor number. <porttype> is either sonet or sdh. 5 Set the protection mode (optional). Unidirectional is the default. For bidirectional mode: set aps/<m> mode bidirectional For unidirectional mode: set aps/<m> mode unidirectional where: <m> is the instance number of the APS component. Possible values range from 0 to 255. 6 Set the switching scheme (optional). Non-revertive is the default. For non-revertive switching: set aps/<m> revertive no For revertive switching: set aps/<m> revertive yes where: <m> is the instance number of the APS component. Possible values range from 0 to 255. 7 Check, activate, and conrm provisioning changes.
For more information on the operation and use of line APS, see 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide.
2.0S1
40 Chapter 1 Basic process for configuring a function processor
241-5701-610 2.0S1
41
Chapter 2 Port Testing

Passport supports two types of diagnostic port tests: initial and maintenance. Initial tests ensure that ports are fault-free when they initialize. The system runs initial diagnostic tests on a port during its initial start up and whenever the port state changes to the unlocked state from the locked state. Initial diagnostic tests are fully automated and do not require operator intervention. Maintenance port tests help you detect and isolate a problem area with a port and its related facilities. Port tests verify that data is being properly transmitted and received along known segments of a link. Port tests calculate the number of frames transmitted and received, and calculate a bit error rate. Most port tests that test a line or facility set up their own loopbacks. The manual test, however, requires you to insert a loopback at some point. A loopback loops received data back to the FP being tested. You can set up a physical loopback using a cable to cross-connect transmit and receive pins. Or, you can have an operator at the far-end set up a software loopback. Loopbacks do not produce test results for the local node because they loop received information back to the node being tested. Line automatic protection switching (line APS), a form of line-protection for optical cards, has a test component that is dynamically created when the APS component is provisioned. The test component under line APS replaces the Sonet or Sdh test component to which it is linked. You can set up both tests and loopbacks by setting the type attribute under the Test component.
2.0S1
42 Chapter 2 Port Testing
See the following sections for information about maintenance tests on ports and related components: Types of port tests on page 42 "Testing ports and port components" on page 49 Port testing of optical interfaces with line APS (page 59) "Port test results and their meaning" on page 64
Types of port tests

Passport supports the following port tests: "Card loopback test" on page 42 "Local loopback test" on page 43 "Manual tests" on page 43 "Remote loopback test" on page 46 "Remote loopthistrib test" on page 47 V.54 remote loopback test on page 47 PN127 remote loopback test on page 49
Different FPs support different tests. For a list of the tests an FP supports, see the specic section for that FP.
Card loopback test

The card loopback test veries the internal working of the FP. This test transmits a test pattern through the internal circuits and processors of the FP. Data is transmitted back from the link interface of the port. The test compares the pattern received to the pattern transmitted and calculates a bit error rate. To set up the card test, set the type attribute under the Test component to card. See the procedure Testing a port (page 49). If you are using a DS1 MSA32 FP or an E1 MSA32 FP to do the card loopback test, see also DS1 MSA32 FP diagnostic tests (page 238) or E1 MSA32 FP diagnostic tests (page 248).
241-5701-610 2.0S1
Chapter 2 Port Testing 43
Local loopback test

The local loopback test loops test data through the local CSU or modem. This test veries the line interface up to but not including the facility. The local loopback test is supported on X21 component and HSSI components. When you start this test, the system sends a request to the local modem to loop back to the port being tested. The test then transmits a test pattern to the local modem as test data. At the end of the test, the system sends a request to the local modem to take down the loopback. To set up the local loopback test, set the type attribute under the Test component to localLoop. See the procedure Testing a port (page 49).
Manual tests
The manual test requires you to arrange for a loopback to be inserted at some point along the connection. This loopback can either be a physical loopback congured in the target card using a cable or a software loopback implemented in another far-end node. The test compares the transmitted test pattern to the received test pattern and calculates a bit error rate. Use the manual test to verify: the local interface, by using a physical loopback (such as a connector or cable). See Manual test using a physical loopback (page 43). the line and far-end interface, by having an external loopback provisioned in software in the far-end equipment that veries the transmission of frames. See "Manual test using an external loopback" on page 44. the line and far-end interface, by having a payload loopback provisioned in software in the far-end equipment that removes data from the incoming frames and places the data on new outgoing frames. See "Manual test using a payload loopback" on page 45.
If you are using a DS1 MSA32 FP or an E1 MSA32 FP to do manual tests, see also DS1 MSA32 FP diagnostic tests (page 238) or E1 MSA32 FP diagnostic tests (page 248). Manual test using a physical loopback You can set up a physical loopback by inserting loopback equipment (such as a cable or connector) at any point on the link.
Passport 7400, 8700 Function Processor Configuration and Testing Guide 2.0S1
For some FPs, the loopback cable cross-connects the transmit and receive pins. See the FP-specic sections for information about pin connections. To set up the local node for this manual loopback test, set the type attribute under the Test component to manual. See Testing ports and port components (page 49). Manual test using an external loopback The external loopback test (also called line loopback test or line testing) sets up a loopback on a far-end node to test ports on the local node or target card. The local node or target card is the location where the manual test is being performed. The far-end card is the location where the software loopback is set-up. Test frames are transmitted from the target card to the far-end card and are transmitted back to the target card without modifying the data frames. Since the bit stream does not stop, the data does not leave the frame for processing. The external loopback produces test results at the local node only. The external loopback occurs at the following places: For the Channel component, the external loopback is established at the channel device. If you are testing a channel, the test frames only loop over the timeslots associated with that particular channel. Other timeslots on other Channel components do not loop. For the DS1, E1, DS3, E3, Sonet, Sdh, Sts, and Aps components, the external loopback is established at the line interface circuitry.
To set up the local node or target card for this manual loopback test, set the type attribute under the Test component to manual. See Testing ports and port components (page 49). ensure the duration of the manual test in this target card runs for a shorter period of time than the external loopback does in the far-end card. See Testing ports and port components (page 49). ensure the manual test starts after the loopback starts. See Testing ports and port components (page 49).
To set up an external loopback in the far-end card,

241-5701-610 2.0S1
set the type attribute under the Test component to externalLoop.
ensure the duration of the external loopback is longer in this far-end card than the manual loopback test in the target card. See the procedure Setting up a loopback (page 57). ensure the external loopback starts before the manual loopback. See the procedure Setting up a loopback (page 57).
Manual test using a payload loopback The payload loopback sets up a loopback on a far-end node to test ports on the local node or target card. The local node or target card is the location where the manual test is being performed. The far-end card is the location where the software loopback is set-up. The payload loopback terminates the incoming frames, removes the data from the incoming frames, and places the data on new outgoing frames, which it sends back to the node being tested. The payload loopback produces test results at the local node only. To set up the local node or target card for this manual loopback test, set the type attribute under the Test component to manual. See Testing ports and port components (page 49). ensure the duration of the manual test in this target card runs for a shorter period of time than the payload loopback does in the far-end card. See Testing ports and port components (page 49). ensure the manual test starts after the loopback starts. See Testing ports and port components (page 49).
To set up a payload loopback in the far-end card, set the type attribute under the Test component to payloadLoop. ensure the duration of the payload loopback is longer in this far-end card than the manual loopback test in the target card. See the procedure Setting up a loopback (page 57). ensure the payload loopback starts before the manual loopback. See the procedure Setting up a loopback (page 57).
2.0S1
Remote loopback test

You can use the remote loopback test to test the full length of the facility. There are three types of remote loopback tests: "DS1 remote loopback test" on page 46 "DS3 remote loopback test" on page 46 "X21 remote loopback test" on page 46
To set up the remote loopback test, set the type attribute under the Test component to remoteLoop. See the procedure Testing a port on page 49. If you are using a DS1 MSA32 FP to do the remote loopback test, see also DS1 MSA32 FP diagnostic tests (page 238). DS1 remote loopback test On the DS1 port, a repeated bit pattern (00001) is sent out of the link to request the far-end CSU to set up a remote loopback. Then the specied test pattern is transmitted to the remote CSU as test data. At the end of the test, the Test component automatically requests the remote loop to be taken down by sending another repeated bit pattern (001). DS3 remote loopback test On the DS3 port, the local node sends a line loopback activate signal (carried over C-bits) over the link to force the remote DS3 port to loop the signal. The loopback remains in effect until the local node sends a line loopback deactivate signal over the link. The DS3 remote loop test is supported only when using the DS3 C-bit parity framing mode (the DS3 cbitParity attribute must be set to on). With this attribute setting, the DS3 component also responds to a remote test request. X21 remote loopback test The X21 remote loop test requests the remote modem to loop frames back to the port. The system then transmits a specied test pattern to the remote modem as test data. At the end of the test, the test component automatically requests the remote loop to be taken down. The X21 component must be congured as DTE for the remote loop test to run properly.
241-5701-610 2.0S1
Remote loopthistrib test

You can use the remote loopthistrib test to test the full length of the facility. This test enables you to test tributary DS1 ports beneath a DS3. On the DS3 port, a DS1 line loopback activate signal (carried over C-bits) travels over the DS3 link and forces a remote DS1 component to loop the DS1 signal. The loopback stays until the system sends a DS1 line loopback deactivate signal. This test is supported only when using DS3 C-bit parity framing mode (the DS3 cbitParity attribute must be set to on). To set up the remote loopthistrib test, set the type attribute under the Test component to remoteLoopThisTrib. See the procedure Testing a port (page 49).
V.54 remote loopback test

You can use the V.54 remote loopback test to test the full length of the facility. The V.54 test enables you to test a single channel on a DS1 or E1 port. You can test a single channel on a port without affecting the trafc on any other channels. There are two types of V.54 remote loopback tests: V.54 remote loopback testing on a channelized DS1 FP on page 47 V.54 remote loopback testing on a channelized E1 FP on page 48
To set up the V.54 remote loopback test, set the type attribute under the Test component to v54RemoteLoop. See the procedure Testing a port (page 49). V.54 remote loopback testing on a channelized DS1 FP To test a channel on a DSI FP, the connection to the CSU/DSU must be up and running as shown in the gure V.54 remote loopback test on a channelized DS1 FP. Individual FPs support the V.54 remote loopback test differently. See the FP-specic sections for information about supported congurations.
2.0S1
48 Chapter 2 Port Testing Figure 1 V.54 remote loopback test on a channelized DS1 FP
Function processor Far-end CSU or DSU
Remote loopback test (Channel only)

PPT 1080 000 AA
V.54 remote loopback testing on a channelized E1 FP To test a channel on an E1 FP, the connections to the NTU must be up and running as shown in the gure Remote loopback tests on a channelized E1 FP on page 48. Individual FPs support the V.54 remote loopback test differently. See the FP-specic sections for information about supported congurations.
Figure 2 Remote loopback tests on a channelized E1 FP
Function processor Far-end NTU
Remote loopback test (Channel only)

PPT 1080 002 AA
241-5701-610 2.0S1
PN127 remote loopback test

You can use the PN127 remote loopback test to test the full length of the facility. The PN127 test enables you to test a single channel on an E1 port. Therefore, you can test a channel on a port without affecting the trafc on any other channels. As well, the E1 MSA32 FP can run the PN127 test on multiple channels and multiple timeslots simultaneously. Note: To run the PN127 test, the connection to the NTU must be up and running as shown in the gure Remote loopback tests on a channelized E1 FP on page 48 and must support PN127. Individual FPs support the PN127 remote loopback test differently. See the FP-specic sections for information about supported congurations. If you are using an E1 MSA32 FP to do the PN127 test, see also E1 MSA32 FP diagnostic tests (page 248).
Testing ports and port components

For instructions on testing a port or related component, refer to the FPspecic section to check for special instructions, then use the appropriate procedure: Testing a port (page 49) Testing a tributary port (page 52) Testing a channel (page 55) Setting up a loopback (page 57)
Testing a port
1 Lock the port you want to test: lock Lp/<n> <port>/ where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. 2 Specify the test you want to run:
2.0S1
50 Chapter 2 Port Testing set Lp/<n> <port>/ Test type <testtype> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <testtype> is the type of test. For information on possible values, use the help command for the port type or refer to 241-5701-060 Passport 7400, 8700, 15000 Components. See Types of port tests (page 42) to determine which type of test to run. 3 Specify the number of minutes you want to run the test: set Lp/<n> <port>/ Test duration <limit> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <limit> species the maximum length of time (in minutes) that the test can run. The default value is 1.
Note: If you are performing a manual test with an external or payload loopback, ensure the external or payload loopback runs for a longer duration than the manual test.
4 If you want to specify other characteristics of the port test, set the test attributes under the operational group Setup appropriately: set Lp/<n> <port>/ Test <attribute> <attributevalue> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <attribute> is the name of the attribute. <attributevalue> is the value for the attribute.
241-5701-610 2.0S1
Chapter 2 Port Testing 51 For information on test attributes and possible values, use the help command for the port type or refer to 241-5701-060 Passport 7400, 8700, 15000 Components. 5 If you specied the manual test in step 2, insert a physical loopback or arrange for a provisioned loopback at the far end. See the procedure Setting up a loopback (page 57). Start the port test: start Lp/<n> <port>/ Test where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. 7 If you want to see interim results while the test is running, display test statistics: display Lp/<n> <port>/ Test results where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. See Port test results and their meaning (page 64), for information about the test statistics that you have displayed. 8 If you want the test to run for the full duration, wait for the test timer to expire. If you do not want the test to continue running, stop the test: stop Lp/<n> <port>/ Test where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. The system automatically displays the test results if you stop a test or when the test ends. See Port test results and their meaning (page 64), for an analysis of the diagnostic test results.
2.0S1
52 Chapter 2 Port Testing 9 If you ran the manual test, arrange to remove the loopback you set up in step 5.
10 Restore service to the port. unlock Lp/<n> <port>/ where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number.
Testing a tributary port

1 Lock the tributary port you want to test: lock Lp/<n> <port>/ <trib_port>/<q> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <trib_port> is the tributary port type. <q> is the tributary port number. 2 Specify the tributary port test: set Lp/<n> <port>/ <trib_port>/<q> Test type loopthistrib where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <trib_port> is the tributary port type. <q> is the tributary port number. 3 Specify the number of minutes you want to run the test: set Lp/<n> <port>/ <trib_port>/<q> Test duration <limit> where: 241-5701-610 2.0S1
Chapter 2 Port Testing 53 <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <trib_port> is the tributary port type. <q> is the tributary port number. <limit> species the maximum length of time (in minutes) that the test can run. The default value is 1. 4 If you want to specify other characteristics of the tributary port test, set the test attributes appropriately: set Lp/<n> <port>/ <trib_port>/<q> Test <attribute> <attributevalue> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <trib_port> is the tributary port type. <q> is the tributary port number. <attribute> is the name of the attribute. <attributevalue> is the value for the attribute. For information on test attributes and possible values, use the help command for the port type or refer to 241-5701-060 Passport 7400, 8700, 15000 Components. 5 Start the tributary port test: start Lp/<n> <port>/ <trib_port>/<q> Test where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <trib_port> is the tributary port type. <q> is the tributary port number.
2.0S1
54 Chapter 2 Port Testing 6 If you want to see interim results while the test is running, display test statistics: display Lp/<n> <port>/ <trib_port>/<q> Test results where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <trib_port> is the tributary port type. <q> is the tributary port number. See Port test results and their meaning (page 64), for information about the test statistics that you have displayed. 7 If you want the test to run for the full duration, wait for the test timer to expire. If you do not want the test to continue running, stop the test: stop Lp/<n> <port>/ <trib_port>/<q> Test where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <trib_port> is the tributary port type. <q> is the tributary port number. The system automatically displays the test results if you stop a test or when the test ends. See Port test results and their meaning (page 64), for an analysis of the diagnostic test results. 8 Restore service to the tributary port. unlock Lp/<n> <port>/ <trib_port>/<q> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <trib_port> is the tributary port type. 241-5701-610 2.0S1
Chapter 2 Port Testing 55 <q> is the tributary port number.
Testing a channel
1 Lock the channel you want to test: lock Lp/<n> <port>/ Chan/<r> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <r> is the channel number. 2 Specify the test you want to run: set Lp/<n> <port>/ Chan/<r> Test type <testtype> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <r> is the channel number. <testtype> is card, manual, remoteLoop. See Types of port tests (page 42) to determine which type of test to run. 3 Specify the number of minutes you want to run the test: set Lp/<n> <port>/ Chan/<r> Test duration <limit> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <r> is the channel number. <limit> species the maximum length of time (in minutes) that the test can run. The default value is 1. 4 If you want to specify other characteristics of the test, set the test attributes appropriately:
2.0S1
56 Chapter 2 Port Testing set Lp/<n> <port>/ Chan/<r> Test <attribute> <attributevalue> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <r> is the channel number. <attribute> is the name of the attribute. <attributevalue> is the value for the attribute. For information on test attributes and possible values, use the help command for the port type or refer to 241-5701-060 Passport 7400, 8700, 15000 Components. 5 If you specied the manual test in step 2, insert a physical loopback or arrange for a provisioned loopback at the far end. See the procedure Setting up a loopback (page 57). Start the channel test: start Lp/<n> <port>/ Chan/<r> Test where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <r> is the channel number. 7 If you want to see interim results while the test is running, display test statistics: display Lp/<n> <port>/ Chan/<r> Test results where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <r> is the channel number.
241-5701-610 2.0S1
Chapter 2 Port Testing 57 See Port test results and their meaning (page 64), for information about the test statistics that you have displayed. 8 If you want the test to run for the full duration, wait for the test timer to expire. If you do not want the test to continue running, stop the test: stop Lp/<n> <port>/ Chan/<r> Test where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <r> is the channel number. The system automatically displays the test results if you stop a test or when the test ends. See Port test results and their meaning (page 64), for an analysis of the diagnostic test results. 9 If you ran the manual test, arrange to remove the loopback you set up in step 5.
10 Restore service to the channel: unlock Lp/<n> <port>/ Chan/<r> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <r> is the channel number.
Setting up a loopback
A software loopback must be in place at all times during manual loopback tests involving an external or payload loopback. Ensure the payload or external loopback on the far-end node
1
starts before the manual test starts on the target node. lasts for a longer duration than the manual test on the target node.
Verify that the port is either receiving a clock source from the line or providing its own clock source: 2.0S1
58 Chapter 2 Port Testing display Lp/<n> <port>/ clockingSource where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. 2 Lock the port on the LP that you are using for the loopback: lock Lp/<n> <port>/ where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. 3 Specify the type of loopback you want to run: set Lp/<n> <port>/ Test type <type> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <type> is externalLoop or payloadLoop. 4 Specify the number of minutes you want the loopback to run: set Lp/<n> <port>/ Test duration <limit> where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. <limit> species the maximum length of time (in minutes) that the test can run. The default value is 1.
Note: Ensure the external or payload loopback runs for a longer duration than the manual loopback test.
5 Start the loopback: start Lp/<n> <port>/ Test 241-5701-610 2.0S1
Chapter 2 Port Testing 59 where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number.
Note: Ensure you start the external or payload loopback before the manual loopback test.
6 7 Wait until the operator at the far end indicates that testing is complete. If you want the loopback to run for the full duration, wait for the test timer to expire. If you do not want the loopback to continue running, stop the test: stop Lp/<n> <port>/ Test where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number. 8 Unlock the port on the LP that you used for the loopback: unlock Lp/<n> <port>/ where: <n> is the instance number of the logical processor linked to the port. <port> is the port type. is the port number.
Port testing of optical interfaces with line APS

Line automatic protection switching (line APS) is a form of line-protection for optical cards. Under line APS, one line is designated as working and a second line is designated as protection. Only one line can be active at a time. The inactive line functions as a backup. Signal failure, signal degradation or operator commands can cause the active channel to switch from one line to the other.
2.0S1
The line APS test component is dynamically created when line APS is linked to a Sonet or Sdh port. Ports linked to line APS cannot be individually tested. Port tests are handled by the APS component using the test subcomponent. Testing involves only the currently active near and far-end channels. During testing, line APS is fully functional, and supports automatic and manual switches between the working and the protection line. Unidirectional mode is automatic during testing, regardless of the congured mode setting. To test line APS ports, refer to the following procedures: Testing a port (page 60) Setting up a loopback (page 62)
Testing a port
1 Lock the Aps component to be tested: lock Aps/<a> where: <a> is the instance number of the Aps component. 2 Specify the test you want to run: set Aps/<a> Test type <testtype> where: <a> is the instance number of the Aps component. <testtype> is card or manual. 3 Specify the number of minutes you want to run the test: set Aps/<a> Test duration <limit> where: <a> is the instance number of the Aps component. <limit> species the maximum length of time (in minutes) that the test can run. The default value is 1.00.
Note: If you are performing a manual test with an external or payload loopback, ensure the external or payload loopback runs for a longer duration than the manual test.
241-5701-610 2.0S1
Chapter 2 Port Testing 61 4 If you want to specify other characteristics of the test, set the attributes appropriately: set Aps/<a> Test <attribute> <attributevalue> where: <a> is the instance number of the Aps component. <attribute> is the name of the attribute. <attributevalue> is the value for the attribute. For information on test attributes and possible values, use the help command for the Aps component or refer to 241-5701-060 Passport 7400, 8700, 15000 Components. 5 If you specied the manual test in step 2, insert a physical loopback or arrange for a provisioned loopback at the far end. See the procedure Setting up a loopback (page 62). Start the test: start Aps/<a> Test where: <a> is the instance number of the Aps component. 7 If you want to see interim results while the test is running, display test statistics: display Aps/<a> Test results where: <a> is the instance number of the Aps component. See Port test results and their meaning (page 64), for information about the test statistics that you have displayed. 8 If you want the test to run for the full duration, wait for the test timer to expire. If you do not want the test to continue running, stop the test: stop Aps/<a> Test where: <n> is the instance number of the Aps component.
2.0S1
62 Chapter 2 Port Testing The system automatically displays the test results if you stop a test or when the test ends. See Port test results and their meaning (page 64), for an analysis of the diagnostic test results. 9 If you ran the manual test, arrange to remove the loopback you set up in step 5.
10 Restore service to the Aps component: unlock Aps/<a> where: <a> is the instance number of the Aps component. 11 Unlock the APS component. unlock aps/<n>
Setting up a loopback
A software loopback must be in place at all times during manual loopback tests involving an external or payload loopback. Ensure the payload or external loopback on the far-end node
1
starts before the manual test starts on the target node. lasts for a longer duration than the manual test on the target node.
Verify that the Aps component is either receiving a clock source from the line or providing its own clock source: display Aps/<a> clockingSource where: <a> is the instance number of the Aps component.
Lock the Aps component: lock Aps/<a> where: <a> is the instance number of the Aps component.
Specify the type of loopback you want to run: set Aps/<a> Test type <type> where: <a> is the instance number of the Aps component.
241-5701-610 2.0S1
Chapter 2 Port Testing 63 <type> is externalLoop or payloadLoop. 4 Specify the number of minutes you want the loopback to run: set Aps/<a> Test duration <limit> where: <a> is the instance number of the Aps component. <limit> species the maximum length of time (in minutes) that the test can run. The default value is 1.00.
Note: Ensure the external or payload loopback runs for a longer duration than the manual loopback test.
5 Start the loopback: start Aps/<a> Test where: <a> is the instance number of the Aps component.
Note: Ensure you start the external or payload loopback before the manual loopback test.
6 7 Wait until the operator at the far end indicates that testing is complete. If you want the loopback to run for the full duration, wait for the test timer to expire. If you do not want the loopback to continue running, stop the test: stop Aps/<a> Test where: <a> is the instance number of the Aps component. 8 Unlock the port on the LP that you used for the loopback: unlock Aps/<a> where: <a> is the instance number of the Aps component.
2.0S1
Port test results and their meaning

The table Port test result attributes and uses denes each test attribute. The table Interpreting port test results on page 65 explains how to interpret port test results. For each test, there are a number of actions suggested to correct any problems. You can rerun the test after you complete each remedial action, or after you complete a set of remedial actions.
Table 1 Port test result attributes and uses Attribute bitErrorRate bitsRx bitsTx bytesRx bytesTx causeOfTermination Use Displays the calculated bit error rate on the link Displays the total number of bits received during the test period Displays the total number of bits sent during the test period Displays the total number of bytes received during the test period Displays the total number of bytes sent during the test period Displays the reason the port test ended. Can be one of neverStarted: the port test has not been started testRunning: the port test is currently running testTimeExpired: the port test ran for the specied duration stoppedByOperator: a Stop command was issued elapseTime erroredFrmRx frmRx
(Sheet 1 of 2)
Displays the length of time (in minutes) that the port test has been running Displays the total number of errored frames received during the test period Displays the total number of frames received during the test period
241-5701-610 2.0S1
Chapter 2 Port Testing 65 Table 1 (continued) Port test result attributes and uses Attribute frmTx timeRemaining
(Sheet 2 of 2)
Use Displays the total number of frames sent during the test period Displays the maximum length of time (in minutes) that the port test will continue to run before stopping
Table 2 Interpreting port test results Test type Card test Problem Solution
No frames are 1) Replace the function processor. received or errored 2) Rerun the card test. frames are received No frames are 1) Check the far-end loop. received or errored 2) Check the cabling. frames are received 3) Ensure that both ends of the connection are provisioned properly. 4) Ensure that a clock source is available. 5) Remove devices that may be creating a noisy environment. 6) Run the card test. 7) Replace the function processor. 8) Rerun the manual test. No frames are 1) Check the modem and modem connections. received or errored 2) Check the cabling. frames are received 3) Check the far-end loop. 4) Remove devices that may be creating a noisy environment. 5) Run the card test. 6) Run the manual loop test. 7) Replace the function processor. 8) Rerun the local test. 9) If applicable, check far-end DCE OSI state.
Manual test
Local test
(Sheet 1 of 3)
2.0S1
66 Chapter 2 Port Testing Table 2 (continued) Interpreting port test results Test type Remote test Problem Solution
No frames are 1) Check the CSU, its settings (whether the CSU received or errored supports inband remote loop), and its connections for frames are received the function processor. 2) If the function processor uses a modem, check the modem and modem connections. 3) Check the cabling. 4) Check the far-end loop. 5) Remove devices that may be creating a noisy environment. 6) Run the card test. 7) Run the manual loop test. 8) Replace the function processor. 9) Rerun the remote test.
(Sheet 2 of 3)
241-5701-610 2.0S1
Chapter 2 Port Testing 67 Table 2 (continued) Interpreting port test results Test type Problem Solution It takes about six seconds to actually see the test data looped back for the CSU/DSU or NTU to respond to the loop-up pattern from the Passport node. If after six seconds, the frmRx counter is still not incrementing, the CSU/DSU or NTU is not triggered to loop back. Check if there is a connection problem with the CSU/DSU or NTU.
V54 remote loop test frmRx attribute not or PN127 remote increasing after loop test starting the test
Verification of Since there is no acknowledgment for the loop-down loopback removal pattern, it is hard to tell when the CSU/DSU or NTU is upon test completion out of loopback mode. To make sure that the CSU/ DSU or NTU is out of loopback mode, perform another manual loop from the Passport node. If the loop is not down, then the frmTx and frmRx counters both increase. If the loop is down, then the frmRx counter does not increase. Errored frames Some of the CSU/DSU or NTU equipment takes received at the longer to respond to the loop-up pattern. On the beginning of the test Passport node, you only have to wait for six seconds for the CSU/DSU to go into loopback mode and start sending the real test data. Meanwhile, the CSU/DSU or NUT responds to the loop-up pattern by sending the acknowledge pattern. If the reception of the acknowledge pattern finishes after the six second period, there are error frames. To avoid this condition, set the dataStartDelay attribute inside the test component to a value other than 0. The real test data starts after this specified time (in seconds). Random errored frames received during the test A non-terminated V.35 cable connected to the CSU/ DSU or NTU can cause random error frames. A nonterminated cable can pick up noise that disrupts the normal test data and results in error frames. Check the cabling to make sure that this is not the problem.
(Sheet 3 of 3)
2.0S1
241-5701-610 2.0S1
69
Chapter 3 Card Testing

The card test allows you to stress test new or existing function processors (FP) under controlled conditions. The test circulates frames over the Passport 7400, 8700 bus between the FP you are testing and a target FP, exercising both cards and consuming bus bandwidth. The test frames follow the same route to their destination as normal frames. If the Passport 7400, 8700 node is in dual-bus mode, each test consumes bandwidth from both 800 Mbit/s buses in equal amounts. If the module is in single-bus mode, the test runs only the bus in service. The function processor being tested generates test frames and groups them into the following streams: The loading frame stream rapidly circulates a set of loading frames between the function processor being tested and the target processor. This stream veries the operation of the cards and the Passport 7400, 8700 bus under a controlled load. The verication stream transmits a series of verication frames from the function processor being tested to the target processor. As each frame returns, its contents are veried and the next verication frame in the series is transmitted. This stream veries that frames are not corrupted during the transfer between function processors.
You can congure the card test to send frames from one or both streams. You can also control the priority, size, and content of the test frames.
2.0S1
70 Chapter 3 Card Testing
Each function processor can run the card test independently. You can run the card test on any subset of the FPs simultaneously and can specify different test frame congurations for each test. It is also possible for an FP to act as the target for more than one FP being tested, or while it is itself being tested. This section includes the following procedures: Changing the card test setup on page 70 Testing a card on page 73 Displaying card test results on page 74 Interpreting card test results on page 75
Changing the card test setup

The following procedure explains how to change the attributes that control the behavior of the card test. These attributes are targetCard frmTypes frmPriorities frmSize frmPatternType customizedPattern duration
Procedure 9 Changing the card test setup 1 Set the target card to which the frames transmit during the test. set shelf card/<n> test targetCard <targetNum> where: <n> is the instance number of the test card <targetNum> is the instance number of the target card The card test does not operate when its own card is the target card. If <targetNum> is equal to <n> you cannot start the test. This is the default target selection.
241-5701-610 2.0S1
Chapter 3 Card Testing 71
Note: A card test will fail if the card you are testing and the card you specify as the target card have different processing capabilities. Therefore, you must target a PM1 card when you test a PM1 card. You must target a PM2 card when you test a PM2 card. And, you must target an ATM card when you test an ATM card.
2 Optionally, set the types of frames that transmit during the test. The default is to send both loading and verication frames. set shelf card/<n> test frmTypes <typeSet> where: <n> is the instance number of the test card <typeSet> alters the set of frame types and is any combination of <type> (adds the specied frame type to the set) !<type> (clears the set and adds the specied frame type to the set) ~<type> (removes the specied frame type from the set)
<type> is either loading or verication 3 Optionally, set the priorities of frames that transmit during the test. The default is to send low-priority frames only. set shelf card/<n> test frmPriorities <prioritySet> where: <n> is the instance number of the card to be tested <prioritySet> alters the set of frame priorities and is any combination of <priority> (adds the specied frame priority to the set) !<priority> (clears the set and adds the specied frame priority to the set) ~<priority> (removes the specied frame priority from the set)
<priority> is either lowPriority or highPriority. 4 Optionally, set the size of frames that transmit during the test. set shelf card/<n> test frmSize <priority> <size> where: <n> is the instance number of the test card <priority> is low priority <size> is a value from 16 to 16000 bytes. The default is low-priority frames containing 8192 bytes. Larger test frames are useful for generating high bus utilization rates. However, they can cause congestion, resulting in data loss.
2.0S1
72 Chapter 3 Card Testing 5 Optionally, set the pattern for lling frames that transmit during the test. set shelf card/<n> test frmPatternType <patternType> where: <n> is the instance number of the test card <patternType> is one of ccitt32kBitPattern (a pseudo-random sequence of 32 Kbit is used) ccitt8MBitPattern, (a pseudo-random sequence of 8 Mbit is used) customizedPattern (the pattern dened by the customizedPattern attribute is used)
The default is a pseudo-random sequence of 32 Kbit. 6 Optionally, set the 32-bit customized pattern for lling frames that are transmit during the test. The default is a pattern of alternating 0 and 1 bits. set shelf card/<n> test customizedPattern <pattern> where: <n> is the instance number of the card to be tested <pattern> is a hexadecimal value from 00000000 to FFFFFFFF The value of this attribute is ignored if frmPatternType does not have the value customizedPattern. 7 Optionally, set the maximum amount of time that the test can run. set shelf card/<n> test duration <limit_value> where: <n> is the instance number of the test card <limit_value> species the maximum length of time (in minutes) that the card test can run. The default limit is 60 minutes.
241-5701-610 2.0S1
Chapter 3 Card Testing 73
Testing a card
Use the following procedure to test a card.
Procedure 10 Testing a card
CAUTION
Risk of data loss
The activation of a card test consumes processor time and bus bandwidth on both the card being tested and the target card. Care must be taken when conguring card tests to ensure that the test frames generated during the tests do not cause data loss due to congestion.
1 2 Ensure that you have set the target card (see Changing the card test setup on page 70 Optionally, lock the bus that is not in use in the test. The bus you will use in the test must be unlocked and enabled, otherwise the lock command will fail. lock shelf bus/ where: is the instance value of the bus that is not in use in the test (either X or Y) If you run the test with both buses in service, the card uses them equally. 3 Optionally, ensure the card test is properly congured for the desired test. display shelf card/<n> test setup where: <n> is the instance number of the card being tested See "Changing the card test setup" on page 70 for more information on changing the conguration. You cannot change the card test conguration once you start the test. 4 Start the card test. start shelf card/<n> test where: <n> is the instance number of the card being tested
2.0S1
74 Chapter 3 Card Testing The test continues until it reaches the specied time limit. The test stops automatically if the target card becomes non-operational. 5 Optionally, you can end the test before it reaches the time limit. stop shelf card/<n> test where: <n> is the instance number of the card being tested 6 You can view the results of a test while the test is in progress or after it is terminated. display shelf card/<n> test results where: <n> is the instance number of the card being tested You can display, individually, each attribute describing the results of a test. See "Displaying card test results" on page 74, for more information. 7 Once the test is complete, release the other bus if it was locked during the test. unlock shelf bus/ where: is the instance value of the bus that was not used in the test (either X or Y)
Displaying card test results

The following procedure describes how to display the attributes of the card test.
Procedure 11 Displaying card test results 1 Display the amount of time the test has run. display shelf card/<n> test <attribute> where: <n> is the instance number of the test card <attribute> is one of the following: causeOfTermination, elapsedTime, loadingFrmData, timeRemaining, vericationFrmData See the table Card test result attributes and uses on page 75, for more information on results.
241-5701-610 2.0S1
Chapter 3 Card Testing 75 Table 3 Card test result attributes and uses Attribute causeOfTermination Use Displays the reason the card test ended. Can be one of neverStarted: the card test has not been started testRunning: the card test is currently running testTimeExpired: the card test ran for the specied duration stoppedByOperator: a Stop command was issued targetFailed: the target card became nonoperational elapsedTime loadingFrmData Displays the length of time (in minutes) that the card test has been running Displays the number of loading frames transmitted to the Test component on the target card and the number of loading frames not successfully returned by the Test component on the target card Displays the maximum length of time (in minutes) that the card test will continue to run before stopping Displays the number of verification frames returned by the Test component on the target card and the number of verification frames that had incorrect bits when returned
timeRemaining verificationFrmData
Interpreting card test results

The following table explains how to interpret card test results. For each test, there are a number of suggested actions to correct the problems. In each case, you can rerun the test either after each remedial action, or after a number of remedial actions.
2.0S1
76 Chapter 3 Card Testing Table 4 Interpreting card test results Test type Test result Remedial action No remedial action is required.
Loading The loadingFrmData attribute shows frame stream framesSent>0 and framesLost=0. Loading frames are circulating properly between the card under test and the target card. The loadingFrmData attribute shows framesSent>0 and framesLost>0. Loading frames are lost as they circulate between the card under test and the target card.
Frames can be lost due to congestion, mismatched card types, or hardware problems. You can reduce congestion by using smaller test frames or decreasing the amount of data passing through the cards. Ensure that the card you test and the card you specify as the target card have the same processing capabilities. If the problem persists, try running bus tests to isolate the defective hardware item. No remedial action is required if the loading frame stream was not enabled during the test. Otherwise, try each of the following actions in turn. After each action, rerun the card test to see if the problem still exists. 1) Verify that both cards are operational and that the test setup specifies that loading frames will transmit. 2) Reset the target card. 3) Reset the card under test.
The loadingFrmData attribute shows framesSent=0 and framesLost=0. The card under test was unable to contact the target card to begin the test.
Note: Actions 2 and 3 cause a service outage on the cards.

(Sheet 1 of 2)
241-5701-610 2.0S1
Chapter 3 Card Testing 77 Table 4 (continued) Interpreting card test results Test type Test result Remedial action
Verification The vericationFrmData attribute shows No remedial action is required. frame stream framesTested>0 and framesBad=0. Verification frames are circulating properly between the card under test and the target card. The vericationFrmData attribute shows framesTested>0 and framesBad>0. Verification frames are being corrupted as they circulate between the card under test and the target card. Rerun the card test using a different target card. If the problem disappears, replace the original target card. If the problem persists, replace the card under test. Rerun the original test. If the problem persists after you replace both the test card and the target card, contact Nortel Networks. The vericationFrmData attribute shows framesTested=0 and framesBad=0. The card under test is unable to contact the target card in order to begin the test OR the verification frames are lost due to congestion or due to hardware problems. No remedial action is required if the verification frame stream was not enabled during the test. Otherwise try each of the following actions in turn. After each action, rerun the card test to see if the problem still exists: 1) Verify that both cards are operational and that the test setup specifies that verification frames will transmit. 2) Rerun the test with the loading frame stream enabled and use the results of that test to isolate the cause of the problem.
(Sheet 2 of 2)
2.0S1
78 Chapter 3 Card Testing
241-5701-610 2.0S1
79

See the following sections for information about conguring and testing a V.11 function processor (FP): V.11 FP conguration parameters on page 79 V.11 FP diagnostic tests on page 79 Provisionable V.11 FP components and attributes on page 82 V.11 FP OSI states on page 83 V.11 FP pinouts for physical loopbacks on page 84
V.11 FP conguration parameters

When conguring a V.11 FP, use the following values to help you set component attributes: Card type <cardtype>: V11 Ports <port>: X21 Port numbers <m>: 07
V.11 FP diagnostic tests

The V.11 FP supports the following port tests and loopbacks. The gure Data paths for V.11 FP port tests and loopbacks on page 81 shows the data path for each test and loopback. Card loopback test (page 42)
2.0S1
80 Chapter 4 V.11 function processor
Local loopback test (page 43). To run a local tests on ports associated with an X21 component, you must congure the component as DTE. The X21 component does not respond to a local test request from the far end. Manual tests (page 43). The test depends on whether the port is congured for DTE mode or for DCE mode. Ports congured as DTE do not support physical loopbacks inserted at the termination panel. You can only run a manual test where either test equipment or another Passport provides a loopback point. The equipment that provides the loopback must also provide the clock source. If the dteDataClockSource attribute for the port is set to fromDce, you do not need to physically loop the clock. If you need to insert a clock loopback at the termination panel, enter provisioning mode and change the value for the dteDataClockSource to fromDte. When the test is completed, change the clock source back to fromDce. If you want to insert a physical loopback, you must cross-connect the transmit pins to the receive pins. For port congured as DCE, you can only insert the loopback at the termination panel. Manual test using a physical loopback (page 43).If the dteDataClockSource for the port is set to fromDte, you can physically loop the clock. See V.11 FP pinouts for physical loopbacks (page 84). Alternately, you can use external test equipment or another Passport node that has an external loopback set up at the loopback point. Manual test using an external loopback (page 44). The external loopback is established at the link controller.
Remote loopback test (page 46). This test is only supported on the X.21 component.
241-5701-610 2.0S1
Chapter 4 V.11 function processor 81 Figure 3 Data paths for V.11 FP port tests and loopbacks
Function processor Far-end CSU or modem CSU or modem Line interface Link controller
Local Manual loopback loopback test test in conjunction with physical loopback
Card External test and Payload loopbacks
PPT 0042 001 AB
2.0S1
Provisionable V.11 FP components and attributes

This gure shows provisionable V.11 FP components and attributes.
Figure 4 Provisionable V.11 FP components and attributes
Root Lp X21 Provisioned (Prov) linkMode readyLineState dataTransferLineState dataStatusTimeOut lineSpeed clockingSource dteDataClockSource lineTerminationRequired applicationFramerName CustomerIdentifierData (CidData) customerIdentifier Channel (Chan) vendor commentText
PPT 2920 017 AA
241-5701-610 2.0S1
Chapter 4 V.11 function processor 83
V.11 FP OSI states

These tables contain information about V.11 FP OSI states.
Table 5 X21 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The X21 interface is inoperable. Bad line state and excessive line state changes are possible causes. Lack of clocks will also disable the port. The component is not in use. Provisioning or binding processes are possible causes. The line input is good. Clocks are available. The X21 component is in use. The X21 component services only one user (a Framer component) at a time. A port and line test is in progress. Some hardware test failed or the X21 component is in the locked state. A lock operator command is in effect.
Unlocked, Enabled, Idle Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle
Table 6 V.11 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A V35, X21, DS1, E1, CHAN, DS3, or E3 component creates a Test component. The test component services only the component that created it. A test stops either when the prescribed timer expires or you issue a stop test command.
2.0S1
V.11 FP pinouts for physical loopbacks

To make hardware modications for a physical loopback on a V.11 port, you must cross-connect the transmit and receive pins. You can only insert the loopback at the termination panel. Pin cross-connections for the clock source are optional (pins 6, 7, 13, and 14 for V11 ports).
Table 7 Faceplate connector pinouts for a V.11 FP Transmit pins Pin no 2 9 6 13 Pin name TA TB SA SB Receive pins Pin no 4 11 7 14 Pin name RA RB XA XB
241-5701-610 2.0S1
85

See the following sections for information about conguring and testing a V.35 function processor (FP): V.35 FP conguration parameters on page 85 V.35 FP diagnostic tests on page 85 Provisionable V.35 FP components and attributes on page 87 V.35 FP OSI states on page 88 V.35 FP pinouts for physical loopbacks on page 89
V.35 FP conguration parameters

When conguring a V.35 FP, use the following values to help you set component attributes: Card type <cardtype>: V35 Ports <port>: V35 Port numbers <m>: 07
V.35 FP diagnostic tests

The V.35 FP supports the following port tests and loopbacks. The gure Data paths for V.35 port tests and loopbacks on page 87 shows the data path for each test and loopback. Card loopback test on page 42
2.0S1
Manual tests (page 43). The test depends on whether the port is congured for DTE mode or for DCE mode. Ports congured as DTE do not support physical loopbacks inserted at the termination panel. You can only run a manual test where either test equipment or another Passport provides a loopback point. The equipment that provides the loopback must also provide the clock source. If the dteDataClockSource attribute for the port is set to Dce, you do not need to physically loop the clock. If you need to insert a clock loopback at the termination panel, enter provisioning mode and change the value for the dteDataClockSource to fromDte. When the test is completed, change the clock source back to fromDce. If you want to insert a physical loopback, you must cross-connect the transmit pins to the receive pins. For port congured as DCE, you can only insert the loopback at the termination panel. Manual test using a physical loopback (page 43). If the dteDataClockSource for the port is set to fromDte, you can physically loop the clock. See Faceplate connector pinouts for a V.35 FP on page 90. Alternately, you can use external test equipment or another Passport node that has an external loopback set up at the loopback point. Manual test using an external loopback (page 44). The external loopback is established at the link controller.
241-5701-610 2.0S1
Chapter 5 V.35 function processor 87 Figure 5 Data paths for V.35 port tests and loopbacks
Function processor Line interface Link controller
Manual loopback test in conjunction with physical loopback
Card External test loopback
PPT 0042 002 AA
Provisionable V.35 FP components and attributes

This gure shows the provisionable V.35 FP components and attributes.
2.0S1
88 Chapter 5 V.35 function processor Figure 6 Provisionable V.35 FP components and attributes
Root Lp V35 Provisioned (Prov) linkMode readyLineState dataTransferLineState dataStatusTimeOut lineSpeed clockingSource dteDataClockSource lineTerminationRequired applicationFramerName CustomerIdentifierData (CidData) customerIdentifier Channel (Chan) vendor commentText
PPT 2920 018 AA
V.35 FP OSI states

These tables contain information about V.35 FP OSI states.
Table 8 V35 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The V.35 port is inoperable. Bad line state and excessive line state changes are possible causes. Lack of clocks will also disable the port. The component is not in use. Waiting for a binding to a Framer component is a possible cause. The line input is good. Clocks are available.
Unlocked, Enabled, Idle
(Sheet 1 of 2)
241-5701-610 2.0S1
Chapter 5 V.35 function processor 89 Table 8 (continued) V35 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The V35 component is in use. The V35 component services only one user (a FRAMER component) at a time. A port and line test is in progress. Some hardware test failed or the V35 component is in the locked state. A lock operator command is in effect.
(Sheet 2 of 2)
Table 9 V.35 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A V35, X21, DS1, E1, CHAN, DS3, or E3 component creates a Test component. The Test component services only the component that created it. A test stops either when the prescribed timer expires or you issue a stop test command.
V.35 FP pinouts for physical loopbacks

To make hardware modications for a physical loopback on a V.35 port, you must cross-connect the transmit pins to the receive pins. You can only insert the loopback at the termination panel. Pin cross-connections for the clock source are optional (pins 6, 7, 13, and 14 for V35 ports).
2.0S1
90 Chapter 5 V.35 function processor Table 10 Faceplate connector pinouts for a V.35 FP Transmit pins Pin no 2 9 6 13 Pin name TXDS TXDB TSET (DTE) B TEST (dte) A Receive pins Pin no 4 11 7 14 Pin name RXDA RXDB RSETB RSETA
241-5701-610 2.0S1
91
Chapter 6 Four-port DS1 function processor

See the following sections for information about conguring and testing a four-port DS1 function processor (FP). Four-port DS1 FP conguration parameters on page 91 Four-port DS1 FP diagnostic tests on page 92 Provisionable four-port DS1 FP components and attributes on page 94 Four-port DS1 FP OSI states on page 95 Four-port DS1 FP pinouts for physical loopbacks on page 96
Four-port DS1 FP conguration parameters

When conguring a DS1 FP, use the following values to help you set component attributes. Card type <cardtype>: DS1 Ports <port>: DS1 Port numbers <m>: 0, 1, 2, 3 Number of channels : 13. You can add up to 4 channels on ports 1 and 3 if the other two ports are disabled. Timeslots <timeslots>: 124. You can assign a set of timeslots to a channel. For example, you can set <timeslots> to 4 6 8 10 14 22.
2.0S1
92 Chapter 6 Four-port DS1 function processor
Timeslot data rate <rate>: doNotOverride or 56K. If you select doNotOverride, the card type and zeroCoding attribute value determines the data rate. If you set the zeroCoding attribute to AMI, set the date rate to 56K. Otherwise, your channel can experience data errors. Clocking source: If you install a DS1 trunk between two Passport nodes, you must set the clockingSource attributes to one of the following combinations: local at one end and line at the other, module at one end and line at the other, or module at both ends.
Four-port DS1 FP diagnostic tests

The four-port DS1 FP supports the following port tests and loopbacks. The gure Data paths for four-port DS1 FP port tests and loopbacks on page 93 shows the data path for each test and loopback. Card loopback test (page 42) Manual tests (page 43) Manual test using a physical loopback (page 45). Make sure the loop lengths are within the required range and the lineLength attribute is properly set. If the looped signal is not reamplied, the round-trip loop length for DS1 cannot exceed 223 m (655 ft). See Four-port DS1 FP pinouts for physical loopbacks on page 96. Manual test using an external loopback (page 46). The external loopback is established at the line interface circuitry. Remote loopback test (page 46).
241-5701-610 2.0S1
Chapter 6 Four-port DS1 function processor 93 Figure 7 Data paths for four-port DS1 FP port tests and loopbacks
Function processor CSU Line interface Link controller
PPT 0040 001 AB
2.0S1
Provisionable four-port DS1 FP components and attributes

This gure shows the provisionable DS1 FP components and attributes.
Figure 8 Provisionable DS1 FP components and attributes
Root Lp DS1 Provisioned (Prov) lineType clockingSource crc4Mode sendRaiOnAis CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText IfEntryProv ifAdminStatus ifIndex Channel (Chan) Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerName CustomerIdentifierData (CidData) customerIdentifier IfEntryProv ifAdminStatus ifIndex
PPT 2920 015 AA
241-5701-610 2.0S1
Chapter 6 Four-port DS1 function processor 95
Four-port DS1 FP OSI states

These tables contain information about DS1 FP OSI states.
Table 11 DS1 component state combination Combination (Administrative, Operational, Usage) Unlocked, Disabled, Idle Details The DS1 port is inoperable due to at least one of the following alarms. losAlarm lofAlarm rxAisAlarm. Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The DS1 component is in use. A lock/lock operator command is in effect. The DS1 component is ready to service a user. A test is running. Some hardware test failed. The DS1 component is in the locked state. External factors render the DS1 port inoperable.
Table 12 DS1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy
(Sheet 1 of 2)
External factors render the Chan component inoperable because of DS1 alarms. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time.
2.0S1
96 Chapter 6 Four-port DS1 function processor Table 12 (continued) DS1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
A lock operator command is in effect. The Chan component is otherwise ready to service a user. A test is running. Some hardware test failed or the Chan component is in the locked state.
Table 13 DS1 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A DS1 or Chan component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
Four-port DS1 FP pinouts for physical loopbacks

The four-port DS1 FP has two connectors on the faceplate. Each connector supports two ports. In the table Faceplate connector pinouts for a four-port DS1 FP on page 97, port x refers to the rst port, and port y refers to the second port on the same connector. The pinout congurations are identical for all connectors and ports on the faceplate. Transmit and receive pins match up by polarity. The table Termination panel connector pinouts for a four-port DS1 FP on page 97contains the pinouts for the termination panel connectors.
241-5701-610 2.0S1
Chapter 6 Four-port DS1 function processor 97 Table 14 Faceplate connector pinouts for a four-port DS1 FP Transmit pins Pin no 8 15 1 9 Pin name Port x, transmit + Port x, transmit Port y, transmit + Port y, transmit Receive pins Pin no 7 14 2 10 Pin name Port x, receive + Port x, receive Port y, receive + Port y, receive -
Table 15 Termination panel connector pinouts for a four-port DS1 FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
2.0S1
241-5701-610 2.0S1
99
Chapter 7 Four-port E1 function processor

See the following sections for information about conguring and testing a four-port E1 function processor (FP): Four-port E1 FP conguration parameters on page 99 Four-port E1 FP diagnostic tests on page 100 Provisionable four-port E1 FP components and attributes on page 101 Four-port E1 FP OSI states on page 101 Four-port E1 FP pinouts for physical loopbacks on page 103
Four-port E1 FP conguration parameters

When conguring an E1 FP, use the following values to set component attributes: Card type <cardtype>: E1 Ports <port>: E1 Port numbers <m>: 0, 1, 2, 3 Number of channels : 13. You can add up to four channels on ports 1 and 3 if the other two ports are disabled. Timeslots <timeslots>: 131. You can assign a set of timeslots to a channel. For example, you can set <timeslots> to 4 6 8 10 14 22. If you set the E1 lineType attribute to CAS (channel associated signalling), you cannot use timeslot 16. Timeslot data rate <rate>: doNotOverride or 56K.
2.0S1
100 Chapter 7 Four-port E1 function processor
Clocking source: If you install an E1 trunk between two Passports nodes, you must set the clockingSource attributes to one of the following combinations: local at one end and line at the other, module at one end and line at the other, or module at both ends.
Four-port E1 FP diagnostic tests

The four-port E1 FP supports the following port tests and loopbacks. The gure Data paths for four-port E1 FP port tests and loopbacks on page 100 shows the data path for each test and loopback. Card loopback test on page 42 Manual tests on page 43 Manual test using a physical loopback (page 43). See Four-port E1 FP pinouts for physical loopbacks on page 103. Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry.
Figure 9 Data paths for four-port E1 FP port tests and loopbacks
Function processor Line interface CSU Link controller
PPT 0040 002 AA
241-5701-610 2.0S1
Chapter 7 Four-port E1 function processor 101
Provisionable four-port E1 FP components and attributes

This gure shows provisionable E1 FP components and attributes.
Figure 10 Provisionable E1 FP components and attributes
Root Lp E1 Provisioned (Prov) lineType clockingSource crc4Mode sendRaiOnAis CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText IfEntryProv ifAdminStatus ifIndex Channel (Chan) Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerName CustomerIdentifierData (CidData) customerIdentifier IfEntryProv ifAdminStatus ifIndex
PPT 2920 015 AA
Four-port E1 FP OSI states

These tables contain information about E1 FP OSI states.
2.0S1
102 Chapter 7 Four-port E1 function processor Table 16 E1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm multifrmLofAlarm rxMultifrmRaiAlarm txMultifrmRaiAlarm. Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The E1 component is in use. A lock/lock operator command is in effect. The E1 component is ready to service a user. A test is running. Some hardware test failed. The E1 component is in the locked state. External factors render the E1 port inoperable.
Table 17 E1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy
(Sheet 1 of 2)
External factors render the Chan component inoperable because of E1 alarms. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time.
241-5701-610 2.0S1
Chapter 7 Four-port E1 function processor 103 Table 17 (continued) E1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
Table 18 E1 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. An E1, or Chan component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
Four-port E1 FP pinouts for physical loopbacks

The faceplate of the four-port E1 FP has two connectors. Each connector supports two ports. In the table Faceplate connector pinouts for a four-port E1 FP on page 104, port x refers to the rst port, and port y refers to the second port on the same connector. The pinout congurations are identical for all connectors and ports on the faceplate. The transmit and receive pins must match up by polarity. The table Termination panel connector pinouts for a four-port E1 FP on page 104 contains the pinouts for the termination panel connectors.
2.0S1
104 Chapter 7 Four-port E1 function processor Table 19 Faceplate connector pinouts for a four-port E1 FP Transmit pins Pin no 8 15 1 9 Pin name Port x, transmit + Port x, transmit Port y, transmit + Port y, transmit Receive pins Pin no 7 14 2 10 Pin name Port x, receive + Port x, receive Port y, receive + Port y, receive -
Table 20 Termination panel connector pinouts for a four-port E1 FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
241-5701-610 2.0S1
105
Chapter 8 Eight-port DS1 function processor

See the following sections for information about conguring and testing an eight-port DS1 function processor (FP): Eight-port DS1 FP conguration parameters on page 105 Eight-port DS1 FP diagnostic tests on page 106 Provisionable eight-port DS1 FP components and attributes on page 108 Eight-port DS1 FP OSI states on page 109 Eight-port DS1 FP pinouts for physical loopbacks on page 110
Eight-port DS1 FP conguration parameters

When conguring an eight-port DS1 FP, use the following values to help you set component attributes: Card type <cardtype>: 8pDS1 Ports <port>: DS1 Port numbers <m>: 07 Number of channels : 17. You can add up to four channels on ports 1 and 5 with the other six ports disabled. When you add a port, the system automatically adds the component chan/0 below the DS1 component. On the IMA FP, the system also adds a chan/0 cell component beneath the DS1 component. Timeslots <timeslots>: 124. You can assign a set of timeslots to a channel. For example, you can set <timeslots> to 4 6 8 10 14 22.
2.0S1
106 Chapter 8 Eight-port DS1 function processor
Clocking source: If you install a DS1 trunk between two Passport nodes, you must set the clockingSource attributes to one of the following combinations: local at one end and line at the other, module at one end and line at the other, or module at both ends.
Eight-port DS1 FP diagnostic tests

The eight-port DS1 FP supports the following tests and loopbacks. The gure Data paths for eight-port DS1 FP port tests and loopbacks on page 107 shows the data path for each test and loopback. Card loopback test on page 42 Manual tests on page 43. Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not reamplied, the round-trip loop length for DS1 cannot exceed 223 m (655 ft). Manual test using a physical loopback on page 43. See Eightport DS1 FP pinouts for physical loopbacks on page 110. Manual test using an external loopback (page 44). External loopback is established at the line interface circuitry. Remote loopback test (page 46).
241-5701-610 2.0S1
Chapter 8 Eight-port DS1 function processor 107 Figure 11 Data paths for eight-port DS1 FP port tests and loopbacks
PPT 0040 001 AB
2.0S1
Provisionable eight-port DS1 FP components and attributes

This gure shows provisionable DS1 FP components and attributes.
Root Lp DS1 Provisioned (Prov) lineType zeroCoding clockingSource raiAlarm lineLength CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText IfEntryProv ifAdminStatus ifIndex Channel (Chan) Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerName CustomerIdentifierData (CidData) customerIdentifier IfEntryProv ifAdminStatus ifIndex
PPT 2920 013 AA
241-5701-610 2.0S1
Chapter 8 Eight-port DS1 function processor 109
Eight-port DS1 FP OSI states

Table 21 DS1 component state combination Combination (Administrative, Operational, Usage) Unlocked, Disabled, Idle Details The DS1 port is inoperable due to at least one of the following alarms. losAlarm lofAlarm rxAisAlarm. Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The DS1 component is in use. A lock/lock operator command is in effect. The DS1 component is ready to service a user. A test is running. A hardware test failed. The DS1 component is in the locked state. External factors render the DS1 port inoperable.
(Sheet 1 of 2)
2.0S1
110 Chapter 8 Eight-port DS1 function processor Table 22 (continued) DS1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
A lock operator command is in effect. The Chan component is otherwise ready to service a user. A test is running. A hardware test failed or the Chan component is in the locked state.
Eight-port DS1 FP pinouts for physical loopbacks

The faceplate of an eight-port DS1 FP has four connectors. Each connector supports two ports. In the table Faceplate connector pinouts for an eight-port DS1 FP on page 111, port x refers to the rst port, and port y refers to the second port on the same connector. The pinout congurations are identical for all connectors and ports on the faceplate. The transmit and receive pins must match up by polarity. The table Termination panel connector pinouts for an eight-port DS1 FP on page 111, contains the pinouts for the termination panel connectors.
241-5701-610 2.0S1
Chapter 8 Eight-port DS1 function processor 111 Table 24 Faceplate connector pinouts for an eight-port DS1 FP Transmit pins Pin no 8 15 1 9 Pin name Port x, transmit + Port x, transmit Port y, transmit + Port y, transmit Receive pins Pin no 7 14 2 10 Pin name Port x, receive + Port x, receive Port y, receive + Port y, receive -
Table 25 Termination panel connector pinouts for an eight-port DS1 FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
2.0S1
241-5701-610 2.0S1
113

See the following sections for information about conguring and testing a DS1C function processor (FP): DS1C FP conguration parameters on page 113 DS1C FP diagnostic tests on page 114 Provisionable DS1C components and attributes on page 118 DS1C OSI states on page 119 DS1C FP pinouts for physical loopbacks on page 121
DS1C FP conguration parameters

When conguring a DS1C FP, use the following values to help you set component attributes: Card type <cardtype>: DS1C Ports <port>: DS1 Port numbers <m>: 0, 1, 2, 3 Number of channels : 123. The system automatically adds Channel 0. Timeslots <timeslots>: 124. You can assign a set of timeslots to a channel. For example, you can set <timeslots> to 4 6 8 10 14 22.
2.0S1
114 Chapter 9 DS1C function processor
If you are setting up a DS1C line between two Passport nodes that are colocated, you must set the clockingSource attributes as one of the following combinations: local at one end and line at the other module at one end and line at the other module at both ends.
DS1C FP diagnostic tests

The DS1C FP supports the following port tests and loopbacks. The gure Data paths for DS1C FP port tests and loopbacks on page 115 shows the data path for each port test and loopback. Card loopback test (page 42). You can only test one channel component at a time. Manual tests (page 43). Make sure the loop lengths are within the required range and the line Length attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for DS1 cannot exceed 223 m (655 ft.). Manual test using a physical loopback (page 43). See DS1C FP pinouts for physical loopbacks on page 121. Manual test using an external loopback (page 44). External loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45) V.54 remote loopback test (page 47). The DS1C FP supports V.54 remote loopback for 64 kbps and 56 kbps timeslot data rates, depending on the network conguration. Before you run a test, make sure the FP is provisioned to support the timeslot data rate expected by the far-end circuit termination equipment. See DS1C FP in a fractional T1 network conguration on page 115 for more information about supported congurations.
241-5701-610 2.0S1
Chapter 9 DS1C function processor 115 Figure 13 Data paths for DS1C FP port tests and loopbacks
V.54 remote loopback test (channel only)
Card External and payload test loopbacks
PPT 2567 001 AA
DS1C FP in a fractional T1 network conguration

The table "Summary of V.54 supported and unsupported items" on page 116 describes how a DS1C FP supports the V.54 remote loopback test.The gures DS1C to a fractional T1 network conguration on page 117 and "DS1C to a DDS network conguration" on page 118 show network congurations supported by the DS1C FP. The DS1C FP does not respond to loop up and loop down requests from the far end.
2.0S1
116 Chapter 9 DS1C function processor Table 26 Summary of V.54 supported and unsupported items Network configuration Supported Unsupported
DS1C to a Fractional One nx64 kbps (n = 1 to 24) Chan One nx64 kbps (n = 1 to 24) Chan T1 network component with B8ZS line coding component with AMI line coding and ESF framing format running one and ESF or D4 framing format (see DS1C to a V.54 test on each port fractional T1 network configuration on One nx56 kbps (N = 1 to 24) Chan page 117) component with B8ZS/AMI line coding and ESF/D4 framing format running one V.54 test on each port V.54 loopback test can be initiated from one Chan component on each DS1C port without affecting traffic on other channels off the same port DS1C to a DDS network DDS customer primary channel data DS1C does not respond to or rate of 64 kbps (clear channel), 72.0 transport DDS network control kbps OCU/loop data rate, a codes (see DS1C to a DDS DS1configuration of B8ZS line network coding, and ESF framing format configuration on page 118) DS1C to a DDS network DDS customer primary channel data DDS secondary channel signalling rate of 56 kbps, 56 kbps OCU/loop either standard or proprietary data rate, a DS1 configuration of (see DS1C to a DDS B8ZS line coding and ESF framing network format configuration on page 118) Supports only 56 kbps and 64 kbps customer primary channel data rate Applicable to a DS1C DS1C sends V.54 loop-up and loop- DS1C does not respond to V.54 to a Fractional T1 down patterns to remote DSI as part loop-up and loop-down patterns network and DS1C to of one V.54 test cycle that are generated externally a DDS network
(Sheet 1 of 2)
241-5701-610 2.0S1
Chapter 9 DS1C function processor 117 Table 26 (continued) Summary of V.54 supported and unsupported items Network configuration Supported Maximum one V.54 test per DS1C port at a time Maximum four simultaneous V.54 tests on each DS1C card so there is one V.54 test running on each port
(Sheet 2 of 2)
Unsupported DS1C ignores V.54 acknowledgement signalling
Figure 14 DS1C to a fractional T1 network conguration
DSU/CSU DS1C Fractional T1 network DSU/CSU

DTE DTE
DSU/CSU Passport node
DTE
DS1 level connection DS0 level connection V35 connection

PPT 1097 001 AA
2.0S1
118 Chapter 9 DS1C function processor Figure 15 DS1C to a DDS network conguration
DDS DSU DS1C DDS network DDS DSU
DTE DTE
DDS DSU Passport node
DTE
DS1 level connection DS0 level connection V35 connection

PPT 1098 001 AB
Provisionable DS1C components and attributes

This gure shows provisionable DS1C FP components and attributes.
241-5701-610 2.0S1
Chapter 9 DS1C function processor 119 Figure 16 Provisionable DS1C FP components and attributes
Root Lp DS1 Provisioned (Prov) lineType zeroCoding clockingSource raiAlarm lineLength CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText IfEntryProv ifAdminStatus ifIndex Channel (Chan) Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerName CustomerIdentifierData (CidData) customerIdentifier IfEntryProv ifAdminStatus ifIndex
PPT 2920 013 AA
DS1C OSI states

These tables contain information about DS1C FP OSI states.
2.0S1
120 Chapter 9 DS1C function processor Table 27 DS1 component state combination Combination (Administrative, Operational, Usage) Unlocked, Disabled, Idle Details The DS1 port is inoperable due to at least one of the following alarms. losAlarm lofAlarm rxAisAlarm. Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The DS1 component is in use. A lock/lock operator command is in effect. The DS1 component is ready to service a user. A test is running. A hardware test failed. The DS1 component is in the locked state. External factors render the DS1 port inoperable.
Table 28 DS1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle External factors render the Chan component inoperable because of DS1 alarms. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. A lock operator command is in effect. The Chan component is otherwise ready to service a user. A test is running. A hardware test failed or the Chan component is in the locked state.
241-5701-610 2.0S1
Chapter 9 DS1C function processor 121 Table 29 DS1 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A DS1 or Chan component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
DS1C FP pinouts for physical loopbacks

The faceplate of a DS1C FP has two connectors. Each connector supports two ports. In the table, Faceplate connector pinouts for a DS1C FP on page 122 port x refers to the rst port, and port y refers to the second port on the same connector. The pinout congurations are identical for all connectors and ports on the faceplate. The transmit and receive pins must match up by polarity. The table Termination panel connector pinouts for a DS1C FP on page 122 contains the pinouts for the termination panel connectors.
2.0S1
Table 30 Faceplate connector pinouts for a DS1C FP Transmit pins Pin no 8 15 1 9 Pin name Port x, transmit + Port x, transmit Port y, transmit + Port y, transmit Receive pins Pin no 7 14 2 10 Pin name Port x, receive + Port x, receive Port y, receive + Port y, receive -
Table 31 Termination panel connector pinouts for a DS1C FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
241-5701-610 2.0S1
123
Chapter 10 E1C function processor

See the following sections for information about conguring and testing an E1C function processor (FP): E1C FP conguration parameters on page 123 E1C FP diagnostic tests on page 124 Provisionable E1C FP components and attributes on page 126 E1C FP OSI states on page 127 E1C FP pinouts for physical loopbacks on page 129
E1C FP conguration parameters

When conguring an E1C FP, use the following values to set component attributes: Card type <cardtype>: E1C Ports <port>: E1 Port numbers <m>: 0, 1, 2, 3 Number of channels : 131. The system automatically adds channel 0. Timeslots <timeslots>: 131. You can assign a set of timeslots to a channel. For example, you can set <timeslots> to 4 6 8 10 14 22. If you set the E1 lineType attribute to CAS (channel associated signalling), you cannot use timeslot 16.
2.0S1
124 Chapter 10 E1C function processor
Clocking source: If you install an E1C trunk between two Passport nodes, you must set the clockingSource attributes to one of the following combinations: local at one end and line at the other, module at one end and line at the other, or module at both ends.
E1C FP diagnostic tests

The E1C FP supports the following port tests and loopbacks. The gure Data paths for E1C FP port tests and loopbacks on page 125 shows the data path for each test and loopback. Card loopback test on page 42. You can only test one channel at a time. Manual tests on page 43 Manual test using a physical loopback (page 43). See E1C FP pinouts for physical loopbacks on page 129. Manual test using an external loopback (page 44). External loopback is established at the line interface circuitry. Note: The external loopback must be established before the manual loopback is started. Incoming frames to the port may not be acknowledged if the external loopback is applied after the manual loopback has begun. V.54 remote loopback test on page 47. See V.54 and PN127 remote loopback tests on page 125. PN127 remote loopback test on page 49. See V.54 and PN127 remote loopback tests on page 125.
241-5701-610 2.0S1
Chapter 10 E1C function processor 125 Figure 17 Data paths for E1C FP port tests and loopbacks
V.54 and PNI27 remote loopback tests (channel only)
PPT 2572 001 AA
V.54 and PN127 remote loopback tests

The E1C FP supports the V.54 and PN127 remote loopback tests for nx64 kbps timeslot data rates using CCS framing. These test do not support data rates lower than 64kbps. You can run up to four V.54 or PN127 remote loopback tests (one test on each port) simultaneously. Before you run the test, make sure the FP is provisioned to support the timeslot data rate expected by the far-end circuit termination equipment. The gure V.54 and PN127 E1C test conguration on page 126 shows an example of a supported test conguration.
2.0S1
126 Chapter 10 E1C function processor Figure 18 V.54 and PN127 E1C test conguration
NTU E1C Fractional E1 network
DTE DTE
NTU

NTU Passport node
DTE
E1 level connection V35 connection

PPT 1097 002 AA
Provisionable E1C FP components and attributes

This gure shows provisionable E1C FP components and attributes.
241-5701-610 2.0S1
Chapter 10 E1C function processor 127 Figure 19 Provisionable E1C FP components and attributes
PPT 2920 012 AA
E1C FP OSI states

These tables contain information about E1C FP OSI states.
2.0S1
128 Chapter 10 E1C function processor Table 32 E1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm multifrmLofAlarm rxMultifrmRaiAlarm txMultifrmRaiAlarm. Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The E1 component is in use. A lock/lock operator command is in effect. The E1 component is ready to service a user. A test is running. A hardware test failed. The E1 component is in the locked state. External factors render the E1 port inoperable.
241-5701-610 2.0S1
Chapter 10 E1C function processor 129
Table 33 E1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle External factors render the Chan component inoperable because of E1 alarms. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. A lock operator command is in effect. The Chan component is otherwise ready to service a user. A test is running. Some hardware test failed or the Chan component is in the locked state.
E1C FP pinouts for physical loopbacks

The faceplate of an E1C FP has two connectors. Each connector supports two ports. In the table Faceplate connector pinouts for an E1C FP on page 130, port x refers to the rst port, and port y refers to the second port on the same connector. The pinout congurations are identical for all connectors and ports. The transmit and receive pins must match up by polarity.
2.0S1
130 Chapter 10 E1C function processor
The table Termination panel connector pinouts for an E1C FP on page 130 contains pinouts for the termination panel connectors.
Table 35 Faceplate connector pinouts for an E1C FP Transmit pins Pin no 8 15 1 9 Pin name Port x, transmit + Port x, transmit Port y, transmit + Port y, transmit Receive pins Pin no 7 14 2 10 Pin name Port x, receive + Port x, receive Port y, receive + Port y, receive -
Table 36 Termination panel connector pinouts for an E1C FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
241-5701-610 2.0S1
131
Chapter 11 DS3 function processor

See the following sections for information about conguring and testing a DS3 function processor (FP): DS3 FP conguration parameters on page 131 DS3 FP diagnostic tests on page 131 Provisionable DS3 FP components and attributes on page 133 DS3 FP OSI states on page 133
DS3 FP conguration parameters

When conguring a DS3 FP, use the following values to set component attributes; Card type <cardtype>: DS3 Ports <port>: DS3 Port numbers <m>: 0, 1, 2
DS3 FP diagnostic tests

The DS3 FP supports the following port tests and loopbacks. The gure Data paths for DS3 FP port tests and loopbacks on page 132 shows the data path for each test and loopbacks. Card loopback test on page 42
2.0S1
132 Chapter 11 DS3 function processor
Manual tests on page 43. Make sure the loop lengths are within the required range and the lineLength provisionable attribute is be properly set. If the looped signal is not re amplied, the round-trip loop length for DS3 cannot exceed 153 m (450 ft.). Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45)
DS3 remote loopback test on page 46. On the DS3 port, a line loopback activate signal (carried over C-bits) is sent over the link to force the remote DS3 port to loop the signal. The loopback is held until the line loopback deactivate signal is sent out of the link. The DS3 remote loop test is supported only when using DS3 C-bit parity framing mode (the DS3 CbitParity attribute is set to ON). With the attribute setting, the DS3 component also responds to a remote test request.
Figure 20 Data paths for DS3 FP port tests and loopbacks
Function processor Far-end CSU or DSU Line interface Link controller
Card Manual loopback test test in conjunction with physical loopback
External loopback
Payload loopback
PPT 0041 001 AB
241-5701-610 2.0S1
Chapter 11 DS3 function processor 133
Provisionable DS3 FP components and attributes

This gure shows provisionable DS3 FP components and attributes.
Root Lp DS3 Provisioned (Prov) cbitParity lineLength clockingSource applicationFramerName CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText
PPT 2920 011 AA
DS3 FP OSI states

2.0S1
134 Chapter 11 DS3 function processor Table 37 DS3 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRaiAlarm or the far end DS3 interface is requesting the local interface to loop back the incoming signal. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The DS3 component is in use. The DS3 component services only one user (for example a Framer component) at a time. A port and line test is in progress. A hardware test failed and the DS3 component is put in the locked state. A lock/lock operator command is in effect.
Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle
241-5701-610 2.0S1
Chapter 11 DS3 function processor 135 Table 38 DS3 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A V35, X21, DS1, E1, CHAN, DS3, or E3 component creates the Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
2.0S1
136 Chapter 11 DS3 function processor
241-5701-610 2.0S1
137
Chapter 12 E3 function processor

See the following sections for information about conguring and testing an E3 function processor (FP): E3 conguration parameters on page 137 E3 diagnostic tests on page 137 Provisionable E3 components and attributes on page 139 E3 OSI states on page 140
E3 conguration parameters
When conguring an E3 FP, use the following values to set component attributes: Card type <cardtype>: E3 Ports <port>: E3 Port numbers <m>: 0, 1, 2
E3 diagnostic tests
The E3 FP supports the following port tests and loopbacks. The gure Data paths for E3 FP port tests and loopbacks on page 138 shows the data path for each test and loopback. Card loopback test on page 42
2.0S1
138 Chapter 12 E3 function processor
Manual tests on page 43. Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for E3 cannot exceed 300 m (880 ft.). Manual test using a physical loopback (page 43) Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45)
Figure 22 Data paths for E3 FP port tests and loopbacks
Manual Card External loopback test loopback test in conjunction with physical loopback
Payload loopback
PPT 0041 002 AA
241-5701-610 2.0S1
Chapter 12 E3 function processor 139
Provisionable E3 components and attributes

This gure shows provisionable E3 components and attributes.
Figure 23 Provisionable E3 components and attributes
EM Lp E3 Provisioned (Prov) lineLength clockingSource applicationFramerName linkAlarmActivationThreshold linkAlarmScanInterval CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText
PPT 2920 010 AA
2.0S1
E3 OSI states
These tables contain information about E3 OSI states.
Table 39 E3 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E3 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRaiAlarm, or the far-end E3 interface requests the local interface to loop back the incoming signal. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The E3 component is in use. The E3 component services only one user (for example, a Framer component) at a time. A port and line test is in progress. Some hardware test failed and the E3 component is in the locked state by the operator. A lock/lock operator command is in effect.
241-5701-610 2.0S1
Chapter 12 E3 function processor 141 Table 40 E3 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The hardware component is unlocked. No resource is available to the Test component. The system will reject Start test requests. The Test component is in use. A V35, X21, DS1, E1, CHAN, DS3, or E3 component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command
Unlocked, Enabled, Busy
2.0S1
241-5701-610 2.0S1
143

See the following sections for information about conguring and testing a DS3C function processor (FP): DS3C FP conguration parameters on page 143 DS3C FP diagnostic tests on page 144 Provisionable DS3C FP components and attributes on page 145 DS3C FP OSI states on page 146
DS3C FP conguration parameters

When conguring a DS3C FP, use the following values to help you set component attributes: Card type <cardtype>: 1pDS3C Ports <port>: DS3, DS1 (tributary ports beneath a DS3 port). When you add a DS3 component, the system automatically creates DS1/1. Port numbers <m>: 0 Tributary DS1 port numbers <q>: 128 Number of channels : 1. When you add a DS1 component, the system automatically adds a Channel 0 component that contains 24 provisioned timeslots. Timeslots <timeslots>: 124. You can assign a set of timeslots to a channel. For example, you can set <timeslots> to 4 6 8 10 14 22. Timeslot data rate for DS1 port <rate>: doNotOverride or 56K
2.0S1
Clocking source: You must set the clockingSource attributes for DS1 components to one of the following combinations: local at one end and line at the other, or module at one end and line at the other. You cannot mix local and module DS1 clocking sources on a DS3C FP. The only valid clocking source for the DS3 component is local.
DS3C FP diagnostic tests

The DS3C FP supports the following port tests and loopbacks. The gure Data paths for DS3C FP port tests and loopbacks on page 144 shows the data path for some tests and loopbacks. Card loopback test (page 42) Manual tests (page 43) Manual test using a physical loopback (page 43) Manual test using an external loopback (page 44) Remote loopthistrib test (page 47). The test is supported only on the DS1 component of a DS3C FP and only when using DS3 Cbit parity framing mode (the DS3 CbitParity attribute is set to on).
Figure 24 Data paths for DS3C FP port tests and loopbacks
Function processor Far-end CSU or DSU Line interface Link controller
Remote loopthistrib test (DSI only)
Card External Manual loopback test loopback test in conjunction with physical loopback
PPT 2573 001 AA
241-5701-610 2.0S1
Chapter 13 DS3C function processor 145
Provisionable DS3C FP components and attributes

This gure shows provisionable DS3C FP components and attributes.
Figure 25 Provisionable DS3C FP components and attributes
Root Lp DS3 Provisioned (Prov) cbit mapping lineLength clockingSource applicationFramerName (null) CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText IfEntryProv ifAdminStatus ifIndex DS1 Provisioned (Prov) lineType zeroCoding clockingSource CustomerIndentifierData (CidData) customerIdentifier AdminInfo vendor commentText IfEntryProv ifAdminStatus ifIndex Channel (chan) Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerName CustomerIdentifierData (CidData) customerIdentifier IfEntryProv ifAdminStatus ifIndex PPT 2920 019 AA
2.0S1
DS3C FP OSI states

These tables contain information about DS3C FP OSI states.
Table 41 DS3 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRaiAlarm or the far end DS3 interface is requesting the local interface to loop back the incoming signal. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The DS3 component is in use. The DS3 component services only one user (for example a Framer component) at a time. A port and line test is in progress. Some hardware test failed and the DS3 component is put in the locked state. A lock/lock operator command is in effect.
241-5701-610 2.0S1
Chapter 13 DS3C function processor 147 Table 42 DS3 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A V35, X21, DS1, E1, Chan, DS3, or E3 component creates the Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
2.0S1
241-5701-610 2.0S1
149
Chapter 14 HSSI function processor

See the following sections for information about conguring and testing a HSSI function processor (FP): HSSI FP conguration parameters on page 149 HSSI FP diagnostic tests on page 149 Provisionable HSSI FP components and attributes on page 151 HSSI FP OSI states on page 152
HSSI FP conguration parameters

When conguring a HSSI FP, use the following values to set component attributes: Card type <cardtype>: HSSI Ports <port>: HSSI Port numbers <m>: 0
HSSI FP diagnostic tests

The HSSI FP supports the following port tests and loopbacks. The gure Data paths for HSSI FP port tests and loopbacks on page 150 shows the data paths for each test and loopback. Card loopback test (page 42) Local loopback test (page 43). This test is also called the HSSI LA loopback-type or the HSSI Local Digital Loopback (loop A). See HSSI local loopback test on page 150.
2.0S1
150 Chapter 14 HSSI function processor
Manual tests (page 43). For a manual test on HSSI components, a physical loopback through hardware manipulation is not possible. If you start a manual test, you must set up an external loopback on the far-end node. Manual test using an external loopback (page 44). The external loopback is established at the link controller.
Figure 26 Data paths for HSSI FP port tests and loopbacks
Function processor CSU or modem Line interface Link controller
Remote Manual loopback loopback test test in conjunction with physical loopback
PPT 0042 003 AA
HSSI local loopback test

You can use the HSSI local loopback test (also called HSSI local digital loopback or loop A) to test the link between a DTE and a DCE. Start the test on the DTE side of the connection. The system handles the loopback set up and test in this way: On the DTE side, the HSSI local loop test asserts the LA and LB loopback control leads. The test then sends out a test pattern to the other end DCE for a preset time after a dataStartDelay period. The HSSI DTE must be unlocked.
241-5701-610 2.0S1
Chapter 14 HSSI function processor 151
On the DCE side, the FP detects the ON state of the LA and LB loopback control leads. The FP issues an alarm to warn the operator that it has received the loopback request and suspended the service on the port while the test is in progress. The OSI state at the DCE changes to reect this condition. The DCE implements the loopback at the link controller and the entire port is looped back. The DCE then asserts the TM signal toward the DTE. When the test is completed, the DTE turns off the LA and LB loopback control leads. On the DCE side, the FP detects the OFF state of the LA and LB loopback control leads and takes down the loopback. The DCE clears the alarm to let the operator know that service will resume at this port, and sets the OSI state back to the previous state. The DCE then turns off the TM signal.
Provisionable HSSI FP components and attributes

This gure shows provisionable HSSI FP components and attributes.
2.0S1
152 Chapter 14 HSSI function processor Figure 27 Provisionable HSSI FP components and attributes
Root Lp HSSI Provisioned (Prov) linkMode readyLineState dataTransferLineState lineSpeed applicationFramerName CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText
PPT 2920 020 AA
HSSI FP OSI states

These tables contain information about HSSI FP OSI states.
241-5701-610 2.0S1
Chapter 14 HSSI function processor 153 Table 43 HSSI component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The HSSI port is inoperable due to at least one of the following alarms: alarms related to actualLinkMode incorrect link cable input modem signal does not meet expected. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input has been recognized as good. Clocks are available. The HSSI component is in use. The HSSI component services only one user (a Framer component) at a time. A lock operator command is in effect and the HSSI component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect and the component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) A hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
2.0S1
154 Chapter 14 HSSI function processor Table 44 HSSI Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The hardware component is unlocked. No resource is available to the Test component. The system will reject Start test requests. The Test component is in use. A HSSI component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
241-5701-610 2.0S1
155
Chapter 15 Three-port DS1 ATM function processor

See the following sections for information about conguring and testing a three-port DS1 ATM function processor (FP): Three-port DS1 ATM FP conguration parameters on page 155 Three-port DS1 ATM FP diagnostic tests on page 156 Provisionable three-port DS1 ATM FP components and attributes on page 157 Three-port DS1 ATM FP OSI states on page 158
Three-port DS1 ATM FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring a three-port DS1 ATM FP, use the following values to help you set component attributes. Card type <cardtype>: 3pDS1Atm Ports <port>: DS1 Port numbers <m>: 0, 1, 2 Number of channels : 13. When you add a DS1 port, the system automatically creates subcomponents chan/0, chan/0 cell, and Test. Timeslots <timeslots>: 124. You must use the full number of timeslots. DS1 ATM function processors support only ESF linetype.
2.0S1
156 Chapter 15 Three-port DS1 ATM function processor
Clocking source: All of the ports on a DS1 ATM FP must have the same clock source. See description of clocking and synchronization in 241-5701-200 Passport 7400, 8700 Hardware Description. Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
Three-port DS1 ATM FP diagnostic tests

You can perform the following diagnostic tests on the three-port DS1 ATM FP. The test congurations are illustrated in the gure Data paths for DS1 ATM FP port tests and loopbacks on page 157. Card loopback test (page 42) Manual tests (page 43). Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for DS1 cannot exceed 223 m (655 ft.). Manual test using a physical loopback (page 43) Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45). This test operates with the clockingSource attribute set to module or local. DS1 remote loopback test (page 46). On the DS1 port, a repeated bit pattern (00001) is sent out of the link to request the far-end CSU to set up a remote loopback. Then the specied test pattern is transmitted to the remote CSU as test data. At the end of the test, the Test component automatically takes down the remote loop by sending another repeated bit pattern (001).
241-5701-610 2.0S1
Chapter 15 Three-port DS1 ATM function processor 157 Figure 28 Data paths for DS1 ATM FP port tests and loopbacks
Far-end DS1A Tx/Rx A Remote Manual Card loop loop loop
DS1 Framer B C ATM Cell Mux/ Demux
External Payload loop loop

PPT 0774 001 AB
Provisionable three-port DS1 ATM FP components and attributes

This gure shows provisionable three-port DS1 ATM FP components and attributes.
2.0S1
158 Chapter 15 Three-port DS1 ATM function processor Figure 29 Provisionable three-port DS1 ATM FP components and attributes
Root Lp DS1 Provisioned (Prov) lineType zeroCoding clockingSource raiAlarmType lineLength CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText Channel (Chan) AtmCell Provisioned (Prov) scrambleCellPayload alarmActDelay
PPT 2920 021 AA
Three-port DS1 ATM FP OSI states

These tables contain information about DS1 ATM FP OSI states.
241-5701-610 2.0S1
Chapter 15 Three-port DS1 ATM function processor 159 Table 45 DS1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The DS1 interface is inoperable due at least one of the following alarms: losAlarm lofAlarm rxAisAlarm or the far-end DS1 interface has requested the local end to loop back the incoming signal. Unlocked, Enabled, Idle Unlocked, Enabled, Busy ShuttingDown, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The DS1 component is not in use. The line input is recognized as good. Clocks are available. The DS1 component is in use. The DS1 component has a Channel subcomponent. A lock command is in effect against the DS1 component, but the Channel subcomponent is not yet suspended. A lock operator command is in effect and the DS1 component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect and the component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) Some hardware test failed. (availabilityStatus: failed) If running in test mode external factors will cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
2.0S1
160 Chapter 15 Three-port DS1 ATM function processor Table 46 DS1 ATM Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Unlocked, Enabled, Idle ShuttingDown, Enabled, Busy Locked, Disabled, Idle The Chan component is inoperable because of DS1, E1 or lcdAlarm alarms. The associated port component is locked. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. The Chan component is not in use. The component is waiting for binding to an AtmIf component. A lock operator command is in effect. The system is waiting for a bound application to suspend. A hardware test failed or the Chan component is in the locked state.
Table 47 DS1 ATM Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A Chan, DS1, or E1 component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
241-5701-610 2.0S1
161
Chapter 16 Three-port E1 ATM function processor

See the following sections for information about conguring and testing an E1 ATM function processor (FP): Three-port E1 ATM FP conguration parameters on page 161 Three-port E1 ATM FP diagnostic tests on page 162 Provisionable three-port E1 ATM FP components and attributes on page 163 Three-port E1 ATM FP OSI states on page 164
Three-port E1 ATM FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring an E1 ATM FP, use the following values to help you set component attributes: Card type <cardtype>: 3pE1Atm Ports <port>: E1 Port numbers <m>: 0, 1, 2 Number of channels : 13. When you add an E1 port, the system automatically creates the subcomponents chan/0, chan/0 cell, and Test.
2.0S1
162 Chapter 16 Three-port E1 ATM function processor
Timeslots <timeslots>: 115 for E1A CAS linetype; 1731 for E1A CCS linetype. You must use all timeslots. The attribute lineType denes the framing mode used on E1 ports. Valid values are: CAS (channel associated signalling) indicates that timeslot 16 within the E1 frame is reserved for multi frame signalling, and that 30 timeslots are available for data. CCS (common channel signalling) indicates that timeslots 1 to 15 and 17 to 31 are all available for data. Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
Three-port E1 ATM FP diagnostic tests

The three-port E1 ATM FP supports the following port tests and loopbacks. The gure Data paths for three-port E1 ATM FP port tests and loopbacks on page 163 shows the data path for each test and loopback. Card loopback test (page 42) Manual tests (page 43) Manual test using a physical loopback (page 43) Manual test using an external loopback on page 44. The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45). This test operates with the clockingSource attribute set to module or local. During the test, the DS3 frames (physical level) stop and the payload data loops over the link controller device.
241-5701-610 2.0S1
Chapter 16 Three-port E1 ATM function processor 163 Figure 30 Data paths for three-port E1 ATM FP port tests and loopbacks
E1A Tx/Rx A Manual Card loop loop
E1 Framer B C ATM Cell Mux/ Demux

PPT 0774 002 AA
Provisionable three-port E1 ATM FP components and attributes

This gure shows provisionable three-port E1 ATM FP components and attributes.
2.0S1
164 Chapter 16 Three-port E1 ATM function processor Figure 31 Provisionable three-port E1 ATM FP components and attributes
Root Lp E1 Provisioned (Prov) lineType clockingSource crc4Mode sendRaiOnAis CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText Channel (Chan) AtmCell Provisioned (Prov) scrambleCellPayload alarmActDelay
PPT 2920 022 AA
Three-port E1 ATM FP OSI states

These tables contain information about E1 ATM FP OSI states.
241-5701-610 2.0S1
Chapter 16 Three-port E1 ATM function processor 165 Table 48 E1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E1 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm multifrmLofAlarm Unlocked, Enabled, Idle Unlocked, Enabled, Busy ShuttingDown, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The E1 component is not in use. The line input is as good. Clocks are available. The E1 component is in use. The E1 component has a Channel subcomponent. A lock command is in effect against the E1 component, but the Channel subcomponent is not yet suspended. A lock operator command is in effect and the E1 component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect and the component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) Some hardware test failed. (availabilityStatus: failed) If running in test mode external factors will cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
2.0S1
166 Chapter 16 Three-port E1 ATM function processor Table 49 E1 ATM Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Unlocked, Enabled, Idle ShuttingDown, Enabled, Busy Locked, Disabled, Idle The Chan component is inoperable because of DS1, E1 or lcdAlarm alarms. The associated port component is locked. Not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. The Chan component is not in use. The Chan component is waiting for binding to an ATmIf component. A lock operator command is in effect. The system is waiting for a bound application to suspend. A hardware test failed or the Chan component is in the locked state.
Table 50 E1 ATM Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A Chan, DS1, or E1 component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
241-5701-610 2.0S1
167
Chapter 17 Eight-port DS1 ATM function processor

See the following sections for information about conguring and testing an eight-port DS1 ATM function processor (FP): Eight-port DS1 ATM FP conguration parameters on page 167 Eight-port DS1 ATM FP diagnostic tests on page 168 Provisionable eight-port DS1 ATM FP components and attributes on page 169 Eight-port DS1 ATM FP OSI states on page 170
Eight-port DS1 ATM FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring an eight-port DS1 ATM FP, use the following values to set component attributes. Card type <cardtype>: 8pDS1Atm Ports <port>: DS1 Port numbers <m>: 07. If trafc shaping (per-VC queueing) is enabled, you can only use port instances 0 to 3 for independent ATM links. For IMA link groups, you can use any port. Number of channels : 1. When you add a DS1 port, the system automatically creates the subcomponents chan/0, chan/0 cell. Only one channel can be activated under one DS1 component. Chan/0 must be deleted before adding another Chan/<1-23>.
2.0S1
168 Chapter 17 Eight-port DS1 ATM function processor
Timeslots <timeslots>: 124. You must use all timeslots.
DS1 ATM function processors support only ESF linetype. Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
Eight-port DS1 ATM FP diagnostic tests

Eight-port DS1 ATM FPs support card, manual and remote loopback tests only if the port has a provisioned link to an AtmIf component. Ports linked directly to AtmIf components are independent links, as opposed to ports that are part of an IMA link group. For information about the difference between IMA links and independent links, see 241-5701-730 Passport 7400, 8700, 15000 Inverse Multiplexing for ATM Guide. The eight-port DS1 ATM FP supports the following port tests and loopbacks. Card loopback test (page 42) Manual tests (page 43). Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for DS1 cannot exceed 223 m (655 ft.). Manual test using a physical loopback (page 43) Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45). This test operates with the clockingSource attribute set to module or local. Remote loopback test (page 46).
241-5701-610 2.0S1
Chapter 17 Eight-port DS1 ATM function processor 169
Provisionable eight-port DS1 ATM FP components and attributes

This gure shows provisionable eight-port DS1 ATM FP components and attributes.
Figure 32 Provisionable eight-port DS1 ATM FP components and attributes
Root Lp DS1 Provisioned (Prov) lineType clockingSource crc4Mode sendRaiOnAis CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText Channel (Chan) AtmCell Provisioned (Prov) scrambleCellPayload alarmActDelay
PPT 2920 024 AA
2.0S1
Eight-port DS1 ATM FP OSI states

These tables contain information about eight-port DS1 ATM FP OSI states.
Table 51 DS1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The DS1 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm or the far-end DS1 interface has requested the local end to loop back the incoming signal. Unlocked, Enabled, Idle Unlocked, Enabled, Busy ShuttingDown, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The DS1 component is not in use. The line input is recognized as good. Clocks are available. The DS1 component is in use. The DS1 component has a Channel subcomponent. A lock command is in effect against the DS1 component, but the Channel subcomponent is not yet suspended. A lock operator command is in effect and the DS1 component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect and the component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) Some hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
241-5701-610 2.0S1
Chapter 17 Eight-port DS1 ATM function processor 171 Table 52 DS1 ATM Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Unlocked, Enabled, Idle ShuttingDown, Enabled, Busy Locked, Disabled, Idle The Chan component is inoperable because of DS1 or lcdAlarm alarms. The associated port component is locked. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. The Chan component is not in use. The Chan component is waiting for binding to an AtmIf component. A lock operator command is in effect. The system is waiting for a bound application to suspend. A hardware test failed or the Chan component is in the locked state.
Table 53 DS1 ATM Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A Chan or DS1 component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
2.0S1
241-5701-610 2.0S1
173
Chapter 18 Eight-port E1 ATM function processor

See the following sections for information about conguring and testing an eight-port E1 ATM function processor (FP): Eight-port E1 ATM FP conguration parameters on page 173 Eight-port E1 ATM FP diagnostic tests on page 174 Provisionable eight-port E1 ATM FP components and attributes on page 175 Eight-port E1 ATM FP OSI states on page 176
Eight-port E1 ATM FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring an eight-port E1 ATM FP, use the following values to set component attributes: Card type <cardtype>: 8pE1Atm Ports <port>: E1 Port numbers <m>: 07. If trafc shaping (per-VC queueing) is enabled, you can only use ports 0 3 for independent ATM links. For IMA link groups, you can use any port. Number of channels : 1. When you add a port, the system automatically adds the subcomponents chan/0 and chan/0 cell. Only one channel can be activated under one DS1 component. Chan/0 can be deleted to add another Chan/<1-23>.
2.0S1
174 Chapter 18 Eight-port E1 ATM function processor
Timeslots <timeslots>: 115 and 1731. You must use all timeslots. The attribute lineType denes the framing mode used on E1 ports. CCS (common channel signalling) is the only valid value. It indicates that timeslots 115 and 1731 are all available for data. Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
Eight-port E1 ATM FP diagnostic tests

Eight-port E1 ATM FPs support card, manual and remote loop tests only if the port has a provisioned link to an AtmIf component. Ports linked directly to AtmIf components are independent links, as opposed to ports that are part of an IMA link group. For information about the difference between IMA links and independent links, see 241-5701-730 Passport 7400, 8700, 15000 Inverse Multiplexing for ATM Guide. The eight-port E1 ATM FP supports the following port tests and loopbacks: Card loopback test (page 42) Manual tests (page 43). Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re-amplied, the round-trip loop length for DS1 cannot exceed 223 m (655 ft.). Manual test using a physical loopback (page 43) Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45). This test operates with the clockingSource attribute set to module or local.
241-5701-610 2.0S1
Chapter 18 Eight-port E1 ATM function processor 175
Provisionable eight-port E1 ATM FP components and attributes

This gure shows provisionable eight-port E1 ATM FP components and attributes.
Figure 33 Provisionable eight-port E1 ATM FP components and attributes
Root Lp E1 Provisioned (Prov) lineType clockingSource crc4Mode sendRaiOnAis CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText Channel (Chan) AtmCell Provisioned (Prov) scrambleCellPayload alarmActDelay
PPT 2920 022 AA
2.0S1
Eight-port E1 ATM FP OSI states

Table 54 E1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E1 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm multifrmLofAlarm. Unlocked, Enabled, Idle Unlocked, Enabled, Busy ShuttingDown, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The E1 component is not in use. The line input is recognized as good. Clocks are available. The E1 component is in use. The E1 component has a Channel subcomponent. A lock command is in effect against the E1 component, but the Channel subcomponent is not yet suspended. A lock operator command is in effect and the E1 component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect and the component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) Some hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
241-5701-610 2.0S1
Chapter 18 Eight-port E1 ATM function processor 177 Table 55 E1 ATM Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Unlocked, Enabled, Idle ShuttingDown, Enabled, Busy Locked, Disabled, Idle The Chan component is inoperable due to E1 alarms or an lcdAlarm The associated port component is locked. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. The Chan component is not in use. The Chan component is waiting for binding to an AtmIf component. A lock operator command is in effect. The system is waiting for a bound application to suspend. A hardware test failed or the Chan component is in the locked state.
Table 56 E1 ATM Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A Chan or E1 component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
2.0S1
241-5701-610 2.0S1
179
Chapter 19 JT2 ATM function processor

See the following sections for information about conguring and testing a JT2 ATM function processor (FP): JT2 ATM FP conguration parameters on page 179 JT2 ATM FP diagnostic tests on page 180 Provisionable JT2 ATM FP components and attributes on page 181 JT2 ATM FP OSI states on page 182
JT2 ATM FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring a JT2 ATM FP, use the following values to help you set component attributes: Card type <cardtype>: 2pJ6mAtm Ports <port>: JT2. When you add a port, the system automatically creates an ATMCell subcomponent. Port numbers <m>: 0, 1 Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
2.0S1
180 Chapter 19 JT2 ATM function processor
JT2 ATM FP diagnostic tests

The JT2 ATM FP supports the following port tests and loopbacks. The gure Data paths for JT2 ATM FP port tests and loopbacks on page 180 shows the data paths for each test and loopback. Card loopback test (page 42) Manual tests (page 43) Manual test using an external loopback (page 44) Manual test using a payload loopback (page 45)
Figure 34 Data paths for JT2 ATM FP port tests and loopbacks
SUNI-PDH A
Manual Card Loop Loop
JT2 Line I/F
JT2 Framer
External Payload Loop Loop
ATM Cell Mux/ Demux
PPT 0775 001 AA
241-5701-610 2.0S1
Chapter 19 JT2 ATM function processor 181
Provisionable JT2 ATM FP components and attributes

This gure shows provisionable JT2 ATM FP components and attributes.
Figure 35 Provisionable JT2 ATM FP components and attributes
Root Lp JT2 Provisioned (Prov) clockingSource lineLength applicationFramerName CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText AtmCell Provisioned (Prov) alarmActDelay scrambleCellPayload
PPT 2920 025 AA
2.0S1
JT2 ATM FP OSI states

These tables contain information about JT2 ATM FP OSI states.
Table 57 JT2 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The JT2 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisPhysicalAlarm rxAisPayloadAlarm rxRaiAlarm lcdAlarm. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The JT2 component is in use. The JT2 component services only one user (an ATM interface component) at a time. A lock command is in effect against the JT2 component. The JT2 component is waiting for the ATM interface component to go into a disabled mode before it completes the lock sequence and shuts down.
Unlocked, Enabled, Busy ShuttingDown, Enabled, Busy
(Sheet 1 of 2)
241-5701-610 2.0S1
Chapter 19 JT2 ATM function processor 183 Table 57 (continued) JT2 component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle A lock operator command is in effect. The JT2 component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect. The component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) Some hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
(Sheet 2 of 2)
Table 58 JT2 ATM Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The hardware component is locked. You can perform a port and line test. The Test component is in use. A JT2 component creates a Test component. The Test component services only that particular component. A teststops either when the prescribed timer expires or you issue a stop test command.
2.0S1
241-5701-610 2.0S1
185
Chapter 20 DS3 ATM function processor

See the following sections for information about conguring and testing a DS3 ATM function processor (FP): DS3 ATM FP conguration parameters on page 185 DS3 ATM FP diagnostic tests on page 186 Provisionable DS3 ATM FP components and attributes on page 188 DS3 ATM FP OSI states on page 189
DS3 ATM FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring a DS3 ATM FP, use the following values to help you set component attributes: Card type <cardtype>: 3pDS3Atm Ports <port>: DS3 Port numbers <m>: 0, 1, 2. When you add a port, the system automatically creates an ATMCell subcomponent. The system also automatically provisions C-Bit Parity mode.
If you do not want to use C-Bit Parity mode, use the command
set lp/<n> DS3/<m> cBitParity off
2.0S1
186 Chapter 20 DS3 ATM function processor
Cells are directly mapped into the DS3 payloads by default for the three-port ATM-based DS3 FPs. You can use plcp cell mapping instead of the default direct mapping for a port on a DS3. Use the command
set lp/<n> DS3/<m> mapping plcp
The mapping affects the reference source used when line clocking source is selected. For direct mapping, the received DS3 bitstream at 44.736 MHz or 34.368 MHz determines the clock. For plcp mapping, the received PLCP framing at 8 kHz determines the clock. Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
DS3 ATM FP diagnostic tests

The DS3 ATM FP supports the following port tests and loopbacks. The gure Data paths for DS3 ATM port tests and loopbacks on page 187 shows the data paths for each port test and loopback. Card loopback test (page 42) Manual tests (page 43). Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for DS3 cannot exceed 137m (450 ft.). Manual test using an external loopback on page 44. The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45). During the test, the DS3 frames (physical level) stops and the payload data loops over the link controller device.
241-5701-610 2.0S1
Chapter 20 DS3 ATM function processor 187
DS3 remote loopback test on page 46. On the DS3 port, a line loopback activate signal (carried over C-bits) travels over the link to force the remote DS3 port to loop the signal. The loopback stays there until the line loopback deactivate signal is sent out of the link. The DS3 remote loop test is supported only when using DS3 C-bit parity framing mode (the DS3 CbitParity attribute is set to on). With the attribute setting, the DS3 component also responds to a remote test request.
Figure 36 Data paths for DS3 ATM port tests and loopbacks
SUNI-PDH B C ATM Cell Mux/ Demux

PPT 0773 001 AA
2.0S1
188 Chapter 20 DS3 ATM function processor
Provisionable DS3 ATM FP components and attributes

This gure shows provisionable DS3 ATM FP components and attributes.
Figure 37 Provisionable DS3 ATM FP components and attributes
Root Lp DS3 Provisioned (Prov) cbitParity mapping lineLength clockingSource applicationFramerName CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText AtmCell Provisioned (Prov) scrambleCellPayload alarmActDelay
PPT 2920 026 AA
241-5701-610 2.0S1
Chapter 20 DS3 ATM function processor 189
DS3 ATM FP OSI states

These tables contain information about DS3 ATM FP OSI states.
Table 59 DS3 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRaiAlarm lcdAlarm rxIdle. Or the far-end DS3 interface sends a request to the local end to loop back the incoming signal. When the PLCP option is turned on, PLCP lofAlarm and PLCP rxRaiAlarm also disable the component. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The DS3 component is in use. The DS3 component services only one user (an ATM interface component) at a time. A lock command is in effect against the DS3 component. The DS3 component is waiting for the ATM interface component to go into a disabled mode before it completes the lock sequence and shuts down.
Unlocked, Enabled, Busy Unlocked, Enabled, Shutting Down
(Sheet 1 of 2)
2.0S1
190 Chapter 20 DS3 ATM function processor Table 59 (continued) DS3 component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle A lock operator command is in effect. The DS3 component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect. The component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) Some hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
(Sheet 2 of 2)
Table 60 DS3 ATM Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The hardware component is locked. You can perform a port and line test. The Test component is in use. A Chan, DS1, E1, DS3, E3, V35, X21, Sonet, or Sdh component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
241-5701-610 2.0S1
191
Chapter 21 E3 ATM function processor

See the following sections for information about conguring and testing an E3 ATM function processor (FP): E3 ATM FP conguration parameters on page 191 E3 ATM FP diagnostic tests on page 192 Provisionable E3 ATM FP components and attributes on page 194 E3 ATM FP OSI states on page 195
E3 ATM FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring an E3 ATM FP, use the following values to set component attributes: Card type <cardtype>: 3pE3Atm Ports <port>: E3 Port numbers <m>: 0, 1, 2. When you add a port, the system automatically creates subcomponents ATMCell and G832.
The system directly maps cells into the E3 payloads by default.You can use plcp cell mapping instead of the default direct mapping for a port on a E3. Use the command
set lp/<n> E3/<m> mapping plcp
2.0S1
192 Chapter 21 E3 ATM function processor
The mapping affects the reference source when you select the line clocking source. For direct mapping, the received E3 bitstream at 44.736 MHz or 34.368 MHz determines the clock. For plcp mapping, the received PLCP framing at 8 kHz determines the clock. E3 ATM FPs use the framing format dened by ITU-T G.832 by default, although the older format dened by ITU-T G.751 is still available. If the port is an E3 port, and you want to use the older framing format dened in ITU-T G.751, use the command
set lp/<n> E3/<m> framing g751
After setting the framing format to G751, delete the G832 component (automatically generated when the VCC is created). Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
E3 ATM FP diagnostic tests

The E3 ATM FP supports the following port tests and loopbacks. The gure Data paths for E3 ATM FP port tests and loopbacks on page 193 shows the data paths for each port test and loopback. Card loopback test (page 42) Manual tests (page 43). Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for E3 cannot exceed 300 m (880 ft.). Manual test using a physical loopback (page 43) Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45)
241-5701-610 2.0S1
Chapter 21 E3 ATM function processor 193 Figure 38 Data paths for E3 ATM FP port tests and loopbacks
SUNI-PDH E3A Tx/Rx A Manual Card loop loop B C ATM Cell Mux/ Demux

PPT 0773 002 AA
2.0S1
194 Chapter 21 E3 ATM function processor
Provisionable E3 ATM FP components and attributes

This gure shows provisionable E3 ATM FP components and attributes.
Figure 39 Provisionable E3 ATM FP components and attributes
Root Lp E3 Provisioned (Prov) lineLength mapping framing clockingSource applicationFramerName linkAlarmActivationThreshold linkAlarmScanInterval CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText AtmCell Provisioned (Prov) scrambleCellPayload alarmActDelay G832 Provisioned (Prov) trailTraceTransmitted trailTraceExpected
Note: G832 component is only applicable if framing attribute is set G832
PPT 2920 027 AA
241-5701-610 2.0S1
Chapter 21 E3 ATM function processor 195
E3 ATM FP OSI states

Table 61 E3 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E3 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRaiAlarm lcdAlarm When the PLCP option is turned on, PLCP lofAlarm and PLCP rxRaiAlarm also disable the component. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The E3 component is in use. The E3 component services only one user (an ATM Interface component) at a time. A lock command is in effect against the E3 component. The E3 component is waiting for the ATM interface component to go into a disabled mode before it completes the lock sequence and shuts down.
(Sheet 1 of 2)
2.0S1
196 Chapter 21 E3 ATM function processor Table 61 (continued) E3 component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle A lock operator command is in effect and the E3 component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect and the component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) A hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
(Sheet 2 of 2)
Table 62 E3 ATM Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The hardware component is locked. You can perform a port and line test. The Test component is in use. A Chan, DS1, E1, DS3, E3, V35, X21, Sonet, or Sdh component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
241-5701-610 2.0S1
197
Chapter 22 OC-3 ATM function processor

See the following sections for information about conguring and testing an OC-3 ATM function processor (FP): OC-3 ATM FP conguration parameters on page 197 OC-3 ATM FP diagnostic tests on page 198 Provisionable OC-3 ATM FP components and attributes on page 200 OC-3 ATM FP OSI states on page 201
OC-3 ATM FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring an OC-3 FP, use the following values to help you set component attributes: Card type <cardtype>: 3pOC3MmAtm, 3pOC3SmAtm Ports <port>: SONET, SDH Port numbers <m>: 0, 1, 2. When you add an OC-3 port, the system automatically creates a Path subcomponent. The system also creates an ATMCell component beneath the Path component. You must set three types of attributes: Set the Sonet or Sdh provisionable attributes using the generic process.
2.0S1
198 Chapter 22 OC-3 ATM function processor
Set the Sonet or Sdh Path component attributes using the command
set lp/<n> <port>/<m> path/0 <attribute> <attributevalue>
Set the Sonet or Sdh Path AtmCell component attributes using the command
set lp/<n> <port>/<m> path/0 cell <attribute> <attributevalue>
Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
OC-3 ATM FP diagnostic tests

The OC-3 ATM FP supports the following port test and loopbacks. The gure Data paths for OC-3 ATM FP port tests and loopbacks on page 199 displays the data path for each test and loopback. Card loopback test (page 42) Manual tests (page 43) Manual test using a physical loopback (page 43) Manual test using an external loopback (page 44)
241-5701-610 2.0S1
Chapter 22 OC-3 ATM function processor 199 Figure 40 Data paths for OC-3 ATM FP port tests and loopbacks
SUNI-LITE Optical I/F

Manual Loop External Loop Card Loop
ATM Cell Mux/ Demux
PPT 0776 001 AA
2.0S1
Provisionable OC-3 ATM FP components and attributes

This gure shows provisionable OC-3 ATM FP components and attributes.
Figure 41 Provisionable OC-3 ATM FP components and attributes
Root Lp Sonet Provisioned (Prov) clockingSource CustomerIdentifieData (CidData) customerIdentifier AdminInfo vendor commentText Path Provisioned (Prov) clockingSource CustomerIdentifieData (CidData) customerIdentifier AtmCell Provisioned (Prov) alarmActDelay Sdh scrambleCellPayload Provisioned (Prov) clockingSource CustomerIdentifieData (CidData) customerIdentifier AdminInfo vendor commentText Path Provisioned (Prov) applicationFramerName CustomerIdentifieData (CidData) customerIdentifier AtmCell Provisioned (Prov) alarmActDelay scrambleCellPayload
PPT 2920 028 AA
241-5701-610 2.0S1
Chapter 22 OC-3 ATM function processor 201
OC-3 ATM FP OSI states

These tables contain information about OC-3 ATM FP OSI states.
Table 63 OC-3 Sonet/Sdh component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The Sonet/Sdh interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRAlarm lcdAlarm. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The Sonet/Sdh component is in use. The Sonet/Sdh component has one Path component under it. A lock command is in effect against the Sonet/Sdh component but the Path component under it is not yet suspended. A lock operator command is in effect. The Sonet/Sdh component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect. The component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) Some hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
Unlocked, Enabled, Busy Unlocked, Enabled, Shutting Down Locked, Enabled, Idle Locked, Disabled, Idle
2.0S1
202 Chapter 22 OC-3 ATM function processor Table 64 OC-3 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The hardware component is locked. You can perform a port and line test. The Test component is in use. A Chan, DS1, E1, DS3, E3, V35, X21, Sonet, or Sdh component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
Table 65 OC-3 Path component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The Path component is inoperable due to at least one of the following alarms: lopAlarm rxAisAlarm rxRAlarm signalLabelMismatch Either a bad path state or the Sonet/Sdh is disabled. If the Sonet/ Sdh is disabled either Sonet/Sdh is locked or there is a bad Sonet/Sdh signal. Unlocked, Enabled, Idle Unlocked, Enabled, Busy
(Sheet 1 of 2)
The component is not in use. The component is waiting for a binding to an ATM interface component. The Path component is in use. The Path component services only one user (an ATM interface component) at a time.
241-5701-610 2.0S1
Chapter 22 OC-3 ATM function processor 203 Table 65 (continued) OC-3 Path component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Enabled, Shutting Down A lock command is in effect against the Path component. The Path component is waiting for the ATM interface component to go into a disabled mode before it completes the lock sequence and shuts down. A lock operator command is in effect.
Locked, Disabled, Idle

(Sheet 2 of 2)
2.0S1
241-5701-610 2.0S1
205
Chapter 23 DS3 ATM IP function processor for Passport 7400

See the following sections for information about conguring and testing a DS3 second generation ATM function processor (FP): DS3 ATM IP conguration parameters on page 205 DS3 ATM IP diagnostic tests on page 206 Provisionable DS3 ATM IP components and attributes on page 208 DS3 ATM IP OSI states on page 209
DS3 ATM IP conguration parameters

For all ATM IPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring a DS3 ATM IP, use the following values to help you set component attributes: Card type <cardtype>: 3pDS3Atm2 Ports <port>: DS3 Port numbers <m>: 0, 1, 2. When you add a port, the system automatically creates an ATMCell subcomponent. The system also automatically provisions C-Bit Parity mode.
If you do not want to use C-Bit Parity mode, use the command
set lp/<n> DS3/<m> cBitParity off
2.0S1
206 Chapter 23 DS3 ATM IP function processor for Passport 7400
Cells are directly mapped into the DS3 payloads by default for the three-port ATM-based DS3 FPs. You can use plcp cell mapping instead of the default direct mapping for a port on a DS3. Use the command
set lp/<n> DS3/<m> mapping plcp
The mapping affects the reference source used when line clocking source is selected. For direct mapping, the received DS3 bitstream at 44.736 MHz or 34.368 MHz determines the clock. For plcp mapping, the received PLCP framing at 8 kHz determines the clock. Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
DS3 ATM IP diagnostic tests

The DS3 ATM IP supports the following port tests and loopbacks. The gure Data paths for DS3 ATM IP port tests and loopbacks on page 207 shows the data paths for each port test and loopback. Card loopback test (page 42) Manual tests (page 43). Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for DS3 cannot exceed 274 m (900 ft.). Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45). During the test, the DS3 frames (physical level) stops and the payload data loops over the link controller device.
241-5701-610 2.0S1
Chapter 23 DS3 ATM IP function processor for Passport 7400 207
DS3 remote loopback test (page 46). On the DS3 port, a line loopback activate signal (carried over C-bits) travels over the link to force the remote DS3 port to loop the signal. The loopback stays there until the line loopback deactivate signal is sent out of the link. The DS3 remote loop test is supported only when using DS3 C-bit parity framing mode (the DS3 CbitParity attribute is set to on). With the attribute setting, the DS3 component also responds to a remote test request.
Figure 42 Data paths for DS3 ATM IP port tests and loopbacks
Framer/cell processor B C ATM Cell Mux/ Demux
External loop
Payload loop
PPT 0773 001 AA
2.0S1
208 Chapter 23 DS3 ATM IP function processor for Passport 7400
Provisionable DS3 ATM IP components and attributes

This gure shows provisionable DS3 ATM IP components and attributes.
Figure 43 Provisionable DS3 ATM IP components and attributes
Root Lp DS3 Provisioned (Prov) cbitParity mapping lineLength clockingSource applicationFramerName CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText AtmCell Provisioned (Prov) scrambleCellPayload alarmActDelay
PPT 2920 026 AA
241-5701-610 2.0S1
Chapter 23 DS3 ATM IP function processor for Passport 7400 209
DS3 ATM IP OSI states

These tables contain information about DS3 ATM IP OSI states.
Table 66 DS3 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRaiAlarm lcdAlarm rxIdle. Or the far-end DS3 interface sends a request to the local end to loop back the incoming signal. When the PLCP option is turned on, PLCP lofAlarm and PLCP rxRaiAlarm also disable the component. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The DS3 component is in use. The DS3 component services only one user (an ATM interface component) at a time. A lock command is in effect against the DS3 component. The DS3 component is waiting for the ATM interface component to go into a disabled mode before it completes the lock sequence and shuts down.
(Sheet 1 of 2)
2.0S1
210 Chapter 23 DS3 ATM IP function processor for Passport 7400 Table 66 (continued) DS3 component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle A lock operator command is in effect. The DS3 component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect. The component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) Some hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
(Sheet 2 of 2)
Table 67 DS3 ATM Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The hardware component is locked. You can perform a port and line test. The Test component is in use. A Chan, DS1, E1, DS3, E3, V35, X21, Sonet, or Sdh component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
241-5701-610 2.0S1
211
Chapter 24 E3 ATM IP function processor for Passport 7400

See the following sections for information about conguring and testing an E3 ATM IP function processor (FP): E3 ATM IP conguration parameters on page 211 E3 ATM IP diagnostic tests on page 212 Provisionable E3 ATM IP components and attributes on page 214 E3 G.832 trail trace on page 215
E3 ATM IP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring an E3 ATM IP, use the following values to set component attributes: Card type <cardtype>: 3pE3Atm2 Ports <port>: E3 Port numbers <m>: 0, 1, 2. When you add a port, the system automatically creates subcomponents ATMCell and G832.
The system directly maps cells into the E3 payloads by default.You can use plcp cell mapping instead of the default direct mapping for a port on a E3. Use the command
set lp/<n> E3/<m> mapping plcp Passport 7400, 8700 Function Processor Configuration and Testing Guide 2.0S1
212 Chapter 24 E3 ATM IP function processor for Passport 7400
The mapping affects the reference source when you select the line clocking source. For direct mapping, the received E3 bitstream at 44.736 MHz or 34.368 MHz determines the clock. For plcp mapping, the received PLCP framing at 8 kHz determines the clock. E3 ATM FPs use the framing format dened by ITU-T G.832 by default, although the older format dened by ITU-T G.751 is still available. If the port is an E3 port, and you want to use the older framing format dened in ITU-T G.751, use the command
set lp/<n> E3/<m> framing g751
After setting the framing format to G751, delete the G832 component (automatically generated when the VCC is created). Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. You can turn cell payload scrambling off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is a possibility of false cell header delineation errors.
E3 ATM IP diagnostic tests

The E3 ATM IP supports the following port tests and loopbacks. The gure Data paths for E3 ATM IP port tests and loopbacks on page 213 shows the data paths for each port test and loopback. Card loopback test (page 42) Manual tests (page 43). Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for E3 cannot exceed 300 m (880 ft.). Manual test using a physical loopback (page 43) Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45)
241-5701-610 2.0S1
Chapter 24 E3 ATM IP function processor for Passport 7400 213 Figure 44 Data paths for E3 ATM IP port tests and loopbacks
TE
Relay
Framer/Cell Processor
Manual loop
Card loop
External loop
Payload loop
2.0S1
Provisionable E3 ATM IP components and attributes

This gure shows provisionable E3 ATM IP components and attributes.
Figure 45 Provisionable E3 ATM IP components and attributes
Root Lp E3 Provisioned (Prov) lineLength mapping framing clockingSource applicationFramerName linkAlarmActivationThreshold linkAlarmScanInterval CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText AtmCell Provisioned (Prov) scrambleCellPayload alarmActDelay G832 Provisioned (Prov) trailTraceTransmitted trailTraceExpected
Note: G832 component is only applicable if framing attribute is set G832
PPT 2920 027 AA
241-5701-610 2.0S1
Chapter 24 E3 ATM IP function processor for Passport 7400 215
E3 G.832 trail trace

On E3 interfaces using G.832 framing, the trail trace feature can be used to verify the continued connection of the E3 port to intended far end port. If the received trail trace string differs from the provisioned trailTraceTransmitted string, a trail trace mismatch (TTM) is reported, resulting in the setting of a TTM alarm. Unlike Passport, many E3 equipment vendors do not support the trail trace feature of G.832 framing. Frequently, an obscure hard coded string is sent instead of the trail trace string expected by Passport. The resulting mismatch can cause TTM alarms to be set. To determine if received trail trace strings are causing G.832 trail trace mismatch alarms, use the following command to display a received string:
> d lp/6 e3/0 g832 trailTraceReceived
When the received string is known, the cause of the alarm can be determined to be either the result of an E3 misconnection, or the result of receiving an obscure, hard coded string. In this case, the G832s trailTraceExpected string needs to be provisioned to match the value received.
E3 ATM IP OSI states

These tables contain information about E3 ATM IP OSI states.
2.0S1
216 Chapter 24 E3 ATM IP function processor for Passport 7400 Table 68 E3 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E3 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRaiAlarm lcdAlarm When the PLCP option is turned on, PLCP lofAlarm and PLCP rxRaiAlarm also disable the component. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The E3 component is in use. The E3 component services only one user (an ATM Interface component) at a time. A lock command is in effect against the E3 component. The E3 component is waiting for the ATM interface component to go into a disabled mode before it completes the lock sequence and shuts down. A lock operator command is in effect and the E3 component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect and the component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) A hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
Locked, Enabled, Idle Locked, Disabled, Idle
241-5701-610 2.0S1
Chapter 24 E3 ATM IP function processor for Passport 7400 217 Table 69 E3 ATM Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The hardware component is locked. You can perform a port and line test. The Test component is in use. A Chan, DS1, E1, DS3, E3, V35, X21, Sonet, or Sdh component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
2.0S1
241-5701-610 2.0S1
219
Chapter 25 OC-3 ATM IP function processor for Passport 7400

See the following sections for information about conguring and testing an OC-3 ATM IP function processor (FP): OC-3 ATM IP conguration parameters on page 219 OC-3 ATM IP diagnostic tests on page 220 Provisionable OC-3 ATM IP components and attributes on page 222 OC-3 ATM IP OSI states on page 223
OC-3 ATM IP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring an OC-3 ATM IP, use the following values to help you set component attributes: Card type <cardtype>: 2pOC3MmAtm2, 2pOC3SmAtm2 Ports <port>: SONET, SDH Port numbers <m>: 0, 1. When you add an OC-3 port, the system automatically creates a Path subcomponent. The system also creates an ATMCell component beneath the Path component. You must set three types of attributes:
2.0S1
220 Chapter 25 OC-3 ATM IP function processor for Passport 7400
Set the Sonet or Sdh provisionable attributes using the generic process (see Conguring a function processor on page 30) Set the Sonet or Sdh Path component attributes using the command
set lp/<n> <port>/<m> path/0 <attribute> <attributevalue>
Set the Sonet or Sdh Path AtmCell component attributes using the command
set lp/<n> <port>/<m> path/0 cell <attribute> <attributevalue>
Note: The cell payload is scrambled by default, according to ITU-T Recommendation I.432. Cell payload scrambling can be turned off for a port on an ATM card. However, when cell payload scrambling is turned off for ATM ports, there is an increased risk of false cell header delineation errors. Automatic protection switching: aps. When an APS component is created, the test component is automatically created for it, replacing the port test component under Sonet/Sdh. APS attributes workingLine and protectionLine must be linked to the Sonet (or Sdh) ports that will function as such. To congure APS, see Conguring line protection on optical interfaces on page 38. For more information on working with APS, see 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide.
OC-3 ATM IP diagnostic tests

The OC-3 ATM IP supports the following port test and loopbacks. The gure Data paths for OC-3 ATM IP port tests and loopbacks on page 221 displays the data path for each test and loopback. Card loopback test (page 42) Manual tests (page 43) Manual test using a physical loopback (page 43) Manual test using an external loopback (page 44)
241-5701-610 2.0S1
Chapter 25 OC-3 ATM IP function processor for Passport 7400 221 Figure 46 Data paths for OC-3 ATM IP port tests and loopbacks
TE
Framer/Cell Processor
Manual loop (can be implemented over any OC-3 equipment or cables)
Card loop
External loop
PPT 2826 002 AA
2.0S1
Provisionable OC-3 ATM IP components and attributes

This gure shows provisionable OC-3 ATM IP components and attributes.
Figure 47 Provisionable OC-3 ATM IP components and attributes
Root Lp Sonet (or alternatively Sdh) Provisioned (Prov) clockingSource CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText Path Provisioned (Prov) applicationFramerName CustomerIdentifierData (CidData) customerIdentifier AtmCell Provisioned (Prov) alarmActDelay scrambleCellPayload AtmCell customerIdProv scheme mode holdOffTime waitToRestore workingLine protectionLine applicationFramerName
PPT 2920 031 AA
241-5701-610 2.0S1
Chapter 25 OC-3 ATM IP function processor for Passport 7400 223
OC-3 ATM IP OSI states

These tables contain information about OC-3 ATM IP OSI states.
Table 70 OC-3 Sonet/Sdh component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The Sonet/Sdh interface is inoperable through due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRAlarm lcdAlarm. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The Sonet/Sdh component is in use. The Sonet/Sdh component has one Path component under it. A lock command is in effect against the Sonet/Sdh component but the Path component under it is not yet suspended. A lock operator command is in effect. The Sonet/Sdh component is operating in test mode (availabilityStatus: inTest). A lock operator command is in effect. The component is in one of the following conditions: Left ofine. (availabilityStatus: ofine) Some hardware test failed. (availabilityStatus: failed) If running in test mode external factors cause errors (availabilityStatus: inTest). Bad line state and excessive line state changes are possible causes.
Unlocked, Enabled, Busy Unlocked, Enabled, Shutting Down Locked, Enabled, Idle Locked, Disabled, Idle
2.0S1
224 Chapter 25 OC-3 ATM IP function processor for Passport 7400 Table 71 OC-3 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The hardware component is locked. You can perform a port and line test. The Test component is in use. A Chan, DS1, E1, DS3, E3, V35, X21, Sonet, or Sdh component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
Table 72 OC-3 Path component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The Path component is inoperable due to at least one of the following alarms: lopAlarm rxAisAlarm rxRAlarm signalLabelMismatch Either a bad path state or the Sonet/Sdh is disabled. If the Sonet/ Sdh is disabled either Sonet/Sdh is locked or there is a bad Sonet/Sdh signal. Unlocked, Enabled, Idle Unlocked, Enabled, Busy
(Sheet 1 of 2)
The component is not in use. The component is waiting for a binding to an ATM interface component. The Path component is in use. The Path component services only one user (an ATM interface component) at a time.
241-5701-610 2.0S1
Chapter 25 OC-3 ATM IP function processor for Passport 7400 225 Table 72 (continued) OC-3 Path component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Enabled, Shutting Down A lock command is in effect against the Path component. The Path component is waiting for the ATM interface component to go into a disabled mode before it completes the lock sequence and shuts down. A lock operator command is in effect.

(Sheet 2 of 2)
2.0S1
241-5701-610 2.0S1
227
Chapter 26 DS1 AAL1 function processor

See the following sections for information about conguring and testing a DS1 AAL1 function processor (FP): DS1 AAL1 FP conguration parameters on page 227 DS1 AAL1 FP diagnostic tests on page 228 Provisionable DS1 AAL1 FP components and attributes on page 228 DS1 AAL1 FP OSI states on page 229
DS1 AAL1 FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring a DS1 AAL1 FP, use the following values to help you set component attributes: Card type <cardtype>: 4pDS1Aal1 Ports <port>: DS1 Port numbers <m>: 0, 1, 2, 3 Number of channels : 0 23. When you add a port, the system automatically creates a Channel 0 component. Timeslots <timeslots>: 124. For unstructured services, you must provision all timeslots.
2.0S1
228 Chapter 26 DS1 AAL1 function processor
DS1 AAL1 FP diagnostic tests

The DS1 AAL1 FP supports the following port tests and loopbacks: Card loopback test (page 42) Manual test using an external loopback (page 44). Remote loopback test (page 46)
Provisionable DS1 AAL1 FP components and attributes

This gure shows provisionable DS1 AAL1 FP components and attributes.
Figure 48 Provisionable DS1 AAL1 FP components and attributes
Root Lp DS1 AAL1 Provisioned (Prov) group lineType zeroCoding clockingSource raiAlarmType lineLength CustomerIdentifierData (CidData) vendor commonText Channel (Chan) component Provisioned (Prov) group timeslots (ts) timeslotDataRate applicationFramerName TrunkConditioning replacementData signalOneDuration signalOne signalTwo
PPT 2920 032 AA
241-5701-610 2.0S1
Chapter 26 DS1 AAL1 function processor 229
DS1 AAL1 FP OSI states

These tables contain information about DS1 AAL1 FP OSI states.
(Sheet 1 of 2)
2.0S1
230 Chapter 26 DS1 AAL1 function processor Table 74 (continued) DS1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
241-5701-610 2.0S1
231
Chapter 27 E1 AAL1 function processor

See the following sections for information about conguring and testing an E1 AAL1 function processor (FP): E1 AAL1 FP conguration parameters on page 231 E1 AAL1 FP diagnostic tests on page 232 Provisionable E1 AAL1 FP components and attributes on page 232 E1 AAL1 FP OSI states on page 234
E1 AAL1 FP conguration parameters

For all ATM FPs, you must link the ports to an ATM interface before they can provide any service. For more information, see the section on provisioning the AtmInterface component in 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide. When conguring an E1 AAL1 FP, use the following values to help you set component attributes: Card type <cardtype>: 4pE1Aal1 Ports <port>: E1 Port numbers <m>: 0, 1, 2, 3 Number of channels : 030. When you add a port, the system automatically creates a Channel 0 component. Timeslots <timeslots>: 131. For unstructured services, you must provision all timeslots.
2.0S1
232 Chapter 27 E1 AAL1 function processor
E1 AAL1 FP diagnostic tests

The E1 AAL1 FP supports the following port tests and loopbacks: Card loopback test (page 42) Manual test using an external loopback (page 44) PN127 remote loopback test (page 49). The E1 AAL1 FP supports this test only when the E1 signal is structured. If a channel contains more than one timeslot, each timeslot is tested in sequence. You can run only one PN127 on an E1 AAL1 FP at a time.
Provisionable E1 AAL1 FP components and attributes

This gure shows provisionable E1 AAL1 FP components and attributes.
241-5701-610 2.0S1
Chapter 27 E1 AAL1 function processor 233 Figure 49 Provisionable E1 AAL1 FP components and attributes
Root Lp E1 AAL1 Provisioned (Prov) group lineType clockingSource crc4Mode sendRaiOnAis CustomerIdentifierData (CidData) vendor commonText Channel (Chan) component Provisioned (Prov) group timeslots (ts) timeslotDataRate applicationFramerName TrunkConditioning replacementData signalOneDuration signalOne signalTwo
PPT 2920 033 AA
2.0S1
E1 AAL1 FP OSI states

These tables contain information about E1 AAL1 FP OSI states.
Table 75 E1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm multifrmLofAlarm rxMultifrmRaiAlarm txMultifrmRaiAlarm. Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The E1 component is in use. A lock/lock operator command is in effect. The E1 component is ready to service a user. A test is running. Some hardware test failed. The E1 component is in the locked state. External factors render the E1 port inoperable.
241-5701-610 2.0S1
Chapter 27 E1 AAL1 function processor 235
Table 76 E1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle External factors render the Chan component inoperable because of E1 alarms. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. A lock operator command is in effect. The Chan component is otherwise ready to service a user. A test is running. A hardware test failed or the Chan component is in the locked state.
2.0S1
241-5701-610 2.0S1
237
Chapter 28 DS1 MSA32 function processor for Passport 7400

See the following sections for information about conguring and testing a 32port DS1 for multi-service access (MSA32) function processor (FP): DS1 MSA32 FP conguration parameters on page 237 DS1 MSA32 FP diagnostic tests on page 238 Provisionable DS1 MSA32 FP components and attributes on page 240 DS1 MSA32 FP OSI states on page 242 Maintenance monitor for DS1 MSA32 function processor (page 243)
DS1 MSA32 FP conguration parameters

When conguring a DS1 MSA32 FP, use the following values to help you set component attributes: Port numbers <m>: 0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31 Note: Only ports 0-29 can be used for ATM UNI. Ports 30 and 31 cannot be used for ATM UNI except as part of an IMA link group. All 32 ports can be used for non-ATM services. Number of channels : 0 23. When you add a port, the system automatically creates a Channel 0 component. Timeslots <timeslots>: 124. For unstructured services, you must provision all timeslots.
2.0S1
238 Chapter 28 DS1 MSA32 function processor for Passport 7400
DS1 MSA32 FP diagnostic tests

The DS1 MSA32 FP supports the following port tests and loopbacks: Card loopback test (page 42) Manual tests (page 43) Manual test using an external loopback (page 44) Manual test using a payload loopback (page 45) Remote loopback test (page 46)
Table 78 Port and channel test types supported on DS1 MSA32 FP Test type card manual externalLoop payloadLoop remoteLoop Supported on port yes yes yes no yes Supported on channel no yes no yes no Performs pattern test yes yes no no yes
The DS1 MSA32 function processor uses hardware to generate a continuous constant bit rate (CBR) pattern instead of using a software-generated series of frames to test error bit rates on the line. The CBR pattern can be customized or a standard pseudo-random bit sequence or pattern (PRBS). Hardwaregenerated CBR patterns allow complete testing of the line because the function processor can then detect all bit errors. With software-generated test patterns, the function processor only detects bit errors if they occur within the frame containing the PRBS pattern. For framed line types, the function processor generates the continuous CBR pattern within the framing on the line. For unframed line types, the function processor generates the CBR pattern over the full port bandwidth. The DS1 MSA32 function processor also uses hardware to evaluate the bit test stream that is returned.
241-5701-610 2.0S1
Chapter 28 DS1 MSA32 function processor for Passport 7400 239
Because of these particularities, the DS1 MSA32 function processor has some unique behaviors for port testing, as explained in the following sections: Clock synchronization (page 239) Test setup and result attributes (page 239) Interpreting test results (page 240)
Clock synchronization
The PRBS patterns used by the DS1 MSA32 function processor are subject to the same constraints as framed trafc on the access ports. This means that to prevent frame slips from occurring, you must congure the clockingSource attribute to module when doing port tests on framed line types on the DS1 MSA32 function processor. This sets the active CPs clock as the source of the transmit clock for the DS1 line and ensures that the received data and transmitted data have the same clock as the DS1 MSA32 function processor. Because of the nature of PRBS, if a frame slip occurs and pattern synchronization is lost, the DS1 MSA32 function processor cannot resynchronize to the pattern and a patternSynchLost condition is declared. See Interpreting test results (page 240) if this happens. For unframed line types, you can congure a local, line or module clocking source.
Test setup and result attributes

Because the DS1 MSA32 function processors does not use softwaregenerated frames: the frmsize attribute of the test setup component is redundant the frmTx, frmRx and erroredFrmRx attributes of the test result component are redundant
2.0S1
Interpreting test results

On the DS1 MSA32 function processor, Passport terminates a test on framed line types as a patternSynchLost condition when the received bit errors rise to a level of greater than 1%. A patternSynchLost condition is declared, terminating the test, if either of the two following situations occur: A line is error-free but a conguration error causes frame slips. The function processor is unable to re-synchronize after a frame slip, causing the test to terminate. In this situation, the test results show a bit error rate of zero and the termination cause as patternSynchLost, indicating that the last sample had a bit error rate of greater than 1% due to the frame slip. A line has bit error rates of less than 1% but rises to greater than 1% at some points, possibly due to electrical problems in a cable. In this situation, the test results show a bit error rate of less than 1% but the termination cause is shown as patternSynchLost because the last sample had a bit error rate of greater than 1%.
To avoid these types of situations when running framed line types, ensure that you have congured your clocking source correctly. For information on clocking source, see "Clock synchronization" on page 239.
Provisionable DS1 MSA32 FP components and attributes

The gure "Provisionable DS1 MSA32 FP components and attributes" on page 241, shows provisionable DS1 MSA32 FP components and attributes.
241-5701-610 2.0S1
Chapter 28 DS1 MSA32 function processor for Passport 7400 241 Figure 50 Provisionable DS1 MSA32 FP components and attributes
Root Lp DS1 Provisioned (Prov) group lineType zeroCoding clockingSource raiAlarmType lineLength CustomerIdentifierData (CidData) group CustomerIndentifier (Cid) AdminInfo (AdminInfo) group vendor commonText Channel (Chan) Provisioned (Prov) group timeslots (ts) timeslotDataRate (dataRate) applicationFramerName TrunkConditioning (TC) Provisioned (Prov) group replacementData (data) signalOneDuration (duration) signalOne (sigOne) signalTwo (sigTwo) AtmCell(Cell)
PPT 2920 034 AA
2.0S1
DS1 MSA32 FP OSI states

These tables contain information about DS1 MSA32 FP OSI states.
Table 79 DS1 component state combination Combination (Administrative, Operational, Usage) Unlocked, Disabled, Idle Details The DS1 port is inoperable due to at least one of the following alarms. losAlarm lofAlarm rxAisAlarm.
Note: With unstructured CES, only lossOfSignal will cause this OSI state.
Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The DS1 component is in use. A lock/lock operator command is in effect. The DS1 component is ready to service a user. A test is running. A hardware test failed. The DS1 component is in the locked state. External factors render the DS1 port inoperable.
(Sheet 1 of 2)
241-5701-610 2.0S1
Chapter 28 DS1 MSA32 function processor for Passport 7400 243 Table 80 (continued) DS1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
Maintenance monitor for DS1 MSA32 function processor

The DS1 MSA32 FP allows you to monitor the ingress data ow of a single channel on a port and direct it as an AAL1 CES data stream to a remote receiver. The purpose is to provide a system that, once provisioned, may be activated remotely by operations staff to add a non-intrusive monitor onto a channel. The maintenance monitor can operate on the following types of channels: ATM frame relay structured AAL1 CES
The output AAL1 CES data stream can be directed to a local port, or to a remote port anywhere in the network, that supports CES. The following gure shows provisionable components and attributes associated with the maintenance monitor.
2.0S1
244 Chapter 28 DS1 MSA32 function processor for Passport 7400 Figure 51 Provisionable maintenance monitor components and attributes
Root MaintenanceMonitorTX (MmTx) Provisioned (Prov) group linkToLogicalProcessor (IpName) monitoredDirection (direction )* serviceType (serType)* partialFill (partFill)* idleSuppression (idleSup)* Operational (Oper) group connectionStatus (connStatus)* chanToMonitor (chan) Aal1NailedUpAdaptionPoint (Nap) Provisioned (Prov) group atmConnection (ac)
*read-only attribute
PPT 2920 035 AA
The procedures associated with the maintenance monitor are: Provisioning the maintenance monitor (page 244) Starting the maintenance monitor (page 246) Stopping the maintenance monitor (page 246)
Provisioning the maintenance monitor

Before provisioning the maintenance monitor, make sure that the channel to be monitored is provisioned and operating with either an ATM, frame relay or AAL1 CES service. For provisioning details of these services, see 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide 241-5701-900 Passport 7400, 8700, 15000 Frame Relay UNI Guide
241-5701-610 2.0S1
Chapter 28 DS1 MSA32 function processor for Passport 7400 245
241-5701-720 Passport 7400, 8700, 15000 AAL1 Circuit Emulation Guide that an ATM virtual channel connection with an nailed-up end point has been set up to the port where the remote receiver is connected
Perform the following steps in provisioning mode. For information on working in provisioning mode, see 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide.
1 Add a MaintenanceMonitorTx component add Mmtx/<n> where: <n> is the instance number of the MaintenanceMonitorTx component 2 Link the MaintenanceMonitorTx component to the LP containing the channel to be monitored set Mmtx/<n> lpName Lp/<lp> where: <n> is the instance number of the MaintenanceMonitorTx component <lp> is the LP containing the channel to be monitored A separate instance of the MaintenanceMonitorTx component is required for each monitored channel. Only one instance of the MaintenanceMonitorTx component can be linked to a particular LP. 3 Add a Aal1NailedUpAdaptationPoint subcomponent to the MaintenanceMonitorTx component add Mmtx/<n> Nap where: <n> is the instance number of the MaintenanceMonitorTx component 4 Link the Aal1NailedUpAdaptationPoint subcomponent to the ATM virtual channel connection to the port where the remote receiver is connected. add Mmtx/<n> Nap atmConnection AtmIf/<m> Vcc/ <vpi>.<vci> Nep where: <n> is the instance number of the MaintenanceMonitorTx component <m> is the ATM interface with the port where the remote receiver is connected
2.0S1
246 Chapter 28 DS1 MSA32 function processor for Passport 7400 <vpi>.<vci> identies the virtual channel connection to the port where the remote received is connected 5 Activate and conrm the provisioning changes. activate prov confirm prov
Starting the maintenance monitor

Perform the following steps in operating mode. For information on working in operating mode, see 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide.
1 Use the maintenance monitors chanToMonitor attribute to specify which LP, port and channel to monitor. set Mmtx/<n> chan Lp/<lp> DS1/<x> Chan/<y> where: <n> is the instance number of the MaintenanceMonitorTx component <lp> is the LP containing the channel to be monitored <x> is the port containing the channel to be monitored <y> is the channel to be monitored The value of <lp> must be the same as the one specied in Provisioning the maintenance monitor (page 244). The specied channel must be linked by provisioning to an ATM interface, a frame relay interface, or a structured AAL1 CES interface.
Stopping the maintenance monitor

1 Clear the maintenance monitors chanToMonitor attribute. set Mmtx/<n> chan ! where: <n> is the instance number of the MaintenanceMonitorTx component
241-5701-610 2.0S1
247
Chapter 29 E1 MSA32 function processor for Passport 7400

See the following sections for information about conguring and testing an 32-port E1 for multi-service access (MSA32) function processor (FP): E1 MSA32 FP conguration parameters on page 247 E1 MSA32 FP diagnostic tests on page 248 Provisionable E1 MSA32 FP components and attributes on page 251 E1 MSA32 FP OSI states on page 252
E1 MSA32 FP conguration parameters

When conguring an E1 MSA32 FP, use the following values to help you set component attributes: Port numbers <m>: 0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31 Note: Only ports 0-29 can be used for ATM UNI. Ports 30 and 31 cannot be used for ATM UNI except as part of an IMA link group. All 32 ports can be used for non-ATM services. Number of channels : 030. Timeslots <timeslots>: 131. For unstructured services, you must provision all timeslots.
2.0S1
248 Chapter 29 E1 MSA32 function processor for Passport 7400
E1 MSA32 FP diagnostic tests

The E1 MSA32 FP supports the following port tests and loopbacks: Card loopback test (page 42) Manual tests (page 43) Manual test using an external loopback (page 44). Manual test using a payload loopback (page 45) Remote loopback test (page 46) PN127 remote loopback test (page 49)
Table 81 Port and channel test types supported on MSA32 E1 FPs Test type card manual externalLoop payloadLoop remoteLoop pn127RemoteLoop Supported on port yes yes yes no yes no Supported on channel no yes no yes no yes Performs pattern test yes yes no no yes yes
The E1 MSA32 function processor uses hardware to generate a continuous constant bit rate (CBR) pattern instead of using a software-generated series of frames to test error bit rates on the line. The CBR pattern can be customized or a standard pseudo-random bit sequence or pattern (PRBS). Hardwaregenerated CBR patterns allow complete testing of the line because the function processor can then detect all bit errors. With software-generated test patterns, the function processor only detects bit errors if they occur within the frame containing the PRBS pattern. For framed line types, the function processor generates the continuous CBR pattern within the framing on the line. For unframed line types, the function processor generates the CBR pattern over the full port bandwidth.
241-5701-610 2.0S1
Chapter 29 E1 MSA32 function processor for Passport 7400 249
The E1 MSA32 function processor also uses hardware to evaluate the bit test stream that is returned. Because of these particularities, the E1 MSA32 function processor has some unique behaviors for port testing, as explained in the following sections: Clock synchronization (page 249) Test setup and result attributes (page 249) Interpreting test results (page 250)
Clock synchronization
The PRBS patterns used by the E1 MSA32 function processor are subject to the same constraints as framed trafc on the access ports. This means that to prevent frame slips from occurring, you must congure the clockingSource attribute to module when doing port tests on framed line types on the E1 MSA32 function processor. This sets the active CPs clock as the source of the transmit clock for the DS1 line and ensures that the received data and transmitted data have the same clock as the E1 MSA32 function processor. Because of the nature of PRBS, if a frame slip occurs and pattern synchronization is lost, the E1 MSA32 function processor cannot resynchronize to the pattern and a patternSynchLost condition is declared. See Interpreting test results (page 250) if this happens. For unframed line types, you can congure a local, line or module clocking source.
Test setup and result attributes

Because the E1 MSA32 function processors does not use software-generated frames: the frmsize attribute of the test setup component is redundant the frmTx, frmRx and erroredFrmRx attributes of the test result component are redundant
2.0S1
Interpreting test results

On the E1 MSA32 function processor, Passport terminates a test on framed line types as a patternSynchLost condition when the received bit errors rise to a level of greater than 1%. A patternSynchLost condition is declared, terminating the test, if either of the two following situations occur: A line is error-free but a conguration error causes frame slips. The function processor is unable to re-synchronize after a frame slip, causing the test to terminate. In this situation, the test results show a bit error rate of zero and the termination cause as patternSynchLost, indicating that the last sample had a bit error rate of greater than 1% due to the frame slip. A line has bit error rates of less than 1% but rises to greater than 1% at some points, possibly due to electrical problems in a cable. In this situation, the test results show a bit error rate of less than 1% but the termination cause is shown as patternSynchLost because the last sample had a bit error rate of greater than 1%.
To avoid these types of situations when running framed line types, ensure that you have congured your clocking source correctly. For information on clocking source, see Clock synchronization (page 249).
241-5701-610 2.0S1
Provisionable E1 MSA32 FP components and attributes

The gure "Provisionable E1 MSA32 FP components and attributes" on page 251 shows provisionable E1 MSA32 FP components and attributes.
Figure 52 Provisionable E1 MSA32 FP components and attributes
Root Lp E1 Provisioned (Prov) group lineType clockingSource crc4Mode sendRaiOnAis raiDeclareAlarmTime raiClearAlarmTime CustomerIdentifierData (CidData) group CustomerIdentifier (Cid) AdminInfo (AdminInfo) group vendor commonText Channel (Chan) Provisioned (Prov) group timeslots (ts) timeslotDataRate (dataRate) applicationFramerName TrunkConditioning (TC) Provisioned (Prov) group replacementData (data) signalOneDuration (duration) signalOne (sigOne) signalTwo (sigTwo) AtmCell (Cell) FrameLinkMontoring (flm)
PPT 2920 036 AA
2.0S1
E1 MSA32 FP OSI states

These tables contain information about E1 MSA32 FP OSI states.
Table 82 E1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm multifrmLofAlarm rxMultifrmRaiAlarm
Note: With unstructured CES, only lossOfSignal will cause this OSI state.
Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The E1 component is in use. A lock/lock operator command is in effect. The E1 component is ready to service a user. A test is running. Some hardware test failed. The E1 component is in the locked state. External factors render the E1 port inoperable.
241-5701-610 2.0S1
Table 83 E1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle External factors render the Chan component inoperable because of E1 alarms. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. A lock operator command is in effect. The Chan component is otherwise ready to service a user. A test is running. A hardware test failed or the Chan component is in the locked state.
Table 84 E1 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. An E1, or Chan component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires, a stop test command is issued, or there is a failure in loopback continuity.
Maintenance monitor for E1 MSA32 function processor

The E1 MSA32 FP allows you to monitor the ingress data ow of a single channel on a port and direct it as an AAL1 CES data stream to a remote receiver. The purpose is to provide a system that, once provisioned, may be activated remotely by operations staff to add a non-intrusive monitor onto a channel.
2.0S1
The maintenance monitor can operate on the following types of channels: ATM frame relay structured AAL1 CES
The output AAL1 CES data stream can be directed to a local port, or to a remote port anywhere in the network, that supports CES. The following gure shows provisionable components and attributes associated with the maintenance monitor.
Figure 53 Provisionable maintenance monitor components and attributes
Root MaintenanceMonitorTX (MmTx) Provisioned (Prov) group linkToLogicalProcessor (IpName) monitoredDirection (direction )* serviceType (serType)* partialFill (partFill)* idleSuppression (idleSup)* Operational (Oper) group connectionStatus (connStatus)* chanToMonitor (chan) Aal1NailedUpAdaptionPoint (Nap) Provisioned (Prov) group atmConnection (ac)
*read-only attribute
PPT 2920 035 AA
The procedures associated with the maintenance monitor are:

241-5701-610 2.0S1
Provisioning the maintenance monitor (page 255) Starting the maintenance monitor (page 256)
Stopping the maintenance monitor (page 256)
Provisioning the maintenance monitor

Before provisioning the maintenance monitor, make sure that the channel to be monitored is provisioned and operating with either an ATM, frame relay or AAL1 CES service. For provisioning details of these services, see 241-5701-710 Passport 7400, 8700, 15000 ATM Conguration Guide 241-5701-900 Passport 7400, 8700, 15000 Frame Relay UNI Guide 241-5701-720 Passport 7400, 8700, 15000 AAL1 Circuit Emulation Guide that an ATM virtual channel connection with an nailed-up end point has been set up to the port where the remote receiver is connected
Perform the following steps in provisioning mode. For information on working in provisioning mode, see 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide.
1 Add a MaintenanceMonitorTx component add Mmtx/<n> where: <n> is the instance number of the MaintenanceMonitorTx component 2 Link the MaintenanceMonitorTx component to the LP containing the channel to be monitored set Mmtx/<n> lpName Lp/<lp> where: <n> is the instance number of the MaintenanceMonitorTx component <lp> is the LP containing the channel to be monitored A separate instance of the MaintenanceMonitorTx component is required for each monitored channel. Only one instance of the MaintenanceMonitorTx component can be linked to a particular LP. 3 Add a Aal1NailedUpAdaptationPoint subcomponent to the MaintenanceMonitorTx component add Mmtx/<n> Nap Passport 7400, 8700 Function Processor Configuration and Testing Guide 2.0S1
256 Chapter 29 E1 MSA32 function processor for Passport 7400 where: <n> is the instance number of the MaintenanceMonitorTx component 4 Link the Aal1NailedUpAdaptationPoint subcomponent to the ATM virtual channel connection to the port where the remote receiver is connected. add Mmtx/<n> Nap atmConnection AtmIf/<m> Vcc/ <vpi>.<vci> Nep where: <n> is the instance number of the MaintenanceMonitorTx component <m> is the ATM interface with the port where the remote receiver is connected <vpi>.<vci> identies the virtual channel connection to the port where the remote received is connected 5 Activate and conrm the provisioning changes. activate prov confirm prov
Starting the maintenance monitor

1 Use the maintenance monitors chanToMonitor attribute to specify which LP, port and channel to monitor. set Mmtx/<n> chan Lp/<lp> E1/<x> Chan/<y> where: <n> is the instance number of the MaintenanceMonitorTx component <lp> is the LP containing the channel to be monitored <x> is the port containing the channel to be monitored <y> is the channel to be monitored The value of <lp> must be the same as the one specied in Provisioning the maintenance monitor (page 255). The specied channel must be linked by provisioning to an ATM interface, a frame relay interface, or a structured AAL1 CES interface.
Stopping the maintenance monitor

241-5701-610 2.0S1
Chapter 29 E1 MSA32 function processor for Passport 7400 257 1 Clear the maintenance monitors chanToMonitor attribute. set Mmtx/<n> chan ! where: <n> is the instance number of the MaintenanceMonitorTx component
2.0S1
241-5701-610 2.0S1
259
Chapter 30 DS1 voice function processor for Passport 7400

See the following sections for information about conguring and testing a DS1 voice function processor (FP): DS1 voice FP conguration parameters on page 259 DS1 voice FP diagnostic tests on page 260 Provisionable DS1 voice FP components and attributes on page 261 DS1 voice FP OSI states on page 262 DS1 voice FP pinouts for physical loopbacks on page 264
DS1 voice FP conguration parameters

When conguring a DS1 voice FP, use the following values to set component attributes: Card type <cardtype>: 1pDS1V Ports <port>: DS1 Port numbers <m>: 0 Number of channels : 023 Timeslots <timeslots>: 124
2.0S1
260 Chapter 30 DS1 voice function processor for Passport 7400
If you are setting up a DS1 trunk between two Passports that are co-located, you must set the clockingSource attributes as one of the following combinations: local at one end and line at the other module at one end and line at the other module at both ends
DS1 voice FP diagnostic tests

To run diagnostic tests on a DS1V FP, the frmSize attribute must remain at the default setting. The frmPatternType attribute must also remain at the default setting of customizedPattern. You can perform the following diagnostic tests on the DS1 Voice FP: Card loopback test (page 42) Manual tests (page 43). Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for DS1 cannot exceed 223 m (655 ft). Manual test using a physical loopback (page 43). See DS1 voice FP pinouts for physical loopbacks on page 264. Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry.
241-5701-610 2.0S1
Chapter 30 DS1 voice function processor for Passport 7400 261
Provisionable DS1 voice FP components and attributes

This gure shows provisionable DS1 voice FP components and attributes.
Figure 54 Provisionable DS1 voice FP components and attributes
Root Lp DS1 Provisioned (Prov) linkMode zeroCoding clockingSource raiAlarmType lineLength CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText Channel (Chan) Provisioned (Prov) timeSlots applicationFramerName CustomerIdentifierData (CidData) customerIdentifier
PPT 2920 038 AA
2.0S1
DS1 voice FP OSI states

These tables contain information about DS1 voice FP OSI states.
Table 85 DS1 component state combination Combination (Administrative, Operational, Usage) Unlocked, Disabled, Idle Details The DS1 port is inoperable due to at least one of the following alarms. losAlarm lofAlarm rxAisAlarm. Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The DS1 component is in use. A lock/lock operator command is in effect. The DS1 component is ready to service a user. A test is running. Some hardware test failed. The DS1 component is in the locked state. External factors render the DS1 port inoperable.
(Sheet 1 of 2)
241-5701-610 2.0S1
Chapter 30 DS1 voice function processor for Passport 7400 263 Table 86 (continued) DS1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
Table 88 DS1 voice Framer component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle A component that the Framer component depends on is not available. A likely cause is that the port component (for example, a DS1 component) is locked for testing. The Framer component is in use. The Framer component services only one user (an application component) at a time.
2.0S1
DS1 voice FP pinouts for physical loopbacks

To make hardware modications for a physical loopback, you must crossconnect the transmit and receive pins. These tables contain the pinouts for the faceplate and termination panel connectors.
Table 89 Faceplace connector pinouts for a DS1 voice FP Transmit pins Pin no 8 15 Pin name transmit + transmit Receive pins Pin no 7 14 Pin name receive + receive -
Table 90 Termination panel connector pinouts for a DS1 voice FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
241-5701-610 2.0S1
265
Chapter 31 E1 voice function processor for Passport 7400

See the following sections for information about conguring and testing an E1 voice function processor (FP): E1 voice FP conguration parameters on page 265 E1 voice FP diagnostic tests on page 266 Provisionable E1 voice FP components and attributes on page 267 E1 voice FP OSI states on page 268 E1 voice FP pinouts for physical loopbacks on page 270
E1 voice FP conguration parameters

When conguring a E1 voice FP, use the following values to set component attributes: Card type <cardtype>: 1pE1V Ports <port>: E1 Port numbers <m>: 0 Number of channels : 030 Timeslots <timeslots>: 131
If you are setting up an E1 trunk between two Passports that are co-located, you must set the clockingSource attributes as one of the following combinations: local at one end and line at the other
2.0S1
266 Chapter 31 E1 voice function processor for Passport 7400
module at one end and line at the other module at both ends
E1 voice FP diagnostic tests

When running diagnostic tests on the E1V FP, the frmSize attribute must remain at the default setting. The frmPatternType attribute must also remain at the default setting of CustomizedPattern. The E1 voice FP supports the following port tests and loopbacks: Card loopback test (page 42) Manual tests (page 43) Manual test using a physical loopback on page 43. See E1 voice FP pinouts for physical loopbacks on page 270. Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry.
241-5701-610 2.0S1
Chapter 31 E1 voice function processor for Passport 7400 267
Provisionable E1 voice FP components and attributes

This gure shows provisionable E1 voice FP components and attributes.
Figure 55 Provisionable E1 voice FP components and attributes
Root Lp E1 Provisioned (Prov) lineType clockingSource crc4Mode CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText Channel (Chan) Provisioned (Prov) timeSlots applicationFramerName CustomerIdentifierData (CidData) customerIdentifier
PPT 2920 039 AA
2.0S1
E1 voice FP OSI states

These tables contain information about E1 voice FP OSI states.
Table 92 E1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle
(Sheet 1 of 2)
External factors render the Chan component inoperable because of E1 alarms. The component is not in use. Provisioning or binding processes are possible causes.
241-5701-610 2.0S1
Chapter 31 E1 voice function processor for Passport 7400 269 Table 92 (continued) E1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
The Chan component is in use. The Chan component can only service one user at a time. A lock operator command is in effect. The Chan component is otherwise ready to service a user. A test is running. Some hardware test failed or the Chan component is in the locked state.
Table 93 E1 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. An E1, or CHAN component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
Table 94 E1 voice Framer component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle A component that the Framer component depends on is not available. A likely cause is that the port component (for example, a V35 component) is locked for testing. The Framer component is in use. The Framer component services only one user (an application component) at a time.
2.0S1
E1 voice FP pinouts for physical loopbacks

To insert a physical loopback, you must cross-connect the transmit and receive pins. These tables contain the pinouts for the faceplate and termination panel connectors.
Table 95 Faceplate connector pinouts for an E1 voice FP Transmit pins Pin no 8 15 Pin name transmit + transmit Receive pins Pin no 7 14 Pin name receive + receive -
Table 96 Termination panel connector pinouts for a DS1 voice FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
241-5701-610 2.0S1
271
Chapter 32 J2MV function processor for Passport 7400

See the following sections for information about conguring and testing a J2MV function processor (FP): J2MV FP conguration parameters on page 271 Provisionable J2MV FP components and attributes on page 274 J2MV FP diagnostic tests on page 272 J2MV FP OSI states on page 275 J2MV pinouts for physical loopbacks on page 277
J2MV FP conguration parameters

When conguring a J2MV FP, use the following values to help you set component attributes: Card type <cardtype>: J2MV Ports <port>: E1 Port numbers <m>: 0. When you add a J2MV port, the system adds a Channel 0 subcomponent. Number of channels : 030 Timeslots <timeslots>: 131. Do not use timeslot 16. A J2MV FP is provisioned to use an E1 port with CAS, A-bit signalling, and CRC4 off. The J2MV function processor converts TTC protocol to E1 and vice versa.
2.0S1
272 Chapter 32 J2MV function processor for Passport 7400
If you are setting up an E1 trunk between two Passports that are co-located, you must set the clockingSource attributes as one of the following combinations: local at one end and line at the other module at one end and line at the other module at both ends
J2MV FP diagnostic tests

When running diagnostic tests on the J2MV FP, the frmSize attribute must remain at the default setting. The frmPatternType attribute must also remain at the default setting of CustomizedPattern. The J2MV FP supports the following port tests and loopbacks. The gure Data paths for J2MV port tests and loopbacks on page 273 shows the data path for each test and loopback. Card loopback test (page 42) Manual tests (page 43) Manual test using a physical loopback (page 43). See J2MV pinouts for physical loopbacks on page 277. Manual test using an external loopback (page 44)
241-5701-610 2.0S1
Chapter 32 J2MV function processor for Passport 7400 273 Figure 56 Data paths for J2MV port tests and loopbacks
Manual loop
Card External loop loop

PPT 0040 002 AA
2.0S1
Provisionable J2MV FP components and attributes

This gure shows provisionable J2MV FP components and attributes.
Figure 57 Provisionable J2MV FP components and attributes
Root Lp E1 Provisioned (Prov) lineType clockingSource crc4Mode CustomerIdentifierData (CidData) customerIdentifier AdminInfo (AdminInfo) vendor commentText Channel (Chan) Provisioned (Prov) timeSlots applicationFramerName CustomerIdentifierData (CidData) customerIdentifier
PPT 2920 039 AA
241-5701-610 2.0S1
Chapter 32 J2MV function processor for Passport 7400 275
J2MV FP OSI states

These tables contain information about J2MV FP OSI states.
Table 97 J2MV E1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm multifrmLofAlarm rxMultifrmRaiAlarm txMultifrmRaiAlarm. Unlocked, Enabled, Busy Locked, Enabled, Idle The E1 component is in use. A lock/lock -force operator command is in effect. The E1 component is otherwise ready to service a user. A test is running. A hardware test failed. The E1 component is in the locked state. External factors render the E1 port inoperable.
Table 98 J2MV Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle
(Sheet 1 of 2)
The Chan component is inoperable because of E1 alarms. The component is not in use. Provisioning or binding processes are possible causes.
2.0S1
276 Chapter 32 J2MV function processor for Passport 7400 Table 98 (continued) J2MV Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
The Chan component is in use. The Chan component can only service one user at a time. A lock/lock operator command is in effect. The Chan component is ready to service a user. A test is running. A hardware test failed or the Chan component is in the locked state.
Table 99 J2MV Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A V35, X21, DS1, E1, Chan, DS3, or E3 component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
241-5701-610 2.0S1
Chapter 32 J2MV function processor for Passport 7400 277
J2MV pinouts for physical loopbacks

To insert a physical loopback, you must cross-connect the transmit and receive pins.
Table 100 Faceplate connector pinouts for a J2MV FP Transmit pins Pin no 4 11 Pin name transmit + transmit Receive pins Pin no 2 9 Pin name receive + receive -
2.0S1
241-5701-610 2.0S1
279
Chapter 33 DS1 MVP/MVP-E function processor for Passport 7400

See the following sections for information about conguring and testing a DS1 MVP/MVP-E function processor (FP): DS1 MVP/MVP-E FP conguration parameters on page 279 DS1 MVP/MVP-E FP diagnostic tests on page 280 Provisionable DS1 MVP/MVP-E FP components and attributes on page 282 DS1 MVP/MVP-E FP OSI states. on page 283 DS1 MVP/MVP-E FP pinouts for physical loopbacks on page 284
DS1 MVP/MVP-E FP conguration parameters

When conguring a DS1 MVP/MVP-E FP, use the following values to set component attributes: Card type <cardtype>: 1pDS1Mvp (for DS1 MVP) or 1pDS1Mvpe (for DS1 MVP-E) Ports <port>: DS1 Port numbers <m>: 0 Number of channels : 023 Timeslots <timeslots>: 124
2.0S1
280 Chapter 33 DS1 MVP/MVP-E function processor for Passport 7400
If you are setting up a DS1 trunk between two Passports that are co-located, you must set the clockingSource attributes as one of the following combinations: local at one end and line at the other module at one end and line at the other module at both ends
DS1 MVP/MVP-E FP diagnostic tests

The frmSize attribute cannot exceed 1024 when you run diagnostic tests on the DS1 MVP/MVP-E FP. The DS1 MVP/MVP-E loop tests cannot run on a channel associated with timeslot 25 when the linetype attribute is set to CAS. The DS1 MVP/MVP-E supports the following port tests and loopbacks. The gure Data paths for DS1 MVP/MVP-E port tests and loopbacks on page 281 shows the data path for each port test and loopback. Card loopback test (page 42) Manual tests (page 43). Make sure the loop lengths are within the required range and the lineLength provisionable attribute is properly set. If the looped signal is not re amplied, the round-trip loop length for DS1 cannot exceed 223 m (655 ft.). Manual test using a physical loopback (page 43). See DS1 MVP/ MVP-E FP pinouts for physical loopbacks on page 284. Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45)
241-5701-610 2.0S1
Chapter 33 DS1 MVP/MVP-E function processor for Passport 7400 281 Figure 58 Data paths for DS1 MVP/MVP-E port tests and loopbacks
Manual loop

PPT 0040 002 AA
2.0S1
Provisionable DS1 MVP/MVP-E FP components and attributes

This gure shows provisionable DS1 MVP/MVP-E FP components and attributes.
Figure 59 Provisionable DS1 MVP/MVP-E FP components and attributes
Root Lp DS1 Provisioned (Prov) group lineType zeroCoding clockingSource raiAlarmType lineLength CustomerIdentifierData (CidData) CustomerIdentifier (Cid) AdminInfo vendor commonText IfEntryProv ifAdminStatus ifIndex Channel (Chan) Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerName CustomerIdentifierData (Cid)Data customerIdentifier IfEntryProv ifAdminStatus ifIndex
PPT 2920 041 AA
241-5701-610 2.0S1
Chapter 33 DS1 MVP/MVP-E function processor for Passport 7400 283
DS1 MVP/MVP-E FP OSI states.

These tables contain information about DS1 MVP/MVP-E FP OSI states.
(Sheet 1 of 2)
2.0S1
284 Chapter 33 DS1 MVP/MVP-E function processor for Passport 7400 Table 102 (continued) DS1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
DS1 MVP/MVP-E FP pinouts for physical loopbacks

To insert a physical loopback on a port, you must cross-connect the transmit and receive pins. These tables contain the pinouts for the faceplate and termination panel connectors.
Table 104 Faceplate connector pinouts for a DS1 MVP/MVP-E FP Transmit pins Pin no 8 15 Pin name transmit + transmit Receive pins Pin no 7 14 Pin name receive + receive -
241-5701-610 2.0S1
Chapter 33 DS1 MVP/MVP-E function processor for Passport 7400 285 Table 105 Termination panel connector pinouts for a DS1 MVP/MVP-E FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
2.0S1
241-5701-610 2.0S1
287
Chapter 34 E1 MVP/MVP-E function processor for Passport 7400

See the following sections for information about conguring and testing an E1 MVP/MVP-E function processor (FP): E1 MVP/MVP-E FP conguration parameters on page 287 E1 MVP/MVP-E FP diagnostic tests on page 288 Provisionable E1 MVP/MVP-E FP components and attributes on page 290 E1 MVP/MVP-E FP OSI states on page 291 E1 MVP/MVP-E FP pinouts for physical loopbacks on page 293
E1 MVP/MVP-E FP conguration parameters

When conguring an E1 MVP/MVP-E FP, use the following values to set component attributes: Card type <cardtype>: 1pE1Mvp (for E1 MVP) or 1pE1Mvpe (for E1 MVP-E) Ports <port>: E1 Port numbers <m>: 0 Number of channels : 0 30 Timeslots <timeslots>: 131
2.0S1
288 Chapter 34 E1 MVP/MVP-E function processor for Passport 7400
E1 MVP/MVP-E FP diagnostic tests

To run diagnostic tests on an E1 MVP/MVP-E FP, the frmSize attribute cannot exceed 1024. The E1 MVP/MVP-E loop tests cannot run on a channel associated with timeslot 16 when the linetype is CAS. The E1 MVP/MVP-E FP supports the following port tests and loopbacks. The gure Data paths for E1 MVP/MVP-E FP port tests and loopbacks on page 289 shows the data path for each test and loopback. Card loopback test (page 42) Manual tests (page 43) Manual test using a physical loopback (page 43). See E1 MVP/ MVP-E FP pinouts for physical loopbacks on page 293. Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45)
241-5701-610 2.0S1
Chapter 34 E1 MVP/MVP-E function processor for Passport 7400 289 Figure 60 Data paths for E1 MVP/MVP-E FP port tests and loopbacks
Manual loop

PPT 0040 002 AA
2.0S1
Provisionable E1 MVP/MVP-E FP components and attributes

This gure shows provisionable E1 MVP/MVP-E FP components and attributes.
Figure 61 Provisionable E1 MVP/MVP-E FP components and attributes
Root Lp E1 Provisioned (Prov) group lineType clockingSource crc4Mode sendRaiOnAis CustomerIdentifierData (CidData) CustomerIdentifier (Cid) AdminInfo vendor commonText IfEntryProv ifAdminStatus ifIndex Channel (Chan) Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerName CustomerIdentifierData (Cid)Data customerIdentifier IfEntryProv ifAdminStatus ifIndex
PPT 2920 042 AA
241-5701-610 2.0S1
Chapter 34 E1 MVP/MVP-E function processor for Passport 7400 291
E1 MVP/MVP-E FP OSI states

These tables contain information about E1 MVP/MVP-E OSI states.
2.0S1
241-5701-610 2.0S1
Chapter 34 E1 MVP/MVP-E function processor for Passport 7400 293
E1 MVP/MVP-E FP pinouts for physical loopbacks

Table 109 Faceplate connector pinouts for an E1 MVP/MVP-E FP Transmit pins Pin no 8 15 Pin name transmit + transmit Receive pins Pin no 7 14 Pin name receive + receive -
Table 110 Termination panel connector pinouts for an E1 MVP/MVP-E FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
2.0S1
241-5701-610 2.0S1
295
Chapter 35 TTC2M MVP/MVP-E function processor for Passport 7400

See the following sections for information about conguring and testing a TTC2M MVP/MVP-E function processor (FP): TTC2M MVP/MVP-E FP conguration parameters on page 295 TTC2M MVP/MVP-E FP diagnostic tests on page 296 Provisionable TTC2M MVP/MVP-E FP components and attributes on page 298 TTC2M MVP/MVP-E FP OSI states on page 299 TTC2M MVP/MVP-E FP pinouts for physical loopbacks on page 301
TTC2M MVP/MVP-E FP conguration parameters

When conguring a TTC2M MVP/MVP-E FP, use the following values to set component attributes: Card type <cardtype>: 1pTTC2mMvp (for TTC2M MVP) or 1pTTC2mMvpe (for TTC2M MVP-E) Ports <port>: E1 Port numbers <m>: 0 Number of channels : 030 Timeslots <timeslots>: 131
2.0S1
296 Chapter 35 TTC2M MVP/MVP-E function processor for Passport 7400
TTC2M MVP/MVP-E FP diagnostic tests

In order to run diagnostic tests on an E1 MVP/MVP-E FP, the frmSize attribute cannot exceed 1024. You cannot run a loop test on a channel associated with timeslot 16 if the linetype attribute is set to CAS. The TTC2M MVP/MVP-E FP supports the following port tests and loopbacks. The gure Data paths for TTC2M MVP/MVP-E FP tests and loopbacks on page 297 shows the data path for each test and loopback. Card loopback test on page 42 Manual tests on page 43 Manual test using a physical loopback (page 43). See TTC2M MVP/MVP-E FP pinouts for physical loopbacks on page 301. Manual test using an external loopback (page 44). The external loopback is established at the line interface circuitry. Manual test using a payload loopback (page 45)
241-5701-610 2.0S1
Chapter 35 TTC2M MVP/MVP-E function processor for Passport 7400 297 Figure 62 Data paths for TTC2M MVP/MVP-E FP tests and loopbacks
Manual loop

PPT 0040 002 AA
2.0S1
Provisionable TTC2M MVP/MVP-E FP components and attributes

This graphic illustrates the provisionable TTC2M MVP/MVP-E FP components and attributes.
Figure 63 Provisionable TTC2M MVP/MVP-E FP components and attributes
PPT 2920 012 AA
241-5701-610 2.0S1
Chapter 35 TTC2M MVP/MVP-E function processor for Passport 7400 299
TTC2M MVP/MVP-E FP OSI states

These tables contain information about TTC2M MVP/MVP-E FP OSI states.
2.0S1
241-5701-610 2.0S1
Chapter 35 TTC2M MVP/MVP-E function processor for Passport 7400 301
TTC2M MVP/MVP-E FP pinouts for physical loopbacks

Table 114 Faceplate connector pinouts for a TTC2M MVP/MVP-E FP Transmit pins Pin no 4 11 Pin name transmit + transmit Receive pins Pin no 2 9 Pin name receive + receive -
Table 115 Termination panel connector pinouts for a TTC2M MVP/MVP-E FP Transmit pins Pin no 3 11 Pin name Transmit + Transmit Receive pins Pin no 1 9 Pin name Receive + Receive -
2.0S1
241-5701-610 2.0S1
303
Chapter 36 Ethernet function processor

See the following sections for information about conguring an Ethernet function processor (FP): Ethernet FP conguration parameters on page 303 Provisionable Ethernet FP components and attributes on page 304 Ethernet FP OSI states on page 305
Ethernet FP conguration parameters

When conguring an Ethernet FP, use the following values to help you set component attributes: Card type <cardtype>: 6pEth10BaseT Ports <port>: en Port numbers <m>: 0, 1, 2, 3, 4, 5
2.0S1
304 Chapter 36 Ethernet function processor
Provisionable Ethernet FP components and attributes

This gure shows provisionable Ethernet FP components and attributes.
Figure 64 Provisionable Ethernet FP components and attributes
Root Lp En Provisioned (Prov) heartbeaPacket applicationFramerName CustomerIdentifieData (CidData) customerIdentifier ifEntryProv (ifEntry) IfAdminStatus ifIndex (iFI) AdminInfo (AdminInfo) vendor commentText DebugProv defaultTraceLevel Lt La CustomerIdentifieData (CidData) clockingSource (cid) MediaProvisioned (MediaProv) linkToProtocolPort ifEntryProv (ifEntryProv) ifAdminStatus ifIndex Framer Provisioned (Prov) interfaceName
PPT 2920 044 AA
241-5701-610 2.0S1
Chapter 36 Ethernet function processor 305
Ethernet FP OSI states

This table contains information about Ethernet FP OSI states.
Table 116 Ethernet (En) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Shutting Down, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The component is disabled due to a broken physical disconnection or bad line state, etc. The component is not in use. The component is waiting to bind to the Framer component. The component is in use. This component can only service one Framer component at a time. No usage states are active. The component is going from the unlocked to the locked state. The component is breaking the link to the Framer component. A lock command is in effect. You can test the component. A hardware test failed or a physical connection was broken while in the locked state.
2.0S1
306 Chapter 36 Ethernet function processor
241-5701-610 2.0S1
307
Chapter 37 100BaseT Ethernet function processor

See the following sections for information about conguring a 100BaseT Ethernet function processor (FP): 100BaseT Ethernet FP conguration parameters on page 307 Provisionable 100BaseT Ethernet FP components and attributes on page 309 100BaseT Ethernet FP OSI states on page 310
100BaseT Ethernet FP conguration parameters

When conguring a 100BaseT Ethernet FP, use the following values to set component attributes: Card type <cardtype>: Eth100BaseT Ports <port>: eth100 Port numbers <m>: 0, 1
Procedure 12 Conguring a 100BaseT Ethernet function processor 1 2 Follow the procedures in Basic process for conguring a function processor on page 29. After you set provisionable attributes for each port, add the Lan component. add la/<m> where: <m> is an instance value for the Lan component.
2.0S1
308 Chapter 37 100BaseT Ethernet function processor To use hardware switching, only provision one Lan component. Otherwise, provision one Lan component for each port. When you add a Lan component, the system automatically adds a Framer subcomponent. 3 Link the Lan application to a port. set la/<m> framer interfaceName lp/<n> eth100/ where: <m> is the value for a Lan component you added in step 2. <n> is the lp you linked to the FP. is the port number To use hardware switching, link the same instance of the Lan application (for example, la/0) to both ports on the FP. Otherwise, link a different instance of the Lan application to each port. 4 Activate the conguration changes. See the procedure Activating conguration changes on page 35.
241-5701-610 2.0S1
Chapter 37 100BaseT Ethernet function processor 309
Provisionable 100BaseT Ethernet FP components and attributes

This gure shows the provisionable components and attributes for the 100BaseT Ethernet FP.
Figure 65 Provisionable 100BaseT Ethernet FP components and attributes
Root Lp Eth100BaseT (Eth100) duplexMode lineSpeed autoNegotiation applicationFramerName (framer) La CustomerIdentifieData (CidData) clockingSource (cid) MediaProvisioned (MediaProv) linkToProtocolPort ifEntryProv (ifEntryProv) ifAdminStatus ifIndex Framer interfaceName
PPT 2920 045 AA
2.0S1
310 Chapter 37 100BaseT Ethernet function processor
100BaseT Ethernet FP OSI states

This table contains information about 100BaseT Ethernet FP OSI states.
Table 117 100BaseT Ethernet (En) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The component is disabled due to a broken physical disconnection or bad line state. The LP associated with the component is down. The component is not in use. The component is ready to bind to the LAN application component. The component is in use. The component is in transition from the unlocked to the locked state. A lock command is in effect. You can test the component. A hardware test failed or a physical connection broke while the component was locked.
Unlocked, Enabled, Idle Unlocked, Enabled, Busy Shutting Down, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle
241-5701-610 2.0S1
311
Chapter 38 DS3C AAL function processor

See the following sections for information about conguring and testing a DS3C AAL function processor (FP): DS3C AAL FP conguration parameters on page 311 DS1 tributary ports on page 312 DS3C AAL FP diagnostic tests on page 312 Provisionable DS3C AAL FP components and attributes on page 313 DS3C AAL FP OSI states on page 315
DS3C AAL FP conguration parameters

When conguring a DS3C AAL FP, use the following values to help you set component attributes: Card type <cardtype>: 2pDS3cAal Ports <port>: DS3, DS1 (tributary ports beneath a DS3 port) Port numbers <m>: 0, 1 Tributary DS1 port numbers <q>: 0 28 Number of DS1 channels : 1. The system automatically creates Channel 0.
The DS3C AAL function processor supports DS1 tributary ports beneath each DS3 port. When you add a DS3 component, the system automatically creates DS1/1. You can create up to 28 DS1s for each DS3 component.
2.0S1
312 Chapter 38 DS3C AAL function processor
When you add a DS1 component, the system automatically creates a Channel/0 component that contains 24 provisioned timeslots. The system also creates a TrunkConditioning (TC) component beneath the Channel component.
DS1 tributary ports

The DS3C function processor supports DS1 tributary ports beneath the DS3 ports. Most generic procedures in this guide and the 241-5701-605 Passport 7400, 8700, 15000 Operations and Maintenance Guide do not show commands that take into account a hierarchy of ports (DS1 under DS3). Therefore, remember to include the DS1 hierarchy when you issue commands. For example, to set provisionable DS1 attributes, use the command
set lp/<n> DS3/<m> DS1/<q> <attribute> <attributevalue>
To display DS1 tributary port information, use the command

display lp/<n> DS3/<m> DS1/<q>
To lock a DS1 tributary port, use the command

lock lp/<n> DS3/<m> DS1/<q>
DS3C AAL FP diagnostic tests

The DS3C AAL FP supports the following diagnostic tests: Manual test using an external loopback (page 44). Manual test using a payload loopback (page 45) The DS3C AAL processor card only supports the payload loopback on the DS1 components under the DS3 port. Therefore, the DS3 port does not support the payload loopback. Set the DS3 CbitParity attribute to on to enable the DS3 component to support a remote loop or remote tributary loop test request from the far end. The lineType attribute beneath the DS1 component must be set to esf or esfCas in order to support a remote loopback request.
241-5701-610 2.0S1
Chapter 38 DS3C AAL function processor 313
Provisionable DS3C AAL FP components and attributes

These gures show provisionable DS3C AAL FP components and attributes.
2.0S1
314 Chapter 38 DS3C AAL function processor Figure 66 Provisionable DS3C AAL FP components and attributes
Root Lp DS3 Provisioned (Prov) cbitParity mapping lineLength clockingSource applicationFramerName CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText IfEntryProv ifAdminStatus ifIndex DS1 Provisioned (Prov) lineType zeroCoding clockingSource CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText IfEntryProv ifAdminStatus ifIndex Channel (chan) ...continued
PPT 2920 049 AA
241-5701-610 2.0S1
Chapter 38 DS3C AAL function processor 315 Figure 67 Provisionable DS3C AAL FP components and attributes (continued)
Channel (chan) Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerName CustomerIdentifierData (CidData) customerIdentifier IfEntryProv ifAdminStatus ifIndex TrunkConditioning Provisioned (Prov) replacementData (data) signalOneDuration (duration) signalOne (sigOne) signalTwo (sigTwo)
PPT 2920 050 AA
DS3C AAL FP OSI states

The following tables contain information about DS3C AAL FP OSI states: DS1 component state combination on page 316 DS1 Channel (Chan) component state combination on page 316 DS1 Test component state combination on page 317 DS3 component state combination on page 317 DS3 Test component state combination on page 318
2.0S1
316 Chapter 38 DS3C AAL function processor Table 118 DS1 component state combination Combination (Administrative, Operational, Usage) Unlocked, Disabled, Idle Details The DS1 port is inoperable due to at least one of the following alarms. losAlarm lofAlarm rxAisAlarm. Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The DS1 component is in use. A lock/lock operator command is in effect. The DS1 component is ready to service a user. A test is running. A hardware test failed. The DS1 component is in the locked state. External factors render the DS1 port inoperable.
Table 119 DS1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle External factors render the Chan component inoperable because of DS1 alarms. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. A lock operator command is in effect. The Chan component is otherwise ready to service a user. A test is running. Some hardware test failed or the Chan component is in the locked state.
241-5701-610 2.0S1
Chapter 38 DS3C AAL function processor 317 Table 120 DS1 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A DS1 or Chan component creates a Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
Table 121 DS3 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm rxRaiAlarm or the far end DS3 interface is requesting the local interface to loop back the incoming signal. Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processes are possible causes. The line input is recognized as good. Clocks are available. The DS3 component is in use. The DS3 component services only one user (for example a Framer component) at a time. A port and line test is in progress. A hardware test failed and the DS3 component is put in the locked state. A lock/lock operator command is in effect.
2.0S1
318 Chapter 38 DS3C AAL function processor Table 122 DS3 Test component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Busy The hardware component is unlocked. No resource is available to the Test component. Start test requests will be rejected. The Test component is in use. A V35, X21, DS1, E1, Chan, DS3, or E3 component creates the Test component. The Test component services only that particular component. A test stops either when the prescribed timer expires or you issue a stop test command.
241-5701-610 2.0S1
319
Chapter 39 32-port E1 AAL function processor

See the following sections for information about conguring and testing a 32-port E1 AAL function processor (FP): 32-port E1 AAL FP conguration parameters on page 319 32-port E1 AAL FP diagnostic tests on page 320 Provisionable 32-port E1 AAL FP components and attributes on page 321 32-port E1 AAL FP OSI states on page 323
32-port E1 AAL FP conguration parameters

When conguring a 32-port E1 AAL FP, use the following values to help you set component attributes: Card type <cardtype>: 32pE1Aal Ports <port>: E1 Port numbers <m>: 132 Number of E1 channels : 1. The system automatically creates Channel/0.
When you add an E1 component, the system automatically creates a Channel/0 component that contains 31 provisioned timeslots, numbered 1-31. The system also creates a TrunkConditioning (TC) component beneath the Channel component. The lineType attribute beneath an E1 component must be set to ccs.
Passport 7400, 8700 Function Processor Configuration and Testing Guide 2.0S1
320 Chapter 39 32-port E1 AAL function processor
The clockingSource attribute beneath an E1 component, can be set to local or module. You can only set the clockingSource attribute to module if a NetworkSynchronization component is provisioned. The clocking source for all for all E1 components must be the same. The timeslotDataRate attribute beneath a Channel component must be set to doNotOverride.
32-port E1 AAL FP diagnostic tests

The 32-port E1 AAL FP supports the Test component beneath the E1 component, but does not support the Test component beneath the Channel component. The 32-port E1 AAL FP supports the following port tests and loopbacks: Card loopback test (page 42) Manual tests (page 43) Manual test using an external loopback (page 44) Manual test using a payload loopback (page 45)
Each connector on the faceplate of a 32-port E1 AAL FP is used in conjunction with a multiport aggregate device. If a connector on the faceplate of the FP, its associated multiport aggregate device, or the cable that connects the two fails, Passport generates alarms on the 16 E1 ports affected. The system does not distinguish between LOS and LOF. If you use a termination panel to spare the FP and a termination panel connector or its associated cabling fails, Passport also generates alarms on the 16 E1 ports affected. To determine the location of the fault, you can set up a manual loopback on the ports of the FP. If the problem clears, the fault is either with the termination panel or the multiport aggregate device. You can then set up a manual loopback on the termination panel to further isolate the problem. If the problem clears, the fault is with the multiport aggregate device. To determine the location of faults for a single E1 port, you can set up a manual loopback on the multi-port aggregate device. If the problem clears, the problem is either with the cabling or with the far end.
241-5701-610 2.0S1
Chapter 39 32-port E1 AAL function processor 321
Provisionable 32-port E1 AAL FP components and attributes

This gure shows provisionable 32-port E1 AAL FP components and attributes.
2.0S1
322 Chapter 39 32-port E1 AAL function processor Figure 68 Provisionable 32-port E1 AAL FP components and attributes
Root Lp E1 Provisioned (Prov) lineType clockingSource CustomerIdentifierData (CidData) customerIdentifier AdminInfo vendor commentText IfEntryProv ifAdminStatus ifIndex Channel (Chan) Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerName CustomerIdentifierData (CidData) customerIdentifier IfEntryProv ifAdminStatus inIndex TrunkConditioning (TC) Provisioned (Prov) replacementData (data) signalOneDuration (duration) signalOne (sigOne) signalTwo (sigTwo)
PPT 2920 048 AA
241-5701-610 2.0S1
Chapter 39 32-port E1 AAL function processor 323
32-port E1 AAL FP OSI states

The following tables contain information about 32-port E1 AAL FP OSI states: E1 component state combination on page 323 E1 Channel (Chan) component state combination on page 324 E1 Test component state combination on page 324
Table 123 E1 component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the following alarms: losAlarm lofAlarm rxAisAlarm Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle The E1 component is in use. A lock/lock operator command is in effect. The E1 component is ready to service a user. A test is running. Some hardware test failed. The E1 component is in the locked state. External factors render the E1 port inoperable.
2.0S1
324 Chapter 39 32-port E1 AAL function processor Table 124 E1 Channel (Chan) component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Busy Locked, Enabled, Idle Locked, Disabled, Idle External factors render the Chan component inoperable because of E1 alarms. The component is not in use. Provisioning or binding processes are possible causes. The Chan component is in use. The Chan component can only service one user at a time. A lock operator command is in effect. The Chan component is otherwise ready to service a user. A test is running. A hardware test failed or the Chan component is in the locked state.
241-5701-610 2.0S1
325
Chapter 40 Voice services function processor

See the following sections for information about conguring and testing a voice services function processor (FP): Voice services FP conguration parameters on page 325 Conguring a voice services function processor on page 326 Sparing the Voice services FP on page 328 Voice services FP diagnostic testing on page 329 Provisionable voice services FP components and attributes on page 330 Voice services FP OSI states on page 330
Voice services FP conguration parameters

When conguring a voice services FP, use the following values to set component attributes: Card type <cardtype>: 12mVspAal Ports <port>: Vsp
The voice services FP contains two types of processing modules. The voice processing module (VPM) processes voice and voice band data. The signal processing module (SPM) processes CAS and CCS information (support for signaling types depends on the software capabilities).
2.0S1
326 Chapter 40 Voice services function processor
Conguring a voice services function processor

To provision a voice services FP, set the cardType attribute rst and then link an LP to the slot on the shelf before you add a port. When you add a port, the system automatically provisions all of the PModule subcomponents. The system also sets the moduleType attribute for each PModule component. The setting for each moduleType attribute matches the placement of hardware modules on the version of the FP that supports 720 timeslots and contains nine VPMs and one SPM. If you are conguring a voice services FP that contains fewer VPMs, you must change the conguration to correctly reect the number of VPMs and their positions on the FP. The table "Settings for PModule components" on page 326 shows how to congure each version of the FP.
Table 126 Settings for PModule components moduleType PModule components attribute setting 3 VPM version none spm vpm 1, 2, 7-12 3 4-6 PModule components 6 VPM version 1, 2, 10-12 3 4-9 PModule components 9 VPM version 1, 2 3 4-12
Procedure 13 Conguring a voice services function processor 1 Follow the steps in the procedures "Conguring a new function processor (FP)" on page 31 and "Provisioning a new logical processor (LP)" on page 32. These steps ensure that you set the cardType attribute rst. These steps also ensure that you link the LP to a slot on the shelf before you add a port. 2 3 Activate conguration changes. See the procedure "Activating conguration changes" on page 35. Add a port to the LP. add lp/<n> Vsp
241-5701-610 2.0S1
Chapter 40 Voice services function processor 327 where: <n> is the LP number you want to associate with the voice services FP. The system automatically provisions twelve PModule components beneath the Vsp component. The system sets the moduleType attribute for components PModule/1 and PModule/2 to none. The system sets the moduleType attribute for PModule/3 to spm. Components PModule/4 through PModule/12 are set to vpm. Passport dynamically creates one processing block (PBlock component) for each PModule component set to spm. Passport creates two PBlock components for each PModule component set to vpm. 4 Verify the number of VPMs on the FP. display -o lp/<n> Vsp PModule/* where: <n> is the LP number associated with the FP The value of the insertedModuleType attribute for each PModule component species the actual hardware on the FP. If the failureCause attribute is set to mismatch for any of the components, you must change the setting for each of these PModule components to match the type indicated by the insertedModuleType attribute. For FPs that contain fewer than 9 VPMs, you must set the moduleType attribute for all mismatched components to none. 5 If necessary, set the moduleType attributes for the empty PModule components to none. set lp/<n> Vsp PModule/<m> moduleType none where: <n> is the LP number associated with the FP <m> is a PModule component that does not contain a VPM. See the table "Settings for PModule components" on page 326. 6 If you did not set the cardtype attribute before you linked an LP to that slot on the shelf, you must provision the PModule components manually. The system only provisions the component PModule/1 and sets its moduleType attribute to none. add lp/<n> Vsp PModule/<m> set lp/<n> Vsp PModule/<m> moduleType <type> where: <n> is the LP number <m> is the instance value of a processing module
2.0S1
328 Chapter 40 Voice services function processor <type> is none, spm, or vpm. See the table "Settings for PModule components" on page 326. You must provision all PModule components. 7 Add an Nsta component. add Nsta/<m> where: <m> is value between 1 and 15999 8 Connect the Nsta component to the voice services FP. set Nsta/<m> linkToServer lp/<n> Vsp where: <m> is value between 1 and 15999 <n> is the instance value of the LP provisioned in step 3. 9 Activate conguration changes. See the procedure "Activating conguration changes" on page 35.
Sparing the Voice services FP

All versions of the voice services FP support one-for-one sparing. All versions also have the same card type: 12mVspAal. To spare all of the connections for a given FP, you must always spare the voice services FP with a version of the FP that contains the same number of VPMs. To verify that the number of VPMs on the spare FP matches the active FP, you can display and compare the values for the insertedModuleType attributes. See "Determining the number of VPMs on a voice services FP" on page 328.
Procedure 14 Determining the number of VPMs on a voice services FP 1 Display the operational attributes of the PModule components for each FP. display lp/<n> Vsp PModule/* where: <n> is the LP number associated with the FP The value of the insertedModuleType attribute for each PModule component species the actual hardware on the FP and can be vpm, spm, or none. To ensure successful sparing, the settings for both FPs must match.
241-5701-610 2.0S1
Chapter 40 Voice services function processor 329
Voice services FP diagnostic testing

You can test the signal path through every processing module on a voice services function processor. The test inserts ATM cells at the CQC and loops the cells through all the processing blocks on the FP. The test compares the cells received with the original data and calculates a bit error rate.
Procedure 15 Testing a voice services function processor 1 Lock the function processor. lock Vsp 2 Set the duration of the test. set Vsp Test duration <m> where: <m> is the number of minutes you want the test to run 3 Optionally, enter text for record purposes. set Vsp Test purpose <text> where: <text> is text you want to record about the test 4 Start the test. start Vsp test 5 Optionally, display statistics as the test runs. display Vsp Test Results 6 Optionally, stop the test at any time. stop Vsp test 7 After the test, view the test results. display Vsp Test Results For information about test result attributes, see Port test results and their meaning on page 64. 8 Unlock the function processor. unlock Vsp
2.0S1
Provisionable voice services FP components and attributes

This gure shows the provisionable components and attributes for the voice services FP.
Figure 69 Provisionable voice services FP components and attributes
EM Lp VoiceServicesProcessor (Vsp) Provisioned (Prov) linkToApplication ProcessingModule (PModule) Provisioned (Prov) moduleType (modType) ProcessingBlock (PBlock) Test
PPT 2920 046 AA
Voice services FP OSI states

These tables contain information about the voice services FP OSI states.
Table 127 Vsp component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Active
(Sheet 1 of 2)
There has been a hardware failure on the processor card. This transitional state occurs before the component becomes active. The component is operational. The processor card can carry traffic.
241-5701-610 2.0S1
Chapter 40 Voice services function processor 331 Table 127 (continued) Vsp component state combination Combination (Administrative, Details Operational, Usage) Locked, Enabled, Idle Locked, Disabled, Idle
(Sheet 2 of 2)
This transitional state occurs an operator locks the component. This state precedes the Locked, Disabled, Idle state. The component has been locked by an operator.
Table 128 PModule component state combination Combination (Administrative, Details Operational, Usage) Unlocked, Disabled, Idle Unlocked, Enabled, Idle Unlocked, Enabled, Active Locked, Disabled, Idle There has been a hardware failure on the processor card. No services have been allocated to the component. At least one service has been allocated to the component. The component has been locked by an operator.
2.0S1
241-5701-610 2.0S1
Passport 7400, 8700
Function Processor Conguration and Testing Guide

Release 2.0 Copyright 2000 Nortel Networks. All Rights Reserved. NORTEL, NORTEL NETWORKS, the globemark design, the NORTEL NETWORKS corporate logo, DPN, DPN-100 and PASSPORT are trademarks of Nortel Networks. Publication: 241-5701-610 Document status: Standard Document version: 2.0S1 Document date: July 2000 Printed in Canada

PP7400 8700 FP Configuration and Testing Guide

Încărcat de

Informații document

Drepturi de autor

Formate disponibile

Partajați acest document

Partajați sau inserați document

Opțiuni de partajare

Vi se pare util acest document?

Este necorespunzător acest conținut?

Drepturi de autor:

Formate disponibile

PP7400 8700 FP Configuration and Testing Guide

Încărcat de

Drepturi de autor:

Formate disponibile

Passport 7400, 8700

Function Processor Conguration and Testing Guide

Passport 7400, 8700

Function Processor Configuration and Testing Guide

Passport 7400, 8700 Function Processor Configuration and Testing Guide

Chapter 1 Basic process for configuring a function processor

Chapter 2 Port Testing

Chapter 3 Card Testing

Chapter 4 V.11 function processor

Chapter 5 V.35 function processor

Chapter 6 Four-port DS1 function processor

Chapter 7 Four-port E1 function processor

Chapter 8 Eight-port DS1 function processor

Chapter 9 DS1C function processor

Chapter 10 E1C function processor

E1C FP pinouts for physical loopbacks 129

Chapter 11 DS3 function processor

Chapter 12 E3 function processor

Chapter 13 DS3C function processor

Chapter 14 HSSI function processor

Chapter 15 Three-port DS1 ATM function processor

Chapter 16 Three-port E1 ATM function processor

Chapter 17 Eight-port DS1 ATM function processor

Chapter 18 Eight-port E1 ATM function processor

Chapter 19 JT2 ATM function processor

Chapter 20 DS3 ATM function processor

Passport 7400, 8700 Function Processor Configuration and Testing Guide

Chapter 21 E3 ATM function processor

Chapter 22 OC-3 ATM function processor

Chapter 23 DS3 ATM IP function processor for Passport 7400

Chapter 24 E3 ATM IP function processor for Passport 7400

Chapter 25 OC-3 ATM IP function processor for Passport 7400

Chapter 26 DS1 AAL1 function processor

Chapter 27 E1 AAL1 function processor

Chapter 28 DS1 MSA32 function processor for Passport 7400

Chapter 29 E1 MSA32 function processor for Passport 7400

Chapter 30 DS1 voice function processor for Passport 7400

Chapter 31 E1 voice function processor for Passport 7400

Chapter 32 J2MV function processor for Passport 7400

Chapter 33 DS1 MVP/MVP-E function processor for Passport 7400

Chapter 34 E1 MVP/MVP-E function processor for Passport 7400

Chapter 35 TTC2M MVP/MVP-E function processor for Passport 7400

Chapter 36 Ethernet function processor

Passport 7400, 8700 Function Processor Configuration and Testing Guide

Chapter 37 100BaseT Ethernet function processor

Chapter 38 DS3C AAL function processor

Chapter 39 32-port E1 AAL function processor

Chapter 40 Voice services function processor

Passport 7400, 8700 Function Processor Configuration and Testing Guide

Passport 7400, 8700 Function Processor Configuration and Testing Guide

Passport 7400, 8700 Function Processor Configuration and Testing Guide

Passport 7400, 8700 Function Processor Configuration and Testing Guide

About this document

Who should read this document and why

How this document is organized

Passport 7400, 8700 Function Processor Configuration and Testing Guide

About this document

Whats new in this document

Maintenance monitor for DS1 MSA32 and E1 MSA32 FPs

Integration of Packet Voice Gateway to Passport 7400

About this document 27

Passport 7400, 8700 Function Processor Configuration and Testing Guide

About this document

How to get more help