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(XRD)
BY IPSHITA RANJANA
63
120903248
INTRODUCTION
When an incident beam of monochromatic X-rays interacts with a crystalline
substance, the atomic planes of the crystal causes an incident beam of X-rays to
interfere with one another as they leave the crystal. The phenomenon is called Xray diffraction.
BRAGGS LAW
Bragg Law was first proposed by William Henry BraggandWilliam Lawrence Braggin response to
their discovery thatcrystallinesolids produced surprising patterns of reflected X-rays. They found
that these crystals, at certain specific wavelengths and incident angles, produced intense peaks of
reflected radiation (known asBragg peaks).
W. L. Bragg explained this result by modeling the crystal as a set of discrete parallel planes separated
by a constant parameterd. It was proposed that the incident X-ray radiation would produce a Bragg
peak if their reflections off the various planes interfered constructively. The interference is
constructive when the phase shift is a multiple of this condition can be expressed by Bragg's law:
Incident Angle
Reflected angle
X-ray Wavelength
Total Diffracted
Angle 2
A comparison of the X-ray powder diffraction patterns of NaCl (bottom) and KCl (top).
METHODS
SINGLE CRYSTAL X-RAY DIFFRACTION
THE POWDER METHOD
LIMITATIONS
However, the technique is limited by the ability to grow nearly perfect crystals that
are suitable for diffraction.
Due to this limitation and the time and cost-intensive nature of the technique,
single crystal diffraction is not used for routine structural characterization of known
materials.
APPLICATIONS
Pharmaceutical industry
Forensic science
XRD is used mainly in contact trace analysis.
Geological applications
Since the 1920s, X-ray diffraction has been the principal method for determining the
arrangement of atoms in minerals andmetals. XRD is the key tool in mineral
exploration. Each mineral type is defined by a characteristic crystal structure, which
will give a unique x-ray diffraction pattern, allowing rapid identification of minerals
present within a rock or soil sample. The XRD data can be analyzed to determine the
proportion of the different minerals present.
Microelectronics industry
As the microelectronics industry uses silicon and gallium arsenide single crystal
substrates in integrated circuit production, there is a need to fully characterize these
materials using the XRD. XRD topography can easily detect and image the presence
of defects within a crystal, making it a powerful non-destructive evaluation tool for
characterizing industrially important single crystal specimens.
Glass industry
While glasses are X-ray amorphous and do not themselves give X-ray diffraction
patterns, there are still manifold uses of XRD in the glass industry. They include
identification ofcrystalline particles which cause tiny faults in bulk glass, and
measurements of crystalline coatings for texture and crystallite size
REFRENCES
Wikipedia
X-Ray Diffraction by Hanno zur Loye
http://serc.carleton.edu/research_education/geochemsheets/BraggsLaw.html