Încărcări by NehruBoda

Device Zero

basicCio.pdf

Thermal-Aware TSV Repair for Electromigration in 3D ICs

Reducing Average and Peak Test Power Through Scan Chain Modification

Dynamic Test Data Transformations For

stage_2

Review

An Efficient Scan Tree Design for Test Time

Dynamic Scan

vlsi_ass_4

vlsi_ass_4

vlsi_HW3

EE669-1

VLSI_ASSIGNMENT1

2015Fall EE669 Course Description Policy

3_3

14

1_3

Ece 4333 Notes 3

Prob 24.17

2015Fall EE669 Course Description Policy

An Efficient Scan Tree Design for Test Time

Matlab Graphics

97_astr

97_phys

David-K-Cheng-Field-and-Wave-Electromagnetics.pdf