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What is done?
Scales of measurement
Nominal
Ordinal
Interval
Ratio
Sampling plans
1. Simple random sample
2. Stratified sample
Contd.
Not suitable for changing processes
Cornerstone of six sigma process
Stratified sample
More refined than random sampling
Segregated from heterogeneous lot on the basis of
some criteria. For example: percentage
Three shifts taking data for each shift together
Reason from stratification:
1. Ensure that particular group is adequately
represented
2. Improve efficiency by gaining greater control over
sampling
. Expensive
. Complex to analyze
Measurement System
Analysis
Q: What is Measurement System Analysis (MSA)?
A: Its a set of techniques that allow us to answer the question:
Bias
Reference Value = 0.500 This is a known size
Mean of multiple measurements = 0.525
The gage is, on average, measuring about 0.025 too big.
It has a positive bias of 0.025
Bias
Bias
Linearity Change in Bias over operating range
Bias
Stability Change in Bias over time
Variation
Repeatability &
Reproducibility
Long-term
Short-term
Measurement Variation
Variation
Variation due
Variation due
w/i sample
to gage
to operators
Repeatability
Calibration
Stability
Linearity
Terminology
Standard unit: any of the n units with
standard values available
Absolute error: absolute value of the
measurement errors for a given test run
EEEAE : Estimates errors of the expected
absolute errors
Measurement system capability (MSA) = 6 X
EEAE (Estimated expected absolute errors)
Gauge capable: If MSA <D, where user
specified maximum tolerable difference
from standard value. Thus 6 X EEAE < D
Example
Use
two
12.0-pound
dumbbells
to
determine
whether
the
following
measurement
standard
operating
procedure (SOP) is gauge capable of
telling apart differences of 5.0 pounds.
1. Put Taylor Metro scale (dial indicator
model) on a flat surface.
2. Adjust dial to set reading to zero.
3. Place items on scale and record the
weight, rounding to the nearest pound.
Process Capability
Analysis
36
Introduction
Introduction Contd..
Tolerance limit
Control limits
38
41
44
51
Process capability
index
USL
3
58
LSL
CPL
3
It is desirable to have CPL greater than or equal to 1
59
3
3
k
target m is given by scaled distance k
USL LSL
C pk2 C p (1 k )
Where m is sum of USL and LSL divided by
Relationship between Cp and Cpk is given by
61
Cp
Cpk
Question
In an electrical circuit, the capacitance of a
component should be between 25 and 40
pico farads. A sample of 25 components
yields a mean of 30 pF and a standard
deviation of 3pF. Calculate the process
capability index Cpk and comment on the
process performance. If the process is not
capable, what proportion of the product is
nonconforming,
assuming
a
normal
distribution of the characteristic?
USL LSL
E
[(
X
T
)
]
T
)
is the standard deviation from the target value and
given by
T
C pm
where
2
2
2
1
(by
T )
Hence Cpm is6given
USL LSL
Cp
Question
A process in control has an estimated
standard deviation of 2 mm. We have
a product with specification limits of
1208mm and a target value of 120
mm. Calculate the Cp, CPL, CPU, Cpk
and Cpm for the process if the process
mean shifts from 118 mm first to 122
mm and then to 124 mm but the
process variability remains the same.
Question
USL = 62mm; LSL = 38 mm; T= 50
Mean = 50; SD = 4
Mean = 56; SD = 2
Mean = 59; SD = 1
Continued
If the natural tendency of process is
to get deviated towards higher side of
mean and if it deviates 1 mm per
week, how many resetting at target
value will be required in an year?
Assume that company can bear
maximum 5% defectives on higher
side of mean and it takes Rs. 10,000
for each resetting of process mean.
Which process among A, B and C