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Format For Instruction Plan [for Courses with Lectures and Labs Course No ECE918 Cours Title ADVANCED SOLID STATE DEVICES Numerical courses with tests and quizzes only Course Planner 15384 :: T.Sampatt Lectures Tutorial Practical Credits 3 0 0 4
Course Category
Text Book:
Other Specific Book: 2 S.M.SZE, Physics of semiconductor devices, John Wiley, 2007 3 Solid state electronic devices by Ben G. Streetman, 2008 4 Integrated Electronics by Millman Halkias (yellow colour book), 1998
Other Reading Sr No Jouranls atricles as compulsary readings (specific articles, Complete reference) 5 http://journalseek.net/cgi-bin/journalseek/journalsearch.cgi?field 6 www.datatranslation/ .../evolution-of-solid-state.pdf 7 http://www.bourbaphy.fr/jeanneret.pdf Relevant Websites Sr. (Web adress) (only if relevant to the No. courses) 8 en.wikipedia.org/wiki/solid-state 9 www.ni.con/solid_state 10 www.scientificcomputing.com/features/feature.php?features Salient Features Basic definitions of solid state Solid state devices Specifications of devices
Part 1
Week 1 Lecture Principles ->Reference :1,1 of Quantum >Reference mechanics, 1Ch1/1.1-1.2 Schrodinger wave equation 1 Approved for Spring Session 2011-12
Week Lecture Principles of 1 2 Quantum mechanics, Schrodinger wave equation Lecture Allowed and 3 forbidden energy bands,electrical conduction
Week Lecture Density of 2 4 states function >Reference :1,>Reference 1Ch3/3.4 Lecture Stastical 5 mechanisms >Reference :1,>Reference 1Ch3/3.5
Lecture Charge carriers 6 in SC >Reference :1,>Reference 1Ch4/4.1 Week Lecture Dopant atoms 3 7 and energy levels >Reference :1,>Reference 1Ch4/4.2 >Reference :1,>Reference 1Ch4/4.3 >Reference :1,>Reference 1Ch4/4.4 >Reference :1,>Reference 1Ch4/4.5 Video demonstration: www.nptel.iitm.ac/cours es.php/courceid=1026
Lecture Extrinsic SC 8
Part 2
Week Lecture Position of 4 11 Fermi level. >Reference :1,>Reference 1Ch4/4.6 >Reference :1,>Reference 1Ch5/5.1
Week Lecture TEST 1 5 13 Lecture Graded 14 impurity distribution >Reference :1,>Reference 1Ch5/5.3 Video demonstration: >Reference www.nptel.iitm.ac/cours :1,es.php?courceid=1026 >Reference 1Ch5/5.4 >Reference :1,>Reference 1Ch7/7.17.2-7.3 >Reference :1,>Reference 1Ch7/7.17.2-7.3 >Reference :1,>Reference 1Ch7/7.4 >Reference :1,>Reference 1Ch8/8.18.2
Week Lecture PN junction: 6 16 basic structure, zero applied bias,Reverse bias Lecture PN junction: 17 basic structure, zero applied bias,Reverse bias Lecture Non-uniform 18 doping
Lecture TEST 2 20
Lecture Junction 21 breakdown, Charge storage and Diode transients, Tunnel diode
MID-TERM Part 3
Week Lecture The Schottky 8 22 Barrier Diode >Reference :1,>Reference 1Ch9/9.1 Video demonstration: >Reference www.nptel.iitm.ac/cours :1,es.php?courceid=1026 >Reference 1Ch9/9.1 >Reference :1,>Reference 1Ch9/9.2 >Reference :1,>Reference 1Ch9/9.2
Lecture Metal24 Semiconductor Ohmic Contacts Week Lecture Metal9 25 Semiconductor Ohmic Contacts
Lecture Heterojunctions 26 >Reference :1,>Reference 1Ch9/9.3 Lecture Bipolar 27 transistor action Video demonstration: >Reference www.nptel.iitm.ac/cours :1,es.php?courceid=1026 >Reference 1Ch10/10.1 >Reference :1,>Reference 1Ch10/10.1 Approved for Spring Session 2011-12
Week 10
Lecture 29
Part 4
Week 10 Week 11 Lecture 30 Lecture 31 Low frequency common base current gain Low frequency common base current gain Non ideal effects TEST 3 Frequency Limitations of BJT Large signals switching ->Reference :1,>Reference 1Ch10/10.6 ->Reference :1,>Reference 1Ch10/10.7>Reference 1Ch10/10.7 ->Reference :1,>Reference 1Ch11/11.1 ->Reference :1,>Reference 1Ch10/10.3 ->Reference :1,>Reference 1Ch10/10.3
Capacitance -voltage ->Reference :1,characteristics >Reference 1Ch11/11.2 Basic MOSFET operation Basic MOSFET operation Frequency Limitations ->Reference :1,>Reference 1Ch11/11.3 ->Reference :1,>Reference 1Ch11/11.3 ->Reference :1,>Reference 1Ch11/11.4 Video demonstration: www.nptel.iitm.ac/cours es.php?courceid=1026
Spill Over
Week 14 Lecture 40 Lecture 41 Lecture 42 revision revision revision
to test Introduction to Individual their quantum knowledge theory in solids, The SC in equillibrium, Carrier Transport phenomenon to test PN junction their diode,Hall knowledge effect,Carrier Diffusion Individual
Test 2
5/7
Test 3
to test Bipolar Individual their transistor knowledge action,Two terminals MOS structure,Basic MOSFET operation.
9 / 11
* In ENG courses wherever the total exceeds 100, consider x best out of y components of CA, as explained in teacher's guide available on the UMS 3 Approved for Spring Session 2011-12