Documente Academic
Documente Profesional
Documente Cultură
11 blvs7
~M ORfkMOO$-10
MILITARY SAMbLING
STANDARD TABLES
PROCEDURES AND
FOR INSPECTION
BY VARIABLES
1.
. . -
OFFICS
OF TEE
~ANT Wuhlngkm
SECRETARY $5, D. c.
OF DE~
1. Thi. .tandard h.. ~en approved and i. mandatory for . . . by the Departm. q ffectivm 11 June 1957. the M. force, ccordance 2. h q Diwl. im k.. d-.ifp.t.d Air For.. , r.. p.ti..ly, .tandard.
rnth e.tabli.bed proc.dur., the Sfandardi.. ticm Bureau of Ordnance. -d tha Chemical -Carp. . . Amp N.v-Air For.. custodian. .1 thi. correction.. sddltlenn, or deletion. .hould be atior. Divi. iom, Of fic. of the As. imta.t Sec... and Logistic.), Wa.hin@an Z5. D. C.
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Recommended
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INTRODUCTION SECTION A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . GENERAL ii 1
D&9tiRIPT30N
OF tibfPL3t4G
PL.#JS
. . . . .
U3LConveraion Table . . . . Sample Size Code tiNers . . . Char.cteri*tie Curve. Operating Plmm of S.ctiOa# B, C, and D San@. Sise tie Letters B
SECTION
B J
Par:
B- I B-2
Simgle 1 . . . . . . . . . . . Sin~le 2 . . . . . . . . . . .
37 38 39 40 41
nd Tighteoed M..ter Tabie for Normal q 3nmpecti0n (Form l-Sinnle fAmit) . . . . . Maater Table for Redueed impection (sOrrnl-singl. LiJnii) . . . . . . . . . . . . . . SPECIFICATION UhUT . . . . . . . . . . , .
Part 1s
tiample of Cdcrdatiomm: Double Specifi. c8tioa LAnit-Cke AQL vai.4 far Upper . . . and Lawe r Specification Limit Combined Example of Calculatinna: Double Specification Umit-DIfferem AC3L values for Upper sud fmwer Specification Umitm . . . . Mmmter Table for Normal Impecti.n (Double Limit
siIl#le LiInif)
43 44
B- 3
qnd Tightened
and f%rm 2-
. . . . . . . . . . . .. . . . . .
. . .
45 46 47
B-4 B-5
Table
Mssier Table for R=duced faspectiom . . . (Double LImitmnd Form Z-Single Limit) Table for 3SatimatiaEthe Lot P. rcent De fective . . . . . . . . . . . . . . . . . . . . . . . .
Part
f3J
I
I
EST1MATION OF PROCESS AVZSAGE AND FOR RZDUCEL AND TIGHTENED C3UTEINSPECTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B-6 B-? L-8 Value. of T for Tigbtenad k#p8!cti011 . . . . . . of Estimated k; P.rcent ~ts Defective far Roduc=d Inspection . . . . . . . . Value. of F for h4asimum Standard Deviafioa.[MBD) . . . . . . . . . . . . . . . . . . .
5?. 54 56 58 59
I APP=dk B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iii
. .
..-
xlL-mTb414 11 Juts 1097
coNTmzTa-caitinmd
SECTION Part
C 1
VASliABILfTY
ZINKNOWN-~S LZMIT
METHOD . . . . . . . . . . . . . . . . 61 .
sU40LSSPECZF1CATION
c-l C-Z
Simsle Eauanph of Ckicniatidm: S~cificatiOa Umit-FOrm i . . . . . . . . . . Exuriplm of Cakuiati0a9: StnSle Specification Limit. Form 2 . . . . . . . . . . Mast-r Tabie for Normal qnd Tightene4 Inspection (Form I_ Siql. Limit) . . . . . . . Msst.r Tabls for Reduced lnapecUorI (FOrml-SiOgl. LImlt) . . . . . . . . . . . . . . SPEC1IVCATION L3M3T . . . . . . , . . . . . . . .
63 64
C-1 c-z
6S 66 b7
Part
Example of Caleulxtioms: Doubl. Sp.eUi catiem LiniIt-Oae AQL value [or Upper and tiwer Spocifieu40m Limit Ckmblaed . , . . Exunple o{ Caiculaiiom: Double Specif{ c-ion Limit-D4ifar8st AQL vahm. for UpPer u8d Lower SPRIcZflcacJon LImitm . . . A.hmI.r Tabl. for fdmnul .md Ti#hte.ed ~P=c~a (-ble Limit 4 Ferm z _ Sias!e Z&nit) . . . . . . . . . . . . . . . . . . . . Maater Tabl@ #or Reduced lmpectiom (Dauble L&nit Fown&Simgle IAnIt) . . . . Ttile for Ectinmiinsthe Lot Percent Dekctive . . . . . . . . . . . . . . . . . . . . . . .
69 70
71 7Z 73
Part Zu
ESTIWTZON OF PROCESS AVIXfAGE AND cRZT3ZRJA PVR REDUCED AND TZOHTSNED INSPECTION . . . . . . . . ., . . . . . . . . . . . . . . . . . . . . c-6 C-7 C-8 Vaium. of T Ior .Tigbtmmd h,pecticm .. . . . . z-bits Of Eotiated kt S%rcemt . Defective for R.duced Z.cmp.ectioa . , . . . . . Value. of ~ 10, M&um Awe ra~e Rsn#e(w) . . . . . . . . . . . . . . . . . . . . . 80 B2 84 85
.,.
APWIUUB SEC7WN D C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . WWN . . . . . . . . . . . . . . . .
VARZASZL3TY
P8rt 1
ST
Exmpleo : Exumple
ZZxampta of Caieubtlms: Siasis *c4fkati0n Z.imit-rofm 1 Si+e Example of c+IeuidzioM: Smcification ZAtaia_FOsm Z
. . . . . . . . . . . . . . . . . . . .
89 90 ,9I 9s
D-l D-Z
d Ti#btened Msst*r Table fof Normal Zzmpoeuom {Form 1-Sk+ Umlc) . . . . . . titer Table [or Reducmd tJ1.p~=tiO_ (FOrml-Slr@*LimitJ . . . .. . . . . . . . . . .
1! ~.
.. . . . .,. ....=_ -
comzNls-cOfmffwd
3hampfe*:
3kAmpfe Exunple
D-3 D-4
Esampk af Cdctdationw Double SpecUication L6mit-Oa* AOL vahm UpPar and fmwer Specification. fAmit Combirmd . . . . . Double +pecUi Emmple of .Calculatioms: c-tion L6mit-D3ffereut AOL value- for Limits . . . . UpVr d kwer Specification Master T*le for Normal and Tightened fn. pectim (Double Limit and Form ZSimgleumlt) . . . . . . . . . . . . . . . . . . . . . Master T&ble for Reduced 3nop.ctiom [Ooubk Limit..d Form Z-Single Limit) . . . . T-ble for Estimating the fat Percentage Defective . . . . . . . . . . . . . . . . . . . . . . . .
97
98
99 101 103
SST1MATION OF PROCB AVESAG!C AND CSJT&R3A FOR REDUCED AND TIGHTENED INSPECTION . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . D-6 D-7 Value. of T for Tightened frt. pection . . . . . . Limit- of Ectinutod IAX Percent Defective for Reduced hmpecfiom . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
APP*6
D........
I
mlL-8m-414 llhfislm? INTRODUCTION Thi. Stamdardwa. prepmred to meet q growing IIeeo for tbe U. of standard ptmm for Jampection by vari*ble. in ti~rnmatn procurement, DIIpply and .torage, and maintenance ia.pciion opa ratiozm. Tbe variabf.. sampJ&s in@e quality characteristic which can be rnea.tirmd on q coattnplane .pply to q q xpressed in term. cd percent de fectiue. The tm.. scale, and for which quality i. q theory unclerlying the developrne.t of the wari.bte. .aniplim~ plaua, including the oparatiq charact=rimtic curve.. a.awne. that rnea.urem.mt. of tba quattty char. qcteristic q re independent, identicslfy di.tribufed normal random varisblea.
q unpliq
..mpfing pfmn., warlah!es umpfiag plamm 1. comparium with atfributa. dvanta~e of ummfly remdtin~ & cmmide rsble .avinem in #ample q ihave tbe q for .xmnparabl. a..uruice . . to the correctness. of decision. in judging . .in#le quality characteristic, or for the .arne sample size. greater a.mirance is obtained using variable, plan.. Attribute. sampling pfan. have the advantage of greater simplicity, of being applicable to either .ingle or rnuttiple quality characteristi c., and of requiring no knowledge about the distribution of the contlaueu. rn. a.ur. rmenc. of any d the quality cfur. txeridc..
q rm mot to be um.d It 10 imporfsmt to mot. tfut variable. .amptfmp pha. i.di. crirninat.ly, ,impfy bec.u.e. it i. po..ible to obf.in vaxi.bk. tnea.urarnemt q .smnp,data. fn conmlderq appfieatlon. where the rmrmatity or irtde~nde.ce dvi.ed to cm-..ult hi. technical agency to tion. may be que.ticmcd, the user i. q detci-rh in. the fe.. ibility of appfi calion.
Thi8 Srandard 1. divided into four .ectimm. Section A describe. @n. rat procttlur. a of the .amplimg plan.. Secfic.m. B utd C de.crib. .Pcifi. procedure. pplic ation. of the .arnpIing plan. when w.=iability i. unknovr., In Section B and q of lot .%and. rd d.vi.tion i. used .s lh. fn. i. 10. an q .timat. of the the .stirn.te unknc.w. variability, and in Section C the average rams. of the sunpf. 1* used. Section D desc=ibes the plan. when variability is known. Each of Sectiono B. C, and D i. divided into fbree part.: (l) SAMPJIIW PIUM for the Single S~cifieuiom Limit Ca.e, 111)Sampfimg Plans for th. mubl. Spcific. tion Limit Case, and (3JJ) Procedure. JorEsthnation cd Proce.. Average and q rid Reduced Ja. pection. Criteria fer Tighmned ingle s~cification For tba q cceptability trite rio. i. giv=n im two foran.: Form 1 amd Form Z. limit ca. e, Lhe q ii-ici they q rc idettticti a. to .ainple sise -d Either of the fonnc may be u.ed, q cceptability or rejeetabilify. III deciding whether w u.= Form 1 deci ion for lot q or FQrrn Z, the followin~ poiDt . should be bo=n. in mind. Form I provide. the lot qccept ability cri~. rion without q.titn.tirtg 10I percent defective. The Form 2 101 Theme e#li acceptability criterion require. emtirnates of Jot percent defective. verage. mate. at.o .r. ~quimd for e stiznatbn of tha proea q a q Operating Characteristic Curve. fn Table A-3 how fhe r=latioa.ftip betweem for the quality cbaractari.tic quality and percent of lot. expected to be qcce~able inm~et.d. A. stated, the .e Ope rating Characfe ri tic Cur-. are &sed 011tbe raadanalrom a ciorsnti distribution. ..#urnpiari that meam. mment. q re .ekctedat unpfin~ plan. in SectiW. S, C. ~d D w. m mstcbed The corre spending q closely ., po.. ible ~der q .y.tem Of fixed .unpfe .Ise with re. pcct to their Opcraling Characteristic Cu?wes. O~raUng Chsracteristjc Cum. in T.bf. A-3 h..= been computed for the .mpling p]an. b... d orj th. ..timate of lof .tudard deviation ef unknown ..ri.bility, Thy are eqully .pplie.ble ior .arnpllns plan. and theme bam.d hoed on th. averaga range of the .awIpI. of unfmown variability on known variabUity.
q.
C.rtaim cln..cmri.:ic. concerning the sunpliag phm. in S..tiom. B amd C -d tbosa la S9ction D dwufd b, moud. Pkn. baa.d on fba q mtima& ot umk=09m Wariablllty require fe~r .M@e wit. for cm~ra~e . ..ranca -baa tb q d. Mate of lcM .taadard tiwl.si~ i. ..d than _bg. ib .~..ae rua~. d ffn .-+ in u.ed: on fhe ottwr tid, plan. Vsbg the .W~.gG r~ge of the #AM@. r.quira VII
mb61v414 11 June 19s7 compuuttmm. Plarm umlnn bm=variablltty -qutre con*l&rablT f-r sample tmk far comwrabk amUJrMC* tbaI q ich=r of the plans whw =TIabtuty of k#umII -rkbiUty Is q q rtnsent am. 1s uakam: @we wer, tba roquir=mw.t The user 1s. dvised to co.milt MS tectalcal~uc~ bdom WPIYLW cunptiaj piano U.tng bDOwa w8rIAbuuy. Tath B-8 provids q values of tbe f~ctor F to compute tfia maxfmum standard dewiation hfsD. The hfSD se-s M q ~uide for the magnitude of tht eatirnate of lot standard de-scion when u-in Plazm for tbm double spcff ication limit c--e, deviation of un.bn.arimtdUty. SimifArly based on the q intimate of lot .taa~rd Table C-8 provides vmlue- of the Iactor f to com~te the maximum average range ruige of the MAR. The MAR qor.ew m a g de for tbe magnitude of the average .pecific.tia. limit . . . . . ba.ed . . the q rnple wk. usin# planm for ke do.bfe t wariddlity. Tba edmate of lot qtmdard ave rage range of the cunple of unbam mpk, U it is Iem thm the hfSD or MAR.re. deviation or q verage range of the q q t=ctively. hslps *O immure. but doe. mot guarmt.e, lot accept. bfllty. ymbols and their definition. q re gimn III tha a-ix to Part JU cd the AU q h Ulumtratim of the com~tiom and proc.durma .~ed IIJ applicable #*ctim. uf Part- I and 11 of tbe spplkable the .unpling plans i. give. i. the qnmplec .ection. The computathmm irwolve simple q rithmetic operation. such am .dditina, qubtractio. multiplicuion, &d dIvimion of mwnbera, or q most, the taking of q .quare root of q number. The user should become funiliarwith the g.neral propplicable sectioa for detailed iawtructiom cedure. of Sectian A. and refer to she q q pccific procedure.. cornpu. ions. md tables for [he Barnpliag plan.. regarding
q imphr
I
I
1,
A PLANS
OF SAMPLING
Thi 8 Sammkrd =stablimhes All Pur + mmplnng P anm and procedures for inopec ticm by variable q for use in Government P*.c. reme.t. s.ppfyuad stora~., and rnAJltetts.cc inspection op8rati0rIm. when .ppli cabfe this Standard #hall. be referenced in the specification, contrzct, or in8pcctien in.tructic.r. m, and the provision, set forth herein shall #ovem. Al. ? III*PC ction. lnmpeclion i. tiw pro . . . . xamining. testing. gaging. 0. of measur, ns. q othe rwise comparing the unit of product (See Al .4) with the appkabfe requirememla.
Inspection by AI.3 lnspcctiby Variables. variables i. inspection wherein r+ specified quality characte-ri. tic (See AI.5) on a unit of proeuct i. measured on . continuous feet per sec.cale. .u. h q . pound-. iwheo, ond, etc., And q rneamtreme. t is recurd. d.
Tfm se pfwm may be used whether pracuremrml inspection i. per. kmrmd at the plant of q prime coatract?r. wbcontractor or vendor. or q t destination, -S90 may be uaod when AppTOPrU1O in -d q ppfy and storage. and main fanaace fL18pection ofm rattom. A3. CLASSIPTCAITO?f OF DEFECTS
unit of product.
AZ. I Mtthodof Cia8sifring~fect@. Asf8m .ificat, c.n al defect- . . the q rmine ratio. of defect. of the unit of product claasifi. d according to their irnporfaace. A defect 19 q deviation of the unit of product fr-am, requirement. of the specifications; drawiags, Purcha.e da~cripfia., and aay cbu~c Defects the reto in the contract or order. normally belong to one of fhe fOllO*g classes; however. defects may be plkced k other ciao. cs. AZ. 1.1 Critical Defeeto. A criticaf defect i. .. that iudeme. t and axmrience indicate coule reeult ;.. hazardou. or unssfe conditions for individual. u.ing or m.imaining the product; or, formajnr end it.rn9 unit~of or famba. q product, such a. ships, aircraft, d.f. ct that could prevent fmrforrnaaco of their tactic-i fumction. A2. I.2 Major Defects. A major defect i8 a defect. other than critical, thaf coutd result in failure, ormateritlly reduce the usability of the unit of product for its intended fmrpobe.
A2. I.3 Minor Defects. A minor defect is on. that doc n not materially reduce the usability of the unit of product for itm intem&d from qstablislmd Purposa. or i- q deprfurc atandard9 hating .0 signUi CUIt bOa CinI OrI the effective u.e or operation of th@ unit.
A1.4 Unit of Product. The unit of product i. the entity of product in.xcted in order to dew rrnine it; measurable quality charq cteristic. Thim may be a single article, a pair. a qet. q component of an end product, or the end product itself. The unil of product may or may K.t be the sune q s the unit of purchame, supply, production, or thipmer.t. A 1.5 Quality Characteristic. The quality charact. riatic for varxablee in. pecti4n is that characteristic ef i unit of p,oduct that is actually m.a. uzed, to determim conformance with q given requirement.
A1. b Specificaticm Limit.. The q peclflcation Iimtt(e) is the requi rerncnt that q quality characleri. tic .hould meet. Thi* q n q . upper req.~rement may be exprenmd q prc~f ication limit; or 6 lower pacification specification limit, called herein q .in~le limit; or bolh upper and lower .~cifieatiem ~cificmion limit., called herein a double q limit.
A3.
PERCENT
DE FECTTVE
co. Tti A3.1 =.PT89.88. Of NO. CMtfO_ of pro dues 9fnff e$fcnt of nonconformance be expre-scd i. terms of percent &faetive. A3.Z Percent f%.feetiwe. Tbe percent d.fectiv-.~acterimtic of q Ii%.
...
A 1.7 Sampli.~ Plans. A sampling pfan 1. peciiies the rmxnber c.< a PrOCedUr* *h*ch q units of product from q lot which q re to h itmpected, arid th. cril. rion Xor aecepfabil ity of the lot. Sampling pfazm desipated in thi. Standard are qpplicable to the insPcof a tfon of q chgfs quality cbaracteri-fke
lox of prodv;ti. th~ number of unit. of praduct de fectiwe for that cfuractc ri.tic divided by the tataf number of unitm of product And q man multidimd by on. hundred. Expressed Percen: rkfectiv8 .auatiorx Number of Aefectivea x 100 Numbs r of dtm
..
.. .
LEVEL
q
Tba =a CBOmlnaf xpr*s.e.i in farm. of percaat d8f*c value q tive .Pcif ied for q sbigle quUity characteriatic. Grtain numeried vaftws o; AOL r=~img f ram .04 to 1S.00 parce.nt am qhO-a i. Table A- 1. Whe. . ranof AOL VUWi. .pecified. it dull he treated q s if it wore mfa2i0c equal to the WdUC of AQL for which q and which i~ bcluded plms q re lu-whed within the AOL range. When the ~c~ted AOL i- a particular value other tb& tivme for which oamplhg pfanm q re furniched, the pP2yihg the AOL, which i- to be used in q yovi.ions of this Standard, .Itafl be ., .ho~ m Table A- 1. A4.2 Specifying AOL1 c. Tin particular AOL vafue le be used for q q ingle quality charq ctarimtic of a given product must be qpeePcifi.athm ified. fn the CM. of a double q for limit. q ith. r an AOL value it #PcUied the total percent de fecti.. muaida of bath up~r -d lower specification Umita, o. t-e AOL value. are specified. om. for the upper limit and another for the lower Ifmit. AS. SUBJbflmAL OF PRODUCT
A6.2 Choice of SarnfAim Plain. SunpUaB ~D u!d PIWCEOU-9 a:e pro-dad in d8C tion B if Variddlity 10 uabnown amd the .taadamf de rf.uion mathd is !mwd, h Soc ticm C U variability i wunbaewn a?id the range matbod i c uced. and in Secfioa D if .ariabUity is bnown. Urdesa otkrwi.e q pcffied, un. q -d=rd dewiafim method b-n variabiUty, q unF41rtd plans. and the q ceef=ablfifv crl terbr. d Farm 2 (for the 9ic@e specification iimit case) Aaif be used. A7. SAMPLE
A7. I
SELECTION
Determination of Sample Sise. The .Unpl. .,h, tha mmlfmr of unttm of prodsamph aIws uct drawn frcan q lot. Retati~ q m Aesimated by cute letters. The 8ampf4 sise cod= Iette rdepcitds on the.inq=ticm le.ve: and the lot q1=4. There q m fiva hothe rwhe q pecffiod Ia-fmctien Ieval IV shali unple .i.e cod. letter applik used. The q cable to the .pcifi.d izi.pectim l.wel arid for lots of given sise .hdl be obtained from Table A-2. NOTICE-5P. c ial Reservaticm for Critical CharackrnB1ic8. Tbe Go.errmi.nt re. e.vo. tbe rmhl to in smct emryunit mbmkkd hy the ;uppfier fos critieti etir.c uad to reject the remainder of the te!rimko, q defect is fouud. Tbo lot Immedlafelyafter GOvemirnent timo rcr:rvee tht right to qampfe fo~ criticmf d. f.ctc evm ry let aubmittad uppUer arid to reject any I-* if A by tk q sample dr.wm thrn refr~ is fo-d to contain ow or more. criticti da fects. A7.2 Dr.wimB of Samples. A sample 10 om. or mere unit. ol product drawn from . lot. UnItc of ttn munfdo Aa2i be, ,al~ct,d withO* re#ard to t?bdr q.safity.
f=ctiOale=J~: L U. fU. IV. -d v. ff~e-~
I I
A5. I lat. The tsrrn ,,1ov hall nmmn ,virtcpecti~lot, - i.e., a collection of unit. of product from which q sample is dram! ad inopec~td to dete rmme complhrme with fhe acceptability criterion. A5. 1.1 Formation of Lots. Each la; shall, q s far q mla practicable, con.iwt of unit. cd product of q .ingla type, gssde, ~Ass, size, or cornpo. itkn manufactured under e.. enri.Ily the same conditimit. A5.2 Lot Sise. The lot q im 1. tha number of unit. d product in q lot, and may differ f rem the quantity de.i#r.atmd h fbs comtraet q biprnellt. or order a, q lot for prodctlar., or Ether Purpo..,. A6. A6. I LOT ACCEPTABILITY Criferien.
material
br imapc:kta ddf be detennh.d byum of ~ of the .ampling plait. a..oeiaf.d~tb. .pec Tbi. Standard ffied value of the AOL{S). ampliag plaa. baaad ombaowa 4 provide 8 q bvariability. fn the Iatfar can q m provitid, two affa mativo met+, bared on the e qtfmaia of im qfattdard dovi. atioa and the die r on lb am rqe range of the t-fate. These .r. r. f.rred to . . the standard dowiatio. method and tbe rinse method. For tha case of a single cpeeifiea tiatl unlit, lb acc.ptabiu~ criterion Iqiknitid
qbility of a lot of
Acce Sabfiity
The
qcca@-
q for q 8tLmatfmg 22n preeomm Proe.dure awrage @ criteria for ticbtaned and re dweed in. fmcftan bared = th Umpacthn romiito of pmeedinc lots are provided in Part uf of dactiorm B. C. and D.
--
I i
i
q lu
q ttrlbcuaa
prwid=d
for
-Wunpumg
Amptm wwI&mc. oximta Condltlon A. W tbm produ ct cubmittod for iaapctioa IS q mhctod by Ch #Upfli, Z tO meat tfM ,IWXiZ creemlng proee q m Ikatlan ltmit(s) by q q f rmn q Iarae r qus.mtity of product which 1. not being produced wltbln tba ,Pclfication
A lot me of mcdm Ui* q ccef%abi the fouowln Comtitiem. i. .*tL.fic.&. A. 7bo lot com~i4s cca*bllIty variab14 q q terlm of section B, C. or D.
Ilmlt(al.
CodltiaQ B. warrant tb= mttributem ara~i4is
Camdltkm
ttn apprsprmta
with crl -
tbt
tbe A9.2 Definition.. A9.Z. 1 in.pactlom by Attrlbut8s. fnspectioa ttribute. I* inwpectkoa wbardc. tba unit by q of product is Chsdfied simply m defective or mandcfectiwe with reapact to a given re qtiire.mom 07 s.t of nqutrnmentm.
q lnmP8c A9.Z.Z Mind Variabla q -Attrib* tion. tinnd varimhle q -attributes inmp8ction arnfie by stt ributa q . in ~mgpcction of q q q ddition to inspection by variable. mmlready q unple, before . demad. of q previo.a e ki,on .ao ~o.,*: ca~qsi!iv.o r .*I- c-bili~ ~ q M ctihmtie. . -
Caa6itLm
B.
The
Ist cmIPU*s
of
+tb
pragrapb
11.1.2
A9.4. 1 U Condition A ia not qatiefied, pro. coed iri accordance with tk q tt tibute q oMl plirig plan to meet Condition B. A9.4.2 lf Condition B ia not cati;lied, the lot doe # not meet the 8ccepabilicy crlte rian. A9.5 Se=rltY of Iaaopaetion. The proceu f m.pecti.m rel=rred to dures for .everity in ~rarraph A8 are net qppficsbl. for mixed Vaziable..attribum. inm~ction. NOTICEWhen Gouerrmtemt drawin#.. SPedfiCatiOmn, or othc.r data q re u.e4 tar UIY prmme other than In connection wltb a definitely relamd Government procurement opa ratloa. thm Lbit.d States Gow rrunent tbe=aby imzur, no re. pm. ibility or my obligation wbtcoevcr; and the fact that the Co.ernnteztt may have form.latd. f.rnimbed. pplied the qaid Lrswiags, or In uIy way q q wcificationa, or other data (* II@ t. = rm~arded by implication or otherwime q in mY m-e r licerming the tilde r or any otha r pcr*On or corporation, or conveying any u**. rights or p rmis. ion to m-nufbctufe, or qell aay patented invention thu may in mn7 =*T h ra~-td tbreto.
of Samplirtc Plans. The A9.3 Selection miaad *arlable.. att YiS -plmg plan qelected in UCOdUICe with thn stall h fcdlovim~
I I
ror spd56d A03. va3u.eI a236q WiIhin mmu r-got 0.050 0.070 O.lloto 0.165 to to to to 0.049 0.069 0.109 0.164 0.Z19 0.439 0.699 1.09 1.64 2.79 4.39 6.99
Use thh AQl Vazue 0.04 0,O65 0.10 0.15 0.Z5 0.40 0.65 1.0 1.5
6610
m
Be&c
1JOIB35DF31
111 to
180
181 to 301 to Z.5 501 to 4.0 801 t 6.5 1.301 to to 10.9 to 16.4 10.0 3.ZO1 to 15.0 8.001 to
Et
DFH_j
C32GIK DFHJL
ample .i;e code letter. given in body of Uble q re appli. abze when the indicated inq ptctim levelw are to be med.
. - --,-
mL-sm-414 11 Smn 1*
TABOpraCinC Clmr.ete.si.tic
A-S
CtMW9.
for
Sun@iD* D
Plan.
of t%cti~m
B, C, 4
-.
TABLE OPERAllNG
CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANOARO OEVIATIOM METHOO SAMPLE SIZE COl)E LETTER B I Cures * m?l~s p-i bed ml,. +ti 04!..V1.wlty .
!!
a
..
..
TABLE oPERAnNo
A.3
.4
-0
10
so
30
40
00
100
U%RATINO CW#fWTERISTIC
ii~
-----
.. _ _
._
TABLE
h .3
IYERATINO CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANDARD 0EVIA710N METMOD SAMFI-E SIZE CODE LETTER E I b, w * t9#wq pm, bed m mm,.dti
q *9k-
..I.W,
.l*
+.dot
bo
-0
10
IQ
30
40
!m
40
loo
M,I., rq!lmo m
Ut Is#.ul
Itpn, ,
t!
7ASU
LETTER
[ corm f S*,
?wI.bm,
* ,(++
,,uk,td )
.hl-,tWllrdcfhh-lMhh
.-
.-
-rw. -94
TASU
$lTER
F I Cenfh.edI ,
TABLE
A .3
OPERATING CHARAC7ER15TfCCU17VESFOR SAMPLING PLANS 8ASEC ON STfi?!DLRD DEVIIITION METHOD ii SiMFLE S1ZE COOE LETTER :~ G I C.*.B IV ..v96, p!ru b.n.d w <a. ..IM .~ l.loo * .W1.bflllr w. ...lld+ ~.i..l.nl )
Ri
10
-.
TMLE
Ii
x
( h pod
tihdb, I hv., m,
B-m, 1910 -d 1.
I
l___
-----
TABLE A-3
WERATINQ CHARACTERISTIC CURVES FOR SAMPLING PLANS BASED ON STANDARD OEVIATION METHOO SAMFtE SIZE CODE LETTER H I tiwl & ,@h, ,h., b.sd m ,,,, 44 W4 know,i,blll!, , . ,,,,d,+ wI.,IA )
TABLE
A.3
OPERATI NO CHARACTERISTIC CURVES FOR SAMPLIN6 PLANS BASEO ON STANDARD OWIATION METHOO
A.3
CURVES FOR SAMF1.lNO PLANS SASEO ON STANDARD DEVIATIDN METHOD SAMP.-E S1ZE CODE LETTER I
I hi
la st+q
tlmt k.d
m rm~. AA
-t h-
.wI*WI, u.
.m..lhlb H.1..lrd )
-a
m e
.,
TABLE
OPERATINO CHARACTERISTIC CURVES FOR SAMPLIN13PLANS BASED SAMPLE SIZE COOE LETTEfi I ( Contllwl )
?s
TAME
A-3 y
OPERATINO CNAIIACTERISTICCURVES FOR SAMPUNO PLANS BASED ON STANOARO OEVIATII?N METMOD E!j SAMW SIZE COOE LETTER J ?& * O..* k-l .lMI, , Al+ b+.w I
qw
.- .
TASK O~RATINO
CHARACTERISTIC CURVES FOR SAMPLINIJ PL~NS SAMRE J lb.., k M@, ,1.., b.).t -
Is.,. AM##Lu.n,O-l.bill*
.,,.
2
TABLE
A. 3 y
OPERhTINQ CHARACTERISTICCURVES FOR SAMPLING PLANS BASEO ON STANOARD OEVIATION METHOD 3 Sf+@LE SIZE CODE LETTER K { C-w, * ,1.@q ,1,., b,,d m ,..,; 4.* a h.W,bdll, w, ,,,,1;4$ qulw.11 j g !! +
!3
.,
TABLE
h .3
OPERATINO CMbRACTERISTICCURVES FOR SAMPLING PLANS BASED 0:1 STANDARD DEVIATION METHOO SAMFLE SIZE COOE LETTER K ( Cennn.t~) { -t b *I p-t h-i m lul\s 4 i.ul.w~ .9
q ***W+ +!.1-1 I
ht.,
~,,
m-
bm+tl.
dmltt,1,!, 1- -d
,,,o,wz
TA9LE c@ERAnNo
A-3 =!5 :x
CHARACTERISTIC CURVES F(XI SAMPUNG PLANS BASED ON STANDARO DEVIATION METHOO SAMFtE S1ZE CODE LETTER L t *8 fWt }1b-d m m,, dn4 -8 invul,blhtj w, cud!+ WIV,lon!I
1 f
TASLE cmmo
A.3
CMbRACTERNWICCURVES FOR SAMPLING PLANS BASED ON STANDAR5 DEVIATION METHOD SAMFtE SIZE COOE LETTER L t Con!h..d )
TABLE
A -3
OIWMTINO ChARACTERISTIC CUfWES FOR SAMPLING PLANS BASED ON ST.ANOAROOEVIATION METHOD SAMPLE SIZE CO@E LE TTEII !4 I h,,, 1 ,,q,!h, ,hns b,,,d m ,,.9, ,A,b ,: ,,nwdl,ll, ,,u(v,M }
ou4m
of WBulmo
Lois
[ h ,,remtW.nil,. ) ,,,,,,,..
1,
TABLE
A -3
OPERATING CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANDARD DEVIATION METHOO SAMPLE SIZE CODE LETTER M ( Contln..d ) I W-.sa ?0?snplhl, ,19.s b-d
m ,0 604 d i.-
..rl.bnll, .
m!h!lf @!mlWd)
,.
. ... ..
il q lnwm Wm m,, ~., of WSM171C0 .079 { 1.ptm! 4.1..! .,I 1 1 * ..9 k+. 0.l,t, L.1. 4- W.*I h+.,llo...
TASLE
A .3
OPERATING CHARACTERISTIC CURVES FIX? SAMPLING PLANS BASEO ON STANOARD OEVIAilON METHOO SAMFtE SIZE CODE LETTER N f I&w, b ,udq ,!,, b,,.d m ,,,, Ihd -4 t..l.b.t,l, . ,,, l,tq ~.,.di,,, )
LOU
. Auvl.bl. 0.!1!,1,1, t. -,
TAGLE
A. S
OPERAllNQ CHARACTERISTIC CURVES FOR SAMPUNG PLANS GASED ON STANOARO OEVIATION METHOO_..
-. .. .
TABLE
DPERATING CHARACTERISTICCURVES FOR SAMPUNG PLANS BASED SAMPLE SIZE COOE LETTER o i G, 1 a+, ,Im, $,,,4 m ,,.,. 44
W, t-mm.ar,.bdlt,w
. ---.
TASLE
A .3
OPERAnNG CHARACTERISTIC CURVES FOR SAMPLINO PLANS BhSED ON STANDARD DEVIATION METHOO SAMPtE SIZE CODE LETTER O I Contln.*d) I Cnrm fw w-q PIM1bm.d m r9ng.4M -4 k.vi.bill!, . .,,,.lhl~ qll.,1-l I
r5
.i
TABLE
A. 3 ~15 gi
OPERATING CHARACTERISTIC CURVES FOR SAhiPLINQ PLANS BASED ON STANOARO oEVIATION METHOO
SAMFtE S! 2E COOE LETTER P t C4WW8 ,qll., t,Im, b.,.d m rq. ..fbti .,, &.cu vwl.btit+,,, , ,,,.1,+ ,,.,..11 )
: !/ d:
unu
TABLE
A .3
CURVES FOR SAMPLING PLANS BASED ON STANOARO OEVIATION METHOO SAMPLE SIZE COOE LETTER P ( e--m 1- -I )Iul W I Conllnwd1 -4 i.kbllllj , oatId+ tq.lnl.! )
m Ire,, d
OUALIW SWUl17t0 101S I 1.,.r.m$ #.1..lh.1 Or lb,,, nw,., -. . k~,.,,. 0,.1!,, L.1, I- -..1 In,,,,,,..l.
.
,.$,
TASK
A -3
RA5E0 ON 5T,ANDAR0DEVIATION METHOC
SAMFtE SIZE cooE LETTER Q I Cuml fw t.wh, 01,,},,.4 m f.,, ..*W .. . b.-
.i,blmy
,,,m,,
d,,
_,.,!M!
mmkuilm~tibl,~,,bb
-.woM*ubal -,,.
-04
d a
* d
41,+.MI..
1 OUAUW OP $uBMITrCo LOTS ( h ,.,,,9 ,.1,,1,.,) W., flpt .I W. k.pl.bl. IWI~ L...l, l,, f.x.,1 I,TV,,,W I
.,
.,
TASLE
)
. ,,,4+ w@vdcd I
mm,bin.., .whb,hly
SSCTIW VARIABIIJTY uNKNowN-sTANDAmf Parf SINGLE S1. SAMPIJNG PLAN FOR SPECIFICATION LXM!T I
B DEvlAnoN
SPEUF3CAT10N
LUA3T
SINGLE
Thi. pArl Of the Standard deocribe. the procedure* for us. whh plani for q oingle ape .ifiution limit when variability y of fhe lot with re.pect to the quality charae%eri. deviation tic i. unknown q nd the .tandard method ia u#ed. The acceptability criterion i. given in two equivalent iorm9. Tbeoe are identified as Form 1 -d Form.2. B1.1 Use of SamPtinfl PlaJw. To determin. whsther the lot me=t. the q ccept ability criterion with respect to q particular quality cfuracteristic a.ud AQL. -Iue. the applicable campling plan shafJ be uced with lb. proviaionm of S.c in q ccordance uc.n A, Generai Description of Samplmg Plan. .-d th.. e in %hi, part Of th. Standard. B 1.2 Drawi..qof Samplem. AfI .amplew q hall be drawn in accordance -th paragraph A7. Z. of Sample Size Code B1. 3 Determination qzce cod q letter q ~. Th e .smpla ha be selected from Table A-Z in q ccordance with parasraph A7. 1. B2 SELSCTING THE SAMPLING WHEN FORhf 1 IS USED PM
BS. Z.2 Accepu bility brmant. The acc.pc.gtotbemundility corutaaf k. correewmt ple size mentioned ia pnagraph B2.2.1, ia indicmed in the column of the nuster table cor re~pmxling to tbe applicable A(2L value. Table B-1 i. entered from the fop for normal inopecfion q nd from the bottom for tightened inspection. Sampling plum for reduced inspection are providd_ in Table B-2. B3. LOT-BY-WT ACCEPTABILITY PROCEDURES WHEN PURIM 1 LS USEI?
B3. 1 Acceptability Criterion. Tbe degree of conformance of q q uafit y cb8ractericti c limit with respecf lo q single specification .W1 be judg.d by th~, qusntity (u-XJI* or fl-L)/i.. B 3.2. Corn tatien. TtIt following quantity .haff b(-X)/ ., (x-L)/., d,pendiagon whether the specification limit i, ~ qper or lower limit, +ere U L X . i. ii. i. tk upper specification limit. tbe lower specification limit, the sample mean. and de.rlatioa. the q .tirnate of lot qsn&rd Acc ability Crite rfon. Cumpare the
B3.3
BZ. 1 Maater sampling Tables. Th= muter qanmlmn tables for mlana based or. -riaingle specification bilit~ -MI for ~ q limit vben using the ctaadard deviation Table B- I method q re Tables B-1 .nd B-Z, in .m=d ler norm.] and tighter.ed iriapection art< Table B - Z for reduced imspeetioit. B 2. Z Obtaining the Sa?nPlinK PIan. The .mnpl.tig plan cons.st. .1 q .unple .i.e 8d Cc. m q ~nociafed q eptability COtI.unt. 1 The sampling plan i. obtained from Mater Table B-1 -, B-.?. B2.2.1 Sam Ie Sise. The #ample .ise qhoum m t e ma.,.. tabl - eo.-.. p-.fing ~ .-.1. ..cnple qice cute tetter. Z* *O
abifttywmst-nt k. ff (u-x)/m or (x- f.)/a ia equal to .ar gre8ter tlun k, the lot meets the =cc~tiIf.fty criterion: if (U-X)1.** (X-f-)1~ ia l.mm Uu8 k or nerative, 3hrm the M &es not meef the =e~llity criterion. M. t31JM3tMRY FOR ~~MNG PLAN OPXRATION WREN FORM OF s m
~marise
he PrO -
(1) Daterrnirw the sxmple .i.ecode lti ter from Table A-2 by uming the let sise and in.pccfion leeel.
MIL-m-414 11 Jt333e 1957 (2) Obfai. Pk. from Mamer or B-z by .eleeting the sample the ac..ptabill$y constant k.
unit.
cpecifteation limit. The percentage of Macoaforming product is cstimattd by wiieria T~le B-5 with the quglity index and the sample q ize.
B6. Z GE-I utatio of Qtufit ~-lity~-X)~rnpE~ if the specification limit i. q a upper limit U, or OL . (X- L)/t if it is a Io-er Jimit L. arnpl. Th* quaatitie.. X q md s. q re the q mean q nd e.timm e of lot standard deviation. respectively.
of n (3) Select at random the sampl= lrorn the let; inspect q nd record the mea. urernem of she quality characteristic fer each utiit of the sample.
(4) Cmnp.te the s.mpIe mean ~ and dcvistic.n . . and estimate of lot stsdard q ISO compute the quantity (u-X)1. for an u per specification limit V or the q~ntity lids 3.. A-L)/. for q k.wer .peciticatio~ 15) M the quantity (u-X)/s or (X-W. i. equal co or greater than k, the 10I meets c.ept.bilicy criterion: it (u-X)/. or the q thes the (X-L)/. i. [e.. (ha--- k or negative, lot doe rwtmeel Iheaccepttii lily criterion. B5. SELECTING THE SAMPL3NG WNEN FOfUd Z 5S USED P2AN
-ii-t-d P.,. em d.f=~tiin d the upper specification limit, or by ?z.. th. estimated percent defective below the lower .pecifi catian limit. Tbe q stimated Pc*.=.: defective PU or PL i. obtained by enterina Tabk B-5 with Ou or QL and the q ppropriate q anple size. W. lot
qbove
~e
S35.1 h4asccr Sampling Table.. Th. ma. ter .ampJmg tables for plans based onvariabil ity unknown for a single specification limit when using the m~nd-rd deriatitm method sre Table. B-3 q nd B-4 of Part If. Tsble B-3 is used for normal adai~htened inmpec eion and Table B-4 .fc.r reduced.inspection. the Sampling Plan. B 5.Z Oblainin~ The sarnpli~ plan co. ss.ts of . .unpl. ,Ize and maximum alk.w=ble percent sn q ssociated da$eclive. The samplin~ plm i. obtained from MaDter Table B-3 or B-4. mnple mice n is 65.2.1 Sample Size. T)M q q hewn m the ma. tcr table cortespendin~ 10 each sam>le .iz. code letter. 135..?. Maxim. mAllow8ble Z Percent De feeq llowable p.=. ent det$ve. The rrmxim.tn q stimate. correspond. =live M for ample img to the .unple size m=nt ioned in pa:agrmph 95.2.1 is ittdicated in the column of the nm.ter table .xxre.pondiytg to the qPplic=ble AOL value. Tabl. B-3 i. =nt=,.d from tbe top for normal inspection -d from the bottom lo, lsghter.ed in. peetion. Sam -li>g plan. lcIr reduced inspection q rm prov-l ea ,. ~a~,e ~-,. d
336.4 Acceptability Criterion. Gmpare the estimated lot pereent deIectivepU or pL with the maximum allowable percent defective M. U PU Or Pl, 1. eqUf to or leas thn U, the if Pu lot rneets the acceptability criterion; or p~ is greaier than M or if Qu or Q is ,negative, then the 10: does not meet \he acceptability criterion. B7. SIJ71SMARY FOR OPERATION SAMPL3NG PL.AN WHEN PORM USED The fellc.rnng step. .umrnariz.e cedure. to be fallc.u.ed,
OF
2 3S
the pro-
mple .i=e code let (1) Determine the q ter from Table A-2 byu. ing the lot size md the inspection level. (Z) Obtain plan from Master T=ble B-3 or B-d by .elecfi.~ the .unple .ixa n attd the maximum allowable percent defective M. (3) Select q t random the #ample of n unit. frmn the Iof; inspect UId record the m.asurernemt of the quality charact. rimic ample. cm each .unh of the q (4) Cmnpute3h= sample mean X arid the ectimale of lot .tadard devfatian . . (5) Compute the quality index Q Jfi: limit (U-X)/ * if q n upp. r .pe.ific.tie,. q P.*ified. or OL = (x. L)/. if q lctwerspec iiication 1;...;. L <. snecif; ed. (6) Det~rmb-Ic the estimated lot pereent de fecnive pu er pL from Table B-5.
B6.1 Acceptability Criterion. The dc~ree of conformance Of a quallty characteristic limit with respect m q ai.ngle specification hall b, judged hy the percent of rmnem-, Iorm,ng product outsidt the upper or low+r
%.
Ex_pie
B. z for .a cemplete
Mu.-sm4l4 11 Juoe 19S7 fi) ff the e.timated lot percerndefective PU Or PL i. ~ud to or 1... than the maxi. mum .dlowable percent defective M. the lot cc.pt~bil$ty criteriom if PU Or PL meet. the q is~reatertl.an U Orif QuOr C3~ is aepti e, ccepmbi r IIY then the lot doe. ml meet the q criterion.
B-1
Speci!icatlon
Unknown
- Standard
of operation for q cer:aindevic. i. .pecifi.d q . .?09 F. The rn.timum temperature A lot of 40 item. i. submitted for inspection. Zn. pection Z-evel IV, normal inspection, with AQL = 1-% i. to be u, cd. From Tables A-2 q nd B-1 i! i. aee : that a marnplc 01 sise 5 i. required. Suppose the measurement. obtained are q . <c.11ow.: 197.. 188-, 184 ,205-, and ZOl : and compliance wfth the acceptability criterion i. 10 be determ%nea.
Information n IX
Needed
Value
Obta{ned 5 975
Explanation
Sum of Z.@.ur.m..t.: Sum of Squared Correction Corrected Variance Estimate Sample Me,,
ureznentn:
XX2
Factor
(CF):
77.5 Deviation .: fi 8.S.1 I 95 u 209 1.5.9 k f2mpare w-X)/O with k 1.53 1.59> 1.s3
1
8 9 10 II
lZ
(upper):
criterion.
ingle lower spcffieat{on limit L is given. fhen compufe If q s Iin. 10 -d com~re il with k, the lot meet. the =ccept8bility equal to or greafer than k.
!.
Limit-Form
,? Method
- Standard Detiation
CUmple
The maximum temperature of operation for q certain device is specified q s 209 F. 2nspection Uvel IV, normal inspecA JOI of 40 items is qubmilted for inspection. tion, with AOL = 1% in 10 be u.ed. From Table- A-2 and B-1 it i. .een that a sample of .ize 5 is required. S.ppome the measurements obtained art q . follow.: 197., 188-, 184.,205-, and 201 ; and compliance with the acceptability criterion in to be deter rnitied. Inforrntiion Sample Size: n XX 1X2 Needed Vmlue Ob:.ined 5 975 190,435 190,125 lX~CF 310 77.5 Deria:icm .: fl 8.81 195 u Z09 1.59 % De:.: M Pu vilh
q6nce
Lime
tkpl .nati.n
J z 3 4 5 6 7
Sum .3[ Mea. urcme.ta: Sum ef Squared Correction Corrected .V.4@I<. Estimate Sample
F=ctor
8
9 10 11 1?, 13
Mean X:
Limit au
2ndmc b
ercen
Compare
qcccptablzsty critarion,
pu is 1.-0 tti
NOTE:
U a sin@. lower specification limit L is Siven, then compute the quality index OL = PL rnth (X-L)/s i line 10andobuLn the q .timate of lot percent defective p . Compar. M; the lot meets the acceptability criterion. it pL is equal to 0? 1C*S lbn M.
- -- ---M
...
I
B-1 Standard Deviatiom Methc.d Unknown
I
TABLE
MIster Table Far Normal &.d Ti~htened fn. pectlo. for PlaIJs Based on Variability [Single Specification Limit Form 1) Acceptable ( Sample size
code letter
Gik
,10
,15 k
.25 kk
.40
allty . .65 T
.CVCIS (normal m k 7 1.45 1.53 1,62 1.72 t.79 1.8.? 1.85 1.86 1..99 1.50 k
inspection) 4.00 k .958 1.01 I .07 1,;l 5 1.23 1.30 1.3) 1.35 1.36 1.39 1.39 1.42 1.46 1.48 1.51 1.51 6.50
2.s0 k 1.12 1,17 1.24 1.33 1.41 1.47 1,51 1.53 1.55 1.57 1.58 . 1.61 1.65 1.67 1,70 1,70 4.00
m
k .765 .814 .874 .955 1.03 1.09 1.12 1.14 1.1s 1.18 1.18 I.ZI 1.Z4 i.26 1.29 1.29 ,0.00
10.00
k
15.00
k
+k
B c D 5 7 10 15 20 25 30 35 40 50 75 100 150
E F
G 34
t
2.64 2.69 2.72 2.73
1.17 2.77 2.83
i
2.53 2.58 2.61 2,61 .?.65 ?.,66 2.71 2.77 2.80 Z.84 2.85 .10
l-k
$ 2.00 2.11 2.2o k 1.88 1.98
1
v
1.34 1.40 1.50 1.58 1,65 1.69 1.72 1.73 1.76 1:76 1.80 1.84 1.86 1.89 1.89 Z.50
1.65
.?.24
2.42 2.47
2.3?. 2.36
2.06
T
.566
. .
.341
.617
.393
.67S .7s5
.4s5
.516
.82n .886
.611
.664
.69s
,1 J K L
L
5.4 N o P Q
2.31 2.35
--t2.73
zoo
-t.15
A21AOL wdue8 ye knpercent de-a. [Irst tunpllq plan belcw q rrow, that is, both sample OIZ.S well ao k va2ue. When nample sise equdt er e=ceedo lot as ,V.V ,tern hth. lot must be inspected.
1:::,
1
2.18 2.03 2.22 2.27 2.29
a.33
.969
2,08
+ .971
1.00 1.03 1.05 I .07 1.07
2.41 2.43
2.12
2.14 7,1!
2.00
2.47 2.47
2.03 2.04
2.33
2,1[
1.50 ,fVela
I 5.00
lightened inspectio! ~~
TABLE
23-2
Standard Deviallm
Method ~E
Maater Table for Reduced lnmc.ectimfor Plana Breed On Varlabilitv Unkmwm (Single Spc.ifi..tl.n Litnit-F. rm I ) I I
SampIe
size I
m
D E T G H
Code latter
.06S I .10
.15 k
-L
3 3 4
x .
k
EEE
l.lz I,lz 1,45 . 1.51 t 1.62 1.7Z . 1.72 1.79 1.50 1,58 k 1.50 1.6S 1.34 1.40
Z.50 k . .958
6.50 k .566 .566 .564 ,566 ,617 ,675 .755 .828 .828 ..986 .91? .917 .936 .946 1.00 1.01
i65i
k .141 .141 _ .141 .341 .393 ,455 .536 .611 II .664
5 7 10 10 15 Zo Zo 25 10 Z.53 Z.58 2.58 z.61 t-t Z.4Z Z.47 Z.47 Z.50 z i Zoo Z.11 Z.11 Lzo Z.Z4 .LZ4 2.Z6 2.Z8 Z.Y5
-i1 J
K L u
1.9a 1.9a
I
1.$8 2.06 Z.11 Z.11 2.14 2.ZZ 2.27
J+~~
1.12 1.12 .958 .958 .95.9 1.17 1.Z4 1.33 1.41 1.41 1.47 1.01 1.07 1.15 1.23 1.23 1.30 1.11 1.33
..914 .874 .955 1:01 1.03 1.09 I.lz I.lz 1.14 1.15 I.zl 1.24
All AQLvm3ues q re in percent defective. f2rotdunplln,g plmbelowtrrow. that it, both mm-qde nize no well ~ kvalue. ~~;;, e,:,, ,,,m i the ,0, lll,t t., ,mpetted.
T
N 0 P Q
.?.!5
50
*
Z.41
75
-1-d
1.8Z 1.8z 1.69 1.51 1.69 I,7Z 1.51 1.85 I 1.86 1.51 1.73 1.80 1.55 1.61 1.91 1.98 (.84 1.65
1.35
.80$ .
lot
n
3XM3I
SPEC337CATZ034
DOUBLE
This part of the Stan-dard describe. the procedures for use with plain for q double specification limit when variability of the lot with re.p. ct to the quality cluracteristic i. unknown and the standard deviation method is used. Bfl.1 use of Sampling Phm.. TCI determine whether the lot meets the qcceptability criterion with respect to a particular quality characteristic ad AQL value (.) the applicable camplig plan qha31 be used in accordanc. with the provisions of Section A, General Description of Sampling Plans, and those in this part of the Stamdard. B9. SEIJ2CTI?JG THE SAMPLING PLAN
the maxfzmIM tiowable percent de fecfivc by ML for the lower limit, mad by M for fhe upper limft. If one AOL is asci~e 3 to both IiAt. contbi.ed. designate the timum Ulowable percerd d-f% by ht. Table B -3 i. q ntered from 3be 30p for marnul flupection and from the bottom for tisbtaaed fLlWpecffon. Samp3fng pfuu for reduced fnspect.ien q re provided io Table B -4. B 10. DRAwU?G OF SAMPLES be elected A7.2. T in accord-
ACCEPTABILITY .
A sampling pJa. for each AOZ. value .hall. be q elected from Table B-3 or B-4 m [C.;JWS:
B9. 1 Determination of Sample .Stze Code ktter. The .arnple i.. cone letter .hal; be selected imm Table A-Z in q ccordance with paragraph A7.1. B9. Z Maater Sampling Table.. The master satnplmg table. for plum based on variability .kt-mwn for a double specification limit when using the standard deviation mctbod are Tables B-3 and B-4. Table B-3 i. u.ed 10. normal and tighlened ir.spection amd T=ble B-4 for reduced impectiom B9. 3 Obtaining Sampling Plan. A sampling da consists of a .arrml. ..ze and the as. soeiated maximum allowable perceni defecpplied i. tive(s). The sampling plan to be q inspection shtil be ob-iaed from WSter Table B-3 or B-4. B9.3.1 Sample Size. The .unple #ize o is tablas correape=ding show in the mater tO each sunple size cod. letter. B9.3.2 M-.imum Allowable Percent Defec. percem *. T h. maximum allowable defective for #ample estinuLe. of pert.mt de fe. civ. for the Icxmr. upper, or both .pec. ificatiori limit. combined, corresponding to the sample .ize mentioned ia paragraph f39.3.10 in shown in the COhmm of the masto the applicable ter table corresponding AQL value(s). U different AOL, S q re a.sign=d to each .pe cification limit, de.ignmfe
B 11.1 Acceptability Criterion. The degree 01 Conformaa Ce or a WlA3ity elaaractcria3fc with re. pect to m doubje m pacification limit .hafl be judged by the percent of r.onconform% P.tiuct. The percentage of manconforrn img product i. e.timated by entering Table B-5 with the quality index and fhe.ample .ize.
U L X s
is ia is is
the upper specification limit, the lower sp.cificacion limit, the sample mea., and tkm estimate of lot standard deviation.
B 11.3 Pere=nt Defective i. the Lat. The aualitv. of a lot shall be cx~r.a~terms . of the lot perc=nt deiecti~c. Ita estimate +33 be de.i~ted by p~. PUO Or P. me iadicsten cmifornunce with :::;52ptL upper .Pe.tllctiorl limit, PF w.ilh .e. pee: to fbe lowez .pecifiutio. lima . -d P for both .Pecifiati.n limiteombimed. The emtimstea p mid p r=.pec be determined by wIterins + q ble B- Y . w tively +f.h QL and f) md the sample q isc. dding The eotinute p Zhmfzbe determined by q the corresponding ectinuted percent defective- pL and p found in the tible. B12. ACCEPTABILITY CRITERION SUMMARY FOR OPERATION SAMPLING PLANS both Upper umd. AND OF
and
MI L-STD-414 11 JurIe 1957 B 12.1. I Acceptability Criterion. 4 Carapare the q stimated lot pe.rcatt delective P = PW + q llowable p=rcent PL with the maximum qual to or less tfun M, d. fective M. 11p in q the lot meets the accepmb{lity criterion: if p is grcatertban Mor ii eifher Qu or QLor ,then the lot does not meet both q re n.@ive cceptability criterion. the q B 12.1.2 Summary lor Operation of Samplin# m.glc ACfl. value is Plan. In cases where a q ~lished for the .tmer and lower .pccifi cation limit combined for q .in81e quality characteristic, the following mtep. summa rize the procedures to be used (1 ) Delerminc the ample size code letter [rem Table A-2 by sing the let .i%e q nd the iriap. ction level. (2) Select plan from Master Table B-3 or 8-4. Oblain the ample size q nd the maximum allowable percent defective M. (3) Select q t random the sample .af unit. Imrn the lot: i.sp. ct and r-cord the mea. ur. merit of the quality characteristic on each unit O( the amp]=. mple rnesn X (4) Compute the q and c.timltc Of lc. .tand=rd t dcviatic.n s. (5) Compute the quality QU = (u-X)/. and QL= (X. L)/,. indices tdu, the lot meets the q ccepubi.fityc riteria; otberwimm, the lot doe. not nwet the ace~. abf3ity criteria. U .mither QL or Qv or botb are me~tiive, then the 101does not meet the acceptability criteria. BIZ.Z.2 SurnmaryfOr Opertiianal Sampffrt& Plan. 3n ca. eg where q t erenf AOl. walue ~stablished le. the upper and lawer .pec ification limit for q single quality cfuract=r istic, the following steps sunururie the procedures to be US=CL (1) Deterrninethe ample .izecod= letter from Table A-2 by twin, the lot size and fnspectimt level. (.?) Select the sampling plan from Master Table B-3 arB-4. Obtain the.ampfe .ize . and the maximum allowable percent defective Mu and M. corr=apondi.g to the AOf. va2ues for the upper and lower specification limft., respectively.
of (3) Select .1 random the ..ntple fr.rn tie lot; ia. pe.t and =ecord the measremerd of the quality cfur. cterimtic on each unit in the .mrIple. n unite
(4) Compute the sample mean X and estimate . 10I .tamlard deviation s. ,, (5) Compute the quality Qff = (u-X)1. and OL = (x- L)/a. ittdice.
p.,r.n: B-5.
(7) lf the e.tirnated lot percent defective p i. equal tc. or 1,.. than the maximq llowable ptzcen% defective M, the )ot um cceptability criterion; if p is meet, the q ur.~t=, th=n M Or if either W or QL bolhar. ne~.tive, then the 101doe. not met cceptability criterion. the q B] 2.2 Different AOL Valueo Lower specification Limit. for Upper and
(6) Deterrniae tbe estimsted lot percent defective ~ and p~, correspandiag \othe percent defective* shove fhe upper and below the lower .peciIscaticm limit-. A2eodetermie the combin.d percent delec tive p = pu 4 p~. (7) 11all tbre=of dition.: (a) ~ % L.
q
i.
equal
~] PL !9 =LNJ81tO 0, h..
B 12.2.1 Accernability Criteria.5 Gmpare th. e.tirnated 1 fJC,C.llt dd ectives pL and 01 PU with the cm? c.pn.ding rntimum allow. able p.rcem defective. M compare p = F.L + Pu wfth tke%~#~fa?L qual to or Iesn than htL, and Mu. If pf, i. q PO i. =qu*: to or le.. than MII. and P im .@al to or 1.*s than the larger of ML and
larger
of ML
cceptabifhy are sati. fied, fh= lot meet. the q criteria; ofhe=wi. e the lot does mat meet the acceptability criteria. ff either OL or Gff or both q re negatiwe, then the lot does not tne=t tbe acceptability e=iter ia.
+S.. *W
Etimple Example
xample of ibis proc.dure. B. 3 {or . cmnplete q B.4 lot a cmmpl=te exatnple of thfs procedmre. 42
E-+
i
I I
spa Mlutino
E-de
1
Line 1 2 3 4 5 6 7 s 9 10 II 12 13 14 15 16 17
Tbc minimum temperature of operation for a c=rtAtn device 48 speetfied 8.180- F. The masimwnt.mprst.re h 209 F. A lot of 40 item. i- submitted for imopection. 3nmpection Level 3V. normal in.pect(on, wtth AOL. s 1% im to be ..d. From Tablam Suppo*e the rne...re. A-2 and B-3 it is neen that s sample of qi=e 5 is zequird 197, 188, 1M., 205, md 201 -; q nd cmnpliuw. mcntm obtained q re 8. fof30w.: with the acceptability criterion i. w b. determined. Znforrnatian Sample Sise: n mant.: SX XX2 Needed Value Obtained s 975 190,435 190,125 310 77.5 Deviation s: & 8.81 195 Limit: LitnAt: U L 209 180 1.59 1.?0 % PL 2.1 9% .64% 2.85% 3.32% P . Pu + 2.85% < 3.3.2% (zo9-1951/a.nl (195-180)/8.81 .%Table B-5 (975)2/5 190,435-190.125 310/4 m 9?5)5 Explanation
Sum 01 Measu.. Sum of Squared Correction Corrected Variance Estimate Sample Upper
Factor
(SS): XX~C~
Mean ~:
Specification
C3udity tid=:
p = pu + pL 3.4
Acceptability p~ with M
Compare
3&
lot meet.
the
qcceptability
criterion.
Ante
P s Pu + PL i. 1=. s t~
M.
,..
43
AQ3. Value.
and Luwer
Specification
Example
The minimum temparamre of optra3foa for q certiin dewice i. .pecified q - 180- F. The rnu5mumtempQ=a3ure ii 209 F. A lot of 40 items in subrnkted for inmpm=3ion. f.mp=ctic.n L=v=l Iv, normal imW=CCICQI.--I* ACZL = 1% foI *= upper -d ~~ = From Tables A-Z and 23-3 it 2.5% for tha 10uer specification limit is to be used. Suppcme the measurements obtained is q.en that . sample of sise 5 ia required. are aa follows: 197. , 188. , 184. 205, and ZOI. ; and compliuce with the acccpt ability criteria i. 10 be determined. Information Needed Vat.. Obtain. d 5 ZX XXZ 975 190.435 190.125 lX~CF 310 71.5 Deviation s: fi 8.61 195 w L Z09 ,1s0 1.s9 1.70 U: ~ PL 2..19% .64% 2.85S [209 -195) /6.s1 (195 -180) /n.81 See see Table B-5 Table B-S W75)215 190.435-190,125 31OI4 m 97515 Explanation
~
1 z 3 4 5
b 7 k
Sample
Size:
Factor
Sample Me=
9 10 11 lZ 13 14 is lb 17 la
Limit: . (u-X)/o
Eat. of f..of Percent Def. Total E.;. Mu. Mu. P. rcent &f.
belsw k.
in Lot,: p . PU q pL Def. bov~ U: Def. below (s) Comp-rc @) ;;;p;f (c) Compare Wifh ML & MU ML PU pL p
qbe
9.00% 2.19%. .bf+ Z.esn 18(s), 3.3.?% < 9.80% c 9.80% (c)are
See
Acceptability
See Para. Blz. z.z(7 )(a) see Psra. BIZ. Z.2(7)(bj S.. Para. BIZ..2.Z(7)IC) ati~fied; i.-.. PU ~
qcceptability
criteria.
(b); ad
44
TABLE
B-3
Minter Tsble for Norm81 and Tightened tnapcction for Plms Blsed on Variability Unknown (Double Specification Limit and F.rm2-Single Specification Limit) Acceptable ~ Sample cite code letter .04 M B c D E r G H I J K
L M N
.065 M
.10 M
.15 M
.2s M
.40 M
3 4 5 ; 7 10 15 Zo Z5 30 35 40 50 75 I00 150 zoo v 0.099 0.13s 0.155 0.119 0.110 0.17 9 0.16 3 0.14 7 0.14 s 0.13 4 0. ;3 5 .06 5 v 0.186 o.2zn 0.250 0.280 0,264 0.275 0.Z50 O.zze O.zzo O.zo 3 O.zo 4 .10 v 0.31Z 0.165 0.380 0.413 0.388 0.401 0.36 3 0.33 0 0.31 7 0.Z9 3 0..294 .15 0.349 0.503 0.544 0.:51 0.581 0.5}5 0.566 0.503 0.467 0.447 0.41 3 0.41 4 .25 - i + 0.422 1.o6 0.716 0.818 0,846 0.017 0.079 0,847 0.873 0.789 0.7.20 0.68 9 0.63 8 0.63 7 .40 1.30 1.31 1.Z9 1,29 I ..?9 1.23 1.z6 1.17 1.07 I.oz 0.949 0.945 x
10.9Z 9.80 8.40 1.Z9 6.56 6,17 5.97 5.06 5.57 5.5B 5.20 4.87 4.69 4.43 4.40 4.00
16.45 14.39
ZZ.8b ZO.19
29.45 Zb.56
36.90 33.99
Z.14 Z,17 Z.11 2.o5 Zoo 1.98 1.87 1.88 1.71 1.60 1.53 1.43 1.4Z I .00
Zzo
10.54 9.46 8.9Z
Il 4
15.11 13.71
0$0
Z1. S7 z5.61
ZO.14 18.94
47I
261 I s 024
16.651 Z2.91 11.Z3 15.87 15.13 14.75 14.ZO 14. IZ 15.00 -5 -. ZZ.00 21.11 ZO.66 Zo.oz 19.9Z
8.10111.871
o P Q
Z.50 ;htem
insrmcticml
a
7.61 7.15 10.63 [0.32 6.91 6.57 9.86 6.53 9.81 6.5o 10.00
TABLE
23A
Muter Table far Reduced fnvpecclm [m Plan. Bared o Vsrlablllty thkn.awn (Double SpecU{cation Limit -d Form 2- StttgteS !clfic atim Limit) ample cite :xI* Iettsr sample 81;0 -j I B 3 7 Acceptab = ..?5 .40 zi, -ii I
~
1.00
M
10
1.50 3.4 7.59 7.59
1.59 7.59
}.( t.. .
=2
c
D E F G I H A a 1. J K L M. N o I
3
3 3 4 s 7 10 10 15 Zo Zo Z5 30 , 0. I 0.228 0.ZZ8 O<Z50 0.280 ( 2 0.349 0.349 0.s03 0.544 0.544 0.551 0.581 0.503 0.467 0.412 0.716 0.716 i. fllfl 0.846 0.946 0..977 0.879 0.789 0.720 v 1.06 1.30 1.30 1.11 1.29 1.Z9 I,zv 1.Z9 1.17 I .07 v 1.33 2,14 Z,17 Z.17 Z.11 ~2.a5 2.05 ,?.00 ,1.9s t 1.53 3.32 3.5s 3.26 3.z6 3.05 1.95 2.95 2.86 2.83 Z.49 Z..?9
!
--
18,06 16.45
26.94
S.50 5.83
10.9Z 9.80 8.40 1.Z9 7.Z9 6,56 6.17 6.17 5.97 3.86 5.20 4.87
5.15 4.71 4.77 4.31 4.09 4.09 3.97 3.91 3.45 3,20
4-4-4-=
9.46 I 13.11 I 18.94 ] Z5.bl
All AQL and t-ble values qre {a percent defective. Jy:a, first ounpllng PIU bdow qrrow, that is, both #unple oize a. well m M value. When cunplo sise equa2@or exceeds lot e.e~y item in tha lot mumtb. in#pecled,
_l-1-LK
1.11
1.6o
. _ . _____
B-5 M#thedl
.- .
B-5-Conthed
EZ k!
-.
.,,
. ,.. .
,.
E k F
1.
i.
..
. .
B-5-Cadimed
- .
ML-rm-414 11 J5fffa 1957 Pmrt m C5TZMATZON Or PBOC= AV~E REDUCED A35D TIONTU4CD B13. ESITbfATfON AGE OF PR~ AVBRAND ~TER3A =PECTION FOR
The qverage percent defectiwa. b-cd for origfnd = group of let- submitted inspection. i. cafled the proceoq voragc. Originaf imspectimi i. the firm im*pecfiOn Of qbmttted ~ -~cb? ety of p~ cceptability a. dfotiaguf.kd from f3M for q immpe c;ie. of product wbfch ti. been remtbmifted after prior re&cftcm. 3%. pro-.. average .fuU be ..timated from flm r..uft. of in. peetic.. of samples dr.wmfmrn a .peelot. for the purified number of precedfq up. d.rin~ the c..r.e of . cmdr.cf in accordance with ~rag,.ph B14.3. AD, 1- sM1 b- iustinuffag lb pxocem. cIuded only once in q qwr.verqe. The ..ti_t. ef Uw prw.. =K= i. d=. i~t=d by PU -be. eompufed wifh pee fficatier. lisnit, by re. pect to an upper q PL w.h=. c,.mpyte,d w+fh rc.pecf to q lower .P=c,f,.~t*I.mtt. md by p when computed with re. peet to a double .pecfficatio. fimit. .-. B 1~.1 Ahn.rmA R.muft.. l%. r.. ult. of inspection ef product _ufaetured under . ..diti... mot typfcd of ..IuI p.odmeficm pre.3u15 be exeluded frmn the q .tinnted ce.. avera~e. (hnputmtion of the Est5nuted %0. . estimated procem- q =ratm t. t e q r thmetic mean of fhe .atfmafed ~ h l~t percent defective. computed from b .amptia~ iit.p. ction *..uft. d the pxecedtms ten (10) lcIt. .M a. may be othetwf. e decig. nated. b order to e.tirnate tbe lot percent dal.etive, tba quality Ucea QU tiler QL shaff be cmn~ted for q ub lot. Tbom ~e: C3U = (u-X)/c md QL= (X. L)/a. @em pus. Sr*pb 3511.2.) B 13.2
~.= Of d=~=rdaiag
and the ~rremmondtnsedmtid 1c4 +rcud &fOcfiw ~ & p=,-respectively. iw mad from tfm fable. Tbe ectinuted proceco q vcrage ~ i* * ~ifhnwfic meaaef fbe fad3vtdual e.ttrnmted tot perce.t defective- pu c. 6tmitarly. the etiimated procem q q =rage $L it tbe arithmetic mean of the individual q ctfaut9d 30t pareemt &facUwa pL8. B 13.L2 Uoubl. SpecW. UtImI Limtc. The c &timated Iof percent defecfive q . q .termIned from Table B-5 for the pfaim ba.ed on the standard deviation method. The qtuf It, imdf... Qu d 0= sti ba e-vu-f. epar.tely wlfh ~ and Tabfe B-5 i- enzered q the eor--mpmdQL d the -unP5e qiae, d fag ~ and PL us read f mm the t8ble. Th. eatitrmt.d lot percent defecfive t. p = p .+ PL. The eatimuted proc. qS a=rage p is se q rifbm.fic mea. of the individtuf c..tinuted lot ~rcenf defectivep.. D 13.Z.3 S cfal Cam. It the qtulity index OIJ or C3L< a negative numb=.. the. Table B-5 i. entered bvdimrenardins the negative .ip. f-i---, i. tbi.- a., h. c.. fi&ated lc.t percent de fecfive above ftm uppa r limit or below fbe lo=. Zimit i. obtafned br mzbtractiq the PCrcenuge found i m the table from 100%.7 .BIL. NORMAL TIGHTENED, DUCED IkBP33CTfON AND m-
q.v9rity
of iacp.cfian
Wetfon 31W
Mrnuz
tirncttan
fisbtmnd er r.duc8d LrJsp.cficm 1. ~ mrquir9d b ccor~ wttb pr.sr.~ B 14.3 d n14.4. B14.3 Tishtaa8d 311spectioa. TI~btarnd h. q poetfon qbalf b- fmtitmad whn tha c cti wmpidmd from tfm matid pro- qa .nragm When Form I -Sfngl. Spectff~tfon ~ 1. rm.d for tba acmptabfflty criterion. tbe octl mafe of 101percextl &feetfve pu.or pL 10 mot obta.lmed;fmordertoewtimate the proc.am q v8r ~s=. it i* n=c=a~=rr to complete paragrapba B6.2 uuf B6.3 of Form L 7FOraXUnP18. U ~ . -.50-0 q SMPZO SCM SO,PU = 100% - 30.93% = 69.071b, = 1.60. us~ P1. 9 ~-n -P* 69.07s + S.sk . 74*. 52
. ..-
II preceding ten (101 108. (Ot ..& 04h*r rlwn bar of lat. de. i~ted) 1. =crnrduue with Kr=zr&pb BIXZ i- srestcr than the AQL, -d when more than A c=rta~ number T of of flx percent dethem lots have e.timafes fective sxceediq the AQL. The T vdttbs q re given in Table B-6 far the procea. .verage computed from 5. 10. Or 15 Iots.e NormmI inspection shall he reinstated if the q ver-ge of lots und=r ..tinut.d preces. tightened i..prction is cqud to or 1..8 tkmn the AQL. B 14.4 Reduced Im.pectiom. Reduced ilI.pection may be inmitumd prc.vid. d that q ll of the following conditionare qatiofied: Condition A. The preceding ten [10) lot. (or .uch other mmnber cd lm. de. igruted) and nom have been under nornul ia.peclio. has been rejected. Condition B. The e ctimated percent defective for each of theme preceding lot. io 1=.. Uthe appUcable lower limit shown in Table B-7; or km =ertak .arnplirIg plan. ,
XIL-STD414 11 June 19S7 b estimated lot percent defective is eqtnt to =ero for a q pedfied number of conmeeutiwe tot, (gee Table B-?).
q teady
Cad6tfon
rata.
c.
PrOdnctiM
is
qt
Normal impaction qhall he r.in.tated if any oaac of the following condition. occ. ra undc r reduced inspection. Condition
q .eragc
D.
A lot i. rejected.
Production
become.
Qther condition. .. . Condition G. ~? ~brrmt that normal inspection .hould be reinstated. B 14.5 Sampling P18m. 1.. Tightened Or Reduced lmpecthm. Sunplu-ig plan. ior tightene d and reduced in.pecticm .re provibd in Section B, Part. 1 and U.
I:
..
Cuve] Z.5 4 6 8 4
10.0 15.0
4 : 9 4 1 10 4 1: 4 1! 4 1: 4 1: 4 1; 4 1: 4 1: 4 a 11 4 a 11 4 1: 4 8 11 4 8 11 4 1: 4 a 11 4 8 11 -4 a 11
t49mbar Of bta 5 0 5 10 15 5 10 15 5 10 . 5 10 1s 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 io 15 5 10 15 5 10 15 5 10 15 15 i5
1
9 4 1: 4
1: .: 11 4 a 11 : 11
1: 4 a 11 4 a 11 4 8 11 4 e 11 : 11 4 1: 4 8 11 4 8 11
4 8 11 4 a 11 4 8 11 L 4 6 a 4 6 9 4 6. 999910 44 7 : 4 8 11 4 8 11 4 s 11
..
I 10 I
mm
q re m
9mp31a#
dAO1.wshm9.
..-.
Th. top figure ia ..ch ilock refers t. fbe preced~g 5 10C~. the ~ddfe preceding 10 let. and the boftom fipre to the preceding 15 let-.
fi-re
~ e
Ti@encd ia.pection i. required whom tbe numb. r of lnta wltb e~tfmates of percent 5. 10. Or 15 Lets is srester tbmn th= xiveri wdue defective qbove tbm AQL from the precediq of T in lhe table. ad tbe pro.en~ average from them. 10t@ .=.=.da tba AQf-. N1 estirnatew of the tot percent defective are c.btained f rem T8ble B-5.
-.
TABLE
B-7
Llmlt# 01 &#tim~ttd Lut Percent Defective for Reduced Za.pection sample tll* code letter I 23 *
q
.04
.25
.40
T5-
[ZB]**
[45]**
[II]**
[22]**
[15]**
[31]**
[25]**
[18]*.
[13]*O
[ 9]**
[25]**
[18]**
[14]**
[11]..
.00 ,10 .es .044 .74 1.50 .123 1.14 1.s0 .521 1.31 1.50 .653 1.39 1.50 .750 1.44 1.50 -..
.00 .88 2.49 .>06 1.80 2.50 .84 2,23 2.50 1,14 2.40 2,50 1.33 2.48 2,50 1.47 Z.50 A
.11 z.65 4.00 1.05 3.56 4.00 1.64 3.94 4.00 Z.24 4.00 ,& Z.49 4.00 A Z.66 4.00 A
?
F q q q ,000 .002
.000
.001
.029 .002 .057 .151 .017 .111 .?.1s ,037 .146 .248 .054
.169 .2s
.000 .016 .123 .011 .143 .315 .04.s ,2.3s .396 .083 .214 .40 .113 .306 .40
.000 .101 .369 .041 .310 .6.?6 ,121 .445 .65 .185 .509 .65 .231 .550 .65
.003 .317 .81 .136 ,643 1.00 .266 .78s too .36o ..963 I .00 .431 .909 1.00
.000 .006 .02s .002 .03.3 ,0s0 .006 .039 .077 .012
.050 .089
.000 .018 .062 .005 ,040 .10!! .014 ,071 .133 .023
.087 .146
. $ -1Slmdtrd
DevIa440n M!thod
I ::
[IO]**
[lZ]**
( 9]**
[IO]**
[ 7]0.
10
15
10
15
4.24 10.00 i
10
15
6.50 &
5.19 10.00 i
iO.47 15,00 4
10
Is
6,06 I0.00 A
11.51 15.00 L
10
15
4.29 6.5o 1
7.40 10.00
A
4.59 6.50 1
7.74 10.00 A
1
lZ.4> 15.00 &
12.07 15,00 A
10
15
10 15 5 10
1
,011
.027
4,81 6.50 ,A
1.98
10.00 h
15
q Th=i* mrc no mmpliag plain provided Anth!o Standard for these code Ieltero and AOL vduei.
,.
.-
-____
,._
TABLE
B-f-ConUnued
Limlto of Cctimalcd Lx P~rcetN Delectl}e for Reduced hwpectim Sunple OIZR code letter Levels Acceptable @di}y .65 2.5 1,0 ! 1,5 .210 .577 ..65 .300 .596 .65 .345 .621 .65 .414 .65 A .453 .65 A .501 .65 A .525 .65 A ,483 .940 1.00 .8.?1 1.47 1.50 1.57 2.50 L 1.64 2.50 6 1.76 2.50 1 1.92 2.50 k ,?.01 ,?.50 , 2.13 2.50
&
.04 .004 .017 .012 .005 .020 .035 .008 .025 .04 .014 .0)1 .04 .01s .014 .04 .023 .038 .04 .025 .04 &
.065 .008 .033 .058 .011 .038 .ObJ .016 .045 .065 .026 .054 ,065 .032 .058 ,065 .039 .064 .065 .044 .065 A
.10 .017 .059 .091 .022 .065 .10 .030 .075 .10 .044 .081 .10 .0s3 .091 .10 .064 .10 b .069 .10 &
.1s .03.? ,099 .15 .040 .108 .15 .05?. .120 .15 .0?2 .136 .1s .085 .14J .15 .101 .1$ A .108 .15 i
.25 .069 .186 .25 .082 .199 .25 .102 .215 .25 .134 .2)6 .25 .153 .245 .25 .177 .25 1 .1!38 .25 A
.40 .137 .3Z.9 .40 .157 .343 ,40 .187 .36{ .40 .235 .389 .40 .261 .40 b .296 .40 A .312 .40 b
4.0
6.5 4,96 6.5b a 5.08 6,50 4 5.21 6,50 & S.!iz 6.50 A 5.67 6.50 , 5.87 6.50
a
10.0 8.1s 10.00 1 a.z9 I 0.00 h 8.50 10.00 & 8.01 10.00 & 8.98 10.00 & 9:22 Io.oo
&
15.0 12.08 15,00 & 13.03 15.00 A 13.2s 1S.oo & 13.60 15.00 & 11.00 15.00 L 14.07 1s.00
A
Numha r of &to 5 10 15 5 10 Is 5 10 15 5 10 15 5 10 1$ 5 10 15 5 10 15
2.19
4.00 h 2.88 4.00 A 3.01 4.00 A 3.24 4.00 A 3.36 4.00 , 3.52 4.00
A
.5, ?5 .876 .961 1.49 1.00 1.50 ,507 .989 1.00 .6.91 1.00 A .733 1.00 k .799 1.00
A
1,276 1.50 8
2.19 2.50 i
~.59 4.00 1
5.96 6,50 i
9. N. 10.00 1
14.19 15.00 A
VAf3methe flrot figura In dlraetZom o{ qrrow and corresponding number of Iotm. fa qach block tha top (Igure rofcrc to the prccedlos 5,10ts, the m5dd2* figure to tho preceding 10lott, snd the bottom figure to the prteedlng 15 loto.
q ttlrmtd lot P rcsnt defcctivc!from the preccdins S, 10, or 1S leto it Reduced 6nspectlea IIWY ba Sr@itoted when wary atlmtiod bdow tha flpr* civm tn the tabl*; rcducod inspection for sampling PIMC mmk.d (**) la fho tlblc raquireo that tha q lot po?cent dcfoctlvo 10 eqttafto saro for the number of conteeulive lots Indicated In bracketo. la sddltlon, q other cendltlont ll for roduead Inspection, in Pmt 223 Section B. mutt be ostitfi.d. of
N1
~ F r? s ~g
q aihnatem of the lot parcent defectIv* are Obtained from Table B-5.
,:
Sample Oise 3 4 5 7 10 15 Zo Z5 30 J5 40 50 75 100 150 200 .18?. .177 .114 .173 .170 .169 .166 ,lb2 .160 .1s0 .I.521 .18J .180 .119 .176 .Ilb .112 .1613
.lb6
leOudity T -.
ercec
1.50
,Z94
.24z
,)53 .Jz) .Z9S .Zlb .262 .255 .251 ..?49 ,245 .245 .241 .Z35 .Z31 .Z30 ..?Z8
,399 .)73. .345 .5Z4 .309 .302 ,291 .Z95 .Z91 .290 .Z84 .Z79 .Z7b .z71 .Zb9
.4JZ .408 ,M31 .359 .344 .3)6 .331 .320 .323 .3Z3 .317 .310 .307 . 30Z 30Z
.47Z .45Z .4Z5 .403 ,386 .371 .372 .369. .364 .363 .156 .348 .345 .341 .338
.S28 .s11 .489 .4b0 .442 .43Z .4z6 .4Z3 .416 .416 .408 .399 .393 )81 .386
E F G H I m m J K L M N 0 P Q
,Z53 .23s
,Zzz
.Zb6 .248 .,215 .ZZ9 .Zzs ,22J .Zzo .Z19 .Z14 .Zll .208 Z06 ;,Z03
.214 .19s .190 .202 .197 .193 .192 .189 .IE.5 .184 ,181 .179 .175 .175
.2Z4
.Z98 ,Z84 .Z17 ,27) .?70 .?bb .Z66 ,Zbl .Z5S .2S3 .Z49 .Z48
.211 .z06 .203 .201 .198 .190 .194 .189 .la7 .185 .183
.248 .Z42 .238 .236 .ZJZ ,232 ,ZZ7 .ZZJ .Z20 .21b .215
.z16 ,Zlz .Zlo .Z08 .207 . ,ZOJ .199 ,197 ,191 .191
.181
,185 .183 .182 .178 .174 .172 ,170
.lb8
.Ibl .163
.151
The MSD msy b, obtalmdby muhiplylmg the factor F by the diNereace balwoen the uppr spaclflc~tlcm Ilmil U and lower spee5fictiian limit L Tha formula lt MSD = F{ U-L). The MSD s+met m I gulda for the magnitud- of the qoiimatc of let otaad~rd deviation whtnu81a[ plmc for th* double specification Ilmh came, bm.td en the eatlmat. of 108ctandard davlatlea of umbown v~riability. The estimua of lot otaadard deviation, if it Ic IF-o Ihm the MSD, helps 10 imure, but doe- not uuar MIee, Ipt acceptability. NOTE: Therm Is s corr*opondlng acccptablllty constud In Tikle 6.1 for qachvdue tbmaccc~tabil!ty commnt of Table B-Z In Table B-1 and u,e the corresponding vahe of ~. of F. For reduced lnopectlen. find
5!!!!9!
m
Red Sample
X bsr qix. for q .i=~le
x .
Arithmetic
E.tinute cd lot ctandmrd deviation- Standard deviation of qun insle lot. (See &xmpIe* iaSect40n ple measurement [mm a q 33. ) Upp=r Lower The Q qub U Q qub L p sub U
u
L k
qcceptability
t
I I
Qu QL
Quality Ouality
!
I
%
L
Sample q .tirnale Table B- 1.. Sampl. estimate Table B-S. Total .ampl.
p sb L
defective
P I ,, M
e.timate
P = PU + P~ eatinutea
Mtimum allowmblc Pcrceat defective q bove U given B-3 and B-4. (For uoe when differeot AOL valuea L are specified. ]
ML
M sub L
Maximum Alowable percexaf dcfecfive below L given in TableB-3 and B-4. (For we when differenl AQL vtiuea for U & L q re #pacified. ) Bamp3e q intimate of the proceem estinuted procea q qve rage. percemf defectivw i.e., the
p bar
% Pf, T 1
F
p bar p b-r
sub U
qub L
upper specification
limit. Mmft.
for q 10W* r
q pacification
The maximum number of eattnnted prece. s sveragam wbkb BlverI in Table B-6. (For u.e in determay q xceed tb#AQL pplication O! ti~hteaed inspection. ) mining q A lactez ua.d in d.te rmim.i~ the ~um (hLSD). The F valu=s are given In Table Greater ham than Standard B-8. Deviation
i I
> <
than
.x
sum of Ml
SECITON VARIABILITY
c METBOD
UNSNOW7J-3LMJGE
Part 1 sZNG LE SPECIFICATION Cl. SASIPLUJG PLAN FOR SPECIP3CATZON LDdIT SINGLE
UT
This part d the SUmZ. rd describes the prO.y@ur=~ fOr. u*e wilh PlaM for s Si=ule rep..c1ficati0n knit whcri variability O{ cbe lot with rempecl 10 the qtmlily cbarseteri. tic M u.knowm and the ZWC nmtlmd i. used. The -cceptability criteric.ti i# give= in lwo equivalent form.. Th. mc arc identified as Fo,rm 1 d Form Z.
CZ.2.2 Accep-ility Comstit. The acceptability COa.t-t k. correspo~w tithe sunple mi. e mentioned in paragraph CZ. Z. 1. is indicated in the column of the master t.ble corre. poading m the applicable AQL value. Table C-1 i. enmred lrom the 10P lo. nc.r rn.1 impection qmd from th. bottom for tightened inspection. Sampling plans for reduced inspection a*e provided in Treble C-Z. C3. WT-BY-L&fT ACCEPTA=ITY PROZ CEDURES WffEN FORM 1 IS USED
use of SUnpliag Plan.. To deterC1.1 mine whether the. 10C meet, tbe ACCCptability criterion wJth respect to a particu. lar quality characteristic ~d AQL vaZue. amplih~ PIq hall be treed the .pplic~ble q in .ccordance with the provisions of Section A, General Demcripciou of Sampling pl.m.. b the... in thi. part of the Sc.ndard.
Cl.2 Drawing of Sarnp3e.. AN .armples sbdl
C3. 1 AccepUbiZity Criterion. The degree of coaormance of a quazmy characteristic :imit with re8pect to q #ingle specification qhaZl be judged by the quantity (u-X)/R or {X- f.)lsi.
:/::1
be draw. m accordance wltb paragr@iA7.2. Cl.3 Determination of Sample Size Code Letter. T he sample sme cod e letter hd~ =ected from Table A-2 in q ccordance with par~raph A7. 1. CZ SELECT3NG THE wHEN FORM 1 ls SAMPLINO USED PLAN
-i:
iw%%(ilwz
Iimi!
depending on whether the specification is = upper or q lower lirnis. where U L X ~ im the is fhe is the i. the upper specification limit. lower specification IimIt. sample mean, and qverage range of the #ample.
Samplin~ Tmblec. The matter C* co r DlaM b- ed on varia peef.fieation blIity u---n for ~ single q Tables limit wbenuakg & raag. unfkodaro C-1 qnd C-Z. Tabia C-1 b .u..d for normal q nd ti~htened inspecfi.m uuf Table C-2
for reduced izupoction.
CZ.Z Obtining the SunptinS P3an. The q X q -d .unp3im~ plain ccmsastm . .unple O{ f The q m q sociated accepIAbUiv Ctaut. .unplimg plain ia obtain.d from Maater Table C-1 or C-Z. size CZ. Z.1 Sam le Si=e. Tbe sample .homa ,n 1 e nlater table CC4rrm#p0~ ~ mple .1== e-de Iater. each q a it tO
3n this Standaqd. K ia the average range of ,.bKrmip ranges. 32ach d die subSro.p. consists of 5 mea*u*emenl.. except for tbOa* unple qke 3, 4, or 7 in which plans with q kgroup q im 19 fh sum as i.h u** fbe q sanw3e sise. Zm wanpufiq K 338= Ord=r Of c=u*t b= Ihc sample meam=rem=iits u .-de rer.-iimd. Smkgrwpa af cnumcrmive nn.. urements must ba formed d the range of .xh .ubgroup obtalwd. X is the qweraae of bgroup nngea. tbe individnaZ q C3. 3 AeceptsbIlltY Crite Finn. compare the q.mtity (u - m (X- L1 Kwithtbe qbilitv cor.8cant LOrZf (u-XI/X or (X- C%% L) equal to or Creater than k. the lot meats tbe q.ccptab13icy c rito rloix u (u-X)/R or (X- 2.)1X ia less tbm k or m.afiva. tbea the lot deem not met the .c..ptability e ritoricm.
pl~o
ampllng 1Se. Appendix C for definitions of afl cymbolo us id b tbe q uak90wm- raaga mmbod. xunple of tbi. procedure. %we f+ample C-1 f.r q cmIIp3eto q
bac.d
on varIablltty
al
._ . ..-
I
3A1L-m-414 11 June 1957 CL f3uMM~Y FOR OP3IRATION SNAP LANG PLAN WHEN FORM USED OF 1 LS CO. f.CfT-BY-LOT ACCEPTABI w P% CEDU3432S WNEN FOR3A 2 3S USED c6. 1 AcceptabUity Criteric.n. The degree of conformance of q qutilty characteristic with respeet CC.q q imgle .pecificstimi limit .hafl be judged by tbc p.r. mit of notlccmfomnirt~ p.od. ct out. ide the upper er lower specific aticm limit. The percentage of rmnconforming product i. estimated by emtering Table C-5 with the quality iadex and the #ample qi*e. c6. ?. Computation c.f Quality Index. The quality izidex Or, . (U- ZC)CIR hall be com puted if the sp%cificaticm limit i. an IIppcr limit U, O= QL = (X- L)c/K if it is a lower limit L. Tbe qamitie., X q nd R, q re the sample mean and qverage ran~e of tbe sample, respectively. The compmatioa of K i. qxplairted in paragraph C3.2. The facbar c is provided in Master Tabl=s C- 3 an& C-4 corresponding to the .unple size code letter. Defective in bt. C6.3 fhtimate of Percent The quditv of a 1.s1 hall be expre.. ed by PU. the =.timated percent de fe~tive in the limit, or lot q bov= the upper specification p.r. =ntd=fectiv= beloby PL. the q .ti-@d pccificatiort lirnii. The q .tima~ed thc lower q Percent de f=cti~. PU O, PL i. mbt~im=d by .mteri+j Table C-5 with Qu or QL .nd the q pp. Opri~t= q AMPlt qi*e. C6.4 Acceptability Criterion. Compare the e.timated 1 percent defective PU or pL with m the m~imutn aZlew.hle perceM defective M. U .pU or pL is equml to or le.. Uun M. cceptmbitity criterion, if the lot meet. the q pu or pL is grekter than M or U QU Or QL i~ negative. then the lot does not meet the acceptability criterion. Cl. SUMMARY OF OPERATTON OF SAMPLING PLAN WHEN FOR3d 2 IS USED
qununar 3s9
the pro-
ample .i, c cede let(1) Determine the q ter from Table A-Z byu. iq the 101.ize and the in. pecti.an level. (2) Obtain plan from Mater or C-Z by .elecfin~ the sample the acceptability ccm.taat k. Table C-1
qize n and
(3) select *1 random the .;rnpl. of m nit. from the lot: in. pect .nd record the meamurernenx of the quality charactari. tic for q=ch uait of the sample. (4) Compute the .;rnple mean X and the range of the .arnple ~, .md q l.o compute the quantity (u- X)IR for am upper qpe. ificatiomlirnit V or thequamtity (X- L)/R for . lower specification limit L.
qvera~e
(u-X)/R c.r (X. L)/R i. equal to or greater thas k, the lot meet. cceptability criteriow if (u. X)/11 or the q (X- L)llf i. I.*9 than k or negative, then the cceptability criterion. lot doe. not meet the q
(5) ff th= quantity
C5. C5.1
PLAN
Ma#ler Samplinj? Table.. The ma. ter for plana ba. ed o= varisbil ity unka&n for a single specification litit when u.iq the rang. method ar= Taidec C- 3 q nd C-4 of Part IL Table C-3 is used for nc.nnal and tightened inspection qnd Table C-4 for reduced inmpectimi.
qamplmx table.
the Sampltng C5. Z Obtaininz Pllrl. Th q sampling ptan con. i.t~ of m .UIWI]e .ize and an aooo~ik.d maximum a310w&le percent amplfq ptam ic obtdncd def qctive . The q from Ma.t=r Table C-3 or c-4.
the
C5. Z.Z Maxd8mtm AIIc.wable Pereent Defective. The madrnwn allowable percemt de=ive M for s-pie eotim.tes corres~ndtied in ing 10 tbe sample qiz= me~tie paragraph C5.Z.1 i. indicated tn tbe COIUMII Of the rnmms.r tabte correa pending to the applicable AfZL value. Table C-3 ii entered from lb. top f-r ~orrnal iaapectian mad from the botfom for ti~htened in. pecticm. SunP~ Plaru for reduced inspecticm are pr.a vided in Table C-4. 3See 3cxAmple c-z tar a complete example
(1) Demwime ihe -ample .ise code lel from Table A-S ~u~inn the lot dae and the iriapecttosi Iov@l.
ter
(Z) Obtmi. plan from t.mater Iable C-3 or C-4 by .electirg the -ample sk= n. the factor c, and tbe maximum qllowable pw. ceat defective M. (3) Select qt random the sample of n unit. {ram the 10C inopect and record the meamm.mem al the quazity characteristic on each nut; of the 8sMple.
of thim pru..dur.. 62
MI L-sin-414 11 June 1057 unple me-m X 4 (4) timpute the q ample K. av.ra~c raaSe of the q the (7) Uthe q .timaled lot pcrcentdelective PU or PL i. eqtml to or Ie*. thaa the mdmum azlowable percent defective M. 3he lot meets the acceptability criterion; it PU or pL img.eater than M or U Ou or Oi.%=_~ -i.. them the lot doe. W1 meet the q cceptqbiliw criterion.
the q.=lity index QU = (5) Comp@= (U-X)c/K M the upper speckfieation limit U iripecified, or QL = (X- L)CIK i3 the lower .pccificatirm limit L ia .pecif ied.
10s m.rc.r.. 161Decermirie the q .limaled .-, defective PU or pi. from Table C- 5.-
c-1
of Ca3culati0n* Limit-Form 1
Specification
Variability EXarnple
The lower .pecifie.tion limit for electrical r.miataace of q certtim qlectricti comInspection ponent is 620 ohm.. A lot of 100 item. is submitted for inspection. Level IV, normal inspection, tith AOL = .4% i. to be used. From Tablet A-2 ud C- 1 it i. ..en that a sample of size 10 i. required. Suppose that value. of the sample resistances in the order reading from left to right q re . . follow-: 643. 651, 67o, 673, and compliance with the 619, 641, 627. 650, (R, = 658 - 619 = 39) 538, 650, (Rz = 673 - 638 = 15) i. to be determined. EXP1anatiom
Line 1 .? 3 4 5 6 7 8 Speckfieatio. The qu~tl~ Accep3AZZity Acceptability with k The lot doe. = Sample Site:
3nf. rrn.ti.. n
Needed
Value
Obtained 10
I X
620
Camsmt:
Criterion
qcceptability
criterion.
is 1c99 than k. kn i-
limit U im give., then compute tb. quantity (u-Xl/X U q .imK1e .PP=r .Pecificati.. line 6 q ad cmmpar= it with k the lot meet. the acceptabUitY criteriom, if (U- rnf~ equal 10 Or greater [ham k.
.-
U.knowmi - Rang.
Method
Ex. mple
comA lo.ver specification limit for electrical re. i.tan.e of q certain electrical Zaspection ponent i. 620 duns. A 10 of 100 item. i. submitl.d I for inspection. Level lV. normal in. Dection. wish AQL - .4% i. m be used. From Table. A-2 mad Suppo. e lh. v*Iu=. Of the C- 1 is is seen thal ; sunple of qizc 10 i. required. sample reaiatance. in the order readimg from left m. right are as follows: 643. 651, 619. 627. 6S8. (R, = 658 - 619 = 39) 670. 673. 641. 638, 650. (R2 = 673 - 638 = 35)
qnd compliance
criterioo
Inlorrnati.n m
IX
Range ~:
XRlne.
(~we.
):
620 1.76 2.54S (647-620)2.405/37 See Table See Table See Para. than M. C-5 C-3 C6.4
ercent
Allowable
PerceIIt Criterion:
1.14% 2.54%>
since pL
Compare
1.14%
is gr=ate.
-E:
U . .ingl. upper specification limit u i. Rive., th=. compute the quaii3y frufax QU ~ fU-X)c/3! in line 7 d obtain the eotimate of lot percent defe.tive PU. -mpr= PU cceptability criterion, U p ia q qu~ io or iz*. ~hn M. with M: the let meet. the q
. .. .
_.
TABLE
C-1
RmIrn Method
Master Ttble far Normat and Tightened Zn$ptctlon for Plans Based an V~riabIllty unknown (Single Specification Llmlt - rarm I I ml in pectiml sample t 1se code letter
1 15,00 T
K k
B c D E F G H 1 J K L M 24 0 P Q 230 1.21 .063 1,21 I .10 1,16 .15 I 1.)2 .25 1,,06 I .996 .932 .87o
v
.s38 .565 .SZ5 .65o .684 .7,?3 .730 ,734 .746 .754 .1b8 .780 .791 .807 .309 2.90 med
. 50?,
.450 .431 .405 .307 .516 .371 .577 .581 .591 .598
.401 .364 .)52 .336 .424 .452 .484 .490 .494 .s03 .510 .!21 .530 ,539 .552 .5s3 10,0[
.178 .116 .184 .189 ..?5?. .216 .105 ,310 .~lj .321 .327 .336 .34s .3SB x .364 #2
.519
.610 .647 .654 .658 .668 .616 .689 .701
+ .610
,621 ,631 .644 --1-.646 6.50 +
.111
.7z6 .728 4.00
Impec m)
AU AC2Lv~ueo qre in gercent defeciivo. amplln$ plan below qrrew, that {s, both sample -lie ,:: tir,t & a q, 9wory Item 2a tha lot mnmtbn ln#pected. i
S* well as k value.
When sunplt
i$! 4s
TABLE
C-2
Raa[e
Mtthod
:6
Mantar Table for Reduced Tnnpeclion for Plan~ Based on VariabLllty Unknown (Siogle SpeciflcalIon Llmi!-Form i}
Sarnpls q{SC
--1-B c 3 D 3 E ; G 33 1 J K L. M 1 4 5 7 10 10 15 25 23 JO
EEE
.15 -i-
:ept&l J 7 .
1.50 k .581
2.50 k ,502
4.00 k ,401
10.00 k .178 .178 ,178 .178 .176 .184 .189 .252 .2s2
.663 .61J
.614 .569 ,703 .703 .738 .179 .179 .707 .791 .826 .8J9
.565 .s2s .650 ,650 .684 .723 .723 .130 .734 .768 .7E0
.498 I .43,
1,.3s2
I
9 1.10 1.10 1.10 1.0s
.861 .916 .958 ..963 .90J .951 .951 ,959 .964 1.00 I.oz
P Q
60 8s
E
1.05 ;.01 1.o6 1,07 1.02 1.11 I ,0.? 1.16 1.17 1.11 I.IJ 1.06 1.08
1.01
-u-.579 I ,50? I .424 .341 ,610 5J6 ,452 .360 ,647 .s71 .404 .398 .30$ .10s .Jlo .647
.276
,s11
.371
.484
M
.654
.490 .494 ,658 .5s1 .6.99 .610 .621 .521 .5)0 .701
C8.
DOUBLE
This part Of the Sf-rd describes the procedures for tue with plain [or q double cpecificafioa Iimft when variabttify Of the let with respect to tbe quality characteristic ia u.knc. wm q nd the range method is umed.
cA. 1 u.. a{ .. .Plan.. .- determine -------. S-.11.. ... Tc, ~hethe r the 8.x meet. tbc .C eept.bility c rite rion *ith rcapeet to a partiastar quality char.eteristic .~d AQL. vtiue(. ), the .ppli ampliag F.lao q U be used in accordcabl. q atxe with the pre. i.imm of Section A, Genq wJ eral De.eription d SunplinS PIMa, the. e in thi. part of the Staadard.
mmtimum q llowable ~rcemt defectively ML for the lower Iindt. ad by MU for the upper limit. If ~ AOL i8 88sinmd to bofh limits c.mbiaed. designate tbc -urn aflo.able percemtdelecfiveby M. Table C-3 is entered tram fhe cop for aornul inspection and from tbe bottma for tAIhtamd inspection. Samq re pr. plim8 P1W9 .Sor roduce!ttmpaction . vialed iii Table G-4. C1O. DRAW7NG
aace
OF SAMPLES
be q lected
in
q ccord -
A7. Z. T ACCEPTAB1_
C1l.
C9. .N1
THE
SAMPLING
PLAN
10 UOU..
-..
C9. 1 Determination of Sunple Size Code .s. code letter =hfi ~. Th q .unple b. q elected from Table A-Z in accord-ee with paragra~ A7.1. C9. Z hta-tor SamIIlimX Tabla-. The master munnlinn tablem [or mlam hmed On variabil ity ~fca~wu for a d~ble specification limit wbeo uming the range rn.tbod q re Tablea C-3 q nd C-4. Tsble C-3 is used for norrnaf and tightened im.pectiom and Table C-4 for ra duced Lrup.ccfion. C9. 3 Obtaintng Sampling Plan. A q sM@in4 plm Comai,ts of q qampfe sise the sl qoctatad maximum attowablo percent dafac pplied in tiw-e(. ). The cunplin3 plan to be q kn#pect&a stmfl be ~btied from Maater Table c-3 or c-4. C9.3. I Sun .bownbiitdl,.. unple each q 10 Si=e.
qice
Cl 1.1 Acceptability Criterion. The degree of c.nfo~aracteristi. with re. peel to . doub_fe .~cific. tion limit hall be Judg.d by tbc percent ei wnco. ICr.rni.g producL The per.enta~e of no.Cwderming product is estimated by entering Table C-5 with the quafity imd=x q nd the ample :Ue. Cf 1.2 timputatioa of Ouality bdicei. The qualify inchcea Q {u .C xl [R and QL= (X- L)c/R cbdl be !o&uted. -here limit, u im the upper specification limit, L ia the lower .peeificalion c is q iacfor provided in Tables C-3 C-4, x i. fbe q mple mean, and u i- the qverage range of the sample.
and
The
q antple sise
.Orr..pmdiag
m Is to
code
letfer.
C9. 3.2 Maximum Allowable Percent DeIe c five. The maximum-t allowable PC rcrnnt dee.tirnatec of percent ~tive for cunple
def q etiv. for the lower, qpsr, or botb
q p.c -
b tbh Standard. R is the >verage rmge of bsroup rauKc& ~cb of tie sti#*0Up9 tba q exc=pt for those consimt. of 5 meuurement$. rnple qis. 3, 4, or 7 in which pduu dtb q ubaro.p qis. h th= q ame q e the case flu q q ~e. 3a computing R, the Order Of s-pfa fbe .unple meamtrernemm q s nude mat be ratahad. subgroup of co-ecutive meu urementi mnot be formed and tbe range of ubgreup obtahed. K ia the q -erase etch q qubgroup ranges. of the individud Cf 1.3 Percent Defective In the Lint. The qualify of q lot qhall be exprew~ed SrImrmof the lot ~rc.nt dof=cfi.=. Its c~~** W~ be dosipawed bY P L, PUO 0? P. The q gtiwta PU iadic*eD contmrmca ~tb respect to tbe UPPG r spockfieatien Mnait. p with resp.ef to the lower .peckfi.atim lAU. P fOr b o t h spaekfieation limlta combined. TIM 67
=.cirnatc. p.Laad pU q baJl be determined by entering Table C-5. r.mpacti..l~ iJb Qt. q nd Qu q nd the q ampl* q i=.. The =~tim~te ddin~ the co rres p shall he dew rmined by q pcmdimg estimated percent defective. PL amd PU found iii the table. C12. ACCEPTAB1~ CRZTER20N SUMMARY FOR 0PE2tAlTUN SAMPLING PLANS AND OF
q nd
Cl 2.1 O!ie AQt- value for both Upper b-e r + Cit,catmm Limit Cmnbmed.
CIZ. Z.1 A.c=ptabitity Critdria. 5 timp8re the estimated lot Per.cenc de fcctive~ Pt. ~ P with the corresponding maximum aTiowq nd Mu q lso 8e Ie percent defective M compar. p . pL + Pu with tk e larcer Of ML q nd Mu. 2f pL ia equal to or 1=6s ~h~ Mb PU is equal to or lees than b4u. d P is equal to or 1=0s than the larger of btL ~ c ritcri=, Mu. Ihc lot meet8 the *cceplability otheruase.7be lot does not meet the scce Pl ability criteria. 33 q ither QL or OU or both q re negative, then the lot does not meet the aeceptabitity c riteri& Cl 2.2.2 Summary far O~~atic.n -f ~mPliWf PJan. & ~.ses m.h.re q cliffere.t AQL value ~tmblished (or the upper qnd k.wcr .Pec ificatio limit fc.r a sim~ie quality characterthe istic, the fol Jmnimg steps qm-.mari=e procedures to be used: (1 I Dcternai~e letter from Table A-2 and inspection Jewel. the sample ai.e &d. by using the lot q i=c
Cl 2.1.1 Acceptability Criterion. 4 Compare P . p + che eetimamd lot percent delectlve q l10-abl* Prc=nt PL -ilh the maximum dcfcc:ive M. U p is equal to or less than M. cceptability criterion, if $h. lot meets the q P i. e,e*t=, th*n MOr if either QU r Lor both .re negative, Ihenthe Jot does not meet cceptability criterion. the q C12.1.2 Summary for Operation of Sampliag Plain In came. where q .ingle AQL value 1. =blished forth. um~er and lower s~ecifi i=gle quality C~t;ori limit cornbin;~ for a q .haracleristic. the following steps summa=i.. lh. procedure. to be used: . ll)Dctcrminc the sample si. ecode letter from T.ble A-2 by using the Jot sic and the in, pe. tie. level. (2} Select plan from Maater Table C-3 or C-4. Obtain the sample ttie n. th= factor c, and the maximum mfloumble percent defective M. 13) n unit. from mea. urem.. or. q .ch unit average ample of Select m random, the q the lot; respect and record tbe t of the quality characteristic of the sample.
q nd
(2) Select the sampJitig plan from Master Table C-3 or C-4. Oblain the ampthe m~mum le size K.. the factor c. -d q llowabJe percent defective. MU and ML. corre. pondi=g to AOL VaIUeS fo, the uPP=r q nd lower Specific atiec. limit., respectively.
ample of (3) Select q t random lhe q from the 10C inspect and record the measurement or the quality characteristic on each unil in the .UTIPIC. a utit.
q.er.~e
q .d
(5) Compute the qualiJy imdicec QfJ . (u- X)c/R. and OL =(X-L)CfU. (6) Determine the q .timm~ed lot percent defective. pU amd pL. corresponding to the p.r. em defective. above the upper and below the lower specificticw limitt. AJSO determine lbe combined percent detectiV= p - ~ + pL. (7) 32atl three of the lollowlris dbt~ons: (a) PU is =q-~ ~u. MLl.rger tO Or lEM tbu (b) P,. ia aqtml co or I=*w th*m {c) p is equal toor Jesmtin of ML and Mu. the cos-
IS) -mpt tbe quality indite. . IU. X)c/K arid QL, F (X. L)C/R. = y-fi=nt
OU
(7) 2f the eotinuted lot percent defective pi. equal to erlem. thui the maximum d20wable percent defective M. fbe 10Jmeets the acceptability criterion, if p ia graatar lIIM M or U either Ou or QL Or both am negative, then the lot doe. awt meet tbe acceptability trite rion. C#w.~r Different
4tie ~pk
AOL
for
a~d
d tbi.
p8cuLcmU0m
fh lot m.mtm tbe accepfAbi21ty criteria; otherdse the lot hew not meet the scc=ptability criteria. If either Oz., or QU or fba. *h. lot dw* tit UI**C both q re =gative. the acceptability criteria. of Ma proc.dure. PrO=~ur*.
q re qaticfied.
SW
*PI=
c.4
C-3
for . =om**t*
exunpZe
q xample
-. -..
. .
Specification
Unknown and
Specification. Limit
peclficstioni [or elec:riea2 recisfaace -f a certaiu electrical cOrnponeu5 * The q is qibmitt.d for In*petiiar& fmspecfi.. Uwe2 65o.o q 30 ohm.. A lot of 100 item. IV, normal intpectiea, wftb AOL . .4% ii to be used. From Tuble. A-2 and C-3 it of size 10 1. required. Suppose the vafuea of the q mnp2e is q eer. that q samfle resistance in the order reading frm-n left to ri~ht are q s follows: 643, 651, 619, 627, 65B. (Rl 67o. 673. 64). 630, 65o. (R2 and compliance with the acceptability criterion . 658 - 619. = 39) s 673 - 638 c 35) i. m be determined. Obtti~md 10 xx 6470 647 37 .?.405 680 fawer Ctudity Ouality Specification Index Zndex: Ltmit: L c/R 620 2.15 1.76 u: L (680 -64Y)z.405/37 (647-620)2.405/37 See Table see Tsble .s5s C-5 C-5 6470/10 (39 + 35)/2 See Table C-3 Zcxpla.atien
*.
1 2 3 4 5 6 7 8 9 10 11 Sunpl.
V .lu.
X:
XXI.
Cfu . (U-X)
~-t.
of
Lut p--t
Percent
w
pL
Est. of 3A
12 13 14
P = Pu + PL M
p -
+ 2.54s C-S
Percent
Def.:
Crtterloa: 64
Carnpare
2.e98
>1.14s
tbe
q cceptabifify
crilerlOn.
since
p = p
M.
de
I
I ~ph
EXAMPLE
c+
of Cakuhuom
Specfficatlom LimI1
Doub3e
I
Different
Unknown
- ~we
ra~e
for Upper
and Lwer
ZZ.unple
The q pecifi.aticm. f.r electrical reaiscance of q certain electrical cmnpone~t iZn.pectimi 3AV.1 650.0 q 30 darns. A J*1 of 100 items im q ubmitted for inspection IV, rmrmmz impecziou, vifb AQ3. . 2.5$ far the upper and AQL E 1% far tbc lower specification limit i. Ie be used. From Tablet A-z and C-3 it i. q ce= that q .am P1. of size 10 is reauired. SuPrmse the values of the sample resistances in the irder reading fmm left to right a-re a. follows: 643. 651. 619, 627, 658. (R, = 6S8 - 619 = 39) 670, 673, 641, 638. 650, (Rz = 673 - 638 = 35) and compliance with the
q cceptability
c*iteria
i. co be determined. Obtained 10
Needed
Value
1X
IXf.
~:
Average
Factor Wp=r kwer c
Z4.nge
X3tlno. of .ubgroups
specificatio~ Specification
Limit: Limit:
U L c/R /R FU PL
I
I
8 9 10 11 lZ 13 14
Qu = (u-X) QL = fX-L).
Perce=: p=c.mt
Ems. Per.emt
p = PU + PL
q bove
U: Mu 3A M
below
See Table
15
Acceptability
Criteria:
See Pars. clz.z.z(7)(d See Para. C12.Z. Z(7)lb) See Pars. CIZ.Z.Z(7)(C)
criter&,
slats
15(-).
q re
satisfied;
i.e..
PU <
,______
.. _.
Rtrme Mcihc.d TABLE C-3 lIA.,w. --- Mamer Tbbl. fer Nermal .nd Tlthtencd fnsmctionf.r Plan. B.nedmv..i.hlltt.. ndf;r Form Z-Single ~peciflc~fion Limit; (Double Speclficatlon ~lmlt q
4cceptable C mlity Levels (normal in#pectlon] Sumplc *IS* cede Icller B c D E r G 4 w 34 1 J m L M N 0 P 0. Ssmple *11* 3 4 5 7 10 15 2s 30 35 4b 50 60 85 115 113 230 fa:to? G z.a34 2.474 2.8)0 2.405 LJ79 Z.358 2.353 2.349 2.346 2.342 2.339 2.335 2.333 2.111 z,j30
.125
iiir!t
MMM
.04
.06S
.10
mT
It
.061 .147 .lbS
.136
.2s3
.ZJ .430
B I
M M MM ~vv t.sl 1.42 3.44 v .28 .89 I .9q 3.46 .58 1.14 1.]0 Z.05 Z.lo (.95 3.Z3 3.11 .786 .5o6 .53? .564 .539 .827 1.27 1.z9 1.31 1.Z5 1.25 1.16 I.lz 1.06 .972 .q76 .65 Z,8Z .856 .883 .842 .818 .1.51 .755 .718 .65S .661 .40 1.q6 1.98 1,B8 1,60 1.74 1.61 1.58 1.46 ,?.81 2.82 2.69 Z.b3 2.41 2.37 Z.zs 1.0s .493 .43Z .23
.25
.40
.65
1.00
1.50
Z.50 M
4.00 M lfI.86
ZE-1
M Z6.94
.7.59
5.50 5.93
10.91 9.90
\b.45 22.S6 14.47 12,]s 10.79 9.76 8.65 s. 50 8,42 0.11 7.91 1.s4 1.17 6,99 6.60 6.511
ZO.Z7 26.S9 11,s4 I 5.4q 14.09 12. s9 12.36 12,24 11,04 12.57 11.10 10,73 10.37 9.89 9.!34 2).s0
5.JZ
4.77 4.44
T I
M M 31.6q 29.43 40,47 3b,90 33.95 30.66 21.06 2?.90 19.36 2%92 17.40 17.19 17.03 16.55 16.20 +I $.64 15.11 t4.14 14.i5 23,79 23.41 z3. zi 22.38 ?.2.26 ,?1.63 21.0$ 20.31 19.88 19.02
10.00
1s.00
.214
,>36
3.96
5.98
-t-t
.z3q
-L
I4.1O
TABLE
-!5
~ ~$
Maamr Table #or Redueed Zmpecticmfor Plan, Baoedon VSrlabillty Umkmwn (Doubl* Speclficalion kltand Form ?-Single SptcUicttion LlmII] Acmptablo OuaZ{t I I Smnpl* 81SC Samp10 cede letter q IX* .065 .10 .15 I ..?5 I ,40 I .65 I L M[hIl MIM IAVCI1 1.50 M 2.$0
inM
10.00 -ii-
1,
10 15
LZS M
25
30
05
ML bad table waluec tra in pcrcmt d. f.ctlve. %deZ3rdt #ampNnszdmb.kw.rrtmr, that,,, betb ccmple,l.ea~
$ $ II
1.910 1.?10 1.910 1.910 2.234
MM
MM
Z.474
Z.405
z. 379
.253 .336
.21
. I1!
7.59 7.59 1!59 1.53 10.92 9.90 1.42 3.44 3.46 !.93 Z8 1.99 5.3Z 4.77 4.77 4.44 3.96 8.47 7.42 .58 .58 l,i 2.05 1.23 ).Z3 1.14 I,JO Z.05 7,42 6.76 .786 Z.10 3.11 .S27 .827 l.z7 1.95 Z.8Z 2.82 2.81 S.9.3 5.98 1.21 1.95 1.96 3.96 3.92 ,S56 .883 1,29 5.88 1.33 1.98 2,82 .75.1 ;755 1.16 1.74 2.47 3.90 3.44 5.85 S.17 4.97 l.l Z 1.67 2.37 3.30 weNa* MvsJu*. WI..SamPle
1.99
18.06
26.94 26.94
33.69 33.69
40.47
18.86
40.47
18.86
Z6.94
33.69
40.47
1.s.86 16.5
26.94
3J069 29,45
40.47
2Z.8b 20.Z7
36,90
14.47 If?.Js
G-
33.95
17.S4 15.49
Z3.SO. z1.06
JO.66
21.90
.430
14.09
19,30 17.48
Z,MB 2.358
.214
.506 .506
IZ. S9
,214
.136
Z.353
.240
.366
.537
z.349
.261
,391 .356
.564
Z.339
.144
.504
Z.J3S
.242
.350
.493
&
8.50 8.42 7.54 1.Z7
8.65
IZ.S9
17.48 17.19
12.36 la.z4
17.03 15.64
11.10 10.13
21.63 21.05
15.17
10,
... ..
-.
TABLE
C-5
Tabh for EcUmatInI lha Lot Percent Defective USIIIg Rans* Methedl
L-...
. ..-
TABLE Ttbh
C-5-ConUINed Method
.
. . .,
..
,.
,.
.
.- ... ,.. . .
,..
. .
;,. .. .. ..
I..
,-
,.
. t.. . ,,.
. . ,,,* ,,.
,.
,..
* .
. . . .
6..
. . . .. . ,..
4..
. .
4..
,..
.* ..
t.
*
,.*
a
)..
..
..
,A ,a l.. ,.
,..
,,.
,.. ,,.. ,,.
*..
,.0 ,.
,.94 .
1..
.
.
,s ,.
9,.. m
1
I
TABLE
--
TABLE
C-5-Continued
:!
Table fer Eotlmatlng the l-al Percrn! Defective Uolnc Range Method
.. .\. .
. . ..
ESTIMATION OF R=UCED
AND
CRfTERfA
f=OR
3NSPECTION
C 13. fig~MATION
OF
PROCESS
AVER-
corresponding e.limated lot prcent dcf. cor p . rempecfivel~, is red from Uve p the ta~)e. Tk ..tirnated proce.. .ver.~e
Tbe .verag. percent defective, based ~POa q group of lot. .ubmttted for c.ri~iii.l In. pectmn. i. called [be prc.ce. a q verase. OrigiM1 im. pectiert imthe fir.t inspection of . particular quantity Of product .ubmitted from the le. qcceptability . . diati~uiah.d ia. pe. tion of praducl which hambeen re. ub rnisted after prior rejection. The pr.acc.. q vera~e shall be e.timated from the remdtm drawn from . .pec of im. peetion of qmple. Uied numb. t of pr. ceditq lot. for the pur PO.. of delerminiag .everity of imapection durimg the .our. e cd q co=t?.ct in aecordaace with paragraph C14.3. Ay lot .bdl be incitided md, ante (m rt.dnutfri~ chm proc... avera~c. The e.timate of thepmcc.. average i. de. igriated by p wbem cwnpuc.d with rempect tc. q n upper .pecific.tion limit, by (JL -b.. ..mP.ted rnth respect to a lower .p. cifi..tic.n limit, and by p when computed with respect to q double .pecifi..t ion Ilmft. . C13.1 Abnormal R.. uft.. Th. ra.ult. of ic!. pectitin of product rnamuf. cmred under ccanditions aot typica3 of u.tmf production hall b. excluded from the emtimaled proctm. q verage. Cl 3.2 Compufatio. of tbe EsUnmted ProCe.. Average. Th e estmuted pracemm q vmr .;. 18 the a%hrnetic mean of 4(I. e-hated lot percent d. fecti.=m computed from tbe qampliag i.. pectioa re. ufto of the precedlmg ten ( 10) lot. er q . may be otberwi. e de. ig matad. & order to eatim.t. the lot p.rcem defective, the qua3ity hdie.. Q andlcw OL 9ball be Coin q d for aach lot. Tb... ua: Ou = (u-X)C r X and Ot, = (X- L)c/IL (See parwraph Cl 1.2. ) C13.7..1 S&l* Specific& 3An& Tbe emilmuea lot percent d q 1 eetlva qbQ b. d.Iarmin.d from Tabl. C-S forth #_ ti.d tuetbod. T& qdity M-x Ou on the r~c 6
% i~ the -it f-=*ic M-= Of thepus. Sim individu~ -.titn.ted lot percent d. fectiva.
q.=r8ge PL itarly. tbe estimti.d proces8 i. fbe srifhmetic mean of the individual estimated lot perceot defective. pL..
Spccificatioa Umit. The C13..?.2 Dc.uble e.timateii lot pe,=.nl de fcct, ve shall be determi~ed {mm Table C-5 fc.r the Plan. baaed cm the rmt~. method. The quality iridice. OU and OL shall be computed. Table C-5 is cmter.d #.parately with Cfu ad QL q nd the .ampfe .izc, and the c.rrespohdi:g Pu PL q re read from the table. The q sti-d m.ted lot percem defective i. P . PU + P . q verage p i. ct+ q Tb. e.lirnated proce.. q rithmetic mea. of the i.divid.af ..tinuted 10I percemt defective. p,..
C13. Z.3 Special C.. e. If the quality iade. Ou or 01. i. . aegativ. amber, lhen Table C-5 i. entered bydi. regarding the negative .iar.. Howcwer , ii. thi. c-.. the ..timat=d lot perce.m defective above the uppar limit or below the lower limit i. obthic.ed by .ub Cr.cting fh~ percentage lc.und in the table from 100%. C14. NORMAL TIGHTENED, DUCED IkSPECTION AND RE-
qunplfng Tbia Standard esmblisbed P(U far normal, tightened. and reduced IEmpectk.n.
C14. 1 At Start of fa. pectiom. Normal inspection .hd3 be used q t the start of ias PeeU& uateoc otb.rwise dacignated. C14. Z ZturirIg 3aspection. Qurimgfhe courm &xctio. sbdl be of iwrnctiim, normal Coaiitimms are quch UDd vba. imspoctian (&85 tibteaed or reduced iMmcc?ion io not -itb paragrmpfu r.4dTd Lm q ccordume C14.3 d C14.4. Cl 4.3 Tisbtened fxukmcfion. Tishw..d ia9D0ct10m 91M31 be ttmtituted wbem tbe estj J td &t&f procemi qverage computed from
tb8 cu. d . tir q p.cuictiom ulmlL T&l* c-s b tirti dfb C)uor QL q nd (h* qrnfla qti=. d ~*
Ific.tlmi Mrnft er Q~ ler
q bd
uood
for
tbae~e
ti
u-r
~.
prec.di.# t.. ( 10) lots (or quch other aember of lot. de.i~nat.dl in q ccmrdaoee .ith para~raph Cl 3-Z is greater than th= AQL, T of sod when mere than q cc.rlaln ~r theme hats have emtimatea O! the percem delecctve .xecedisg the AQL. Tba T-values qr.give. ln Table c-6 for tbeprocem qwer,r age compted from 5, 10 or 15 101*.8 r40rmal in. p.ctioa hall be reiiut.ted i[ the q verane of Iota her e.tinuted proces. Cightea.d im.pecxic.n is qqtd to or le.. tkn the AQ t.. Iled=ced inCl 4.4 Reduced ln9PccUon. qpecti.a rrmy b. uutitutad providd that all of the following conditions q rc catiafied: Conditioa A. The preceding ten {10) lot8 (or .uch other number of Iota deaigrmted) have bee. under norm81 inspection and non. ha. be.m rejected. thmdicioa B. The ecttnu:ed pereemt defective for each d theme preceding Ietm ile.. than tbe applicable lower limit #bow. in Table C-7; or for certain qampiius plar.a.
the q stimat.d lot percent defective i- ~ vclfied ~r of towauto sero for b q tiv. 10CC(see Table C-?). COmdItkl c.
Production
i-
qt q
qteady rata.
Normal Iaspectlen one of the following reduced ia.~ctiOU. Cmditbm
qva q hall
M my ti.r
D.
condition E. Tbe q ettmatad procema age 1. greater tbao tite ML tkmditi.. F. or delayed.
1.
Prehcttom
Dtber
become,
irregular
Camdittc.a G.
may warrant b. r.ltwtated.
Umt normal
Cl 4.5 SPling PIUIO for Tfuhta.d or Re dimed LompeCroon. Sam #w P~ i or tightened -d reduced in@p@ctioa q re provided in Sectio. C, Partm 1 aad U.
... ,...
..
.. ..
.. .. .
Qa
MIL-sTD-414 11 Jme 19s7 TABLE VA.e. Sample code #ix. .04 . .065 . C-6 k.spcction
ectke]
Range
Me3b0d
letter B
.10 .
T?.
1.0 .
6.5 : 8 : 9 4 1 F10 4 7 10 44 78 10 4
: :8 10 .4 7 10 4 7 10
1: 4 11 4 8 11 4 8 11 : 11 4 5 10 1: 4 8 11 4 8 11 4 8 11 4 8 11 4 a 11 4 8 11 4 8 11 5 10 5 10 15 5 10 15 5 1s 5 10 15 5 10 15 5 10 15 5 10 15
z > 4 3 4 5
z 4 s 3 5 6
z 4 5
T -L
q
3 5
2 4 6 3 5 7
23 44 56
3 5 7
:7 89
2
8 4 6 9 44 77 99 44 7 :9 4 7 +9 4 7 10 4 7 10 4 7 10 ; 10 4 1! 4 7 10 4 7 10 4 7 10 4 1: 4 7 10 4 e 11 4 a L1 4 ,?
d4,4 44 7 10 44 7 10 1: 1: 4 78 10, 4 11 44 80 11
44 67 99
11 : 11 4 8 11 4 8 11
G ,H
1: 3 :
! 3 ; 3 :
; -3 5 7 3 b 7 4 6 0 4 6 8 4 6 9 4 7 9 4 7 91 4 1:1
: 3 b 7 4 6 8 4 6 8 4 6 8 4 6 9 4 : 4 7 01 .4 :1
! 4 6 e 4 6 8 4 6 9 4 : 4 7 9 4 ;1 4 7 0, 4 :1
: 4 6 s ,4 6 9 4 : 4 ; 4 7 9 4 7 0 4 7 10 4 :
1; -t--t 4
11 4 -8 11
.1
3 5 7
; 7
: 7 4 6 8 4 6 a 4 6 9 4 7 9 4 Ii
: 10 4 1: 4 7 JO : 10 4 a 11 4 8 11
: 7 4 6 a 4 6 a 4 7 9 4 7 9
$
11 44 a 11 1: 44 88 11 4 8 11 11 : 11
: 11
: 11 4 8 11 4 a 11 4 8 11 4 a 11
10
15 10 15
$
4 8 11 4 8 11 4 8 11
4 8 11
5 10 15 5 10 15
44 80 11
11
15 uid MLvm3umm.
----
Q-lx
Aff estimates
=%!7
.10 .15 44 77 10 10 4 7 10 : 10
of the lot
The S-D fiiwm in each block refers to the precedim 5 lot., .preceding 10 lots and lhc bottom figure to the pre&ding I S-lot..
z m z IT
Vale.
d T for Ti@t-.d A. ce ble Ouatit .40 5A ,.1s [ill 1.0 ..?5 .6s 4 1.5 4 4 788 10 11 w 11 44 f5a 11 11 44 a8 II 11 I I 1 44 laa 11 11
11
11
11
4 a !1 +
: 11
4 a 11
4 a 11
45
10 15 to the
1:
the middle
li~rc
of percent Tightened inspection i. required when the number of lots with q .timatem defective above th= AOL from the precedin~ 5, 10. or 15 lots i. ~rester fhan the given vtiue of T in the table, and the pr-.e=m averaae from these lat. exceeds the AQL. percem defective are obtained from Table C-5.
al
C-7
RWISQMethod
Number .?.5 [42]*. 4.0 [28]** 6.5 [18]** 10.0 [121.. 15,0 [ 9]** or z.ato
.065
q
.10 o
.1$ *
.25
q
.40
q
.b5
q
I ,0
q
[45]**
(31)**
[221..
[15j**
[[O]**
( 7]**
s 10 Is s 10 15 5 Jo Is 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15
[)1]**
[25].*
[18].*
[II]**
[ 9]**
0.00 4.40 6.50 .19 5.74 b. 50 .?.04 6.06 6.50 3.27 6.50 A 4.27 ..50 , 4.52 6.50 a 4.11 6,50 A
.74 9.96 10.00 3.s2 10,00 b 4.92 10.00 & 6.30 to.oo & 1.40 10.00 A 7.68 I 0.00 A 7.91 10,00 i
[JO]**
[23]**
[17/..
[13]..
[IO}**
.00 .35 1.84 .061 1.37. ,2.30 .5)6 1.94 2.s0 1,12 2.)4 2.s0 1.27 2.42 2.s0 1.39 ?..47 2.s0
0.00 1.84 4.00 .s3 3.01 4.00 1.41 3.63 4.00 2.20 4.00 , 2.42 4.00 L 2.S7 4.00 b
[191** [141**
[II]**
.000 .008 .158 .006 .19z .466 .112 .422 .65 .16.2 .478 .65 .202 .51b .65
I 5.00 i 11.01 15.00 1 12.13 I 5.00 & 12.43 15.00 A 12.65 15.00 A
[12]**
[loI**
[ 8)**
.000 .002 .0.?0 .004 .047. .096 .010 .061 .118 .017 .075 .131
.000 .015 .014 .014 .101 .199 .028 .110 .230 ,042 .151 .24B
.000 ..060 .199 .04Z .209 .174 .069 ..?52 ,40 .094 .281 .40
.Z48, .498 .755 1.26 1,00 1.50 .326 ..522 I ,00 .Jsb .861 I ,00 .600 1.34 1.50 .691 1.39 1.50
q Th-rc ~rc no tunpllng plmo provided In this Standard for the-e code Iettera and A(3L vduos.
.
I
TABLE
C-I-C.mthtued
RUIIO Method
TF
.002 .013 .0Z6 .004 .010 .033 .007 .023 .036 .Olz .Ozfl #.04Z ,015 .013 .04 ,00s ,021 ,010 L .010 .016 .0s9 .014 .041 .064 .Ozz .051 .065 /.oz9 .056 .06s 5.5 N
,04
,06S
,10
T
.0Z4 .087 .144 .036 .1OZ .1s .046 ,112 .15 .064 .1Z9 .15 .078 .139. .15 .093 .146
.076
2.5 1.40 2.50 & .140 .332 .40 .Z88 .581 .65 ,326 .6o4 .65 ,509 .94.? 1.00 .562 .968 1.09 .648 1.00 i .109 1.00 .857 1.47 1.s0 .92i 1.50 b 1.6,? 2.s0 & 1,7Z Z,50 A
.012 .049 .088 .020 .062 .09? .07.6 ,069 .10 .0)8 .0 z .1)
y
4:00 i 2.86 4.00 k 2.99 4.00 b
.0 It .08 .10
333
.190 .Z5 6.50 A .09Z .z06 .Z5 .174 .35Z .40 .z16 .378 .40 5.2Z 6.5o 1 tt-t.Izz .2Z6 .25 .144 .Z)a .25 ,389 .636 .65 l.o4l 1.50 A 1,87 2<50 A 1.90 Z.so b .246 .391 .4044A .434 ,65 1.119 1.50 3.19 4.00 A 1.32 4.00 1 &
5.01
11.o~
19.00 b 13. z7 15.00
5 10 15 5 10 15
.?.08
Z.50 & Z.15 2,50 &
q re
.1s
El&E!!
,103 1 .149 k AQ Ipt tholI In the bracketm,
q re
N]
T#
5.BO 6.5o l&A 9.15 10.00 14.OZ 5 15.00 10 5.90 6.50 A 9.Z7 10.00 11 14.15 1S.00 5 10
AA
15
1s
Is
Wm. tht (Irml flsu?o In diractlon O( arrow aad corree~adin~ number of Iotn. in e~eh bl~ck tho top (Inure prccodkng 3 Iota, the mlddlo Npre to tho preceding 10 Iott, and the bottom figure to the precedlal 15 lots.
ref. r# to the
Reduc~d Impaction may bo Inotltuted when every emtlmmed lot percent defectlv~ from the preceding 5, 10, or 15 IotmIc bdew the figure @iven la the labl~ raduced impectlea (or sunpllng plum marked I*.) in tbe table requires that the e8tImated lot percent defecllve la equa2to -ero, for the number of comecutive Io!* iadlcsted !n br~cket~. in tddltlam. dt other condltiom for r-ducad lnapection, In Part 221 Sactlom C, mumtbe q attmii*d. et btlnmtem of tbe lot percent defective ~1 q obtained from T.ble C-5.
:! !,g g$
,
TABLE Vducs Of f for h{dmum $ample #lz* CO* Ienor B c D E r G n I 1 % K L M N 0 P a Slrnple 91s* 3 4 5 1 10 15 15 30 35 40 50 60 85 115 175 230 .444 .4[6 .411 .408 .402 .396 .190 .J8Z .460 .412 .426 .4?.3 .417 .411 .405 .398 .)92 .384 .384 ,477 .447 .442 .438 .4JZ .426 .419 .412 .406 .399 .197 .529 .49J .463 .457 .454 .441 .441 .434 .427 .421 ,411 .41z .04 .065 77 .756 .764 .804 ,64z .572 .537 .531 .527 .519 .503 .505 .6OZ .567 .56o .556 .548 .542 .533 .525 .517 .300 .507 .78.9 !801 .846 .677 ,637 .6OO .593 .588 ,580 ,573 .564 .555 .540 .5)8 .516 C-8 Average Range (hfARl de/cctive) 4.00 .865 .891 .923
2.50 .811 +
1,028 I
1.180
.816 .857
--t-%
I I 442!3
.517 .486 ,480 ,416 .469 ,463 ,542 ,509 .503 .49?
.910 I .985
.730
.68.9
-t.649 I .707 .642 I .699 .6)7 j .694 .628 I .684 .621 .676 .666 ,752 ,740 .129 I .720 I .708 I .843
I 1.004
.4?2
.486 .478
.96)
it-
,455
.608
.830
.618
I
I
.6OZ I .656
.318
.371 .369
i--l--
,s08 ] .194 I
The MAR may ba obtdaod by multlplyin~ the factor f by the difference between the upper .pecificati.an limit u .nd lew. r speciflcallon Ilmif L. The formuh 1- MAR . lIU-L). The htAR serveB as a guide for the magnitude Of the average rang, of Iha ounpla when uaia# plant for the double opecUicatian Ilmit .ca#e, based on the average range of the munpla of .mbm.wn varlabUity. Tha werap ruge of the .smple, tl It.ls Ieoo than the 5dAR, helpc to inoure, bd doe- not [utrantee, lot accept. abiflty. NOT&: There h t eorreopoadkg occepfablllty constant In Table C. I for eqch .aZue of f. ccepttbillty comtant of T-ble C-Z in T~ble C- I md u-e the corre~pmtding value or f. tht q
For
mMlmitfO.s
SY@.?!
m
Read
Definition.
sample
X bar
q ike far
single
lot. meam of
x
R
qmple
mea..
r.m.rm
Range. The difference betweer. the Iarge. t and qrnalle.t mea.ur. mests in . .. bgroup. & this Smitdard, the #ubg.o.p site <s 5 except for them= plan. in which m . 3. 4: er 7. in size. which ea.. the qubgroup i. the same a. ths .ampl. Range e: the fir. t subgroup.
Range d
the
qecond
subgroup.
R bar
Aver.~e ruag.. The arifhn-.etic mean of the rug. values of the subgroups ef tbc sample measurcm.nta [ram q single lat. Upper faumx spec Uication apecificstien limit. limit. conctanr given in Tables C- 1 nc.d C-Z
u L k
c O Q
qub q.b
The acc.pcability
A factor u.ed in determinizi~the quality index when using the range method. The c values q re given is Table.. C-3 and C-4. U L Ouafiry Ouafiry fmdex for .= wijh Table C-5. C-5. defective above U from
Qu QL
I
I
Pu
p .ub U
L P
qub
f.
defective defective
for
below
L from
p = Pu + PL.
q mtimam.
defective
sample
in Tablmm C-3
M,ub.
percent d. fecfive above U gi.em in Tables use wbem differenf AOL valuca for U and
ML
de f.cti.. blew f. Siv.m in Tabfe. ~uxn mflowmble pert..t C-3 and C-4. fF~r u.e -ha. different AQL value. for U ad f. q re cp=dfied.) p bar p bar #ub V p bar suh L
P $U FL T
p.rc.m
defective.
i.e..
Cbe
proce..
..era~e
q verage
lf-mit. limit.
pro . . . .
.pecific.tion
um number of emtintated proces. a.er4ea w~cb The mmay exceed the AOL given in Table C-6. (For use in deffr_ WW+fiCafiL= U fi~ht=aod Ampeefloa) 8s
..
D
KNOWN
SPEC1fICATION Dz.2.2
LIMIT Acceptability
01.
SINGLE
This part of the Stand~rd de.tribes tbe prOc=<u, =* fer u*= with plan- fOr q qin81= .peciftcac ion limit whe. variability of the lot with rcapecl to the quality chbracteri. tic Tbc acceptability criterion i. i. known. givcm in two equivalent form.. The.. are identified am Form 1 q nd Form 2. D1. 1 U.c of Samplinu Plan.. To determine the qcceptability whether the lot meets criterion with respect to q particular qtmtity chsracteristi. and ACIL value, the applicable .ampling plan shall be umed in accordance with the prcwi. iom of Sectic. n A. General Plan.. q nd lhose in Description of S.mpling thi. psrt of the Standard. D1.2 Drawing of Sag. be dramt i. qccarrJa.ce All -ample. with para#rmph
Com.tant. Th= q=c=Ptto the SUTIple is. mentioned in paracraph DV..2. I, im i-dicated in the column of the maater tabl* pplicable AOf.. vafue. corre. p.amding to the q Table D-1 i- .ntered from the t.pf. r normal i.. peetion q nd from tbe bottom for tightened im.pection. Sampling plan. for reduced ic.apectioo q re provided in Table D-Z.
D3.
WT-BY-~T CEDURES
D3. 1 Acceptability
of conformance
(x- L.)/..
Criterion. The dearof a quality characseri. tic with re. pect to a in~le specification limit hall be judged by lb. quantity {u-X)/_ or
qhail
A7.2.
I
D1.3 Determination of Sample Size Cod. T he m-pie Letter. 91ZC code,letter .hdf ~.cted from Table A-2 tn 8ce.rdmce with paragraph A7.1. D2. SELECTING THE SAMPLING wHEN FORM 1 IS USED DZ.1 PLAN
D3.2 timputation. The folio witas qu~tifY q ball be compute& (u-X)1. or (X- I.)l. . dependins on whether the .p..fficatiom limit i. u upper Or q 10wer limit, where U .L X e
Mntlt, llmit.
Master Sampliq Table-. The rzm. t.r fabJe. Ior planm ba. =d on v8ria imsle qeetfkattc$m ltmlt bttlcy ~ k? q q q re Tables D-1 and D-z. Tablo D-1 i- omd (m -rmsl Ind tightened tnapectiom and T&l. D-z for rod.ced icupectioa.
qamplms
btlltv Criterion. timpar. the - L)I. with tba qcceptqmantity qbifity coaatant L M (U-X)1. or (X- L)le i. tbb. tfmbg=-e~ ~ .quf te ox sroater qcc*pfabfflfy crtsertcud If (U-w. or ~- L)/. Is 18** tbn k or Decative. tin tbe lot dOa* mt mat tbo 8cc*pfAbtltty c rlterioa. D4. SUMMARY PUR 8mAuNGm..Az4wmz OPERATION N?onu OF 12s
8ampffnR PtM. Tbo Qu81i.a, wd M pli8* ph. C.nmmtm 01 q ,unpl* Tbe s~moclated qcceptability conmtant. from k.te r samplimg plan ia ebtahed
DZ. Z Obtdmimr
Table DLL,
D-I
q nd D-Z.
~pfe
Sise.
The ..niph
she
qhowa in t e mamter table correspoadhs AOL. each qampl. qhe code leffer &
lS.a Appcadis
m i. fo
[1) Determine [be sample sise coda letter from Table A-Z by u-lr.I Ibc lot qiM ad tba tipecftoa lee:. used in tba sunptiQz prO=eda.e. PIUU bned oavar~U~
Z~-~PIe
COmpfete .sunpfe
Of tti 67
mL-snb414 11 June 1957 (21 Obtain PI*. from Master Table 33-I or D-Z by sel=ctitag the qample .i%e rI qnd the .Cceptabitity Coti.ta-t k.
q Pecificalion limit. The p.rc.mtag. ef nomc.nferming product i q .;imamd b~ qnfcrTablt D-5 with the quality index.
lade-. The of Oualilv D6. Z Computation quality ic.de= QtI . [U-X) VI. .h.lf be corn. limit im u. upper puted if the 8pe; ification limit U, or C3L = fX-L) v/. if il is s lower limit L. The quzc.litie.. ~ and . . q re the ..mplc mean and known variability. respectively. The laclor v i. provided in Tables D-3 and D-4 corre. pc.ading to the .unpfe size. D6.3 Estimnte of Pert.nt Defective in Lot. The quality of q lot qhall be exprem. ed by Pu. the estimated percent delective in the lot q bove the upper .pecificstmn limit, or the qstimated percetit defective below by P ih. l- owcr specific alior. limit. The citimated by percent de~ective PU or pL i. obtaizted cmte. img Table D-5 with OU or Cfti D6.4 Acceptability Criterion. Compare the estimated 101 p=rcent defective p~ or pL llowable percent de fcc with th. maximum q ti. e M. lf pu or pL i equal to or le.. than M, the lot meet. the acceptability criteriotx if PU or PL is ~reater than M or U QU or L ~S negative. ~h=n th= 10t do= C@ IIWCt cn. acceptability crxterior.. .137. SUMMARY SAMPLZNG USED FOR OPERATION PLAN WNEN FOffhf the OF 2 IS
at random ~ha .unple ef u (3) Seleti units from the lot: inspect q nd record the tn. amur. merit of the quality characteristic Ior each unit of the q ample.
[4) Cornput. the .unpl. me.. X, qnd the quantity (u-X)/e for an u per specification limit U or the quamtity L)/. for q lower .peciiicatiaa limit L {f-
qlso compute
(5) lf the quatitity (U-X)/. O. (x- L)/a i. equal to or greater lhas k, the lC.I meet. the acceptability criterion; U (u-X)1. or (X- L)/W is Icaa :han k c.r eesative, them the 101do=. not meal the acc.ptabillty criserbn. D5. SELECTING THE SAMPL3NG WHEN FORM 2 3S USED PLAN
D5. I Master Samplirm T. bles. The ma.t.r m.rnpling tables for plans ba. ed on vari. Iirnil bilily knc.un (~r q .ingle specification q rc Table. D-3 qnd D-4 of Part IL Table D-3 is used {or normal .ad tightened inspection and Table D-4 for reduced inspection.
The D5. Z Obtainin~ the Samplinff Plan. sampl.ug plan .onsi. ts c.{ q ample .iz. qnd maximum qllowable perccnl an qssociated defective. The .amplimg plan is obtained from Master Table O-3 or D-4.
cedures
D5. Z.1 Sample Sise. The .ampl. .i=e ~ i. .hown in the rnasler table .x. rreaportdine to each s~mple .i=e code letter, D5.2. Z Maximum Allnr.. able P.rcecIt De~ereent fe<tive. The rnaxirnum q llowable corr.. i~ve M for 9UTIP1. q.timalc. poadkmg b tbe sample qi.e meatlomed i. r-wr~pb D5.z. 1 I* irtdicated in the Colwn. of the mseter table corrempoadiag to the ~PP1ic~hle AOL value. Tabl. D. 1 is acte, ed from tbe t.pfar .armaf inopecfioh and frc.m tbc bottom let tight.md tip.cuon. Sunplirig plans for reduced Iamfmctima.are provided io Table D-4. DE. ~T-BY-WT CEDURES ACCEPTABILITY PROWNEN FORM Z IS USED 3
Pro-
(1) Dele. rninethe .mnple size code cer from TabIe A-Z by ..ing the lot .ise the in. pecliem level.
141and
(2) Obtaia plmr. from Mater Table D-3 i=e U. fbe or D-4 by qelecting lhe qunple q df.wable perfbctor ., qnd the mulmum cent defeefiwe M. (3) S4ect st ramdom tbe .unple of n umits from the 10G irs. pect and record the nma.ur.nmnt 01 the qualhty charutari9tic on each umit of tbe qempl.. (4) Compute tbe sample meX.
Db. 1 Acceptability Criterion. The de~ree of con>ormae.ce c.f q quality eha~aeterimtic .pecifi. atio~ limit with respect m q .iagi. .hdl be judpd by the prc=a of ~~conformimg producl nutside tbe upper Or lm.er S=. EXamPI. D-2
far . complete
16) Determine the qmtimsted lot prcasd defective PU or pL fram Table D-5. of thl. 88 precedure.
exunple
MUA7D-414 11 Juoa 1SS7 (7) U the emthrmtcd lot percent de f.c UW* pU or pL im eqtml W or Ie*a ttmo tbe maximum atlowable percent defective M, cricerla~ the lot meata thm qccaptabiii.~ u QLu h r nesattve, = thea the let M ad 4Z deem f the =ccopMbUitY criterion.
EXAMPLE &Ample
D-1
of Ca3ctiiiam
Form 1
Example
The qpecif ied minimum yield point for certain qt4el c~-ttags is 50,000 psi. A lot of 500 item. im wubmicted for inspection. lo bpection Level IV. normal Ia.poction. The variability . i. knowm te be 3000 p-i. From with AOL . 1.5S i. to be u..d. SUPW9C fhe Table. A-Z and D-1 it i- seen that q mample of qkc iO io re.autred. yield point. of the qunple specimen, q re: 6Z,500; 6z.000; and rompliame 60,500; 68,00(h 59.000; 65.500; 61 ,000; 69.000; S6.000; 64.500; criterion i- to be determined. Expluulion
Information n .
Value Obtained
io
3.000
IX 630,000
2 3
4 5
ZXln
L
63.000
58,000 1.67 k Compare (X- L)/. 1.70 1.67 c 1.70
6J,000110
I I I ..
b 7 8
mot meet
the =eceptabi3ity
critmriom, dnce
(X-L)!.
is le..
th=
~ tm i.
I I
NOTE:
ksie upper specUiCatiOn ltrrdt u i. SWen. tbeh compute If q q b d compu~ it with k the 10C meet. the .cceptabiiify lbequal to or greater tbui k.
I I I
89
Example
The specified mimimum yield poiuf f-r certain .teel casting. . . .in S8.000 psi. A lot or 500 item. is submitted ror inspection. inspection Level Iv, normal lnspectlon, with AQL = 1.5% is to be u.ed. The variability e is known to be 3000 psi. From Table, A-2 and D-1 it is . ..cI that q sample of q ize 10 i. required. .SuPpa. e the are: yield points of the sample mpecimen. 62.500; 60.500: 68,000; 59.000; 65,500: 62,000; 61 ,000; 69,000; 58.000; 64,500; and compliance with the qcceptability criterion is m be determined. Explanation
Line I 2 3
4
Know. Variability:
630,000/10
5 b 7 8 9 10
ltiwe r):
f-
S8.000 !.76 3.927. (63.000-58.000)1 3,000 Se. Table D-5 D-3 D6.4 .054
OL : (X- L)v/o 1 L M pL
Crcent
Compare
since PL is great=r
than M.
ff . sin 1. upper .pecific.tion Iii-nit ff i. given. the. compute the qu~lity index Qu = defective PU. compare PU (U. XIV . m lme 7 and ebtain the sstimale -f $he perceml if pu i. q qual 10.0. 1.*S than Mwith W. the 1.s rn. et. the qcceptability criterion
F-
90
-------
. .
..-
.-
TABLE D-1 Matter Table for Normal and Tlghtenad Inspection for Planr Baoed on Varlablllty Known (Single Specification Lkmlt-Form 1) ccepttble Ouallty Level? (norma2 Inopaction] Sample 91*c code letter n B c D E F G H 1 J x 5., M N o F 3 4 5 6 2.58 2.63 .?,69 .04 k n .06S k a .10 k .1s [ [nklnklnkl I .25 [ .40 I ,65 ak
3 4 6 6 7 8 11 15 20
++
.
1
I
I
1
I I
,
I
I I
,
5
2.05 I I I 5 1,25 6Z.0* 8 9 10 12 14 2.13 2,13 2.16 2.la 2.21 2.21 2.29 2.33 2,34 .65 I I I ?. 1,95 8 10 1.96 1.99
2.39
2.30
2,14
S 6 -1 8 9 11 16 22 31 42
2.46. 2.49 2.s0 2.54 2.54 2.59 2.65 2.69 2.72 2,71 .15
62.2, ? 8 9 II 2.25 2.26 2.29 2.31 2.35 Z.41 Z.4J 2,41 2.48 ~o
2,12
2.7? 2.7? 2.81 2.88 2.92 2.96
1
8 10 14 19
12 I 1? 2)34 45
13 19 25 31 49
I I I
21 27 40 %4
r1=
27 10 2..94 37 2.97 ~ .063 .10
. ---
TABLE D-1-Conl[nud Maoler Table [or Normal and Ti~htenid Znopectionfor PlarJI Based On Variablllty l(nown (Single Speclflc.tlon Limit-Form II Sample q Ic* code Ietlar
=s ?1 ;. d z ~~ * 3
l==
I .00 n k
31ty Level# (normal Inmpeetim) 4<00 n . kink 1 1 I 6.5o I n 10.00 k]ak I 15.00
v I
2 2 1.36 1,42 1.s6 z
c
D
z 3 4
Vlvlvlvl
4 5 8 10 13 Is I 18 20 25 36 48 ,.,, 1.20 1.28 1.31 1.34 1.35 1.38 1.38 J,42 1.46 1,48 1.51 1.51 6.50 I , 6 9 12 Is lZI 20 .9,9 .991 I I , 7 .,.28 .197 .877 .906 ,924 ,942 .964 I I I , 8 12 lb ..20 24 27 .,,, .S84 .649 .685 .706 .719 .737 I
1.09
I --+-H%E 3 H 7 9 l-II 12 14 17 25 31 49 65
,? J 4 6 B
1.17 1.28
5 1.$9 7 9 11 13 IS 1.45 1.49 1.51 1.53 1.56 1.57 1.61 1.65 t 1.67 1.69 1.70
1.01
1.11 1.13 1.15 1.11 I [
11
14 17 21 24
1.s0
1.83 1.S6 1.88 [.09
1
f K L, M N o P Q
10
12 14 Is
I
1 I
2.03
2.04
1.50
I AI
I!fi::v,r,
AQL VdUS* q?E In Bercent dafectlve. at cunplkag plm baZowqrrow, that ln, both aunple site *8 well amk value, item in nzuat be kmpected.
idol
k
10 39 22 28 32 36 54 1.86 1.89 1.89 42 61 El ?1 2,50
Ill
=-b-t=-,
55 I.Z~ ] 64 1.05 ] , 75 .8I9 .841 82 109 1.29 1.29 95 1.07 1.07 I , Ill 147
t--I
70 93
I t
I
127 .045 I
4.00
10.00
15.00
I
I
Acceptable O
When S~ptO
TABLE
D-2
Msomr ~nbte for Reduced Zn8pectionfmr Plant Baiedon Variability bon (Sinlle SpecUicaIlon Limit- Form 1)
a
Sample aico coda Inttmr .04 } 8 k m 25 c D E r G 34 1 I J K L
.065
132.
914
4 4
2.ss
5 5
2.46
r
39 I
3 3 4 5 5 6 7 la 17
F17 R
n knk n knk Z z 1.3b 1.42 z ,.581, 1.b9 I z 1.94 z 1.01 1.91 1.91 3 1 2.07
II
1.S.6
3 4 6
2.07
s b b 8 9 14 21
M N
2.55
k 7
-=-H-i =-l-=-i
5 l.aa b 1.7a II 10 [.99 I II 1.86
6 6 11
b 7 11 16
0 P Q
a
13
15
19
4*
:.
TABLE Masltr
D-2-ConUnued
:s :8
Table {m Reduced kicpectbn f.? I?lan. Breed On Variability IGI.Wm (Sin@Speciflcatlon Limit -F.atm 1)
..
Acecptable C2uaIityLevelt Smple Siso code letter n B c D, E F G 53 z .1 J K L 1.00 k I n 1.50 k ! m 2.50 k ! n 4.0 k I n 6.5 k n k
a a
9 4
2 1 4 5
2
3 4 5
3
3 5 6 6 9 11 12 15 18 29 42
.755 .8.35 .919 .991 .991 1.01 1.11 1.11 1.13 1.15 1.21 1.24
J
4 5
.573 .641 .1?.8 .797 .797 .877 .906 .906 .9?.4 .942 .995 1.03
=--l
6 ,515 0 8 !2 16 16 20 2.4 18 56 .584 ,584 .649 ,685 ,685 .706 .719 .770 .803 I
1 1
11 14 14 17 21 33 49
41.53 b 1.62
II
1.60 1.60 1.70 1.?2 1.79 1.84 I 9 9
a
S 10 12 19 28
E
M N
11
13 22 32
13 \s 25
36
Psrt n DOUBLE
SP3ZC3SXATZON Lfb4ZT
FOR
DO CfBCE
This part Of the Standard describma the procedures f.r use with pftis for q double Specific-tiom limit when variabttlty of the lot =ith reopact to the qtmfky c~rscteristic i. known. DE. 1 U.* Of SUnplimc Plan,. TO determine w%the r the lot meets the qcceptability cri qu~i~ le.-ion with ?=*PCCX co q XrtiCtIISr characleri~ tic and AOL vazuels). the applicable qampliag plan shall bc u.ed in accordance with the prwimic.nm cd .$ection A, Gea eral DeacriptiOm of SkrqdiW Plmns, md those in this part of the Standard. D9. SELECTWG A sampling .h.11 be selected [0110-s: THE fMkfPLfNG PLAN
the lover Itrnlt. M4 by MU for tb= UPWr limit. u one AOZ. i- qssigned to bath l~ltc combined. demipte tbe maximum A31.wable p-rcerd defective by M. Table D. 3 is entered tipeczton and from from the zop for uornuz tbe bosom for ttghtened imopectdon. Sampli.s plans for redoced imcpeczion sre prOvided in Table D-4. D1O. DRAWING OF SWLES be selected A7. Z. T In accord-
q nce
D1l.
ACC~PTABIIXl%
D! 1.1 Accepi.bility criterion. Tbe degree r.cleri~ tic et conformance al q qutiltY c with respect to a do~le sF&c Ification limit al ~con.ihll be judged .by tbe perce~ The ~TCeIIUSS Of Wafarmiog product.
.IJaforzniq product La estimated by enterkg
...
--
D9. i Determination Of S=mple Sise Code Letter. T he qample q ma cade letter .bfi b~.cte.d [ram Treble A-Z in mecordamce with paragraph A7. 1. D9. Z Master SamPlinE Table.. The maater SUnpl-es ier w bs. ed on wuiabi3Itit q r= ity known for q double cpecific-tti T=bleD-3 and D-4. Table D-3 11 u~ed for .O rmal amd tightened izupection ud Tmblc D-4 for reduced inspect.ion. D9. > Obtaining .sunpli.g P1_ A qunpliag q 2*, d M q s80plaa Celia, mt, 01 q qmple .dated maximum aflowsble ~rc=m defecPIti be qpp3Aed Jo tively). The quf@ins inspection shall be ebtahed from 3dmcter Table D-3 or D-4.
D9.3. 1 Sun 1. Si.e. The q unple qi.e #how. = t e master ~ ZAb3e. eorrecpondlag each qunple qtxe code letter -d AOL. m ito
Table
M-x.
D 11.2 Computation of Quality lndice s . The . (U-xwi e and OL= qua3ity iadices Q (X- L)v/c. qball be ~omputed, where U L X . is iis is ia the upper specification limit, limit, the 10wer qpeeificmion a facsor providsd in Table* D- 3 ~d tk .unple mean. and zbe ksowm wariabifizy.
D-4.
..:
~Iv*
.unpte .8Unut.* percent th4 Imr. nppe?. 0rb04b cp*ctfication limits co~ta.d. eerr*mpOndbs fa qize memfiomed in parasrmpb tb. sample D9.3. 1. i. #ho_ in the cdunm of the W18mter
for
.of
dafeectwe
for
applicable
AQ3.
m aa~isad w qxb speckficatlon Umlt. demtsuua th8 -tmmm tile-able percent defective by ULIOZ
es
+b *= s-Am .Uew*Ie P~z~ti delceuve M. 25 p u equaf to or lea- 3baa U ff the Id meeb the qccep3abUIty crUeri~ p ic re=ter tbm M or if Of) or Of. or both ml meet the .,* Itapfive. Umn the lot &es acceptabffity criteriam D12.1. Z Suna~ryef OP erati.n of Sunplia Plan. la caoe. where a .ingle AOLvtiue ~ ~bliohed for tbe upper and lower qpacififwle quality cation limit cornbim.d (or a q characterimtlc. the tolZowinS steps 8umma. ri. e th.. procedtwe. to be u.ed: (1) Determine the sunple qise code letter from Table A-2 by u.ing the lot .ize and the in. pectioa level. Table (Z) Select plan fr.am Mater D-3 or D-4. Obtti tbe .unpla si.e n. the factor ., and the rruximurn allowable perced defective M. of (3) .%], ct q l ra=dem the .am~le n unit. from the lot; in. pect and record the m... ttmeatat of tbe quality characcerimtic on q .cb unit of the sample. (4) COmpute the .unple (s) compute the quality ad QL . (X. L)v/.. mean X. indicem Qu
Pi
: D12.Z. Z summaryc.f operation ef sPlan. Za em=. wtmre q diflereot AOL -d lower t~c. ~ctabliched f., the p-r Aficatiom limit for a in~le qtmii17 character .tcp. . urnnmrime imtic, tbe ;dfowtbe prmcedurem fn be u.ed: (1) Determlae letter from Table A-Z d in.peetio. level. k. code the qunple q by uefa, the 105.&e
{Z] Select tbe san-tpliag plan front Mate. Table D-3 or D-4. Obtaio tb. ample .ise tI .ad the I.cter ., eorre.podirq to the lar~erof lb. two AQLva3ue.. dal. o the maximum .U.Ywable percerit delecgive. qnd M corresponding to the AOL va ue. for 1# e apper and lower specificatiea Y limit., respectively. mple of 13) Select at random the q n unit. from tbe 10C irIap. ct qmd record the mcaauremcm of the quality characteristic on each unit in the .arrtple. (4)
compute
tie .8mpIe
mean indiee.
x.
QU
..
= (U-x)vl.
(5) Compute the q~ty = (U- fov/. and CZL = (X- L)v/&,.
percent D-5.
(7) M tbe e. f.inuted lot percent dequal to er le.. than the maxi. fective p i. q mum allowable p.rceas defective M. tbe lot me. t. tbe acceptability criterion: if p is sreater than M or if Qu or OL o, both q xe =S~~V~. tfI*n *let doa - not meet ~e mccapc-bility criterion. DIz. z
&w.r Dlff8remt AOL Values .Sp.eUi.aUOO LiInlL for Upper and
@t (6) Determine the q.tImued p mud pL, correspond p.rceat de fectl.es ins to tha pa rc.af d. f.ctivec tie tb. upper and b.lmw the lower .pecific.tkm limit.. Afmo d.te rmine th. combined percent de f.c tive p = p + p~ . (7) u all three of tbe fallowing diuolta : l.) %. (b) pL i. mquaf 1. or lR.8 Mu
larger
~u
cc,ntbma
i equaf
to or 1...
ffun
D1 2-2; 1 Aceap4abflUy Crit9ria. 5 COirtfu*e the qstdnuted 1 pmrc~t defeetivem m.. h ot the cerro@omd4ng PU dth ~ -a..=bI= Perta=t de f==ttvew M d Mfj alao =Omi=r. P . Pfi + PU wittt k larger d ML mmdMu. lf pL sequmt taarle*attmm ML. P ic 9qtmf to or Ie*m tbul Mu. ad p i. q A to or lam than the larger of ML aad Mu, criterk the lot meat. tbe qecepbility
ts Or Ie*#fzlamthe
u. satiaficd, th. lot umato the ~C~tdiii~ criterk other+se. the lot does MC meet the =~ or both am A* aesativ~ tbeo * * criterb lot%::%
---
. .
mitdmnun yield 3,0311u[m cemd. steel rutimzN are The qpeclfie.d maximum ad 67.000 p. i and 58,000 psi, rucpceUvel y. A lot of 500 items is q tbmitted for impec tloa. 3nop.ct30n &val ZV. aornd insPct3aa, W3UI AQL = 1.5% 1- to be ..4. T& ?abka A-2 qnd D-> it i. seem fzut a variability c is &o-n to be 3,000 psi. Frati .unpl. of q i.e 10 i. required. SuPpu. e the yi.ld point. of the qample specimens q re: 6z, SOO; 60,500; 68.000; s9,000; 65.500; 6z.000; 61 ,000; 69.000: 58.000; 64.500;
qnd compliance
Lb. 1 ?. 3 4 Sample Know. lnIornutio. Size: n
criteriom V. I.e
is to b, determined.
Obtaim.d
Explanation,
10
o ZX 3,000 630,000 63, o0O 1.054 Untie: Limiti U L 67,000 56,OOO 1.41 l.?b U: pu 7.93% 1.92% 11.85% D.[.: M n . . 3.63S 11.85% > 3.63% criterion. da..
p = pu
Variability:
5 6 7 8 9 10
Est. of Lot Percen: 12tc. of &t TelaJ ~*t. Pu + P~ Max. PerccnI P=r=e=t
..:
11 J2 13 14 IA P& P -
A310w~ble Percent
cmn~r= .
the qccepzcbiflty
+ PL io sreater
97
------
.. .
D-4
Cafcutatimu ZAmtt
sp0dfka3A9n
V.rkatduty
Difiere.t
KaOwt!
AQL. Vti.ss
for Upp.r
&
lmwer
SpeeUicDtinm ZAmlt.
q re The .pecified maximum and minintum yield p0&39 for cer3mim oteel ca.tl~o psi -d 58,000 psi. reapectivdy. A lot d S00 item, is submitted for inspeeknspctinn with ML = 1%. for the uPP8r aad UO.. znspctko. *CI IV, uarnuf The vari.bilicy . is AOZ. . 2.5% for the lower tipecificuiom lkmit im m. be u..d. Frern Table. A-Z qd D.> it i. .... that q .unple cd ais. kcuaw. m be 3.000 pi. 11 c~rre. poridir..g to the s.rnple .ise code letter, 1, qnd the AQL value Of 2.S% i. mple specimenq re: required. S.ppc.. e the yield Pc.itis d the q
67.000
6Z.500; 60.500: 64.000; 59,000; 65.500: 6Z.000; 61.000; 60.631; 68.000; 62.000; 63,000 and cmnplisnce Lime
I ~ 3 Sample
criteria Value
Information Size-: n o
3,000 Ix 67.9,131 61,64.9 1.049 u L 67,000 58,000 1.07 1.28 u: Pu pL 3.07% 10.01% 13.10% Del. Abo.e U: % L 3.07s
-
rernen:.: XXIC.
4 5, 6 7 8 9 10 11 17. 11 14 15
UPPe r Specific atiort Lirnic faw. r Speci[ieatiea Index htdex: t au QL Limit: = (u-X)v/.
(67,000-61,648)1.049/3,000 (61.648 -SB.000)l.0491J. See Table See T-ble D-5 D-5 oOO
cent
E.1. of bt
p = pu + 3.07% + 10.03%
Se.
Allowabi. A31.wable
Pe r..mt Pe rcest
Tabl.
D-3 D-3
See Table
Acceptabilit~
Criteriw
PLI PI. 0
with Mu
(b] Compare with ML (c) Cemoare with ML The 10: dins. not meet fied; i.e.. pu q64U. pL > Mb
see Par*. DIZ..Z. Z(7)(a) see Para. 1312. Z(7)lb) Z, s.. P.**. D12. Z. Z17)(C) (c)
q re
Dot q*-
08
,: -. -.. .
..
,.
...
..
TABLE Matter
D-fl;
nd Tightened Ioapectlon ~or Plain Bamadon Known Vtriabllity Table for Normti q (Doubla 5pec{flcatlon Llmlt and Form Z-Single Specification Llmlt]
1 J K L M N
,.
I l! IJ 1 I
P Q
J!LJ__
AU AQ L id tabl~ who q m In pmcaat defective. q firm sunpllq plan balow arrow. that Id, bath mmpsa 01*4 as well as M valua. I:la., @v*r, Mm ,. tba 10, rnu,tb. SrIlpocied. When q ample q Is* equdo or q xe*sd*
lot
...
,.
TABLE MmIar
D-3-Con(lnued
Tcble for Normal and TI$ht~ned hmpectlon for Plma Baaed on Known VarlabIllty (Doubl. Specllic8tl.m Umit -nd 5orm Z-Single Speci[icztlm Limit) Acceptable Quality Level# [normal In#pectio,
1.00 m M v
1.s0
2.50 n he v n
4.00 M v n
6,50 M v n
10.00 64 v
I
m
13,00 M v
1
1.15s
?. 3.90 1.414 2 1 4
T
Mv
v 9.27 1.414
v 3 {1.14 1.ZZ5 3 15.60 1.ZZ5 5 15,21 1.118 6 13,s9 1,095 9 12.88 1.061 12 12.35 1.04s 15 12.04 1.03s la I l,n8 1.029 20 11.57 1.o26 z] 11.5b 1.023 39 10.93 1.018 42 I,).40 1.012 5s 10.17 1.Ooq 82 9.76 1,006
v
3 Z4.2Z 1.225 4 22.91 1.IJ5 5 Zo.ao 1,118 7 19.46 1.080
4 33.67
3 10.79 1..?Z5 4 5 B 9.97 1.155 B.9Z l.lia 8.62 1.069 8.43 1.054 e.13 1.041 8,13 1.035 1.72 1,029 7.80 l.OZb 7.34 1.021 6.9S 1.014 6.75 1.011 6,48 I .007
4 31.01 1.155 6 28.64 1.095 f5 2b.b4 1.0b9 12 24.88 I .04s 16 23.96 1.033 20 23,43 24 23,13 21 u;i) 31 Z2,51 30 21.77 56 20,90 ?5 20.48 [11 19.90 1,026 1.022 1.019 1,011 1.013 1.009 1.001 1.00s 1.003
*
7 5,83 1.080
b 2.s7 1.093
11 I 7.88 1.049 14 17.36 1,038 17 17.03 21 16.71 Z4 16.23 Z1 16.z7 3~ 1S.61 49 14.81 64 14.s8 95 14.09 1,031 1.025 1.022 1.019 1.016 1.010 1<008 1.00s I ,004 I
1 2.bZ 1.000
9 2.s9 1.061 10 ),63 1.054 II I 2.51 1.049 z 2.49 4 2.51 1.045 Iz 3.61 1.045
13 5.50 1.041 15 1$ 5.34 1.035 18 18 5,29 1.0,?9 Zo z?. 4.98 1.024 25 32 4.68 1.016 36 42 4.s5 1,012 48 61 4.35 1.008 70 81 4.34 1.006 93 I 4.00
14 3.43 1.038
M
N
1.038 1! 1.54 1.03s 1 2.3s 1.031 19 3.2$ 1,027 s 2.19 1.02! 2a 3.0! 1.OIE
o
P Q
3 2.12 1.o16 31 2.9~ 1.014 9 7..00 1.010 54 2,s2 5 2.00 1.008 11 1.82 1.50 I 2.50 I.ooq 1.007
I 47 19.84
A33ML ,~c::it
hd tabla vaheo qrt 18 percmt defective. sampling plan bet.- .rrc$w, that f., both .unp,e v-ry item In the 101muot bs hmpecled.
ct..
. . well .S M WIZ..
. .. .
TABLE
D-4
Matter Table for Reduced Znopectlonfar Plan@ Based on Known Varhbllliy fDmhlo Specillcmion Limit and Form 2Single Specllicatl.m Limit) Acceptable (lualhy mph Dim ode letter B c D E r a H i .04 I .065 [ .10 I .1s I Levels .25 I .40 I .&<
k
2( L M 1! o ? Q
AU AOL Ad Iabh VdUCi i?o in PO?CQ84 dafactlvc. I US* flrol mmPlkIs Plan hlOW qrrow, that I*, both mnv.le slsa T*?F Itim k~ha lot mutt ba inspected, {DISC, q
qs
well
qs
M vahie.
.-. .
TABLE
D-4-Continued
.Mmter Tsb2e for Redue.d Zn*p.ctl.n lor PlarM Bated on Known Vsrisbllity (Doub18 Specillcmtion Umit and Form Z-Single Specl{~cItiOn Umit] ACCI Ssmplo BI*9 cod- lqtt@r n B ~.
1
1.06 M v a
1.50 M v n
2,50 M
II
D 12 k G H 1 J K L, M N 0 P 0 1 2 3 4 4 b a 8 10 1z 19 28 v 3.90 3.00 3.85 1.87 3.81 5.77 l.be 3.68 3.63 L61 3.26 3.05 1.414 1.414 1.ZZ5 1.15s 1.155 1.095 1.0699 1.0699 1.05 4 1.04 s 1.02 7 1.01 8 11 13 22 32 1 3 4 5 $ 1 v 6.11 7.5b 6.99 6.05 6.05 5.0) 5.68 5.b8 5.6o 5.58 4.98 4.68 1.414 1.225 1.1s5 1.118 1.118 1.080 1.061 1.061 1.04 9 1.04 1 1.02 4 1.01 6 2 3 4 5 5 8 10 10 13 15 7.5 36 T 9.27 10.79 9.97 8.92 .9.92 8.62 8.43 8.43 8.13 8.13 7.34 6.95
t
1.414 1.2z5 1.155 1.118 1.116b 1.069 1.054 1.05i 1.041 9 Iz IZ 15 J ) 5 6 17.74 15.bO 15.Z1 11.89
F T
1.Z?.5 1.ZZ3 1.118 1.095 3 1.Z25 i 4 IJ.67 )l.O1 1.225 4 lZ.91 1.155 4 1.155 1.095 1.069 1.0$9 5 ZO.80 ).11.3 19.46 6 28.64 zi.b4 ? 1.080 8 7 I 19.46 1.080 8 t4.64 1.061 11 17.88 17.lb 17.36 17,05 16.71 1S.61 14.81 1.049 1z 24.08 z3.96 Z3.96 23.43 23.13 + 21.77 ?.0.90 1.045 1.033 1.033 1.026 1.022 1,013 1.009 1.045 14 1,045 1,035 14 17 1.o38 1.038 1.031 16 16 Zo 1,029 z! 1,018 31 I.olz 49 1.0,?$ Z4 1.016 I.O1O M 56
~.
. __
TABLE
D-5
TabIc for CotlmstInS the lat Percentage Defective for Plans Bared on tiowa Varllbilityl
Part Ill ESTIMATION OF PROCESS AVDLAOE REDuCED AND TIGNTENW A34D CRfTER3A 1NSPECTION ~31
D 13.
~:S#fATfON
OF
PROCESS
AVER-
the corr.
spondin~
.mti-
Th. q ve rage percent defecti*e. baoed tbmitmd for or~imal UPOn A 8r0.P 0[ 10U q in. pecticm, i. called Sbc proceaa average. OrlgirIal inspection is the fir-t Inope.tion Of q prticular quantity 01 product .ubmitted from the [or .eceptahslity q . di.tfngui.hed in. pectian of product which ba. b=cm re. ub after prior rajectimm. Th. procea. shall be ..tinuted frc. rn tbe re. ult. of i.. pe. tion of wampl. mdrawn from . q peeifi.d murnber of preceding lot. for the pur-
defective Pu 0. P L. ?*spectively, is read from #he ~bIe. The qverage pu i. the arithe.tinuted proces. metic m-u. of the Itidi.idual e.timated lot the e.ti percent defective. Pu q. Sinaihrly. nuted procems average p is the arithmetic meof tbeiadividdemt~atcd lot percemt de fect%ve. PL..
q.eragc
rnirted
pose of decermis.img severity cd inspection during lhe tour. e of q contract in accordance with paragraph D14. J. Any Iot. .htil be included OUZY once io e.timatitig tbe proce. a q ver average. The estimate of the prec... qt?. is designated by $u what computed with pecific.tion limit, by r.. pect to q n upper q PL wb=n cOmp~t=d rnth r=~p=ct tO q 10w=r specification Iirnit, and by p when cmnput=d with re. pect W. a dc.uble .pecificaciOm Iimit. D13.1 Abtmrrr,a) Remult,. Th. re. ult. 0[ irmpectior. of product manufactured umdcr conditions not typical cd tmual production. shall be excluded from the estitrmted pre cemm average. D1 3.2 Ccmputatiem d the Esf.inuted prcaverce. a Avers e. Th q e.tmuted proce.. qge M the qr~thrnetic mean of tbe estimated from the 10t pe rcem def qctive computed .unpling itt*pecti.ma re.. tit. of the preceding tea (10) low or S* may be .alhenvi. e d.miS uated. In order to estimate the lot percerat dsf.cti.e, the quality kdicem Ou &\.ar QL q lmfl be computed for each lot. Theme q re: (3u . (U-X)WI. and QL = (X- LWIO. (S8. paragraph D] I. Z.)
D13.?.. I SiI@. Sp.cifieatlon Z.lml% 6 The estimated 1ot percent dof ecu-e q bal-1 b deCennined frarn Table D. 5 ter the plum hawed O. bnowa varbbi3ity. Tbe q-am3ityiadex Q
D13. Z.Z Double Specification lAmit. Tbe e.cim.ced lot percent dciectzve qhall be .determim.d from Table D-5 for the pluI. bm. ed on variability b.swa. The quality Indic.s 0 and QL shall b. computed. Table D-5 ien ered separately Y with QU and OL ad- the carre.pomding pu snd pLare read frOm the The e.timtied ict percemt defective fable. is p = pU + pL. The e.tirnat.d pro . . . . a.er qge p i. th= qrithmetic rn.a.mof the individual =atimsced lot percent defective. p.. D13. Z.3 Special Case. U the quazity index 0,, or Q, ,s a nt~atm.e number. them Table DY5 i..~~ter=d by-di. regarding the negative si~n. However. io thi. case the e.timated iot q bove the upper limit or P. TC.nt defective below the Jow.r limit i* obtained by q ubtract ~~~~ Per==at=ge found in the table from
1,
%%% dWPECITC)N
i-peetioa.
AL
TXGZiTENED,
AND
RE-
This S$azidard e.tabli. ha. wampling pl*rsh for normal, tightened, and reduced
D14. 1 At Start of Inspection. Normal in.pectiom SW b. wed q t the qtart of inapec. UOa IU13C.*S ecberwim de#$gm4ted.
D14.Z OuriaS fn.xctiou During the co.r q e uumction shall be of In9puctia, -rmal used when taapeecio. cmaditioo. q re much tbt t6sht.nod O. redncad iaapection is not rqufred fn accordance with prmS.aphs D14.3 and D14.4. pecttoa. Tiuhtermd tnD1 4.3 Tight=imd 31W Spectltl. .W1 be in. ututed wb. n the emti naat.d proce. m qverage computed from<he
hall be us.d far tbe ea.. of aocJppr .pec iiic.tiom limit c,r QLlor the c.. e of a 10X. qpecifi..ticm limit. Table D-5 ii entered 6Wbem Form
rnste Of
crltariO=, ~h= a~tis~di=utia d.tmit ti a-cd (0? Czu ue*ptabi3~ty defective pzz or pL i. u m ebtaiaed, 10 order to emtinmte the procems qveraga, it ia aecea.~y to eornpiete paragraphs D6. Z d D6. S af hrm 2. ra, .m~e. ifQ . -.50and O = 1.60, thenpu = 100IL - 30.854% = 69. J46%. pL = %4g% ~ P 69.146% + &S . 74.6z6&. lot percent
~_~l.
..-
----
!
prece4iag [e. (1OJ Iot# (.r much other smmwith ber of lma demig=atedl in qccordmce paragraph D1 3.2 i. greaur thaa the AQL. and when more thao q certAn number T Of these 10ta have qstimmen of the percent deiective exceeding ctaeADL. Tb* T-value. are SiWeaI in Table D-b when tbe pr.acua average is computed from 5, 10. or 15 lots. 8 Normal inspection still be reimtmted if the .stinnted pro . . . . ..erage of Iota under c., tightemed iiwpectio. i, equaf tc. lem. than the AQ L. D14.4 Reduced fnsp=ctior.. Reduce4 bcpectien may be instituted provided that all of the following cOndiliOn. q re satisf ied: Condition A. The preceding tea (10) lots designated) lc.ts (or such other mmnberof have be.- under r.c.rrnsl i.. pecti.m -d no.e has been rejected. Condition B. The e.linuted percent lots is defective for qach of these preceding
Iesm than
i- Table
c.
Pr0dmct50n
is
Nonnsf impecthm *baff be retostate4 eondftiom occurm one of tbe foIlowing redueed tic wctlon:
U my tiad~r
Condition
. ..erage
D.
A Iot-ic rejected.
plwJce~-
P.oductiom
be=om.a
irregular
Dthe r ccmditiom u COtisti.n G. that normti inspection should may wtarrwt be reinstated. D1 4.5 Sarnplin~ Plans for Tightened or Reduced k,C.~=CtLOIl. S~PIIDS Pl~S fOr *lghl e~ed and reduced inspection q re provided in Section D, Parts I and 11
I 10s
..
TABLE
v.iu. Sample code size
.J-t Acceptable
D-U
k+spsctbon
mof
.25
q
T for Ti+t.oed
tavels
OustIty
letter B
.065 .
.10 .
.15
q
.40 .
.65 .
i.e
,.5
q
3 5 6 3 : 3 6 7 4 6 8 4 1 ,9 4 7 9
3 5 6 3 :
3 5 7 4 6 a 4 6 9 4 ; 4 7 10 4 7 10
: 7 4 b 9 4 7 9 4 7 9 4 7 la 4 7 10
3 4 b 3 5 7 4 6 8 4 6 8 4 7 9 4 7 !
4 7 9 4 7 9 4 7 10
7F
10.0
q
15.0 *
Nu13160r of bm
w
445 88 11 11 445 88 II 11 -++445 88 11 11
2 4 5 3 :
3 4 6 3 : 4 6 8
: 8 4 6 8 4 7 9 4 7 10
3 F . . . : 3 4 b 3 5 b 3 5 7 : 8 : 8 4 b a 3 4 6 3 5 7 4 6 a 3 5 7 3 b 7 4 b 8 3 5 7 3 6 8 4 6 b 8
: 7 4 6 a 4 6 9
2 9 4 7 99
4 4 7 7 9 I.101
4 4 7 7 10110
4 7 10 4 8 11 4 8 11 4 8 11 4 a 11 4 8 11 4 8 11 4 a II
10 15
10 15
10 15
4 4 4 b b b : a 181819119101 4 b 8 4 6 q
444444 77 :1:1:
u
44= a
9 4 6 9 9 t 1:
9 4 7 9 4 7 9
9 4 7 9 4 1:
9 4 7 10 4 1:
10 4 7 10 4 1:
10 4 7 10 4 1:
10 ; 10 4 1:
10 44 88 11 4 1!
II
445 en 11 11 445 88 11 11
10 1s 10
L I
11 4 l.:
44d
-l-J-15
.There
are no .antplimg
445 4 8 8 8 11 11 .11
plMM provided
+E
10 Is 10 15
445 88 11 11
TABLE VAM.,
Sample code
D4-CmtJmd
f519~Cti00 (in PC rcemt ttefe
1.5 2.5
v qriab.bMc7 ~
qL.
.04 4 7 10 4 1 10 .065 4 7 10 4 7 10
letter P
I .0 4 17 .4 1:
4 1: 4 1: J:
.4 1;
The top rigure in cacb block refer. to tbe precedi~ 5 lot., 15 lots. preceding 10 lot. qnd the bottom figure to the precedi~~
Tightemed i.. pectiom i. rquir.d wbem the aurnber af lotm with .stirn.tea of percent defective qbove the AQL from the preceding 5, 10, or 15 Iotm i. greater thaa the Eiven value Of T iu tbe t.ble, and the proceos qverage from th.. e lat. e=c=ed. th= AOL. N] estinutea of the lot p.rcemt de fectiws
q re
Obtaimed from
Table D-5.
107
TABLE
D.7
V. fIablllI~ Known
~~ *r
Llmlto o{ Estimated Lot PerceIII D. f.c!Ivr ior Reduced Inspection Sample size code letter 35 .04
q
,,?5
q
,40 .
.b5
q
J
.
.021 .2, ?2 .558 ! .027 .222 .558 ,16b .62Z 1.124 .311 .874 1.194 .53J I,IJ9 1.50 .677 1.Z70 1.s0 .718 1.346 1.50 .85J 1.J94 1.50 .910 1.4z7 1.50 .369 I,Z48 2.145 .631 1.64J 2.50 .046 1.880 2.50 1.1)6 Z.141 2.50 1.326 z.Z17 2.50 % 1.461 Z.J59 2.50 1.562 2.412 2.50 1.641 2.449 2.50 .769 Z.354 3.850 1.225 2.9z4 4.00 1.560 3.250 4.00 t.166 3.698 4.00 Z.40J 3.8JI 4.00 Z,643 J.94z 4.00 2.758 3.987 4.00 1.645 4.496 6.50 z.q37 5.69? 6.50 1.3Z5 5.958 6.50 4.o45 6.342 6.50 4,453 6.5o A 4.719 6.5o A 4.909 b.50 A 5.009 6.50 A 4.386 8.049 10.00 5.154 9.330 I 0,00 6.114 9.806 10.00 1.093 10.00 J 7.s02 10.00 A 1,786 10.00 i 8.05s 10.00 a 8.205 10.00 A I I
15.0
.011 .109 ,209 .011 .109 .290 .086 .)57 .669 .178 .5Z8 .867 .Jz Z .718 .00
5 10 Is
.003 .050 .144 .045 .197 .384 .09n .309 .5.22 .147 .385 .6OZ ,ZZ3 .418 .65 .252 .508 .65 .298 .549, .b5 .3!7 .564 .b5
1$
.002 .021 .064 .021 .100 .204 .078 .Z17. .347 .103 .252 .382
J-
10.436 5 15.00 10 b 1$
11.470 15.00 A 12.054 I 5.00 & 5 10 IS 5
G :
.001 .004 .010 .002 .009 .018 .004 .014 .025 .006 .016 .030 .008 .021 .033
q re
.001 .008 .01.9 .004 .017 .033 .011 .011 .051 .011 .011 .051 .014 .036 .056
l-l .-1007 027 055 013 041 071 018 0s1 082 OZJ 0s8 090 ,028 ,064 ,09b + .02.? .0b7 .114 .030 .081 .129 .038 .092 .140 .051 .109 .1S ,057 .147 .227 .070 ,164 .244 .08Z ,177 .2s ,09 I .18B .25 .142 .298 .40 .15.9 .J13 .40 .171 .JZ6 .40
53
.451
.847 ,.00 . .316 .892 1.00 .540 .908 1.00
J 2(
TF
1
-L
12.427 15.00 ~ 5 [015 5 12,693 15.00 A 12.848 15.00 A 5
10 Is
10 15
2.89! ,4.00 A
10 1$
I 4
q There
no aampllng
plant provided
in lhh Standard
D-7-Conllnued
V~rIabIllty Knows
.,
we ualftv
.-.
La C19
X
.107 ,203 .Z5 .120 .Z14 .Z5
.40 .191 .344 .40 .211 .557 .40 .Z51 .38Z .40 .277. .392. .40 .299 .41Z b .316 .40 b .348 .586 .65 .383 .608 .65 .435 .635 .b5
.017 .030 .049 .080 .146 .03Z ,054 ,086 .134 .232 .15 .04 .06S .10 .25 ?
.(41 .241 .2s
T ---1I -1_
.501 .934 I ,00 .934 1.440 1.50 .6zl .959 I .00 I,o1O 1.415 1.50 1.113 1.50 i .705 .994 1.00
T
1.732 Z.406 2.50 1.821 2.50 ha, z.96Q 4.00 b 3.093 4.00 1,959 2.50
A
2.5
5.131 b.io A
13,017 I 5.03 +
1115
5.310 6.50
10
15
5
* ,.
1
3.Z7Z 4,00
A
5.546 6,5o
*
3u15
10 15
10 14
10 15
*
nd All A(3L q tsble vduec ~r; In percent defective. bUmethe flrot fl#ure In dlrectlon of arrow and correepondin~ number of 10M. In each block the top (Igura reform to the precedlm[ 5 lott. the middle figure to the preceding IO lots. and Ihe bottom figure 10 the preceding 15 lots. Rw!uc813 impectkon may b- tnalituled when every emtlmaled lot percent defective from the preceding 5, 10, or 15 lot- in of bdow the flsure glvon In the table. fn addition, III c.ther conditiom for reduced impection, In Part 323 Sectloa D, must bc dtiltfled. AN entknmteoof the lot percent defective
q re
II
Sz@!s!!
n
Read
x
.
bar
rneawaremento
from
Sigma
fbowa variability. The predetermined variability of the quaf bow. ify cbaract.ristic which vill be u.ed rntb the .ariabifify qcceptabfltfy plus. Upper specification Lawmr spectficatian The .ceeptabi3ity Iimtit. limit. givem in Table. D. 1 and D-z. indices when ua ing The v vafues., q re
u
1. k
constant
A factor tw.d in determining the quality the bnowLI variability acceptability plan, giv== in T~b10. D-3 -d D-4.
Q O
,ub U .ub L
Quality
QL
C3uality Index for use with Table Sample estinute .Table D-5. Sample escinute Table D-5. Total qunple 0[
m PL
P M
p sub U ub 1. p q
qbove
below
U front L fr.am
p = p + PL. eatimatea
lor sample
Mu
Maxfmum allowable percent defective qbove U ~ivem h Table. D-3 and D-4. IForuce when different AQf- v81uec for W and L q re spactfjed. ) llow.blcpercent defective below Maximum q D-3 and D-4. (For usawhen different Mf) L qre q~edfted. Sunpfe ewtdnnte Of the procemw merceut amfimated procema average. Tbe qmfimuod pw..s. The estimated Tbe maximum
may exceed
ub L M q
1. @em value.
for
ia Table. U =d
P P L T
p bar
ub U p bar q p bo
defective,
.Verq. average
[*.
-n upper Spectficstlom
qub L
process number
for a lower
q pecf3icatlon
tbe AQL
applic~t~a
pr.xeoa q veragewhich of emttnuted given in Table D-6. {For u.e indetnr Of ti8bt=n=d i=~p=ctiOa. )
tbM
SLunof
110
..
.-
----
----
I I
-.
Ih
It. )
111111
UNITED
OFFKIAL q ENALTV
No PGE?AOe
wscE!EEAmv
1S UAILEO
1947MC
STATU
(Code
524
Indian
had
, KO
20660
,.
DDa??1426
. . ..
--?r