ERTL

VERIFICATION OF
QUALITY AND
RELIABILITY OF
SEMICONDUCTOR
DEVICES BY TESTING
PRESENTED BY-

KIRTI BHUMBEE
0719231031
 TABLE OF CONTENTS
1. Introduction
2. About the organization
3. Methodology
4. Materials and their technology

4.1 Tektronix 7854 oscilloscope with waveform calculator

4.2 Semiconductor tester

4.3 TESEC 881-TT/A Spectra discrete semiconductor test system

4.4 Fluke true rms digital multimeter 289
4.5 Burn in test
5. Conclusion
 INTRODUCTION
The central problem or the aim is to test and certify the
quality and reliability of semiconductor devices by testing.
The test facilities are

• Automatic Test Equipments,

• Constant current/Voltage sources,
• Pulse generators,
• Wave processing oscilloscope,
• Multimeters
The Quality is verified by electrical measurements on
semiconductor components.

Reliability is checked by several conducting tests which

includes physical factors such as temperature, humidity, time
and power dissipation.
 ORGANIZATION
Services provided by ERTL are-

• CCFC (Consumer care and facility center)

• CAG (Computer application group)
• Environment lab
• System lab
• Safety lab
• Components lab
• Burn in lab
• LCR lab
• Audio lab
• PCB and laminates
• Calibration and standardization
METHODOLOGY

QUALITY

RELIABILITY

TESTING

SCREENING
 Materials & Technology
1. TEKTRONIX 7854 Oscilloscope with
Waveform Calculator
 The Tektronix 7854 Oscilloscope with Waveform Calculator
combines the feature of a high performance plug-in oscilloscope with
a waveform-oriented dedicated-function digital processor.
 Up to 16 waveforms can be stored in memory and up to 9 of them
can be displayed at one time.

 A mixed (BOTH) mode is provided to display both the real-time

waveforms and the stored waveforms for comparison or
measurement.
 Cursors are provided for the stored waveforms to delimit or
identify portions of the waveform to be measured.
 Functions such as WIDTH, RISE, ITRP, etc are cursor-
dependent.

 Operating Voltage – 115-230 V, 48-440 Hz.

2. SEMICONDUCTOR TESTER
 The B&K Model 530 Semiconductor Tester is designed for in-
circuit and out-of-circuit semiconductor testing, with special
features for making additional tests on devices out-of-circuit.
 It uses a high-current, low duty-cycle pulse technique to test
transistors in the presence of shunting circuitry.

 It has a low-current drive system which enables the user to

identify the terminals of the device in most in-circuit tests and all
out-of-circuit checks.
 An exceptional feature is the provision for measurement of the
frequency at which the transistor gain is one or unity.

 This is the ft rating for a transistor and is applied to bipolar

devices.
3. TESEC 881-TT/A SPECTRA DISCRETE
SEMICONDUCTOR TEST SYSTEM
 The 881-TT/A is a high performance universal test
system for discrete semiconductor devices.

 When the tester is interfaced to a high-speed handler

or probe, it performs accurate measurements of
devices at high speed.

 Features:-

1.4-digit accuracy.

2.CPU for testing and PC for programming.

3.Multi-user operation.

4.High speed A/D converter for all parameters.

4.Fluke True RMS Digital Multimeter 289
 The new 289 is the next generation high performance
industrial logging multimeter designed to solve complex
problems in electronics, plant automation, power
distribution, and electro-mechanical equipment.
 With the ability to log data and review it graphically on-
screen, we can solve problems faster and help minimize
downtime.
Applications/Features:

1. Saved measurements allows us to name and recall

measurements made in the field
2. 100 kHz ac bandwidth
3. Measures up to 10A (20 A for 30 seconds; 10A continuous)
4. Temperature function
5. Burn in Test

 Burn-In Test is meant to check the reliability of a device for its

lifetime.

After Burn-In the life of a device is reduced by 1.12 years (Given by

Arrhenius Equation), but the device is assured of its reliability for the
rest of its life.
5.1 Burn in Boards

The Burn In boards are designed to mount the

semiconductor devices on them and supply as
well as distribute the required current and
voltage to all the mounted devices.
5.2 Programming Plugs
The Programming Plug is
designed to distribute the
voltage and current to all the
semiconductor devices mounted
on the Burn-In Board.

The Programming Plug also

connects the Burn-In Board to
the Burn-In chamber, where the
voltage and current is applied.
5.3 Burn-In Chamber The Burn-In Boards are placed
inside the Burn-In Chamber all
throughout the Burn-In process.

Rated Voltage and Current is

applied to the Burn-In Chamber
and it reaches the Burn-In boards
through the Programming Plugs
 CONCLUSION & RESULTS

Several activities were carried out to test the quality and reliability
of semiconductor devices.

Their electrical parameters were tested using TESEC Discrete

Test System.

The reliability of semiconductor devices was verified by Burn-In

test, Life Operating test was conducted.

The highly versatile TEKTRONIX 7854 Oscilloscope and

Waveform Calculator was studied and several activities were
performed to study various input signals, store them and process
them.
THANK YOU