STATISTICAL QUALITY CONTROL

COMPONENTS OF STATISTICAL QUALITY CONTROL

Statistical Process Control (SPC)

 

Acceptance Sampling

DEFINITIONS
Statistical process control (SPC) involves the application of statistical techniques in monitoring and controlling the process to prevent excessive defective or nonconformance products. Acceptance sampling is concerned with random sampling to determine if a lot is acceptable.

STATISTICAL PROCESS CONTROL (SPC)

Used primarily to test the process to see if it is in control, i.e. working properly. SPC can only pinpoint possible problems with the process. It does not help correct the problem. The operator, instead, is responsible for rectifying the problem or initiating the

QUALITY CHARACTERISTICS

The quality of a product can be evaluated using either an attribute or a variable of a product.

1. An attribute is a product characteristic that can be evaluated with a discrete response, e.g. good/bad, pass/fail, yes/no, etc. 2. A variable is a product characteristic

Graphs showing if sample results are within statistical control limits. Control limits are the upper and lower boundaries of a control chart. The control charts are employed to establish the control limits for a process and then to monitor the process to indicate when it is out of control.

CONTROL CHARTS

CRITERIA FOR ININA process is in control if 1. No sample point lies outside the CONTROL PROCESS control limits. 2. Most points fall near the process average. Few of them are close to the control limits. 3. Approximately equal numbers of points occur above and below the process average. 4. The points are randomly distributed around the process

CONTROL CHARTS FOR ATTRIBUTES

A p-chart uses the proportion defective in a sample. A c-chart utilizes the number of defective items in a sample.

A from the production process and the proportion of defective items in the sample is determined to see if the proportion falls within the control limits. Based on distribution. the binomial

A P-CHART P- taken periodically sample is

The upper control limit (UCL) and the lower control limit (LCL) of a p-chart can be computed as pfollows: UCL = p+Z p ZW LCL = p - ZWp where Z = the number of standard deviations from the process average p = the population proportion defective or the process average Wp = the standard deviation of the sample [p(1proportion p)]/n

CONTROL LIMITS OF A P-CHART P-

EXAMPLE 1 Lertkitchakarn Co. manufactures Co.

the ceramic coffee mugs. The mugs. company wants to investigate if its production process is in control by adopting the p-chart. The firm has chart. gathered 20 samples (one per day for 20 days), each containing 100 mugs, i.e. n = 100. The samples are 100. inspected for defects. The results defects.

EXAMPLE 1 Sample Number of Sample Number of Proportion Defective Proportion INSPECTION RESULTS Mugs Defective Defective Mugs
1 2 3 4 5 6 7 8 9 10 6 0 4 10 6 4 12 10 8 10 .06 .00 .04 .10 .06 .04 .12 .10 .08 .10 11 12 13 14 15 16 17 18 19 20 Defective 12 10 14 8 6 16 12 14 20 18 .12 .10 .14 .08 .06 .16 .12 .14 .20 .18

EXAMPLE estimated 1p is not known. It will thus be from the SOLUTION total sample: p = total defectives/total sample observation
= 200 / [(20)(100)] = 0.10 The control limits are calculated as follows: UCL = p + Z p(1= = p)/n 0.10 + 3 0.10(10.190 0.10)/100 p - Z p(1LCL = 0.10 - 3 0.10(1p)/n = = 0.10)/100 0.010

EXAMPLE 1 - A PPCHART 05 .2
0 .2 05 .1 0 .1 05 .0 0
1 2 3 4 5 6 7 8

U C L p L C 91 1 1 1 1 1 1 1 1 1 2 0 1 2 3 4 5 6 7 8 9 0 L

A C-CHART C-

Adopted when it is not possible to c a proportion defective and the actua of defects must be used instead.

CONTROL LIMITS OF The upper control limit (UCL) and the lower control limit (LCL) CHART computed A C- of a c-chart can be Cas follows:
UCL = c + ZWc LCL = c - ZWc where Z = the number of standard deviations from the process average c = the mean number of defects per sample or the process average Wc = the standard deviation of the sample = c

CONTROL CHARTS A mean ( x-chart) FOR VARIABLES

utilizes the process average of a sample.

An R-chart uses the amount of dispersion in a sample.

A MEAN OR X CHART
Based on the normal distribution UCL = Q + ZWx LCL = Q - ZWx where Z = the number of standard deviations from the process average Q = the process average = x = (x1 + x2 +x3 + + xk) / k k = the number of samples Wx = the standard deviation of the sample = Wn

Pongpun Iron Pipes Co., Ltd. manufactures iron pipes for industrial uses. The biggest-selling pipe is Model H-999. The company would like to construct a mean chart for the production process of this type of pipe that will include 99.74 percent, i.e. three standard deviations of the process variability with the sample size of 20. The pipe has a mean outside diameter of 5 centimeters and a standard deviation of 0.04

EXAMPLE 2

EXAMPLE 2asUCL and LCL can be calculated follows: SOLUTION UCL = Q + ZW

x

Wx = sample = 0.04/ 20 Thus, UCL = 5 + 3(0.04/ 20) = 5.027 cm. LCL = 5 - 3(0.04/ 20) = 4.973 cm.

LCL = Q - ZWx the standard deviation of the

The range is the difference between the largest and the smallest values in a sample. The upper control limit (UCL) and the lower control limit (LCL) of an R-chart can be computed as follows: UCL = D4R LCL = D3R where R = the average range for the samples D4, D3 = values taken from the Table 1. They are comparable to three standard

A RANGE OR RRCHART

TABLE 1. FACTORS FOR COMPUTING CONTROL LIMITS FOR THE X- AND R-CHART
Sample Size n 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Factor for x-chart A2 1.88 1.02 0.73 0.58 0.48 0.42 0.37 0.34 0.31 0.29 0.27 0.25 0.24 0.22 0.21 0.20 0.19 0.19 0.18 0.17 0.17 0.16 0.16 0.15 Factor for R-chart Factor for Rchart D3 D4 0 3.27 0 2.57 0 2.28 0 2.11 0 2.00 0.08 1.92 0.14 1.86 0.18 1.82 0.22 1.78 0.26 1.74 0.28 1.72 0.31 1.69 0.33 1.67 0.35 1.65 0.36 1.64 0.38 1.62 0.39 1.61 0.40 1.60 0.41 1.59 0.43 1.58 0.43 1.57 0.44 1.56 0.45 1.55 0.46 1.54

EXAMPLE 3
From Example 2, the company also wants to develop the Rchart. Ten samples of 5 iron pipes are taken during a tenday period. The measurements obtained from each sample are shown below:

EXAMPLE 3 - PROCESS Observations (Outside Diameters, cm.) MEASUREMENTS R Sample 1 2 3 4 5 X

1 2 3 4 5 6 7 8 9 10 5.02 5.01 4.99 5.03 4.95 4.97 5.05 5.09 5.14 5.01 5.01 5.03 5.00 4.91 4.92 5.06 5.01 5.10 5.10 4.98 4.94 5.07 4.93 5.01 5.03 5.06 5.10 5.00 4.99 5.08 4.99 4.95 4.92 4.98 5.05 4.96 4.96 4.99 5.08 5.07 4.96 4.96 4.99 4.89 5.01 5.03 4.99 5.08 5.09 4.99 4.98 0.08 5.00 0.12 4.97 0.08 4.96 0.14 4.99 0.13 5.01 0.10 5.02 0.14 5.05 0.11 5.08 0.15 5.03 0.10 50.09 1.15

EXAMPLE 3 = SOLUTION 7R/k = 1.15/10

0.115

From Table 1 for n = 5, D3 = 0, D4 = 2.11, hence UCL = D4R = 2.11(0.115) 0.243 LCL = D3R = 0(0.115) = 0

A COMBINED X AND The upper control limit (UCL) and the lower R-CHART control limit (LCL) can be computed as
follows: UCL = x + A2R LCL = x - A2R where x = the average of the sample means R = the average range for the samples A2 = values taken from the Table 1. They are comparable to three standard deviations.

TABLE 1. FACTORS FOR COMPUTING CONTROL LIMITS FOR THE X- AND R-CHART
Sample Size n 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Factor for x-chart A2 1.88 1.02 0.73 0.58 0.48 0.42 0.37 0.34 0.31 0.29 0.27 0.25 0.24 0.22 0.21 0.20 0.19 0.19 0.18 0.17 0.17 0.16 0.16 0.15 Factor for R-chart Factor for Rchart D3 D4 0 3.27 0 2.57 0 2.28 0 2.11 0 2.00 0.08 1.92 0.14 1.86 0.18 1.82 0.22 1.78 0.26 1.74 0.28 1.72 0.31 1.69 0.33 1.67 0.35 1.65 0.36 1.64 0.38 1.62 0.39 1.61 0.40 1.60 0.41 1.59 0.43 1.58 0.43 1.57 0.44 1.56 0.45 1.55 0.46 1.54

An attribute sampling plan

ACCEPTANCE SAMPLING

1. AofSINGLE A single sample size n is taken randomly for inspection from a SAMPLING PLAN

production lot. If the sample contains the number of defects not more than the acceptable number, the entire lot is accepted. Otherwise, the lot will be

2.than the single sampling A DOUBLE Less costly plan. SAMPLING PLAN
Firstly, a small sample is taken. If the quality is very good, the lot is accepted. On the other hand, if the quality is very poor, the lot is rejected. Should the initial sample is inconclusive, a second sampling is taken. The lot will be accepted or rejected based on the

3. A SEQUENTIAL OR Least expensive of all sampling plans MULTIPLE SAMPLING PLAN

Adopts the smallest sample size of any sampling plan. An initial sample, which can be as small as one unit, is taken. If the number of defects is less than or equal to the lower limit, the lot is accepted. However, if the number of defective items is more than the upper limit, the lot is rejected. If the number of defects falls within the two limits, a second sample is made. The cumulative number of defects is then compared to the upper and lower limits revised upward. If the result is still indecisive for the second sample. The third sample is taken. The procedure repeats until the lot is

4. A VARIABLE Measures the continuous variables, SAMPLING PLAN

e.g. weight, length, or volume. In the attribute plan, the inspection identifies the number of defective items, but in the variable plan, the measured value is checked against the acceptance or rejection limits.